Search NASA⌕ Search

SEARCH · Search NASA

Results for “reliability”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 289 records · Page 16
All sourcesNASA NTRSDOE OSTI
NASA NTRS2011

Optimized Biasing of Pump Laser Diodes in a Highly Reliable Metrology Source for Long-Duration Space Missions

Optical metrology system reliability during a prolonged space mission is often limited by the reliability of pump laser diodes. We developed a metrology laser pump module architecture that meets NASA SIM Lite instrument optical power and reliability requirements by combining the outputs of multiple single-mode pump diodes in a low-loss, high port count fiber coupler. We describe Monte-Carlo simulations used to calculate the reliability of the laser pump module and introduce a combined laser farm aging parameter that serves as a load-sharing optimization metric. Employing these tools, we select pump module architecture, operating conditions, biasing approach and perform parameter sensitivity studies to investigate the robustness of the obtained solution.

808 mm diode pumps↗
NASA NTRS2014

A General Reliability Model for Ni-BaTiO3-Based Multilayer Ceramic Capacitors

The evaluation of multilayer ceramic capacitors (MLCCs) with Ni electrode and BaTiO3 dielectric material for potential space project applications requires an in-depth understanding of their reliability. A general reliability model for Ni-BaTiO3 MLCC is developed and discussed. The model consists of three parts: a statistical distribution; an acceleration function that describes how a capacitor's reliability life responds to the external stresses, and an empirical function that defines contribution of the structural and constructional characteristics of a multilayer capacitor device, such as the number of dielectric layers N, dielectric thickness d, average grain size, and capacitor chip size A. Application examples are also discussed based on the proposed reliability model for Ni-BaTiO3 MLCCs.

statistical modeling↗
NASA NTRS2014

A General Reliability Model for Ni-BaTiO3-Based Multilayer Ceramic Capacitors

The evaluation for potential space project applications of multilayer ceramic capacitors (MLCCs) with Ni electrode and BaTiO3 dielectric material requires an in-depth understanding of the MLCCs reliability. A general reliability model for Ni-BaTiO3 MLCCs is developed and discussed in this paper. The model consists of three parts: a statistical distribution; an acceleration function that describes how a capacitors reliability life responds to external stresses; and an empirical function that defines the contribution of the structural and constructional characteristics of a multilayer capacitor device, such as the number of dielectric layers N, dielectric thickness d, average grain size r, and capacitor chip size A. Application examples are also discussed based on the proposed reliability model for Ni-BaTiO3 MLCCs.

statistical modeling↗
NASA NTRS2016

Verification of Triple Modular Redundancy (TMR) Insertion for Reliable and Trusted Systems

We propose a method for TMR insertion verification that satisfies the process for reliable and trusted systems. If a system is expected to be protected using TMR, improper insertion can jeopardize the reliability and security of the system. Due to the complexity of the verification process, there are currently no available techniques that can provide complete and reliable confirmation of TMR insertion. This manuscript addresses the challenge of confirming that TMR has been inserted without corruption of functionality and with correct application of the expected TMR topology. The proposed verification method combines the usage of existing formal analysis tools with a novel search-detect-and-verify tool. Field programmable gate array (FPGA),Triple Modular Redundancy (TMR),Verification, Trust, Reliability,

Trust↗
NASA NTRS2016

Reliable Design Versus Trust

This presentation focuses on reliability and trust for the users portion of the FPGA design flow. It is assumed that the manufacturer prior to hand-off to the user tests FPGA internal components. The objective is to present the challenges of creating reliable and trusted designs. The following will be addressed: What makes a design vulnerable to functional flaws (reliability) or attackers (trust)? What are the challenges for verifying a reliable design versus a trusted design?

