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NASA NTRS1991

Concurrent-scene/alternate-pattern analysis for robust video-based docking systems

A typical docking target employs a three-point design of retroreflective tape, one at each endpoint of the center-line, and one on the tip of the central post. Scenes, sensed via laser diode illumination, produce pictures with spots corresponding to desired reflection from the retroreflectors and other reflections. Control corrections for each axis of the vehicle can then be properly applied if the desired spots are accurately tracked. However, initial acquisition of these three spots (detection and identification problem) are non-trivial under a severe noise environment. Signal-to-noise enhancement, accomplished by subtracting the non-illuminated scene from the target scene illuminated by laser diodes, can not eliminate every false spot. Hence, minimization of docking failures due to target mistracking would suggest needed inclusion of added processing features pertaining to target locations. In this paper, we present a concurrent processing scheme for a modified docking target scene which could lead to a perfect docking system. Since the non-illuminated target scene is already available, adding another feature to the three-point design by marking two non-reflective lines, one between the two end-points and one from the tip of the central post to the center-line, would allow this line feature to be picked-up only when capturing the background scene (sensor data without laser illumination). Therefore, instead of performing the image subtraction to generate a picture with a high signal-to-noise ratio, a processed line-image based on the robust line detection technique (Hough transform) can be used to fuse with the actively sensed three-point target image to deduce the true locations of the docking target. This dual-channel confirmation scheme is necessary if a fail-safe system is to be realized from both the sensing and processing point-of-views. Detailed algorithms and preliminary results are presented.

Udomkesmalee, Suraphol↗

NASA NTRS1994

Xenon lighting adjusted to plant requirements

Xenon lamps are available as low and high power lamps with relatively high efficiency and a relatively long lifetime up to several thousand hours. Different construction types of short-arc and long-arc lamps permit a good adaptation to various applications in projection and illumination techniques without substantial changes of the spectral quality. Hence, the xenon lamp was the best choice for professional technical purposes where high power at simultaneously good spectral quality of the light was required. However, technical development does not stand still. Between the luminous efficacy of xenon lamps of 25-50 lm/W and the theoretical limit for 'white light' of 250 lm/W is still much room for improvement. The present development mainly favors other lamp types, like metal halide lamps and fluorescent lamps for commercial lighting purposes. The enclosed sections deal with some of the properties of xenon lamps relevant to plant illumination; particularly the spectral aspects, the temporal characteristics of the emission, and finally the economy of xenon lamps will be addressed. Due to radiation exceeding the natural global radiation in both the ultraviolet (UV) and the infrared (IR) regions, filter techniques have to be included into the discussion referring to the requirements of plant illumination. Most of the presented results were obtained by investigations in the GSF phytotron or in the closed Phytocell chambers of the University of Erlangen. As our experiences are restricted to area plant illumination rather than spot lights our discussion will concentrate on low pressure long-arc xenon lamps which are commonly used for such plant illuminations. As the spectral properties of short-arc lamps do not differ much from those of long-arc lamps most of our conclusions will be valid for high pressure xenon lamps too. These lamps often serve as light sources for small sun simulators and for monochromators which are used for action spectroscopy of plant responses.

Koefferlein, M.↗

NASA NTRS2003

Sprectroscopic and time-resolved optical methods and apparatus for imaging objects in turbed media

Method and apparatus for imaging objects in turbid media. In one embodiment, the method comprises illuminating at least a portion of the turbid medium with substantially monochromatic light of at least two wavelengths in the 600-1500 nm spectral range. A first of the at least two wavelengths is equal to a resonance wavelength for an optical property of an object in the illuminated portion of the turbid medium but is not equal to a resonance wavelength for the turbid medium. A second of the at least two wavelengths is not equal to a resonance wavelength for either the object or the turbid medium. Light emergent from the turbid medium following each of the foregoing illuminations comprises a ballistic component, a snake component and a diffuse component. A direct shadowgram image may be obtained by preferentially passing from the emergent light, following each illumination. the ballistic and snake components thereof and detecting the preferentially passed light. Alternatively, an inverse reconstruction image may be obtained by determining, following each illumination, the intensity of the diffuse component at a plurality of points in time and then using these pluralities of intensity determinations and a mathematical inversion algorithm to form an image of the object in the turbid medium. An image of the object with higher contrast and better quality may be obtained by using the ratio or difference of the images recorded with resonant light and non-resonant light.

