SEARCH · Search NASA
Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.
Measuring intermittent enhancement of blinking effect upon addition of neon to imaging gas in helium-tungsten field-ion microscope
Scanning electron microscope used to determine surface morphology of TD-NiCr oxidized at 800 to 1200 deg for up to 64 hours
Electron microscope, electron diffraction, and electron microprobe analysis of defective solid state weldment on liquid hydrogen tank from Apollo 12 fuel cell system
Solar wind microscopic structure, examining interplanetary wave-particle interactions
Chemical reaction rate microscopic reversibility, observing rotational vibrational and/or translational states dependence of products reactants
High resolution phase contrast microscope adaptation for gastight glove box use with stage and focusing knobs in box for Apollo sample microbiological examination
An ion microprobe and a laser microprobe were used to measure concentrations of corrosion-produced hydrogen on a microscopic scale. Hydrogen concentrations of several thousand ppm were measured by both analytical techniques below the fracture surfaces of hot-salt stress-corroded titanium alloy specimens. This segregation of hydrogen below fracture surfaces supports a previously proposed theory that corrosion-produced hydrogen is responsible for hot-salt stress-corrosion embrittlement and cracking of titanium alloys. These advanced analytical techniques suggest great potential for many areas of stress-corrosion and hydrogen embrittlement research, quality control, and field inspection applications.
Two screws and two washers, several small chips of tubing, and a fiber removed from a third screw were examined with the scanning electron microscope and the electron microprobe. The purpose of the examination was to determine the nature of the material on the surface of these samples and to search for the presence of meteoritic material.
The blinking effect, or the intermittent enhancement of ion emission, which is observed when a few parts per million neon are added to the imaging gas in a helium-tungsten field-ion microscope, has been investigated. Measurements of the characteristic quantities involved - i.e., blinking rate, voltage limits, etc. - and their variation with temperature, field, and gas pressure, are described.
Use of an ion microprobe and a laser microprobe to measure concentrations of corrosion-produced hydrogen on a microscopic scale. Hydrogen concentrations of several thousand ppm were measured by both analytical techniques below corroded and fracture surfaces of hot salt stress corroded titanium alloy specimens. This extremely high concentration compares with only about 100 ppm hydrogen determined by standard vacuum fusion chemical analyses of bulk samples. Both the ion and laser microprobes were used to measure hydrogen concentration profiles in stepped intervals to substantial depths below the original corroded and fracture surfaces. For the ion microprobe, the area of local analysis was 22 microns in diameter and for the laser microprobe, the area of local analysis was about 300 microns in diameter. The segregation of hydrogen below fracture surfaces supports a previously proposed theory that corrosion-produced hydrogen is responsible for hot salt stress corrosion embrittlement and cracking of titanium alloys. These advanced analytical techniques suggest great potential for many areas of stress corrosion and hydrogen embrittlement research, quality control, and field inspection of corrosion problems. For example, it appears possible that a contour map of hydrogen distribution at notch roots and crack tips could be quantitatively determined. Such information would be useful in substantiating current theories of stress corrosion and hydrogen embrittlement.
Discussion of a profiling technique using a scanning electron microscope for obtaining depth information on a single micrograph of a small specimen. A stationary electron beam is used to form a series of contamination spots in a line across the specimen. Micrographs obtained by this technique are useful as a means of projection and display where stereo viewers are not practical.
Bragg-reflex images of small individual crystallites in the size range of 20-100 A diameter with known crystallographic orientation were used in a transmission electron microscope to determine in-situ: (a) the relationship between objective lens current (or accelerating voltage) changes in discrete steps and corresponding defocus, (b) the spherical aberration coefficient, and (c) the axial chromatic aberration coefficient of the objective lens. The accuracy of the described method is better than 5%. The same specimen can advantageously be used to properly aline the illuminating beam with respect to the optical axis.
A simple and convenient method of making quantitative magnetic separations has been applied to the lunar fines. The fractions obtained form groups containing distinctively different particle types; thus, it appears that magnetic separation in itself many be a useful way of characterizing lunar fines. Moessbauer studies of fines 10084 show that the metal cannot contain more than about 1.5% Ni, implying that by far the bulk of the metal results from reduction rather than from direct meteoritic addition. Microscopic examination of magnetic separates from 15101 fines suggests that reduction of Fe accompanies every major impact event on the moon.
A study of the opening mode of crack initiation in 7075-T6 aluminum alloy sheets has been conducted with the aid of a scanning electron microscope. Observations were made from several orientations, including the top view of the specimen which showed the notch profile and the edge view of the specimen which showed the entire notch front along the specimen thickness. It was found that the edge view exhibited the first signs of permanent deformation at about 55% of the breaking strength. These changes took the form of deformation bands which were aligned in the direction of the tensile axis and apparently defined limiting regions of homogeneous slip. It is felt that the appearance of microcracks at loads approaching the breaking strength was of fundamental importance in the formation of the final fracture surface. Many of these microcraks were initiated at intermetallic particles and other metallurgically weak regions on the notch surface. It was also possible to correlate the strain in the notch with the stress intensity factor for the various loads. Very large plastic strains were observed on the notch tip as compared to published values of elongation at fracture for unnotched specimens.
It was found that as a result of ultrasonic treatment fir wood (Abies alba Mill) shows the effects of homogenization, and the modulus of elasticity for static flexure drops on an average by 50% for 45 min of treatment. The drop is more pronounced for test pieces with 8 to 12 annual rings. Study of microscopic sections disclosed that early wood with one annual ring undergoes the most powerful effect.
A friction and wear apparatus was built into a real time scanning electron microscope (SEM). The apparatus and SEM comprise a system which provides the capability of performing dynamic friction and wear experiments in situ. When the system is used in conjunction with dispersive X-ray analysis, a wide range of information on the wearing process can be obtained. The type of wear and variation with speed, load, and time can be investigated. The source, size, and distribution of wear particles can be determined and metallic transferal observed. Some typical results obtained with aluminum, copper, and iron specimens are given.
Scanning electron microscopes are used to determine both user-induced damages and manufacturing defects subtle enough to be missed by conventional light microscopy. Method offers greater depth of field and increased working distances.
An electron microscope is described with an electron source a condenser lens having either a circular aperture for focusing a solid cone of electrons onto a specimen or an annular aperture for focusing a hollow cone of electrons onto the specimen. It also has objective lens with an annular objective aperture, for focusing electrons passing through the specimen onto an image plane. A method of making the annular objective aperture using electron imaging, electrolytic deposition and ion etching techniques is included.