Field Programmable Gate Aray (FPGA)↗
NASA NTRS2018

Large Satellite Bus Reliability

NASA is proposing to build a small space station in Cis-lunar orbit called Deep Space Gateway (DSG). At the heart of the DSG is the Power and Propulsion Element (PPE) which is conceptually similar to previously designed and operated satellite buses. A satellite bus is composed of the satellite spacecraft infrastructure minus the payload, and generally includes power, propulsion, avionics, and guidance, navigation and control. In November of 2017, five companies were awarded contracts by NASA to research PPE designs. In order to better understand the reliability of large satellite buses which may be the starting point of the PPE, NASA used Weibull analysis to evaluate spacecraft with similar masses and design life to the PPE. In addition, a subset of the large satellites which had satellite buses manufactured by any one of the five companies was also evaluated. This paper provides the results of the reliability analysis and compares the reliability of the general population of large satellites to the reliability associated with large satellite buses manufactured by the five companies currently studying PPE options.

Bus↗
NASA NTRS2019

Achieving Improved Reliability with Failure Analysis

Reliability is the ability of a product to properly function, within specified performance limits, for a specified period of time, under the life cycle application conditions. Failure analysis is a vital tool in the effort to ensure reliability of electronic products and systems throughout their product lifecycle. Today, organizations involved in activities within the electronics supply chain are facing new challenges, not just from complex assembly styles, harsher lifecycle environments, and sophisticated supply chains, but also from customers who are demanding a quicker turn-around. Unfortunately, root cause failure analysis is often performed incompletely, leading to a poor understanding of failure mechanisms and causes and, customer dissatisfaction due to recurring failures. The PDC (Professional Development Course) starts with an introduction to reliability concepts, physics of failure and an overview of failure mechanisms that affect PCBs (Printed Circuit Boards), PCBAs (Printed Circuit Board Assembly) and components. The PDC then dives into root cause hypothesizing techniques (Pareto, FMEA (Failure Modes and Effects Analysis), fishbone (Cause-And-Effect Diagram), FTA (Fault Tree Analysis)), non-destructive and destructive analysis and, materials characterization will be discussed. Numerous failure analysis case studies will be used to illustrate the techniques and analysis principles to arrive at the root cause(s) of field failures on printed circuit boards, active components, and assemblies. What Attendees will Learn: Topics include: Overview of Reliability Concepts Failure mechanisms of electronic products Root cause analysis Failure analysis techniques -Non-destructive techniques (optical, CSAM (Confocal Scanning Electron Microscopy) etc.) -Destructive analysis (DPA (Destructive Physical Analysis), Decap (Decapsulation), FIB (Focused Ion Beam) etc.) -Materials characterization (XRF (X-Ray Fluorescence) , EDS (Error Detection Sequential), TMA/DSC (Thermal Mechanical Analysis/Differential Scanning Calorimetry) etc.)

PCB quality↗
NASA NTRS2022

NASA Physics of Failure (PoF) for Reliability

An item’s reliability or longevity is dependent not only on its design but also on how it is used, manufactured, tested, and the stresses it has or will experience. Stresses include operational and environmental exposures to thermal, voltage, current, age/exposure, mechanical, and radiation mechanisms. Therefore, in reliability analysis, it is important to consider the contributions of all of these factors when predicting the failure rates of components. Historically, there has been a reliance on handbook data (e.g., MIL-HDBK-217), but experience has shown that these values and distributions are not representative of actual performance (1,2). Therefore, to make more credible reliability and risk assessments for its missions, NASA must transition to estimating likelihoods of failure based on an item’s reliability/longevity factors (or the physical susceptibilities and strengths impacting the design’s performance) has or will experience, whenever possible. To facilitate this transition a “Handbook on Methodology for Physics of Failure Based Reliability Assessments” has been developed by NASA to assist in applying physics experiences or experiment physics for empirical analysis and conceptualized physics exposures or theoretical physics for deterministic analysis, to develop and aggregate realistic likelihoods of failure leading to more credible forecasts of item performance and longevity. In addition, since it is NASA’s intention that this document continues to evolve based on community lessons learned and the introduction of new assessment methodologies, NASA is encouraging and appreciates the contributions of current and future authors to maintain and enhance this handbook and its supporting case studies.