Alfano, Robert R.↗

NASA NTRS2008

Hyperspectral Fluorescence and Reflectance Imaging Instrument

The system is a single hyperspectral imaging instrument that has the unique capability to acquire both fluorescence and reflectance high-spatial-resolution data that is inherently spatially and spectrally registered. Potential uses of this instrument include plant stress monitoring, counterfeit document detection, biomedical imaging, forensic imaging, and general materials identification. Until now, reflectance and fluorescence spectral imaging have been performed by separate instruments. Neither a reflectance spectral image nor a fluorescence spectral image alone yields as much information about a target surface as does a combination of the two modalities. Before this system was developed, to benefit from this combination, analysts needed to perform time-consuming post-processing efforts to co-register the reflective and fluorescence information. With this instrument, the inherent spatial and spectral registration of the reflectance and fluorescence images minimizes the need for this post-processing step. The main challenge for this technology is to detect the fluorescence signal in the presence of a much stronger reflectance signal. To meet this challenge, the instrument modulates artificial light sources from ultraviolet through the visible to the near-infrared part of the spectrum; in this way, both the reflective and fluorescence signals can be measured through differencing processes to optimize fluorescence and reflectance spectra as needed. The main functional components of the instrument are a hyperspectral imager, an illumination system, and an image-plane scanner. The hyperspectral imager is a one-dimensional (line) imaging spectrometer that includes a spectrally dispersive element and a two-dimensional focal plane detector array. The spectral range of the current imaging spectrometer is between 400 to 1,000 nm, and the wavelength resolution is approximately 3 nm. The illumination system consists of narrowband blue, ultraviolet, and other discrete wavelength light-emitting-diode (LED) sources and white-light LED sources designed to produce consistently spatially stable light. White LEDs provide illumination for the measurement of reflectance spectra, while narrowband blue and UV LEDs are used to excite fluorescence. Each spectral type of LED can be turned on or off depending on the specific remote-sensing process being performed. Uniformity of illumination is achieved by using an array of LEDs and/or an integrating sphere or other diffusing surface. The image plane scanner uses a fore optic with a field of view large enough to provide an entire scan line on the image plane. It builds up a two-dimensional image in pushbroom fashion as the target is scanned across the image plane either by moving the object or moving the fore optic. For fluorescence detection, spectral filtering of a narrowband light illumination source is sometimes necessary to minimize the interference of the source spectrum wings with the fluorescence signal. Spectral filtering is achieved with optical interference filters and absorption glasses. This dual spectral imaging capability will enable the optimization of reflective, fluorescence, and fused datasets as well as a cost-effective design for multispectral imaging solutions. This system has been used in plant stress detection studies and in currency analysis.

Ryan, Robert E.↗

NASA NTRS2009

Measuring the Photocatalytic Breakdown of Crystal Violet Dye using a Light Emitting Diode Approach

A simple method to estimate the photocatalytic reactivity performance of spray-on titanium dioxide coatings for transmissive glass surfaces was developed. This novel technique provides a standardized method to evaluate the efficiency of photocatalytic material systems over a variety of illumination levels. To date, photocatalysis assessments have generally been conducted using mercury black light lamps. Illumination levels for these types of lamps are difficult to vary, consequently limiting their use for assessing material performance under a diverse range of simulated environmental conditions. This new technique uses an ultraviolet (UV) gallium nitride (GaN) light emitting diode (LED) array instead of a traditional black light to initiate and sustain photocatalytic breakdown. This method was tested with a UV-resistant dye (crystal violet) applied to a titanium dioxide coated glass slide. Experimental control is accomplished by applying crystal violet to both titanium dioxide coated slides and uncoated control slides. A slide is illuminated by the UV LED array, at various light levels representative of outdoor and indoor conditions, from the dye side of the slide. To monitor degradation of the dye over time, a temperature-stabilized white light LED, whose emission spectrum overlaps with the dye absorption spectrum, is used to illuminate the opposite side of the slide. Using a spectrometer, the amount of light from the white light LED transmitted through the slide as the dye degrades is monitored as a function of wavelength and time and is subsequently analyzed. In this way, the rate of degradation for photocatalytically coated versus uncoated slide surfaces can be compared. Results demonstrate that the dye absorption decreased much more rapidly on the photocatalytically coated slides than on the control uncoated slides, and that dye degradation is dependent on illumination level. For photocatalytic activity assessment purposes, this experimental configuration and methodology minimizes many external variable effects and enables small changes in absorption to be measured. This research also compares the advantages of this innovative LED light source design over traditional mercury black light systems and non- LED lamp approaches. This novel technology begins to address the growing need for a standard method that can assess the performance of photocatalytic materials before deployment for large scale, real world use.

