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At least 235 records · Page 13

Speckle interferometry using fiber optic phase stepping

A system employing closed-loop phase-stepping is used to measure the out-of-plane deformation of a diffusely reflecting object. Optical fibers are used to provide reference and object beam illumination for a standard two-beam speckle interferometer, providing set-up flexibility and ease of alignment. Piezoelectric fiber-stretchers and a phase-measurement/servo system are used to provide highly accurate phase steps. Intensity data is captured with a charge-injection-device camera, and is converted into a phase map using a desktop computer. The closed-loop phase-stepping system provides 90 deg phase steps which are accurate to 0.02 deg, greatly improving this system relative to open-loop interferometers. The system is demonstrated on a speckle interferometer, measuring the rigid-body translation of a diffusely reflecting object with an accuracy + or - 10 deg, or roughly + or - 15 nanometers. This accuracy is achieved without the use of a pneumatically mounted optics table.

Mercer, Carolyn R.↗

Scanning Tunneling Microscopy methods for spectroscopic imaging of subsurface interfaces

A new method for spatially-resolved, spectroscopic investigation of subsurface interface structure has been developed. The method, Ballistic Electron Emission Microscopy (BEEM), is based on Scanning Tunneling Microscopy (STM) techniques. BEEM combines STM vacuum tunneling with unique ballistic electron spectroscopy capabilities. BEEM enables, for the first time, direct imaging of subsurface interface electronic properties with nanometer spatial resolution. STM topographic images of surface structure and BEEM images of subsurface properties are obtained simultaneously. BEEM capabilities are demonstrated by investigation of important metal-semiconductor interfaces.

Bell, L. D.↗

AIAs Diffusion/Schottky Barrier on GaAs

Ultrathin epitaxial film of AIAs deposited on GaAs substrate to serve as Schottky barrier and/or as barrier to diffusion. Deposited without interrupting processing vacuum in which substrate deposited and in which any subsequent layers deposited. In new technique, epitaxial film of AIAs deposited directly on GaAs substrate to depth of only two atomic layers - less than 1 nanometer thick. Film thin enough so it does not constitute electronic barrier, but thick enough to act as barrier to interdiffusion of gold and GaAs. Film also used as barrier to interdiffusion of dopants at heterojunctions.

Kaiser, William J.↗

On diamond, graphitic and amorphous carbons in primitive extraterrestrial solar system materials

Carbon is among the most abundant elements in the universe and carbon chemistry in meteorites and comets is an important key to understanding many Solar System and interstellar processes. Yet, the mineralogical properties and interrelations between various structural forms of elemental carbon remain ambiguous. Crystalline elemental carbons include rhombohedral graphite, hexagonal graphite, cubic diamond, hexagonal diamond (i.e., lonsdaleite or carbon-2H) and chaoite. Elemental carbon also occurs as amorphous carbon and poorly graphitized (or turbostratic) carbon but of all the forms of elemental carbon only graphite is stable under physical conditions that prevail in small Solar System bodies and in the interstellar medium. The recent discovery of cubic diamond in carbonaceous chondrites and hexagonal diamond in chondritic interplanetary dust particles (IDPs) have created a renewed interest in the crystalline elemental carbons that were not formed by shock processes on a parent body. Another technique, Raman spectroscopy, confirms a widespread occurrence of disordered graphite in the Allende carbonaceous chondrite and in chondritic IDPs. Elemental carbons have also been identified by their characteristic K-edge features in electron energy loss spectra (EELS). However, the spectroscopic data do not necessarily coincide with those obtained by selected area electron diffraction (SAED). In order to interpret these data in terms of rational crystalline structures, it may be useful to consider the principles underlying electron diffraction and spectroscopic analyses. Electron diffraction depends on electron scattering, on the type of atom and the distance between atoms in a crystal lattice. Spectroscopic data are a function of the type of atom and the energy of bonds between atoms. Also, SAED is a bulk sampling technique when compared to techniques such as Raman spectroscopy or EELS. Thus, it appears that combined analyses provide contradictory results and that amorphous, or short-range ordered, carbon identified by conventional TEM imaging and SAED may show evidence for sp(3) bonds in EELS spectra. It is suggested that complex, nanometer-scale, mineralogical interrelations are common to all elemental carbons irrespective of their origin. The subsequent thermal history, or energy balance, will determine the ultimate microstructure.

Rietmeijer, Frans J. M.↗

The Moderate Resolution Imaging Spectrometer (MODIS)

The Moderate Resolution Imaging Spectrometer (MODIS) observing facility on the Earth Observing System (EOS) is composed of two instruments, MODIS-Nadir (N) and MODIS-Tilt (T). MODIS-N has 36 spectral bands between 0.4 and 14.2 micrometers with spatial resolution between 214 and 856 meters. MODIS-T has 32 bands with 10-15 nanometer bandwidths between 0.4 and 0.9 micrometers. MODIS-T scans fore and aft + or - 50 degrees. Both instruments scan cross-track so as to provide daily (MODIS-N) or once every 2 days (MODIS-T) coverage at 705 kilometers altitude. Both instruments are entering into the execution phases of their development in 1990.

