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At least 289 records · Page 16

Laser measuring system for incremental assemblies

Wire-wrapped frame assemblies used in spark chambers and the like can be measured using a system which utilizes a laser, an interferometer, and a retroreflector to precisely measure distance. A light source and a photodetector are located adjacent the incremental assembly and mounted on a movable carriage. The interferometer is also mounted on the movable carriage, while the laser and retroreflector are positioned at either end of the carriage track. The carriage is moved along one edge of the incremental assembly between the retroreflector and the laser, and as the carriage is moved, the light from the light source to the photodetector is interrupted. This produces a trigger command to a control unit which in turn causes a distance measurement to be made. A printout is provided for each sampling trigger command to list such items as ideal position, actual position and amount of error.

Etzel, J. G.↗

The vector magnetograph of the Sayan Solar Observatory

The problem of choosing an optimum scheme for the electrooptical analyzer of polarization and related control principles are discussed. An electrooptical deflector, which is advantageously used to employ a single photodetector and to remove systematic errors inherent in magnetographs with two photodetectors in the wings of the line is discussed, as well as adjustment errors of optical elements of the polarization analyzer and errors of control voltages. A method for measuring the telescope's polarization matrix, reduction of magnetographic measurements for instrumental polarization and calibration of magnetograph channels are examined. Questions of evaluating scattered light and of reducing magnetic field measurements are also considered as a computational procedure for the magnetic field vector parameters is briefly outlined. Computer control of the solar magnetograph and of the processing and control system software is discussed.

Grigoryev, V. M.↗

Automatic processing system for shadowgraph and interference patterns

The design and operation of an automatic system for the processing of shadowgraph and interference images are described. The system includes a two-coordinate processing table with an optical system for the projection of transparent images onto the photodetector, an image filter in the photodetector field, and a device for controlling the movement of the table and transmitting information to the minicomputer.

Vereninov, I. A.↗

Tailorable infrared sensing device with strain layer superlattice structure

An infrared photodetector is formed of a heavily doped p-type Ge sub x Si sub 1-x/Si superlattice in which x is pre-established during manufacture in the range 0 to 100 percent. A custom-tailored photodetector that can differentiate among close wavelengths in the range of 2.7 to 50 microns is fabricated by appropriate selection of the alloy constituency value, x, to establish a specific wavelength at which photodetection cutoff will occur.

Cheng, Li-Jen↗

Optical communication with semiconductor laser diodes

Slot timing recovery in a direct detection optical PPM communication system can be achieved by processing the photodetector waveform with a nonlinear device whose output forms the input to a phase lock group. The choice of a simple transition detector as the nonlinearity is shown to give satisfactory synchronization performance. The rms phase error of the recovered slot clock and the effect of slot timing jitter on the bit error probability were directly measured. The experimental system consisted of an AlGaAs laser diode (lambda = 834 nm) and a silicon avalanche photodiode (APD) photodetector and used Q=4 PPM signaling operated at a source data rate of 25 megabits/second. The mathematical model developed to characterize system performance is shown to be in good agreement with actual performance measurements. The use of the recovered slot clock in the receiver resulted in no degradation in receiver sensitivity compared to a system with perfect slot timing. The system achieved a bit error probability of 10 to the minus 6 power at received signal energies corresponding to an average of less than 60 detected photons per information bit.

Davidson, F.↗

Position-And-Direction Sensor For Light Beams

Optoelectronic sensor measures both position and direction of incidence of laser beam or other narrow beam of light. New sensor part of robotic welding system in which laser beam reflected from pool of molten metal and monitored by lateral-position sensor. To provide unambiguous measurement of both lateral position and direction of incident beam, sensor includes two position-sensitive photodetectors or linear arrays of photodetectors.

Smith, Matthew A.↗

Metal Coat Increases Output Sensitivity

Charge-coupled photodetector optimized for maximum quantum efficiency (QE), high charge-collection efficiency, and ultralow read noise. Called "flash-coupled" photodetector, sensor delivers high quantum-efficiency sensitivity in spectral range extending from soft x ray to near infrared.

Janesick, James R.↗

Optical Measurement Of Sound Pressure

Noninvasive technique does not disturb field it measures. Sound field deflects laser beam proportionally to its amplitude. Knife edge intercepts undeflected beam, allowing only deflected beam to reach photodetector. Apparatus calibrated by comparing output of photodetector with that of microphone. Optical technique valuable where necessary to measure in remote, inaccessible, or hostile environment or to avoid perturbation of measured region.

Trinh, Eugene H.↗

Optical Communication with Semiconductor Laser Diode

Theoretical and experimental performance limits of a free-space direct detection optical communication system were studied using a semiconductor laser diode as the optical transmitter and a silicon avalanche photodiode (APD) as the receiver photodetector. Optical systems using these components are under consideration as replacements for microwave satellite communication links. Optical pulse position modulation (PPM) was chosen as the signal format. An experimental system was constructed that used an aluminum gallium arsenide semiconductor laser diode as the transmitter and a silicon avalanche photodiode photodetector. The system used Q=4 PPM signaling at a source data rate of 25 megabits per second. The PPM signal format requires regeneration of PPM slot clock and word clock waveforms in the receiver. A nearly exact computational procedure was developed to compute receiver bit error rate without using the Gaussion approximation. A transition detector slot clock recovery system using a phase lock loop was developed and implemented. A novel word clock recovery system was also developed. It was found that the results of the nearly exact computational procedure agreed well with actual measurements of receiver performance. The receiver sensitivity achieved was the closest to the quantum limit yet reported for an optical communication system of this type.