Ryan, Robert E.↗

NASA NTRS2009

Mid-Infrared Reflectance Imaging of Thermal-Barrier Coatings

An apparatus for mid-infrared reflectance imaging has been developed as means of inspecting for subsurface damage in thermal-barrier coatings (TBCs). The apparatus is designed, more specifically, for imaging the progression of buried delamination cracks in plasma-sprayed yttria-stabilized zirconia coatings on turbine-engine components. Progression of TBC delamination occurs by the formation of buried cracks that grow and then link together to produce eventual TBC spallation. The mid-infrared reflectance imaging system described here makes it possible to see delamination progression that is invisible to the unaided eye, and therefore give sufficiently advanced warning before delamination progression adversely affects engine performance and safety. The apparatus (see figure) includes a commercial mid-infrared camera that contains a liquid-nitrogen-cooled focal plane indium antimonide photodetector array, and imaging is restricted by a narrow bandpass centered at wavelength of 4 microns. This narrow wavelength range centered at 4 microns was chosen because (1) it enables avoidance of interfering absorptions by atmospheric OH and CO2 at 3 and 4.25 microns, respectively; and (2) the coating material exhibits maximum transparency in this wavelength range. Delamination contrast is produced in the midinfrared reflectance images because the introduction of cracks into the TBC creates an internal TBC/air-gap interface with a high diffuse reflectivity of 0.81, resulting in substantially higher reflectance of mid-infrared radiation in regions that contain buried delamination cracks. The camera is positioned a short distance (.12 cm) from the specimen. The mid-infrared illumination is generated by a 50-watt silicon carbide source positioned to the side of the mid-infrared camera, and the illumination is collimated and reflected onto the specimen by a 6.35-cm-diameter off-axis paraboloidal mirror. Because the collected images are of a steady-state reflected intensity (in contrast to the transient thermal response observed in infrared thermography), collection times can be lengthened to whatever extent needed to achieve desired signal-to-noise ratios. Each image is digitized, and the resulting data are processed in several steps to obtain a true mid-infrared reflectance image. The raw image includes thermal radiation emitted by the specimen in addition to the desired reflected radiation. The thermal-radiation contribution is eliminated by subtracting the image obtained with the illumination off from the image obtained with the illumination on. A flat-field correction is then made to remove the effects of non-uniformities in the illumination level and pixel-to-pixel variations in sensitivity. This correction is performed by normalizing to an image of a standard object that has a known reflectance at a wavelength of 4 microns. After correction, each pixel value is proportional to the reflectance (at a wavelength of 4-microns) at the corresponding location on the specimen. Mid-infrared reflectance imaging of specimens that were thermally cyc led for different numbers of cycles was performed and demonstrated t hat mid-infrared reflectance imaging was able to monitor the gradual delamination progression that occurs with continued thermal cycling . Reproducible values were obtained for the reflectance associated w ith an attached and fully delaminated TBC, so that intermediate refle ctance values could be interpreted to successfully predict the numbe r of thermal cycles to failure.

