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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 235 records · Page 13
All sourcesNASA NTRSDOE OSTI
NASA NTRS2010

Accelerated Aging System for Prognostics of Power Semiconductor Devices

Prognostics is an engineering discipline that focuses on estimation of the health state of a component and the prediction of its remaining useful life (RUL) before failure. Health state estimation is based on actual conditions and it is fundamental for the prediction of RUL under anticipated future usage. Failure of electronic devices is of great concern as future aircraft will see an increase of electronics to drive and control safety-critical equipment throughout the aircraft. Therefore, development of prognostics solutions for electronics is of key importance. This paper presents an accelerated aging system for gate-controlled power transistors. This system allows for the understanding of the effects of failure mechanisms, and the identification of leading indicators of failure which are essential in the development of physics-based degradation models and RUL prediction. In particular, this system isolates electrical overstress from thermal overstress. Also, this system allows for a precise control of internal temperatures, enabling the exploration of intrinsic failure mechanisms not related to the device packaging. By controlling the temperature within safe operation levels of the device, accelerated aging is induced by electrical overstress only, avoiding the generation of thermal cycles. The temperature is controlled by active thermal-electric units. Several electrical and thermal signals are measured in-situ and recorded for further analysis in the identification of leading indicators of failures. This system, therefore, provides a unique capability in the exploration of different failure mechanisms and the identification of precursors of failure that can be used to provide a health management solution for electronic devices.

Celaya, Jose R.↗
NASA NTRS2011

Vehicle Integrated Prognostic Reasoner (VIPR) 2010 Annual Final Report

Honeywell's Central Maintenance Computer Function (CMCF) and Aircraft Condition Monitoring Function (ACMF) represent the state-of-the art in integrated vehicle health management (IVHM). Underlying these technologies is a fault propagation modeling system that provides nose-to-tail coverage and root cause diagnostics. The Vehicle Integrated Prognostic Reasoner (VIPR) extends this technology to interpret evidence generated by advanced diagnostic and prognostic monitors provided by component suppliers to detect, isolate, and predict adverse events that affect flight safety. This report describes year one work that included defining the architecture and communication protocols and establishing the user requirements for such a system. Based on these and a set of ConOps scenarios, we designed and implemented a demonstration of communication pathways and associated three-tiered health management architecture. A series of scripted scenarios showed how VIPR would detect adverse events before they escalate as safety incidents through a combination of advanced reasoning and additional aircraft data collected from an aircraft condition monitoring system. Demonstrating VIPR capability for cases recorded in the ASIAS database and cross linking them with historical aircraft data is planned for year two.

Hadden, George D.↗
NASA NTRS2010

Stage Separation Failure: Model Based Diagnostics and Prognostics

Safety of the next-generation space flight vehicles requires development of an in-flight Failure Detection and Prognostic (FD&P) system. Development of such system is challenging task that involves analysis of many hard hitting engineering problems across the board. In this paper we report progress in the development of FD&P for the re-contact fault between upper stage nozzle and the inter-stage caused by the first stage and upper stage separation failure. A high-fidelity models and analytical estimations are applied to analyze the following sequence of events: (i) structural dynamics of the nozzle extension during the impact; (ii) structural stability of the deformed nozzle in the presence of the pressure and temperature loads induced by the hot gas flow during engine start up; and (iii) the fault induced thrust changes in the steady burning regime. The diagnostic is based on the measurements of the impact torque. The prognostic is based on the analysis of the correlation between the actuator signal and fault-induced changes in the nozzle structural stability and thrust.

Luchinsky, Dmitry↗
NASA NTRS2010

Towards Prognostics of Power MOSFETs: Accelerated Aging and Precursors of Failure

This paper presents research results dealing with power MOSFETs (metal oxide semiconductor field effect transistor) within the prognostics and health management of electronics. Experimental results are presented for the identification of the on-resistance as a precursor to failure of devices with die-attach degradation as a failure mechanism. Devices are aged under power cycling in order to trigger die-attach damage. In situ measurements of key electrical and thermal parameters are collected throughout the aging process and further used for analysis and computation of the on-resistance parameter. Experimental results show that the devices experience die-attach damage and that the on-resistance captures the degradation process in such a way that it could be used for the development of prognostics algorithms (data-driven or physics-based).