Salomonson, Vincent V.↗

Spatially resolved ballistic electron spectroscopy of subsurface interfaces

Buried interfaces have traditionally been inaccessible to direct investigation by surface-sensitive techniques. A unique and novel electronic probe, which is sensitive to subsurface electronic structure, has been utilized to probe Schottky barrier interfaces. The method, ballistic electron emission microscopy (BEEM), is based on scanning tunnelling microscopy (STM) techniques. A theoretical treatment has been developed to describe the ballistic electron spectra obtained by BEEM and this treatment is applied to data obtained on the Au-Si Schottky barrier interface system. Excellent agreement between experiment and theory is obtained. In addition, the treatment predicts nanometer spatial resolution for interface imaging by BEEM.

Bell, L. D.↗

Growing Cobalt Silicide Columns In Silicon

Codeposition by molecular-beam epitaxy yields variety of structures. Proposed fabrication process produces three-dimensional nanometer-sized structures on silicon wafers. Enables control of dimensions of metal and semiconductor epitaxial layers in three dimensions instead of usual single dimension (perpendicular to the plane of the substrate). Process used to make arrays of highly efficient infrared sensors, high-speed transistors, and quantum wires. For fabrication of electronic devices, both shapes and locations of columns controlled. One possible technique for doing this electron-beam lithography, see "Making Submicron CoSi2 Structures on Silicon Substrates" (NPO-17736).

Fathauer, Obert W.↗

Calibration and operation of a large space-based optical interferometer

The on-orbit calibration of the optics, structure, and control systems of the CSI Focus Mission Interferometer (FMI) is described. The calibration involves the estimation and propagation of both positional and rotational parameters and the propagation of both positional and rotational parameters at the nanometer/nanoradian level. It is shown that, given a nanometer class metrology system to monitor positional changes of critical optical elements, this calibration procedure should enable the FMI to perform 50 picoradian astrometry. The same Kalman filter that implements the initializing calibration of the interferometer baselines and internal pathlengths will also participate in the astrometric measurements of stellar positions.

Laskin, R. A.↗

A microdynamic version of the tensile test machine

Very large space structures require structural reactions to control forces associated with nanometer-level displacements; JPL has accordingly built a tensile test machine capable of mN-level force measurements and nm-level displacement measurements, with a view to the study of structural linear joining technology at the lower limit of its resolution. The tester is composed of a moving table that is supported by six flexured legs and a test specimen cantilevered off the table to ground. Three vertical legs contain piezoactuators allowing changes in length up to 200 microns while generating axial load and bending moments. Displacements between ground and table are measured by means of three laser-interferometric channels.

Glaser, R. J.↗

Accuracy of the spectral and radiometric laboratory calibration of the Airborne Visible/Infrared Imaging Spectrometer (AVIRIS)

The laboratory procedures, algorithms, measurements, and uncertainties associated with generation of the spectral and radiometric calibration of data acquired by AVIRIS are described. AVIRIS is an airborne sensor that obtains high-spatial-resolution image data of the earth in 224 spectral channels in four spectrometers covering the range from 400 to 2450 nm. The spectral calibration of AVIRIS agrees with the in-flight data to within two nanometers, and the absolute radiometric calibration is consistent with the in-flight verification to 10 percent over the spectral range. In-flight radiometric stability as measured by five consecutive passes over the surface calibration site is reported to be between three and five percent.

Chrien, Thomas G.↗

Lateral tunneling through voltage-controlled barriers

The paper reports on a detailed experimental investigation of lateral tunneling between electrodes of a two-dimensional electron gas separated by the voltage-controlled barrier of a nanometer Schottky gate. The experimental data are modeled using the WKB method to calculate the tunneling probability of electrons through a barrier whose shape is determined from a solution of the two-dimensional Poisson equation. This model is in excellent agreement with the experimental data over a two order of magnitude range of current.

Manion, S. J.↗

Instrument Measures Shift In Focus

Optical components tested at wavelengths from ultraviolet to infrared. Focus-shift-measuring instrument easy to use. Operated in lighted room, without having to make delicate adjustments while peering through microscope. Measures distance along which focal point of converging beam of light shifted by introduction of nominally plane parallel optical component into beam. Intended primarily for measuring focus shifts produced by windows and filters at wavelengths from 120 to 1,100 nanometers. Portable, compact, and relatively inexpensive for degree of precision.