Edlridge, Jeffrey I.↗

NASA NTRS2006

Instruments for Reading Direct-Marked Data-Matrix Symbols

Improved optoelectronic instruments (specially configured digital cameras) for reading direct-marked data-matrix symbols on the surfaces of optically reflective objects (including specularly reflective ones) are undergoing development. Data-matrix symbols are two-dimensional binary patterns that are used, like common bar codes, for automated identification of objects. The first data-matrix symbols were checkerboard-like patterns of black-and-white rectangles, typically existing in the forms of paint, ink, or detachable labels. The major advantage of direct marking (the marks are more durable than are painted or printed symbols or detachable labels) is offset by a major disadvantage (the marks generated by some marking methods do not provide sufficient contrast to be readable by optoelectronic instruments designed to read black-and-white data-matrix symbols). Heretofore, elaborate lighting, lensing, and software schemes have been tried in efforts to solve the contrast problem in direct-mark matrix- symbol readers. In comparison with prior readers based on those schemes, the readers now undergoing development are expected to be more effective while costing less. All of the prior direct-mark matrix-symbol readers are designed to be aimed perpendicularly to marked target surfaces, and they tolerate very little angular offset. However, the reader now undergoing development not only tolerates angular offset but depends on angular offset as a means of obtaining the needed contrast, as described below. The prototype reader (see Figure 1) includes an electronic camera in the form of a charge-coupled-device (CCD) image detector equipped with a telecentric lens. It also includes a source of collimated visible light and a source of collimated infrared light for illuminating a target. The visible and infrared illumination complement each other: the visible illumination is more useful for aiming the reader toward a target, while the infrared illumination is more useful for reading symbols on highly reflective surfaces. By use of beam splitters, the visible and infrared collimated lights are introduced along the optical path of the telecentric lens, so that the target is illuminated and viewed from the same direction.

Schramm, Harry F.↗

NASA NTRS2006

Monitoring Temperatures of Tires Using Luminescent Materials

A method of noncontact, optical monitoring of the surface temperature of a tire has been devised to enable the use of local temperature rise as an indication of potential or impending failures. The method involves the use of temperature-sensitive paint (or filler): Temperature-sensitive luminescent dye molecules or other luminescent particles are incorporated into a thin, flexible material coating the tire surface of interest. (Alternatively, in principle, the luminescent material could be incorporated directly into the tire rubber, though this approach has not yet been tested.) The coated surface is illuminated with shorter-wavelength light to excite longer-wavelength luminescence, which is observed by use of a charge-coupled-device camera or a photodetector (see Figure 1). If temporally constant illumination is used, then the temperature can be deduced from the known temperature dependence of the intensity response of the luminescence. If pulsed illumination is used, then the temperature can be deduced from the known temperature dependence of the time or frequency response of the luminescence. If sinusoidally varying illumination is used, then the temperature can be deduced from the known temperature dependence of the phase response of the luminescence. Unlike a prior method of monitoring the temperature at a fixed spot on a tire by use of a thermocouple, this method is not restricted to one spot and can, therefore, yield information on the spatial distribution of temperature: in particular, it enables the discovery of newly forming hot spots where damage may be starting. Also unlike in the thermocouple method, the measurements in this method are not vulnerable to breakage of wires in repeated flexing of the tire. Moreover, unlike in another method in which infrared radiation is monitored as an indication of surface temperature, the luminescence measurements in this method are not significantly affected by changes in infrared emissivity. This method has been demonstrated in application to the outside surface of a tire (see Figure 2), using both constant and pulsed light sources for illumination and cooled, slow-scan, gated CCD cameras for detection. For observing the temperature of the inside surface of a tire (this has not yet been done), it would probably be necessary to use fiber optics and/or windows for coupling excitation light into, and coupling luminescence out of, the interior volume.

Bencic, Timothy J↗

NASA NTRS2005

Sol-Gel Glass Holographic Light-Shaping Diffusers

Holographic glass light-shaping diffusers (GLSDs) are optical components for use in special-purpose illumination systems (see figure). When properly positioned with respect to lamps and areas to be illuminated, holographic GLSDs efficiently channel light from the lamps onto specified areas with specified distributions of illumination for example, uniform or nearly uniform irradiance can be concentrated with intensity confined to a peak a few degrees wide about normal incidence, over a circular or elliptical area. Holographic light diffusers were developed during the 1990s. The development of the present holographic GLSDs extends the prior development to incorporate sol-gel optical glass. To fabricate a holographic GLSD, one records a hologram on a sol-gel silica film formulated specially for this purpose. The hologram is a quasi-random, micro-sculpted pattern of smoothly varying changes in the index of refraction of the glass. The structures in this pattern act as an array of numerous miniature lenses that refract light passing through the GLSD, such that the transmitted light beam exhibits a precisely tailored energy distribution. In comparison with other light diffusers, holographic GLSDs function with remarkably high efficiency: they typically transmit 90 percent or more of the incident lamp light onto the designated areas. In addition, they can withstand temperatures in excess of 1,000 C. These characteristics make holographic GLSDs attractive for use in diverse lighting applications that involve high temperatures and/or requirements for high transmission efficiency for ultraviolet, visible, and near-infrared light. Examples include projectors, automobile headlights, aircraft landing lights, high-power laser illuminators, and industrial and scientific illuminators.

