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Results for “irradiation testing”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 253 records · Page 14
All sourcesNASA NTRSDOE OSTI
NASA NTRS1987

Influence of electron radiation and temperature on the cyclic, matrix dominated response of graphite-epoxy

The effects of electron radiation and elevated temperature on the matrix-dominated cyclic response of standard T300/934 and a chemically modified T300/934 graphite-epoxy are characterized. Both materials were subjected to 1.0 x 10 to the 10th rads of 1.0 MeV electron irradiation, under vacuum, to simulate 30 years in geosynchronous orbit. Cyclic tests were performed at room temperature and elevated temperature (121 C) on 4-ply unidirectional laminates to characterize the effects associated with irradiation and elevated temperature. Both materials exhibited energy dissipation in their response at elevated temperature. The irradiated modified material also exhibited energy dissipation at room temperature. The combination of elevated temperature and irradiation resulted in the most severe effects in the form of lower proportional limits, and greater energy dissipation. Dynamic-mechanical analysis demonstrated that the glass transition temperature, T(g), of the standard material was lowered 39 C by irradiation, wereas the T(g) of the modified material was lowered 28 C by irradiation. Thermomechanical analysis showed the occurrence of volatile products generated upon heating of the irradiated materials.

Reed, Susan M.↗
NASA NTRS2015

Heavy Ion Test Results of the Vishay DG403DY-E3 Analog Switch

This study was undertaken to determine the Single Event Latchup (SEL) susceptibility of the Vishay DG403DY-E3 (Analog Switch). The device was under a biased and switching configuration during irradiation and continuously monitored for destructive events. The parts were tested at the Lawrence Berkeley National Laboratory 88 inch cyclotron facility

Single Event Latchup (SEL)↗
NASA NTRS1972

Contamination character of materials in space technology testing.

Determination of the nature and degree of contamination of mirrors in a vacuum environment in the presence of UV irradiation by outgases from some materials that are candidates for use inside spacecraft and simulated spacecraft environments. A vacuum apparatus was developed for testing contamination of mirrors. Offgases from heated test materials are deposited on a refrigerated mirror, half of which is UV irradiated. Reflectance is measured between 1100 and 25,000 A. Thermofit RNF-100, insulated wire TRT-24-19-V-93, and Eccofoam FS and FPH gave heavier deposits on the nonirradiated mirror. Moxness MS60 SO8, Scotch Tape Y-9050, RTV-577, RTV-41, Stycast 1090, and Epon 934 and 828 gave heavier deposits on the irradiated mirror. Raychem wire 44/0411, polyimide tape X1156, Insulgrease G-640, High Vacuum Silicone Grease, and RTV-602 gave only slight deposits on the irradiated and nonirradiated areas of the mirror.

Coulson, D. M.↗
NASA NTRS1994

UV testing of INTELSAT-7, 7A, and 8 solar cells

A 4000 hour experiment, conducted in late 1992 through mid 1993, confirmed earlier results on the ultraviolet damage effects in covered solar cells of various types being used, or proposed for use, in INTELSAT programs. Two different UV test systems were used to identify systematic errors and to study the effects of UV source-bulb age on degradation rate. After correction for contamination and UV source-bulb aging, the extrapolated degradation rates for irradiated and unirradiated INTELSAT-5, -6 single AR(SAR) coated cells and INTELSAT-7, -7A, -8 double layer AR(DAR) coated cells in both the 1993 tests confirm the following hypotheses resulting from the 1992 experiment. (a) Irradiated cells display significantly more UV degradation than do the unirradiated cells for tests exceeding 2000 hours. The new data indicates that degradation effects from electron irradiation are proportional to t(exp 2) (the square of the UV hours), at least for times less than or equal to 3000 hours. (b) This difference does not depend upon entire reflective coating, cell resistivity, or manufacturer within the sensitivity and reproducibility of the experiment. (c) There is a clear difference in degradation rate between single AR coated cells (TiO(x)) and double layer AR coated cells (SiO(x) and Al2O3?). At 100,000 hours (11.4 years) the DAR coated cells display more degradation than do the SAR coated cells, even though at 1,000 hours the DAR cells display less degradation. (d) UV degradation rates, to modern covered silicon solar cells, at the beginning of bulb life drop from approximately 2 times the average rate to near zero after 2000 hours (average end-of-life for the xenon short-arc lamps used in the tests). The effects of 1 MeV electron irradiation (10(exp 15) e(-)/sq cm) prior to UV exposure are clearly indicated in the plot of percent change in cell open circuit voltage (Voc) versus percent change in short circuit current (Isc) during the UV test and post-test cleanup of the cells. Clearly, extended UV testing produces a permanent photo-induced redegradation of previously irradiated cells. However, this photo-induced redegradation may be caused by the long-wavelength light, not the UV light.