Physics of Failure↗
NASA NTRS2024

The abcd Reliability Growth Model

This paper presents a modification of the well-known Duane-Crow reliability growth model. In the abcd reliability growth model, the initial period of exponential decline of the failure rate in the Duane-Crow model may be followed by a period of constant failure rate. Data often show that an exponential decline in failures is followed by a constant failure rate. If a growth model including only the initial period of exponential decline is applied to increasingly longer failure rate data sets, the data will include longer periods of constant failure rate, and the estimated reliability growth rate will decline from an initially high value down toward zero. Using the Duane-Crow model without extending it to include a possible period of constant failure rate may create the mistaken impression that the initial reliability growth continues forever, but at an ever decreasing rate.

Reliability growth↗
NASA NTRS2024

The abcd Reliability Growth Model

This paper presents a modification of the well-known Duane-Crow reliability growth model. In the abcd reliability growth model, the initial period of exponential decline of the failure rate in the Duane-Crow model may be followed by a period of constant failure rate. Data often show that an exponential decline in failures is followed by a constant failure rate. If a growth model including only the initial period of exponential decline is applied to increasingly longer failure rate data sets, the data will include longer periods of constant failure rate, and the estimated reliability growth rate will decline from an initially high value down toward zero. Using the Duane-Crow model without extending it to include a possible period of constant failure rate may create the mistaken impression that the initial reliability growth continues forever, but at an ever decreasing rate.

Reliability growth↗
DOE OSTI2025

ACCELERATED DEPLOYMENT OF NOVEL MATERIALS BASED ON RELIABILITY INTEGRITY MANAGEMENT USING CUMULATIVE DAMAGE MODELING

There is currently no widely agreed, detailed general method for licensing a novel plant incorporating novel materials (or materials being deployed in novel environments); in many such situations, there are no directly applicable engineering code cases for decision-makers (including regulators) to rely on. This paper discusses a framework for solving this problem that is based on the Reliability and Integrity Management (RIM) approach delineated in ASME BPVC Section XI Division 2. NRC Regulatory Guide 1.246, Rev. 0, endorses, with conditions, the subject portion of the 2019 ASME Code. The proposed framework is meant to support development of a licensing case by addressing certain remaining technical challenges. The framework discussed here is compatible with the Licensing Modernization Project, but applying it in a specific case will call for advances in the state of practice, if not the state of the art. The RIM approach calls for applicants to (a) allocate reliability targets to plant structures, systems, and components (SSCs), (b) show that they are able to relate the currently observed physical condition of each SSC in the program to its failure probability well enough to determine whether the target reliability allocations are being satisfied, allowing for uncertainty related to the novelty of the materials/designs/operating environments, and (c) be able to demonstrate that the proposed program of surveillances will reliably detect unacceptable degradation of an SSC before SSC failure occurs. A modeling approach potentially applicable to item (b), based on cumulative damage modeling rather than failure rates, is briefly illustrated.

22 - GENERAL STUDIES OF NUCLEAR REACTORS↗
DOE OSTI2026

What Technical Choices Matter to Characterize Heat Wave and Cold Snap Events in Support of Bulk Power Grid Reliability Studies?

Extreme weather events, such as Heat Waves (HW) and Cold Snaps (CS), pose significant risks to the power grid. The United States (U.S.) Federal Energy Regulatory Commission Order No. 896 mandates regional coordination standards that account for extreme thermal events. However, the lack of a universal definition for extreme thermal events may lead to inconsistent compliance efforts among neighboring entities, undermining the reliability of the transmission system. This study directly addresses this challenge by systematically evaluating how varying technical choices in defining HW and CS fundamentally impact the characterization and ranking of extreme events for power grid reliability studies. We used 12 event definitions and multiple temperature spatial aggregation approaches to construct historical (1980–2024) regional extreme thermal event libraries across North American Electric Reliability Corporation (NERC) subregions in the conterminous U.S. We examined the sensitivity of event characteristics (e.g., duration, frequency, intensity, and spatial coverage) to different definitions. While some definitions produced similar libraries and top event rankings, definitions based on moving-window-averaged temperatures yielded markedly different characteristics. Spatial aggregation methods had minimal impact on heat wave or cold snap intensity, frequency and duration but significantly influenced spatial coverage. The top events identified across different aggregation methods were consistent, but their ranking order varied. These findings offer critical insights for characterizing and selecting extreme thermal events and for supporting local and cross-regional coordination as required by reliability standards.