Yu, Kevin↗

NASA NTRS2004

Laser-Induced-Fluorescence Photogrammetry and Videogrammetry

An improved method of dot-projection photogrammetry and an extension of the method to encompass dot-projection videogrammetry overcome some deficiencies of dot-projection photogrammetry as previously practiced. The improved method makes it possible to perform dot-projection photogrammetry or videogrammetry on targets that have previously not been amenable to dot-projection photogrammetry because they do not scatter enough light. Such targets include ones that are transparent, specularly reflective, or dark. In standard dot-projection photogrammetry, multiple beams of white light are projected onto the surface of an object of interest (denoted the target) to form a known pattern of bright dots. The illuminated surface is imaged in one or more cameras oriented at a nonzero angle or angles with respect to a central axis of the illuminating beams. The locations of the dots in the image(s) contain stereoscopic information on the locations of the dots, and, hence, on the location, shape, and orientation of the illuminated surface of the target. The images are digitized and processed to extract this information. Hardware and software to implement standard dot-projection photogrammetry are commercially available. Success in dot-projection photogrammetry depends on achieving sufficient signal-to-noise ratios: that is, it depends on scattering of enough light by the target so that the dots as imaged in the camera(s) stand out clearly against the ambient-illumination component of the image of the target. In one technique used previously to increase the signal-to-noise ratio, the target is illuminated by intense, pulsed laser light and the light entering the camera(s) is band-pass filtered at the laser wavelength. Unfortunately, speckle caused by the coherence of the laser light engenders apparent movement in the projected dots, thereby giving rise to errors in the measurement of the centroids of the dots and corresponding errors in the computed shape and location of the surface of the target. The improved method is denoted laser-induced-fluorescence photogrammetry.

Danehy, Paul↗

NASA NTRS2004

Determining Sizes of Particles in a Flow from DPIV Data

A proposed method of measuring the size of particles entrained in a flow of a liquid or gas would involve utilization of data from digital particle-image velocimetry (DPIV) of the flow. That is to say, with proper design and operation of a DPIV system, the DPIV data could be processed according to the proposed method to obtain particle sizes in addition to particle velocities. As an additional benefit, one could then compute the mass flux of the entrained particles from the particle sizes and velocities. As in DPIV as practiced heretofore, a pulsed laser beam would be formed into a thin sheet to illuminate a plane of interest in a flow field and the illuminated plane would be observed by means of a charge-coupled device (CCD) camera aimed along a line perpendicular to the illuminated plane. Unlike in DPIV as practiced heretofore, care would be taken to polarize the laser beam so that its electric field would lie in the illuminated plane, for the reason explained in the next paragraph. The proposed method applies, more specifically, to transparent or semitransparent spherical particles that have an index of refraction different from that of the fluid in which they are entrained. The method is based on the established Mie theory, which describes the scattering of light by diffraction, refraction, and specular reflection of light by such particles. In the case of a particle illuminated by polarized light and observed in the arrangement described in the preceding paragraph, the Mie theory shows that the image of the particle on the focal plane of the CCD camera includes two glare spots: one attributable to light reflected toward the camera and one attributable to light refracted toward the camera. The distance between the glare spots is a known function of the size of the particle, the indices of refraction of the particle material, and design parameters of the camera optics. Hence, the size of a particle can be determined from the distance between the glare spots. The proposed method would be implemented in an algorithm that would automatically identify, and measure the distance between, the glare spots for each particle for which a suitable image has been captured in a DPIV image frame. The algorithm (see figure) would begin with thresholding of data from the entire image frame to reduce noise, thereby facilitating discrimination of particle images from the background and aiding in the separation of overlapping particles. It is important not to pick a threshold level so high that the light intensity between a given pair of glare spots does not fall below the threshold value, leaving the glare spots disconnected. The image would then be scanned in a sequence of rows and columns of pixels to identify groups of adjacent pixels that contain nonzero brightnesses and that are surrounded by pixels of zero brightness. Each such group would be assumed to constitute the image of one particle. Each such group would be further analyzed to determine whether the image was saturated; saturated particle images must be rejected because the locations of glare spots in saturated images cannot accurately be determined. Within each unsaturated particle image, the centroids (deemed to be the locations) of the glare spots would be determined by means of gradients of brightness distributions and three-point horizontal and three-point vertical Gaussian estimates based on the brightness values of the brightest pixels and the pixels adjacent to them. If the brightness of a given particle image contained only one peak, then it would be assumed that a second glare spot did not exist and that image would be rejected.