Steimle, Lawrence J.↗

Iddingsite in the Nakhla meteorite: TEM study of mineralogy and texture of pre-terrestrial (Martian?) alterations

Rusty-colored veinlets and patches in the Nakhla meteorite, identified as iddingsite, are pre-terrestrial. The rusty material is iddingsite (smectites + hematite + ferrihydrite); like terrestrial iddingsites, it probably formed during low-temperature interaction of olivine and water. Fragments of rusty material with host olivine were removed from thin sections of Nakhla with a tungsten needle. Fragments were embedded in epoxy, microtomed to 100 nanometers thickness, and mounted on Cu grids. Phase identifications were by Analytical Electron Microscopy/Energy Dispersive X-ray Analysis (EM/EDX) standardless chemical analyses (for silicates), electron diffraction (hematite and ferrihydrite), and lattice fringe imaging. This iddingsite in Nakhla is nearly identical to some formed on Earth, suggesting similar conditions of formation on the Shergottites-Nakhlites-Chassigny (SNC) meteorite parent planet. A more detailed account of the results is presented.

Treiman, Allan H.↗

Oxygen isotopes implanted in the LDEF spacecraft

Depth profiles of O-16 and O-18/O-16 were measured on stainless steel nuts and copper sheet (from a grounding strap) recovered from the leading edge of LDEF (Tray E10). The measurements were obtained by dynamic SIMS (secondary ion mass spectrometry) using a VG Isolab 54 ion microprobe. Plots of O-18/O-16 against time, show large depletions of up to a factor of 2 compared to the O-18/O-16 value at sea level. The O-16 current decreases by 2 orders of magnitude in the interior of the metal, and the corresponding profile of anomalous O-16 is strongly peaked in the outer few tens of nanometers of the surface. This depth scale is a tentative one based on estimated sputtering rates. Plots of O-18/O-16 against 1/O-16 should be linear if two isotopically distinct components, one of variable concentration (orbital component) and one of fixed concentration (normal oxygen), are mixed. Data to be presented at the meeting show departures from linearity which result from variability in the concentration of normal oxygen, but may also arise from the implantation of oxygen with a range of fractionation due to the decaying orbit of the LDEF, sputtering of the surface by atomic oxygen, and the different momenta of the two isotopes due to their equal velocities. The potential for using this method as a means of identifying exposure to low-Earth orbit, de-convoluting the effects of space exposure from terrestrial contamination, and using the implanted anomolous oxygen as a means of studying the atomic oxygen density and upper atmosphere temperature height profile will be discussed at the meeting.

Saxton, J. M.↗

Properties Of Plasma-Deposited Amorphous Hydrogenated Carbon

Report reviews experimental research on plasma-deposited films of hydrogenated amorphous carbon. Such films exhibit electrical resistivity, semi-transparency, mechanical hardness, and chemical inertness. Useful as gate dielectrics and passivating layers in semiconductor devices, insulators for metal/insulator/metal devices, and masks in nanometer lithography. Show promise as wear-resistant, hard solid lubricating coats for bearings and optical components.

Miyoshi, Kazuhisa↗

Micro-precision control/structure interaction technology for large optical space systems

The CSI program at JPL is chartered to develop the structures and control technology needed for sub-micron level stabilization of future optical space systems. The extreme dimensional stability required for such systems derives from the need to maintain the alignment and figure of critical optical elements to a small fraction (typically 1/20th to 1/50th) of the wavelength of detected radiation. The wavelength is about 0.5 micron for visible light and 0.1 micron for ultra-violet light. This lambda/50 requirement is common to a broad class of optical systems including filled aperture telescopes (with monolithic or segmented primary mirrors), sparse aperture telescopes, and optical interferometers. The challenge for CSI arises when such systems become large, with spatially distributed optical elements mounted on a lightweight, flexible structure. In order to better understand the requirements for micro-precision CSI technology, a representative future optical system was identified and developed as an analytical testbed for CSI concepts and approaches. An optical interferometer was selected as a stressing example of the relevant mission class. The system that emerged was termed the Focus Mission Interferometer (FMI). This paper will describe the multi-layer control architecture used to address the FMI's nanometer level stabilization requirements. In addition the paper will discuss on-going and planned experimental work aimed at demonstrating that multi-layer CSI can work in practice in the relevant performance regime.

Sirlin, Samuel W.↗

The JPL Phase B interferometer testbed

Future NASA missions with large optical systems will require alignment stability at the nanometer level. However, design studies indicate that vibration resulting from on-board disturbances can cause jitter at levels three to four orders of magnitude greater than this. Feasibility studies have shown that a combination of three distinct control layers will be required for these missions, including disturbance isolation, active and passive structural vibration suppression, and active optical pathlength compensation. The CSI technology challenge is to develop these design and control approaches that can reduce vibrations in the optical train by a factor of 1000 to 10,000. The focus of the paper is on describing the Phase B Testbed structure and facility, as the experimental results are included in other papers presented at this same conference.

Eldred, Daniel B.↗

Optical pathlength control on the JPL Phase B interferometer testbed

Design and implementation of a controller for optical pathlength compensation on a flexible structure is presented. Nanometer level pathlength control is demonstrated in the laboratory. The experimental results are in close agreement with performance predictions.

Spanos, John T.↗