Wan, Heng [Pacific Northwest National Laboratory (↗
DOE OSTI2024

Pool Boiling Reliability Tests and Degradation Mechanisms of Microporous Copper Inverse Opal (CuIOs) Structures

The rising power density in electronic systems requires thermal management solutions that are both high-performing and reliable. Porous materials such as Copper Inverse Opal (CuIOs) have unique structural features, including high permeability and high thermal conductivity, to enhance pool boiling performance. However, there is little understanding of the degradation mechanism of such porous materials under pool boiling conditions. In this study, samples of 10 ..mu..m thick CuIOs with 4.8 ..mu..m diameter, covering silicon substrate of area 11 mm x 11 mm, with various heated areas ranging from 2.5 mm x 2.5 mm to 10 mm x 10 mm, were tested in 100 degrees C deionized water at a constant heat flux of 110 Wcm -2 for 3-to-7 days. The combined effect of erosion and corrosion caused structural degradation of the CuIOs. The directly heated area had the most severe degradation while the edge of the heater and the unheated area showed progressively less degradation, maintaining some CuIOs structure even after the 7-day reliability test. Among all the tested samples with various heater sizes, the 2.5 mm x 2.5 mm heater sample - in which the heater size was designed to be comparable to the water bubble characteristic length - had the largest critical heat flux (CHF) up to 300 Wcm -2 with a superheat ~ 13 degrees C. Additionally, CuIOs with a smaller heated area performed better in terms of reliability. This study offers preliminary insights into CuIOs degradation mechanisms, contributing to the development of more robust thermal management solutions. We expect that electroless plating of CuIOs with gold (Au), nickel (Ni), and atomic layer deposition (ALD) aluminum oxide (Al 2 O 3 ) in combination with appropriate application-specific coolants will further improve the reliability and lifetime of the CuIOs.

boiling-induced degradation↗
DOE OSTI2024

Day-to-day reliability of basal heart rate and short-term and ultra short-term heart rate variability assessment by the Equivital eq02+ LifeMonitor in US Army soldiers

Introduction The present study determined the (1) day-to-day reliability of basal heart rate (HR) and HR variability (HRV) measured by the Equivital eq02+ LifeMonitor and (2) agreement of ultra short-term HRV compared with short-term HRV. Methods Twenty-three active-duty US Army Soldiers (5 females, 18 males) completed two experimental visits separated by >48 hours with restrictions consistent with basal monitoring (eg, exercise, dietary), with measurements after supine rest at minutes 20–21 (ultra short-term) and minutes 20–25 (short-term). HRV was assessed as the SD of R–R intervals (SDNN) and the square root of the mean squared differences between consecutive R–R intervals (RMSSD). Results The day-to-day reliability (intraclass correlation coefficient (ICC)) using linear-mixed model approach was good for HR (0.849, 95% CI: 0.689 to 0.933) and RMSSD (ICC: 0.823, 95% CI: 0.623 to 0.920). SDNN had moderate day-to-day reliability with greater variation (ICC: 0.689, 95% CI: 0.428 to 0.858). The reliability of RMSSD was slightly improved when considering the effect of respiration (ICC: 0.821, 95% CI: 0.672 to 0.944). There was no bias for HR measured for 1 min versus 5 min (p=0.511). For 1 min measurements versus 5 min, there was a very modest mean bias of −4 ms for SDNN and −1 ms for RMSSD (p≤0.023). Conclusion When preceded by a 20 min stabilisation period using restrictions consistent with basal monitoring and measuring respiration, military personnel can rely on the eq02+ for basal HR and RMSSD monitoring but should be more cautious using SDNN. These data also support using ultra short-term measurements when following these procedures.