Wernet, M. P.↗

NASA NTRS2011

Results from Solar Reflective Band End-to-End Testing for VIIRS F1 Sensor Using T-SIRCUS

Verification of the Visible Infrared Imager Radiometer Suite (VIIRS) End-to-End (E2E) sensor calibration is highly recommended before launch, to identify any anomalies and to improve our understanding of the sensor on-orbit calibration performance. E2E testing of the Reflective Solar Bands (RSB) calibration cycle was performed pre-launch for the VIIRS Fight 1 (F1) sensor at the Ball Aerospace facility in Boulder CO in March 2010. VIIRS reflective band calibration cycle is very similar to heritage sensor MODIS in that solar illumination, via a diffuser, is used to correct for temporal variations in the instrument responsivity. Monochromatic light from the NIST T-SIRCUS was used to illuminate both the Earth View (EV), via an integrating sphere, and the Solar Diffuser (SD) view, through a collimator. The collimator illumination was cycled through a series of angles intended to simulate the range of possible angles for which solar radiation will be incident on the solar attenuation screen on-orbit. Ideally, the measured instrument responsivity (defined here as the ratio of the detector response to the at-sensor radiance) should be the same whether the EV or SD view is illuminated. The ratio of the measured responsivities was determined at each collimator angle and wavelength. In addition, the Solar Diffuser Stability Monitor (SDSM), a ratioing radiometer designed to track the temporal variation in the SD BRF by direct comparison to solar radiation, was illuminated by the collimator. The measured SDSM ratio was compared to the predicted ratio. An uncertainty analysis was also performed on both the SD and SDSM calibrations.

McIntire, Jeff↗

NASA NTRS2012

Electron Beam Induced Luminescence of SiO2 Optical Coatings

Optical coatings of disordered thin film SiO,/SiO, samples undergoing electron beam bombardment exhibited a cathodoluminescence effect. Measurements were made of the absolute illuminance and emission spectra as functions of incident electron energy (0.2 keV to 30 keV). flux (approx. 0.1 nA/sq cm to > 100 nA/sq cm) and power (<50 nW/sq cm to > 3mW/sq cm) for coatings (approx.60 nm to approx.200 nm thick) on reflective metal substrates over a range of sample temperatures (approx.40 K to approx.400 K) and emission wavelengths (approx.260 nm to approx.5000 nm). Illuminance reached a plateau saturation intensity I(sub sat) approx. 10(exp -4)W/sq cm. scaling as [I(sub mc)/(I + I(sub mc)/I(sub sat)] as incident power I(sub mc) approached I(sub sat). Well below I(sub sat), illuminance scaled linearly with incident power for lower-energy non-penetrating radiation that deposited all of its energy in the dielectric film. At higher incident energies (> 1-5 keV) electrons penetrate the dielectric, depositing only a fraction of their energy in the dielectric film, where deposited energy scales as the ratio of film thickness to penetration range. Since electron range exhibits a peak below approx. 1 keV, the illuminance decreased with increasing energy for penetrating radiation. The temperature dependence of the illuminance. in general, increased with decreasing temperature. Changes in apparent color with temperature were also observed. Four bands in the UV/VIS/NIR range from 300 nm to 1000 nm were observed in spectral measurements; no significant luminescence was detected in a range from approx. 1000 nm to approx. 5000 nm. These different bands either increased or decreased in intensity and shifted slightly in energy with decreasing temperature. Our measurements are explained in terms of simple disordered band theory models based on atomic-scale stochastic transport of electrons in highly disordered insulating materials. The theoretical models provide a fundamental basis for understanding the dependence of cathodoluminescence on irradiation time, incident flux and energy. and sample thickness and temperature. The observed luminescence occurs when an incident high energy electron excites a valence band electron into the conduction band. Following the excitation. a complex series of transitions take place between the extended conduction states and the long-lived localized trapped states (or chromophores) associated with structural or compositional defects in the dielectric materials. Thc transport equations and models of thc spatial and energy distribution of the trapped states below the mobility edge, their occupancy, and transitions provide microscopic scale insights into this macroscopic phenomenon. Our observations and theoretical models are also compared with similar previous room temperature studies of similar SiO2 films.

