SEARCH · Search NASA

Results for “microscope”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

SourceResearch connectionFrom yearThrough year

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 235 records · Page 13

All sources NASA NTRS DOE OSTI

NASA NTRS1981

Equivalence of macroscopic and microscopic Griffith conditions for subcritical crack growth

Exact relations are derived for a simple bond-snapping model of fracture and numerical results from a previous work are presented. A lattice model with a nonlinear cohesive force law is then considered. In both cases, the results confirm the equivalence of the microscopic and macroscopic Griffith conditions. The Griffith stress intensity is to be identified with the quiescent stress intensity.

Esterling, D. M.↗

NASA NTRS1981

Measurement of surface recombination velocity for silicon solar cells using a scanning electron microscope with pulsed beam

The role of surface recombination velocity in the design and fabrication of silicon solar cells is discussed. A scanning electron microscope with pulsed electron beam was used to measure this parameter of silicon surfaces. It is shown that the surface recombination velocity, s, increases by an order of magnitude when an etched surface degrades, probably as a result of environmental reaction. A textured front-surface-field cell with a high-low junction near the surface shows the effect of minority carrier reflection and an apparent reduction of s, whereas a tandem-junction cell shows an increasing s value. Electric fields at junction interfaces in front-surface-field and tandem-junction cells acting as minority carrier reflectors or sinks tend to alter the value of effective surface recombination velocity for different beam penetration depths. A range of values of s was calculated for different surfaces.

Daud, T.↗

NASA NTRS1982

Microchrons - The Rb-87/Sr-87 dating of microscopic samples

The present investigation is concerned with the extension of the Rb-Sr dating technique to microscopic samples of individual mineral grains as small as approximately 30 micrometers in size. The measurement of the isotopic composition and the relative number of atoms of Rb and Sr has presented difficulties because of the need to separate Rb from Sr due to the isobaric interference at mass 87. This separation is critical since the changes in Sr-87/Sr-86 are directly related to the age of the sample. The approach used in the considered investigation is a modified version of the direct loading technique reported by Wasserburg et al. (1977). It is shown that measurements can be conducted of the Rb and Sr isotopic compositions and Rb/Sr atom ratios in microsamples containing 10 to the 11th to 10 to the 12th atoms of Sr. Rb-Sr model ages may prove to be of considerable importance in identifying and studying interplanetary dust particles.

Papanastassiou, D. A.↗

NASA NTRS1983

Microscopic Lagrangian description of warm plasmas. IV - Macroscopic approximation

The averaged-Lagrangian method is applied to linear wave propagation and nonlinear three-wave interaction in a warm magnetoplasma, in the macroscopic approximation. The microscopic Lagrangian treated by Kim and Crawford (1977) and by Galloway and Crawford (1977) is first expanded to third order in perturbation. Velocity integration is then carried out, before applying Hamilton's principle to obtain a general description of wave propagation and coupling. The results are specialized to the case of interaction between two electron plasma waves and an Alfven wave. The method is shown to be more powerful than the alternative possibility of working from the beginning with a macroscopic Lagrangian density.

Kim, H.↗

NASA NTRS1985

Specimen Holder for Analytical Electron Microscopes

Reduces spectral contamination by spurious X-ray. Specimen holder made of compressed carbon, securely retains standard electron microscope grid (disk) 3 mm in diameter and absorbs backscattered electrons that otherwise generate spurious X-rays. Since holder inexpensive, dedicated to single specimen when numerous samples examined.

Clanton, U. S.↗

NASA NTRS1985

Effects of coating rectangular microscopic electrophoresis chamber with methylcellulose

One of the biggest problems in obtaining high accuracy in microscopic electrophoresis is the parabolic flow of liquid in the chamber due to electroosmotic backflow during application of the electric field. In chambers with glass walls the source of polarization leading to electroosmosis is the negative charge of the silicare and other ions that form the wall structure. It was found by Hjerten, who used a rotating 3.0 mm capillary tube for free zone electrophoresis, that precisely neutralizing this charge was extremely difficult, but if a neutral polymer matrix (formaldehyde fixed methylcellulose) was formed over the glass (quartz) wall the double layer was displaced and the viscosity at the shear plane increased so that electroosmotic flow could be eliminated. Experiments were designed to determine the reliability with which methylcellulose coating of the Zeiss Cytopherometer chamber reduced electroosmotic backflow and the effect of coating on the accuracy of cell electrophoretic mobility (EPN) determinations. Fixed rat erythrocytes (RBC) were used as test particles.

Plank, L. D.↗

NASA NTRS1984

Microscopic optical potential analyses of carbon-carbon elastic scattering

Utilizing eikonal phase shifts determined from a microscopic double-folding optical potential, marked improvement in the agreement between theory and experiment, for elastic carbon-carbon scattering between 200 and 300 MeV, is obtained when only those values for the nucleon-nucleon slope parameter, appropriate for diffractive scattering, are used. The appropriateness of the perturbative eikonal expansion is discussed by comparison with recent results, obtained for the same potentials, using a more exact complex Wentzell-Kramers-Brillouin (WKB) formalism.

Bidasaria, H. B.↗

NASA NTRS1985

Microscopic evaluation of a polyimide (PMR-15)-graphite composite

An effort to evaluate the high temperature performance of a polyimide (PMR-15)-graphite composite which consists of several plies of woven strands of carbon fibers was undertaken. The longterm effect of high temperature on the dry material was studied by exposing polished test specimens of 473 F in a oven for nearly 400 hours. Periodically the specimens were removed and observed microscopically. Gradually surface cracks began to appear and the number of cracks increased over time. At the conclusion of the exposure the specimens were graudually ground down and observed in order to determine the depth of the cracks into the interior of the material. This procedure was repeated at an exposure temperature of 550 F.