General & Internal Medicine↗
DOE OSTI2024

Transmission Operator Workflows for Real-Time Reliability Studies: A Review of Control Room Practices and Naturalistic Decision Making

This report provides an overview of real-time reliability study tools and their use by power system operators in the control room environment. After introducing some of the nuances of the control room environment and the differences in perspectives between power system engineers and operators, the roles and responsibilities of key entities involved in RTCA workflows are introduced. These are specifically the transmission system operator (TOP) and reliability coordinator (RC), which are required to run tools such as real-time contingency analysis (RTCA) as part of a real-time reliability assessment every 30 minutes, as dictated by a series of standards issued by the North American Electric Reliability Corporation (NERC). The process by which power systems operators operate the grid is discussed in terms of naturalistic decision making (NDM) and the recognition-primed decision-making (RPD) model. This cognitive model describe how experts working in high-risk, high-stress environments make safety-critical decisions under uncertainty and time pressure. For power system operators, the mental simulations involved in the traditional RPD model are supplemented by physics-based simulations using numerical tools, such as RTCA, to improve situational awareness and effectiveness of control actions. Next, a generic workflow is introduced to describe operator decision making for running RTCA tools and responding to system violations on a pre-contingent basis. The types of analysis performed and control actions chosen by power system operators are described in detail. The overall high-level workflow is then expanded in subsequent sections, with special attention given to high-voltage violations, low-voltage violations, and thermal overloads. Each type of violation is described in detail, with explanations of common causes, impacts on equipment and customers, and mitigation strategies. An additional workflow diagram is provided for each type of violation.

24 POWER TRANSMISSION AND DISTRIBUTION↗
DOE OSTI2025

Reliable Determination of Pulses and Pulse-Shape Instability in Ultrashort Laser Pulse Trains Using Polarization-Gating and Transient-Grating Frequency-Resolved Optical Gating Using the RANA Approach

Devices that measure the presence of instability in the pulse shapes in trains of ultrashort laser pulses do not exist, so this task necessarily falls to pulse-measurement devices, like Frequency-Resolved Optical Gating (FROG) and its variations, which have proven to be a highly reliable class of techniques for measuring stable trains of ultrashort laser pulses. Fortunately, multi-shot versions of FROG have also been shown to sensitively distinguish trains of stable from those of unstable pulse shapes by displaying readily visible systematic discrepancies between the measured and retrieved traces in the presence of unstable pulse trains. However, the effects of pulse-shape instability and algorithm stagnation can be indistinguishable, so a never-stagnating algorithm—even when instability is present—is required and is generally important. In previous work, we demonstrated that our recently introduced Retrieved-Amplitude N-grid Algorithmic (RANA) approach produces highly reliable (100%) pulse-retrieval in the second-harmonic-generation (SHG) version of FROG for thousands of sample trains of pulses with stable pulse shapes. Further, it does so even for trains of unstable pulse shapes and thus both reliably distinguishes between the two cases and provides a rough measure of the degree of instability as well as a reasonable estimate of most typical pulse parameters. Here, we perform the analogous study for the polarization-gating (PG) and transient-grating (TG) versions of FROG, which are often used for higher-energy pulse trains. We conclude that PG and TG FROG, coupled with the RANA approach, also provide reliable indicators of pulse-shape instability. In addition, for PG and TG FROG, the RANA approach provides an even better estimate of a typical pulse in an unstable pulse train than SHG FROG does, even in cases of significant pulse-shape instability.

47 OTHER INSTRUMENTATION↗
NASA NTRS1972

Reliability of the global NASCOM network.

Transmission media reliability is an extremely important factor in the design and operation of a real-time communications network. It has had a profound effect not only on the configuration design of the NASCOM network itself, but on the philosophy of command/control of all NASA spacecraft, manned and unmanned. In an effort to obtain the highest possible level of circuit reliability and performance, goals or criteria have been established for each type of circuit. Also, special management techniques have been used in an effort to improve circuit reliability. The results of these efforts, as well as general technological improvements in the transmission media, are illustrated by showing measured composite circuit reliability over the past nine years and actual circuit performance measured during Apollo 8 through 15.

Stelter, L. R.↗