Dennison, J. R.↗

NASA NTRS2013

Raster-Based Approach to Solar Pressure Modeling

An algorithm has been developed to take advantage of the graphics processing hardware in modern computers to efficiently compute high-fidelity solar pressure forces and torques on spacecraft, taking into account the possibility of self-shading due to the articulation of spacecraft components such as solar arrays. The process is easily extended to compute other results that depend on three-dimensional attitude analysis, such as solar array power generation or free molecular flow drag. The impact of photons upon a spacecraft introduces small forces and moments. The magnitude and direction of the forces depend on the material properties of the spacecraft components being illuminated. The parts of the components being lit depends on the orientation of the craft with respect to the Sun, as well as the gimbal angles for any significant moving external parts (solar arrays, typically). Some components may shield others from the Sun. The purpose of this innovation is to enable high-fidelity computation of solar pressure and power generation effects of illuminated portions of spacecraft, taking self-shading from spacecraft attitude and movable components into account. The key idea in this innovation is to compute results dependent upon complicated geometry by using an image to break the problem into thousands or millions of sub-problems with simple geometry, and then the results from the simpler problems are combined to give high-fidelity results for the full geometry. This process is performed by constructing a 3D model of a spacecraft using an appropriate computer language (OpenGL), and running that model on a modern computer's 3D accelerated video processor. This quickly and accurately generates a view of the model (as shown on a computer screen) that takes rotation and articulation of spacecraft components into account. When this view is interpreted as the spacecraft as seen by the Sun, then only the portions of the craft visible in the view are illuminated. The view as shown on the computer screen is composed of up to millions of pixels. Each of those pixels is associated with a small illuminated area of the spacecraft. For each pixel, it is possible to compute its position, angle (surface normal) from the view direction, and the spacecraft material (and therefore, optical coefficients) associated with that area. With this information, the area associated with each pixel can be modeled as a simple flat plate for calculating solar pressure. The vector sum of these individual flat plate models is a high-fidelity approximation of the solar pressure forces and torques on the whole vehicle. In addition to using optical coefficients associated with each spacecraft material to calculate solar pressure, a power generation coefficient is added for computing solar array power generation from the sum of the illuminated areas. Similarly, other area-based calculations, such as free molecular flow drag, are also enabled. Because the model rendering is separated from other calculations, it is relatively easy to add a new model to explore a new vehicle or mission configuration. Adding a new model is performed by adding OpenGL code, but a future version might read a mesh file exported from a computer-aided design (CAD) system to enable very rapid turnaround for new designs