Celaya, Jose R.↗
NASA NTRS2011

Prognostics of Power MOSFET

This paper demonstrates how to apply prognostics to power MOSFETs (metal oxide field effect transistor). The methodology uses thermal cycling to age devices and Gaussian process regression to perform prognostics. The approach is validated with experiments on 100V power MOSFETs. The failure mechanism for the stress conditions is determined to be die-attachment degradation. Change in ON-state resistance is used as a precursor of failure due to its dependence on junction temperature. The experimental data is augmented with a finite element analysis simulation that is based on a two-transistor model. The simulation assists in the interpretation of the degradation phenomena and SOA (safe operation area) change.

Celaya, Jose Ramon↗
NASA NTRS2012

Accelerated Aging in Electrolytic Capacitors for Prognostics

The focus of this work is the analysis of different degradation phenomena based on thermal overstress and electrical overstress accelerated aging systems and the use of accelerated aging techniques for prognostics algorithm development. Results on thermal overstress and electrical overstress experiments are presented. In addition, preliminary results toward the development of physics-based degradation models are presented focusing on the electrolyte evaporation failure mechanism. An empirical degradation model based on percentage capacitance loss under electrical overstress is presented and used in: (i) a Bayesian-based implementation of model-based prognostics using a discrete Kalman filter for health state estimation, and (ii) a dynamic system representation of the degradation model for forecasting and remaining useful life (RUL) estimation. A leave-one-out validation methodology is used to assess the validity of the methodology under the small sample size constrain. The results observed on the RUL estimation are consistent through the validation tests comparing relative accuracy and prediction error. It has been observed that the inaccuracy of the model to represent the change in degradation behavior observed at the end of the test data is consistent throughout the validation tests, indicating the need of a more detailed degradation model or the use of an algorithm that could estimate model parameters on-line. Based on the observed degradation process under different stress intensity with rest periods, the need for more sophisticated degradation models is further supported. The current degradation model does not represent the capacitance recovery over rest periods following an accelerated aging stress period.

Celaya, Jose R.↗
NASA NTRS2011

Investigating the Effect of Damage Progression Model Choice on Prognostics Performance

The success of model-based approaches to systems health management depends largely on the quality of the underlying models. In model-based prognostics, it is especially the quality of the damage progression models, i.e., the models describing how damage evolves as the system operates, that determines the accuracy and precision of remaining useful life predictions. Several common forms of these models are generally assumed in the literature, but are often not supported by physical evidence or physics-based analysis. In this paper, using a centrifugal pump as a case study, we develop different damage progression models. In simulation, we investigate how model changes influence prognostics performance. Results demonstrate that, in some cases, simple damage progression models are sufficient. But, in general, the results show a clear need for damage progression models that are accurate over long time horizons under varied loading conditions.

Daigle, Matthew↗
NASA NTRS2012

Physics Based Electrolytic Capacitor Degradation Models for Prognostic Studies under Thermal Overstress

Electrolytic capacitors are used in several applications ranging from power supplies on safety critical avionics equipment to power drivers for electro-mechanical actuators. This makes them good candidates for prognostics and health management research. Prognostics provides a way to assess remaining useful life of components or systems based on their current state of health and their anticipated future use and operational conditions. Past experiences show that capacitors tend to degrade and fail faster under high electrical and thermal stress conditions that they are often subjected to during operations. In this work, we study the effects of accelerated aging due to thermal stress on different sets of capacitors under different conditions. Our focus is on deriving first principles degradation models for thermal stress conditions. Data collected from simultaneous experiments are used to validate the desired models. Our overall goal is to derive accurate models of capacitor degradation, and use them to predict performance changes in DC-DC converters.

Kulkarni, Chetan S.↗
NASA NTRS2012

Bayesian Framework Approach for Prognostic Studies in Electrolytic Capacitor under Thermal Overstress Conditions

Electrolytic capacitors are used in several applications ranging from power supplies for safety critical avionics equipment to power drivers for electro-mechanical actuator. Past experiences show that capacitors tend to degrade and fail faster when subjected to high electrical or thermal stress conditions during operations. This makes them good candidates for prognostics and health management. Model-based prognostics captures system knowledge in the form of physics-based models of components in order to obtain accurate predictions of end of life based on their current state of heal th and their anticipated future use and operational conditions. The focus of this paper is on deriving first principles degradation models for thermal stress conditions and implementing Bayesian framework for making remaining useful life predictions. Data collected from simultaneous experiments are used to validate the models. Our overall goal is to derive accurate models of capacitor degradation, and use them to remaining useful life in DC-DC converters.