Meulenberg, A.↗
NASA NTRS2017

Proton Irradiation of the 16GB Intel Optane SSD

The purpose of this test is to assess the single event effects (SEE) and radiation susceptibility of the Intel Optane Memory device (SSD) containing the 3D Xpoint phase change memory (PCM) technology. This test is supported by the NASA Electronics Parts and Packaging Program (NEPP).

Single-Event Effects (SEE)↗
NASA NTRS1979

Effects of hydraulic fluid CVCM on silver-Teflon

Changes in the solar absorptance of silver-Teflon (Ag/FEP) surfaces were measured after contamination by the outgassing products of hydraulic fluid and irradiation by solar simulators. Although radiator surfaces are selected for stability to the solar ultraviolet and particulate environment, contaminant deposition and their interaction with solar exposure can degrade their performance. The test procedure to deposit the hydraulic fluid collected volatile condensible material (CVCM), irradiate, and determine solar absorptance changes by reflectance measurements using a spectrophotometer and a solar simulator is described. The tests showed that for the estimated deposition rates on the Ag/FEP, the hydraulic fluid CVCM fraction remaining under normal conditions (above -40 C) would not degrade its performance. The residual CVCM can be easily removed from Ag/FEP by wiping with a solvent saturated flannel. The changes in solar absorptance with the CVCM film thickness and the radiation exposure duration are reported, concluding that vacuum ultraviolet radiation did not prevent easy removal of CVCM.

Muscari, J. A.↗
NASA NTRS1984

Adhesion between polymers and evaporated gold and nickel films

To obtain information on the adhesion between metal films and polymeric solids, the adhesion force was measured by means of a tensile pull test. It was found that the adhesion strengths between polymeric solids and gold films evaporated on polymer substrates were (1.11 + or - 0.53) multiplied by 10(6) N/M(2) on PTFE, about 5.49 multiplied by 10(6) N/m(2) on UHMWPE, and 6.54x10(6) on 6/6 nylon. The adhesion strengths for nickel films evaporated on PTFE, UHMWPE, and 6/6 nylon were found to be a factor of 1.7 higher than those for the gold coated PTFE, UHMWPE, and 6/6 nylon. To confirm quantitatively the effect of electron irradiation on the adhesion strength between a PTFE solid and metal films, a tensile pull test was performed on the irradiated PTFE specimens, which were prepared by evaporating nickel or gold on PTFE surfaces irradiated by 2-keV electrons for various times. After irradiation, the adhesion strength increased to (4.92 + or - 0.92)x10(6) N/m(2) for nickel coated PTFE and (1.82 + or - 0.48)x10(6) N/m(2) for gold coated PTFE. The improvement in adhesion for nickel is higher than that for gold.

Yamada, Y.↗
NASA NTRS2011

In Situ Mechanical Property Measurements of Amorphous Carbon-Boron Nitride Nanotube Nanostructures

To understand the mechanical properties of amorphous carbon (a-C)/boron nitride nanotube (BNNT) nanostructures, in situ mechanical tests are conducted inside a transmission electron microscope equipped with an integrated atomic force microscope system. The nanotube structure is modified with amorphous carbon deposited by controlled electron beam irradiation. We demonstrate multiple in situ tensile, compressive, and lap shear tests with a-C/BNNT hybrid nanostructures. The tensile strength of the a-C/BNNT hybrid nanostructure is 5.29 GPa with about 90 vol% of a-C. The tensile strength and strain of the end-to-end joint structure with a-C welding is 0.8 GPa and 5.2% whereas the lap shear strength of the side-by-side joint structure with a-C is 0.25 GPa.

Kim, Jae-Woo↗
NASA NTRS2016

Reliability Characterization of TaOx-Based Commercial ReRAM in Combination with Radiation

We present reliability data combined with total dose gamma radiation for one of the first commercially available resistive memory devices. These Tantalum Oxide (TaOX)-based resistive memory chips demonstrate operation in dynamic program and erase testing up to ~130 Krad(Si) of 60Co gamma dose. In static and unbiased conditions, the stored data in the memory cells were able to withstand up to 50Mrad(Si) of exposure. The access circuitry, though, seemed less robust to gamma radiation and was able to operate only up to a total dose of 3Mrad(Si). Post exposure reliability as indicated by endurance, cycling error rate, and data retention tests showed no detectable impact from the combination with prior gamma irradiation. Overall, the total dose radiation tolerance of the commercial TaOx-based resistive memory chip appears to be higher than flash memory chips and in agreement with prior tests conducted with single cell resistive memories.