Davidson, Frederic↗

A photoelectric technique for measuring lightning-channel propagation velocities from a mobile laboratory

The present device for lightning channel propagation-velocity determination employs eight photodetectors mounted behind precision horizontal slits in the focal plane of a photographic camera lens. The eight photodetector pulses, IRIG-B time, and slow and fast electric field-change waveforms are recorded on a 14-track analog tape recorder. A comparison of the present results with those obtained by a streaking camera shows no significant differences between the velocities obtained from the same strokes with the two systems; neither is there any difference in pulse characteristics or in the velocities calculated from them.

Mach, Douglas M.↗

Ge/Si Integrated Circuit For Infrared Imaging

Proposed integrated circuit consists of focal-plane array of metal/germanium Schottky-barrier photodetectors on same chip with silicon-based circuits that processes signals from photodetectors. Made compatible with underlying silicon-based circuitry by growing germanium epitaxially on silicon circuit wafers. Metal deposited in ultrahigh vacuum immediately after growth of germanium. Combination of described techniques results in high-resolution infrared-imaging circuits of superior performance.

Fathauer, Robert W.↗

Quick Check Of Butt-Weld Alignment

Proposed tool measures alignments of plates before butt-welded. Provides nearly instantaneous check on alignment, thereby facilitating repetitive measurements along length of weld joint. Reduces risk of contamination of weld from dirty measuring tools. Middle photodetector indicates acceptable alignment when position of transmitter fiber preciously matches that of center receiver fiber. If plates offset, other photodetectors signal misalignment.

Smith, Matthew A.↗

Tailorable infrared sensing device with strain layer superlattice structure

An infrared photodetector is formed of a heavily doped p-type Ge(x)Si(1-x)/Si superlattice in which x is pre-established during manufacture in the range 0 to 100 percent. A custom tailored photodetector that can differentiate among close wavelengths in the range of 2.7 to 50 microns is fabricated by appropriate selection of the alloy constituency value, x, to establish a specific wavelength at which photodetection cut-off will occur.

Cheng, Li-Jen↗

Multiplexed 256 element InGaAs detector arrays for 0.8-1.7-micron room-temperature operation

InGaAs photodetectors have been configured into linear arrays of 30 x 30 micron photodetectors spaced 50 microns apart. The devices have typical responsivities of 0.9 A/W (86-percent QE) at 1.3 microns and exhibit room temperature dark currents below 100 pA. A 256-element array has been mounted in a Reticon multiplexer and configured into a PAR optical multichannel analyzer to extend spectral response out to 1.7 microns. Individual InGaAs detectors have been fabricated for response out to 2.2 microns with dark current below 1 microA (-1V) and 50-percent QE at room temperature.

Olsen, G. H.↗

Heterojunction-Internal-Photoemission Infrared Detectors

New type of photodetector adds options for design of imaging devices. Heterojunction-internal-photoemission (HIP) infrared photodetectors proposed for incorporation into planar arrays in imaging devices required to function well at wavelengths from 8 to 17 micrometers and at temperatures above 65 K. Photoexcited electrons cross energy barrier at heterojunction and swept toward collection layer. Array of such detectors made by etching mesa structures. HIP layers stacked to increase quantum efficiency. Also built into integrated circuits including silicon multiplexer/readout circuits.

Maserjian, Joseph↗

Optical Link For Readout From Focal-Plane Array

Outputs of photodetectors modulate beam of light. Proposed optical link carries analog readout signals from photodetectors in focal-plane array to external signal-processing circuitry. Insensitive to electromagnetic interference at suboptical frequencies, and imposes smaller heat load on cryogenic apparatus because it does not include high-power electronic amplifier or laser transmitter within cold chamber.

Fossum, Eric R.↗

Monitoring Weld Penetration Optically From Within Torch

Photodetector or optical fiber leading to photodetector mounted inside gas/tungsten arc welding torch to monitor arc light reflected from oscillating surface of weld pool. Proposed optical monitoring components preserve compact profile of welding torch, maintained in fixed aim at weld-pool position at end of welding torch, and protected against bumping external objects.

Smith, Matthew A.↗

Continuous Measurement Of Mass Density Of Yarn

Prototype instrument provides measurement data from which one computes mass density of strand of yarn. Includes fixtures placing known length of yarn under known tension across fixed and movable support. Transverse vibrations induced in yarn by moving movable support up and down. Source of light illuminates photodetector at midlength of yarn, and photodetector senses repeated shadowing caused by vibration of yarn through light, thereby measuring vibrations. Also used for continuous real-time monitoring of such yarn-manufacturing processes as coating or impregnation.

Hinkley, Jeffrey A.↗