Kulkarni, Chetan S.↗
NASA NTRS2007

Uncertainty Management for Diagnostics and Prognostics of Batteries using Bayesian Techniques

Uncertainty management has always been the key hurdle faced by diagnostics and prognostics algorithms. A Bayesian treatment of this problem provides an elegant and theoretically sound approach to the modern Condition- Based Maintenance (CBM)/Prognostic Health Management (PHM) paradigm. The application of the Bayesian techniques to regression and classification in the form of Relevance Vector Machine (RVM), and to state estimation as in Particle Filters (PF), provides a powerful tool to integrate the diagnosis and prognosis of battery health. The RVM, which is a Bayesian treatment of the Support Vector Machine (SVM), is used for model identification, while the PF framework uses the learnt model, statistical estimates of noise and anticipated operational conditions to provide estimates of remaining useful life (RUL) in the form of a probability density function (PDF). This type of prognostics generates a significant value addition to the management of any operation involving electrical systems.

Saha, Bhaskar↗
NASA NTRS2013

Towards Prognostics for Electronics Components

Electronics components have an increasingly critical role in avionics systems and in the development of future aircraft systems. Prognostics of such components is becoming a very important research field as a result of the need to provide aircraft systems with system level health management information. This paper focuses on a prognostics application for electronics components within avionics systems, and in particular its application to an Isolated Gate Bipolar Transistor (IGBT). This application utilizes the remaining useful life prediction, accomplished by employing the particle filter framework, leveraging data from accelerated aging tests on IGBTs. These tests induced thermal-electrical overstresses by applying thermal cycling to the IGBT devices. In-situ state monitoring, including measurements of steady-state voltages and currents, electrical transients, and thermal transients are recorded and used as potential precursors of failure.

Saha, Bhaskar↗
NASA NTRS2014

Prognostic Analysis System and Methods of Operation

A prognostic analysis system and methods of operating the system are provided. In particular, a prognostic analysis system for the analysis of physical system health applicable to mechanical, electrical, chemical and optical systems and methods of operating the system are described herein.

MacKey, Ryan M. E.↗
NASA NTRS2016

Design, Development, and Testing of a UAV Hardware-in-the-Loop Testbed for Aviation and Airspace Prognostics Research

The airspace is becoming more and more complicated, and will continue to do so in the future with the integration of Unmanned Aerial Vehicles (UAVs), autonomy, spacecraft, other forms of aviation technology into the airspace. The new technology and complexity increases the importance and difficulty of safety assurance. Additionally, testing new technologies on complex aviation systems & systems of systems can be very difficult, expensive, and sometimes unsafe in real life scenarios. Prognostic methodology provides an estimate of the health and risks of a component, vehicle, or airspace and knowledge of how that will change over time. That measure is especially useful in safety determination, mission planning, and maintenance scheduling. The developed testbed will be used to validate prediction algorithms for the real-time safety monitoring of the National Airspace System (NAS) and the prediction of unsafe events. The framework injects flight related anomalies related to ground systems, routing, airport congestion, etc. to test and verify algorithms for NAS safety. In our research work, we develop a live, distributed, hardware-in-the-loop testbed for aviation and airspace prognostics along with exploring further research possibilities to verify and validate future algorithms for NAS safety. The testbed integrates virtual aircraft using the X-Plane simulator and X-PlaneConnect toolbox, UAVs using onboard sensors and cellular communications, and hardware in the loop components. In addition, the testbed includes an additional research framework to support and simplify future research activities. It enables safe, accurate, and inexpensive experimentation and research into airspace and vehicle prognosis that would not have been possible otherwise. This paper describes the design, development, and testing of this system. Software reliability, safety and latency are some of the critical design considerations in development of the testbed. Integration of HITL elements in the development phases and veri cation/ validation are key elements to this report.