total ionizing dose↗
NASA NTRS1972

Proposed specification for the solar constant and air mass zero solar spectral irradiance

The specification defines the solar constant and the zero air mass solar spectral irradiance for use in thermal analysis, thermal balance testing, and other tests of spacecraft and spacecraft components and materials. It is based upon data from experimental measurements made from high altitude aircraft, balloons, spacecraft, and the earth's surface. The stated accuracies are based on the estimated accuracies of the measurements, calibrations, and radiometric scales.

Source record↗
NASA NTRS1976

A model for the X-ray nova A0620-00

The model involves a white dwarf accreting mass from a late-type subgiant companion. The transient behavior of the X-ray source is explained by the instability to mass loss of the companion (as in Algol-type binaries). The brightening, spectrum, and decay timescale of the optical counterpart are explained in terms of re-emission of X-radiation intercepted by the subgiant. It was concluded that A0620-00 can provide an excellent test case for numerical models of stellar atmospheres irradiated by an external X-ray flux.

Endal, A. S.↗
NASA NTRS1975

Hardening of MJS77 spacecraft against the Jupiter radiation belts

Results of the device characterization program to identify components of the Mariner Jupiter/Saturn spacecraft in need of radiation hardening to meet a total dose requirement of 5 trillion e/sq cm are presented. The parts to be tested, including bipolar transistors, JFETs, SCRs, CMOS devices, linear integrated circuits, Zener diodes and other radiation-sensitive parts, were identified by a worst case circuit analysis of the 20 major subsystems. The test samples were exposed to several levels of irradiation from a Dynamitron electron accelerator capable of producing a steady stream of electrons at energies up to 2.5 eV. The electrical parameters of the devices were measured immediately following irradiation to prevent annealing. CMOS devices and linear devices showed the most severe degradation in a moderate radiation environment, and significant degradation was produced at low current in bipolar transistors. Three methods used for screening a number of devices determined by circuit and shielding analyses to be unacceptable radiation-sensitive are described: diffusion and metallization lot screening; wafer lot screening; and irradiation-anneal screening.

W E Price↗
NASA NTRS1976

A model for the X-ray nova A0620-00

A model is proposed for the transient X-ray source A0620-00 involving a white dwarf accreting mass from a late-type subgiant companion. The transient behavior of the X-ray source is explained by the instability to mass loss of the companion (as in Algol-type binaries). The brightening, spectrum, and decay timescale of the optical counterpart are explained in terms of re-emission of X-radiation intercepted by the subgiant. A0620-00 should provide an excellent test case for numerical models of stellar atmospheres irradiated by an external X-ray flux.

Endal, A. S.↗
NASA NTRS1987

Space environmental effects on graphite-epoxy compressive properties and epoxy tensile properties

This study characterizes the effects of electron radiation and temperature on a graphite-epoxy composite material. Compressive properties of the T300/934 material system were obtained at -250 F (-157 C), room temperature, and 250 F (121 C). Tensile specimens of the Fiberite 934 epoxy resin were fabricated and tested at room temperature and 250 F (121 C). Testing was conducted in the baseline (nonirradiated) and irradiated conditions. The radiation exposure was designed to simulate 30 year, worst-case exposure in geosynchronous Earth orbit. Mechanical properties tended to degrade at elevated temperature and improve at cryogenic temperature. Irradiation generally degraded properties at all temperatures.

Fox, Derek J.↗
NASA NTRS1988

Progress in InP solar cell research

Progress, in the past year, in InP solar cell research is reviewed. Small area cells with AMO, total area efficiencies of 18.8 percent were produced by OMCVD and Ion Implantation. Larger area cells (2 and 4 sq cm) were processed on a production basis. One thousand of the 2 sq cm cells will be used to supply power to a small piggyback lunar orbiter scheduled for launch in February 1990. Laboratory tests of ITO/InP cells, under 10 MeV proton irradiation, indicate radiation resistance comparable to InP n/p homojunction cells. Computer modeling studies indicate that, for identical geometries and dopant concentrations, InP solar cells are significantly more radiation resistant than GaAs under 1 MeV electron irradiation. Additional computer modeling calculations were used to produce rectangular and circular InP concentrator cell designs for both the low concentration SLATS and higher concentration Cassegrainian Concentrators.

Weinberg, Irving↗