Wright, Theodore W. II↗

NASA NTRS2018

Physics of the Cosmos (PCOS) Program Technology Development 2018

We present a final report on our program to raise the Technology Readiness Level (TRL) of enhanced charge‐coupled‐device (CCD) detectors capable of meeting the requirements of X‐ray grating spectrometers (XGS) and wide‐field X‐ray imaging instruments for small, medium, and large missions. Because they are made of silicon, all X‐ray CCDs require blocking filters to prevent corruption of the Xray signal by out‐of‐band, mainly optical and near‐infrared (near‐IR) radiation. Our primary objective is to demonstrate technology that can replace the fragile, extremely thin, free‐standing blocking filter that has been standard practice with a much more robust filter deposited directly on the detector surface. High‐performance, back‐illuminated CCDs have flown with free‐standing filters (e.g., one of our detectors on Suzaku), and other relatively low‐performance CCDs with directly deposited filters have flown (e.g., on the X‐ray Multi‐mirror Mission‐Newton, XMM‐Newton Reflection Grating Spectrometer, RGS). At the inception of our program, a high‐performance, back‐illuminated CCD with a directly deposited filter has not been demonstrated. Our effort will be the first to show such a filter can be deposited on an X‐ray CCD that meets the requirements of a variety of contemplated future instruments. Our principal results are as follows: i) we have demonstrated a process for direct deposition of aluminum optical blocking filters on back‐illuminated MIT Lincoln Laboratory CCDs. Filters ranging in thickness from 70 nm to 220 nm exhibit expected bulk visible‐band and X‐ray transmission properties except in a small number (affecting ≲ 1% of detector area) of isolated detector pixels ("pinholes"), which show higher‐than‐expected visible‐band transmission; ii) these filters produce no measurable degradation in soft‐X‐ray spectral resolution, demonstrating that direct filter deposition is compatible with the MIT Lincoln Laboratory back‐illumination process; iii) we have shown that under sufficiently intense visible and near‐IR illumination, out‐of‐band light can enter the detector through its sidewalls and mounting surfaces, compromising detector performance. This 'sidewall leakage' has been observed, for example, by a previous experiment on the International Space Station during its orbit‐day operations. We have developed effective countermeasures for this sidewall leakage; iv) we developed an exceptionally productive collaboration with the Regolith X‐ray Imaging Spectrometer (REXIS) team. REXIS is a student instrument now flying on the Origins Spectral Interpretation Resource Identification Security - Regolith Explorer (OSIRIS‐REx) mission. REXIS students participated in our filter development program, adopted our technology for their flight instrument, and raised the TRL of this technology beyond our initial goals. This Strategic Astrophysics Technology (SAT) project, a collaboration between the MKI and MIT Lincoln Laboratory, began July 1, 2012, and ended on June 30, 2018.

PCOS↗

NASA NTRS1971

Simulated space environment tests on cadmium sulfide solar cells

Cadmium sulfide (Cu2s - CdS) solar cells were tested under simulated space environmental conditions. Some cells were thermally cycled with illumination from a Xenon-arc solar simulator. A cycle was one hour of illumination followed immediately with one-half hour of darkness. In the light, the cells reached an equilibrium temperature of 60 C (333 K) and in the dark the cell temperature dropped to -120 C (153 K). Other cells were constantly illuminated with a Xenon-arc solar simulator. The equilibrium temperature of these cells was 55 C (328 K). The black vacuum chamber walls were cooled with liquid nitrogen to simulate a space heat sink. Chamber pressure was maintained at 0.000001 torr or less. Almost all of the solar cells tested degraded in power when exposed to a simulated space environment of either thermal cycling or constant illumination. The cells tested the longest were exposed to 10.050 thermal cycles.

Clarke, D. R.↗

NASA NTRS1985

Radiation damage in high-resistivity silicon solar cells

High-resistivity silicon solar cells exhibit reduced radiation damage when light is incident on the gridded back surface. Under back illumination, radiation damage decreases as cell resistivity increases; under front illumination, radiation damage increases as cell resistivity increases. Thin back-illuminated cells outperform conventional 10 omega cm 50 and 200 micron cells at low 1-MeV electron fluences. However, at higher fluences, the conventional cells exhibit superior radiation resistance. This is attributed to the low BOL diffusion lengths observed in the thin, sack-illuminated cell. These results are discussed in terms of injected charge distributions, electric fields in the cell base, and the effects of a dominant boron-oxygen defect.

Weinberg, I.↗

NASA NTRS1986

Photoelectrochemical fabrication of spectroscopic diffraction gratings

Photoelectrochemical etching was demonstrated as a means of fabricating a variety of periodic structures in semiconductors. The semiconductor is used as an electrode in an electrochemical cell, and is in contact with a liquid electrolyte. When the crystal is held at a positive voltage and illuminated, etching occurs in only the illuminated regions to a depth proportional to the illumination intensity and exposure time. In Phase 1, it was determined that diffraction gratings could be produced in gallium arsenide crystals by this method, using either a scanned focused laser beam or by uniform illumination of a ruling mask defined in metal or photoresist on the crystal surface. The latter approach was determined to produce V-grooves if the mask is oriented along certain crystallographic directions. These V-grooves were produced with an exceedingly smooth crystal morphology due to the highly controllable nature of the process and the mild electrolytes involved. The results form the basis for photoelectrochemical fabrication of deep, low pitch Eschelle gratings for use in high orders in NASA spectrographic instrumentation such as the Space Telescope Imaging Spectrograph.

Rauh, R. David↗