HITL↗
NASA NTRS2014

Demonstration of Prognostics-Enabled Decision Making Algorithms on a Hardware Mobile Robot Test Platform

Prognostics-enabled Decision Making (PDM) is an emerging research area that aims to integrate prognostic health information and knowledge about the future operating conditions into the process of selecting subsequent actions for the system. Previous work developing and testing PDM algorithms has been done in simulation; this paper describes the effort leading to a successful demonstration of PDM algorithms on a hardware mobile robot platform. The hardware platform, based on the K11 planetary rover prototype, was modified to allow injection of selected fault modes related to the rover’s electrical power subsystem. The PDM algorithms were adapted to the hardware platform, including development of a software module framework, a new route planner, and modifications to increase the algorithms’ robustness to sensor noise and system timing issues. A set of test scenarios was chosen to demonstrate the algorithms’ capabilities. The modifications to run with a hardware platform, the test scenarios, and the test results are described in detail. The results show a successful use of PDM algorithms on a hardware test platform to optimize mission planning in the presence of electrical system faults.

Prognosis↗
NASA NTRSDate not supplied

Sensor-based Prognostics for Safe Batteries for Electric Aircraft

With a new start awarded under CAS for Fiscal Year 2020, the Sensor-based Prognostics to Avoid Runaway Reactions and Catastrophic Ignition project, or SPARRCI, aims to eliminate safety risks of lithium-ion and next-generation lithium-based batteries. SPARRCI is taking a deeper dive into the inner workings of battery cells by introducing miniature multifunctional sensors within the cells to detect early signs of failure. Combined with nondestructive evaluation techniques to gather complementary battery health data, battery data will be monitored in real-time via prognostics which will ultimately be able to identify when the cell is exhibiting abnormal behavior bordering on failure, with the ability to provide early warning such that the battery may be taken offline prior to catastrophic failure events.

Brianne Demattia↗
DOE OSTI2013

Prognostics of damage accural in SSL luminaires and drivers subjected to HTSL accelerated aging

This paper will show an investigation of off-the-shelf luminaires with the focus on the LED electronic drivers, specifically the aluminum electrolytic capacitors (AECs), that have been aged using high temperature shelf life (HTSL) testing of 135°C in order to prognosticate the remaining useful life of the luminaires. Luminaires have the potential of seeing excessive temperatures when being transported across country or being stored in non-climate controlled warehouses. They are also being used in outdoor applications in desert environments that see little or no humidity but will experience extremely high temperatures during the day. This makes it important to increase our understanding of what effects being stored at high temperatures for a prolonged period of time will have on the usability and survivability of these devices. The U.S. Department of Energy has made a long term commitment to advance the efficiency, understanding and development of solid-state lighting (SSL) and is making a strong push for the acceptance and use of SSL products. In this work, the four AECs of three different types inside each LED electronic driver were studied. The change in capacitance and the change in equivalent series resistance (ESR) of the AECs were measured and considered to be a leading indication of failure of the LED system. These indicators were used to make remaining useful life predictions to develop an algorithm to predict the end of life of the AECs. The luminous flux of a pristine downlight module was also monitored using each LED electronic driver that was subjected to HTSL through the progression of the testing to determine a correlation between the light output of the lamp and the failing components of the LED electronic driver. Prognostic and Health Management (PHM) is a useful tool for assessment of the remaining life of electrical components and is demonstrated for AECs in this work.

24 POWER TRANSMISSION AND DISTRIBUTION↗
DOE OSTI2016

Improving online risk assessment with equipment prognostics and health monitoring

The current approach to evaluating the risk of nuclear power plant (NPP) operation relies on static probabilities of component failure, which are based on industry experience with the existing fleet of nominally similar light water reactors (LWRs). As the nuclear industry looks to advanced reactor designs that feature non-light water coolants (e.g., liquid metal, high temperature gas, molten salt), this operating history is not available. Many advanced reactor designs use advanced components, such as electromagnetic pumps, that have not been used in the US commercial nuclear fleet. Given the lack of rich operating experience, we cannot accurately estimate the evolving probability of failure for basic components to populate the fault trees and event trees that typically comprise probabilistic risk assessment (PRA) models. Online equipment prognostics and health management (PHM) technologies can bridge this gap to estimate the failure probabilities for components under operation. The enhanced risk monitor (ERM) incorporates equipment condition assessment into the existing PRA and risk monitor framework to provide accurate and timely estimates of operational risk.

active and passive components↗