Fedderly, J. J.↗

NASA NTRS1986

Low energy X-ray spectra measured with a mercuric iodide energy dispersive spectrometer in a scanning electron microscope

A mercuric iodide energy dispersive X-ray spectrometer, with Peltier cooling provided for the detector and input field effect transistor, has been developed and tested in a scanning electron microscope. X-ray spectra were obtained with the 15 keV electron beam. An energy resolution of 225 eV (FWHM) for Mn-K(alpha) at 5.9 keV and 195 eV (FWHM) for the Mg-K line at 1.25 keV has been measured. Overall system noise level was 175 eV (FWHM). The detector system characterization with a carbon target demonstrated good energy sensitivity at low energies and lack of significant spectral artifacts at higher energies.

Iwanczyk, J. S.↗

NASA NTRS1987

Computer control of a scanning electron microscope for digital image processing of thermal-wave images

Using a recently developed technology called thermal-wave microscopy, NASA Lewis Research Center has developed a computer controlled submicron thermal-wave microscope for the purpose of investigating III-V compound semiconductor devices and materials. This paper describes the system's design and configuration and discusses the hardware and software capabilities. Knowledge of the Concurrent 3200 series computers is needed for a complete understanding of the material presented. However, concepts and procedures are of general interest.

Gilbert, Percy↗

NASA NTRS1985

Microscopic defect structures and equivalent electron fluence concepts

The lack of additivity of proton and electron exposure of GaAs solar cells has been established as due to macroscopic variations in defect densities. The difference in annealing in proton and electron exposure is herein related to the microscopic variation in defect structures. Electron equivalence can be established when annealing is present only for high energy electrons.

Stith, John J.↗

NASA NTRS1987

Energy-gap spectroscopy of superconductors using a tunneling microscope

A unique scanning tunneling microscope (STM) system has been developed for spectroscopy of the superconducting energy gap. High-resolution control of tunnel current and voltage allows for measurement of superconducting properties at tunnel resistance levels 100-1000 greater than that achieved in prior work. The previously used STM methods for superconductor spectroscopy are compared to those developed for the work reported here. Superconducting energy-gap spectra are reported for three superconductors, Pb, PbBi, and NbN, over a range of tunnel resistance. The measured spectra are compared directly to theory.

Le Duc, H. G.↗

NASA NTRS1988

Toolmaker's Microscope With Video Monitor

Display accessories increase resolution and flexibility of use. Toolmaker's microscope equipped with video monitor, auxiliary lighting, and high-resolution readout devices enables noncontacting measurements of tiny slots, indentations, and similar features on parts. Measures places difficult or impossible to reach by mechanical means.

Ahmed, Arif S.↗

NASA NTRS1988

Refilling of a plasmaspheric flux tube - Microscopic plasma processes

The paper elucidates those microscopic plasma processes (electrostatic shocks, pitch angle scattering of the ions, and ion perpendicular heating) which help in trapping and/or thermalizing the plasma in the flux tubes. The mechanism and conditions for electrostatic shock formation are discussed. It is shown that equatorial ion heating stops interhemispheric flow by setting up a potential barrier at the equator.

Singh, N.↗

NASA NTRS1988

Microscopic filamentation due to electrothermal instability and plasma heating in time-dependent solar transition layer

Nonlinear equilibrium states of a microscopic current filamentation (electrothermal instability) in the solar atmosphere are explored. This phenomenon occurs for transition zone ion temperature plasmas provided that the electron to ion temperature ratio exceeds 1. It is shown that when the onset condition for the electrothermal instability is satisfied, the instability drives a current filamentation to a nonlinear equilibrium state that has a spatially periodic electron temperature variation with wavelength.

Hinata, Satoshi↗

NASA NTRS1989

Superconducting phonon spectroscopy using a low-temperature scanning tunneling microscope

The low-temperature scanning tunneling microscope (STM) system described by LeDuc et al. (1987) was used to observe the phonon density of states effects in a superconductor. Using techniques based on those employed in macroscopic tunneling spectroscopy, electron tunneling current-voltage (I-V) spectra were measured for NbN and Pb, and dI/dV vs V spectra were measured using standard analog derivative techniques. I-V measurements on NbN and Pb samples under typical STM conditions showed no evidence for multiparticle tunneling effects.

Leduc, H. G.↗

NASA NTRS1990

Ballistic-Electron-Emission Microscope

Ballistic-electron-emission microscope (BEEM) employs scanning tunneling-microscopy (STM) methods for nondestructive, direct electrical investigation of buried interfaces, such as interface between semiconductor and thin metal film. In BEEM, there are at least three electrodes: emitting tip, biasing electrode, and collecting electrode, receiving current crossing interface under investigation. Signal-processing device amplifies electrode signals and converts them into form usable by computer. Produces spatial images of surface by scanning tip; in addition, provides high-resolution images of buried interface under investigation. Spectroscopic information extracted by measuring collecting-electrode current as function of one of interelectrode voltages.

Kaiser, William J.↗

NASA NTRS1990

Design and calibration of a vacuum compatible scanning tunneling microscope

A vacuum compatible scanning tunneling microscope was designed and built, capable of imaging solid surfaces with atomic resolution. The single piezoelectric tube design is compact, and makes use of sample mounting stubs standard to a commercially available surface analysis system. Image collection and display is computer controlled, allowing storage of images for further analysis. Calibration results from atomic scale images are presented.

Abel, Phillip B.↗