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500 C Electronic Packaging and Dielectric Materials for High Temperature Applications

High-temperature environment operable sensors and electronics are required for exploring the inner solar planets and distributed control of next generation aeronautical engines. Various silicon carbide (SiC) high temperature sensors, actuators, and electronics have been demonstrated at and above 500C. A compatible packaging system is essential for long-term testing and application of high temperature electronics and sensors. High temperature passive components are also necessary for high temperature electronic systems. This talk will discuss ceramic packaging systems developed for high temperature electronics, and related testing results of SiC circuits at 500C and silicon-on-insulator (SOI) integrated circuits at temperatures beyond commercial limit facilitated by these high temperature packaging technologies. Dielectric materials for high temperature multilayers capacitors will also be discussed. High-temperature environment operable sensors and electronics are required for probing the inner solar planets and distributed control of next generation aeronautical engines. Various silicon carbide (SiC) high temperature sensors, actuators, and electronics have been demonstrated at and above 500C. A compatible packaging system is essential for long-term testing and eventual applications of high temperature electronics and sensors. High temperature passive components are also necessary for high temperature electronic systems. This talk will discuss ceramic packaging systems developed for high electronics and related testing results of SiC circuits at 500C and silicon-on-insulator (SOI) integrated circuits at temperatures beyond commercial limit facilitated by high temperature packaging technologies. Dielectric materials for high temperature multilayers capacitors will also be discussed.

dielectric performance↗

Passive Temperature Sensors for Nuclear Applications

Thermocouples are generally used to provide real-time temperature indications in instrumented tests performed at material and test reactors. Passive temperature monitors, such as Silicon Carbide (SiC) and melt wires, may be included in such tests as an independent technique of detecting peak temperatures experienced during irradiation. In less expensive static (drop-in) capsule tests, which have no leads attached for real-time data transmission, melt wires, and SiC temperature monitors (TMs) are essentially the only possibility for peak temperature indication. A melt wire involves placing materials (wires) of a known composition and melting temperature in a test. An inventory is maintained at Material Science Laboratory (MSL) for melt wires ranging in temperatures from 30°C to 1500°C. Unfortunately, melt wires are limited in that it can only detect whether a single temperature is or is not exceeded (melt wire melted or not). SiC TMs, which can also be used to detect peak irradiation temperatures, are advantageous because a single monitor can allow to determine the peak temperature reached within a relatively broad range (100 – 1200°C) resulting in accuracies within ±20°C. Irradiation temperature is determined by measuring a property change after isochronal annealing or during a continuously monitored annealing process using specialized equipment at MSL. Recent research has produced a passive monitor known as sublime temperature monitor. This passive sensor has the capability of recording temperature gradients and pinpointing exactly where a temperature is located along that gradient. Long measurement lengths are achieved with very high accuracy in the location of desired temperature measurements (±2 mm over a 1 m span); however, this sensor has not been deployed in a nuclear reactor. This article will focus only on passive temperature sensors currently being researched and implemented under the Advanced Sensors and Instrumentation (ASI) program at Idaho National Laboratory (INL).

11 - NUCLEAR FUEL CYCLE AND FUEL MATERIALS↗

Ice surface temperature retrieval from AVHRR, ATSR, and passive microwave satellite data: Algorithm development and application

One essential parameter used in the estimation of radiative and turbulent heat fluxes from satellite data is surface temperature. Sea and land surface temperature (SST and LST) retrieval algorithms that utilize the thermal infrared portion of the spectrum have been developed, with the degree of success dependent primarily upon the variability of the surface and atmospheric characteristics. However, little effort has been directed to the retrieval of the sea ice surface temperature (IST) in the Arctic and Antarctic pack ice or the ice sheet surface temperature over Antarctica and Greenland. The reason is not one of methodology, but rather our limited knowledge of atmospheric temperature, humidity, and aerosol vertical, spatial and temporal distributions, the microphysical properties of polar clouds, and the spectral characteristics of snow, ice, and water surfaces. Over the open ocean the surface is warm, dark, and relatively homogeneous. This makes SST retrieval, including cloud clearing, a fairly straightforward task. Over the ice, however, the surface within a single satellite pixel is likely to be highly heterogeneous, a mixture of ice of various thicknesses, open water, and snow cover in the case of sea ice. Additionally, the Arctic is cloudy - very cloudy - with typical cloud cover amounts ranging from 60-90 percent. There are few observations of cloud cover amounts over Antarctica. The goal of this research is to increase our knowledge of surface temperature patterns and magnitudes in both polar regions, by examining existing data and improving our ability to use satellite data as a monitoring tool. Four instruments are of interest in this study: the AVHRR, ATSR, SMMR, and SSM/I. Our objectives are as follows. Refine the existing AVHRR retrieval algorithm defined in Key and Haefliger (1992; hereafter KH92) and applied elsewhere. Develop a method for IST retrieval from ATSR data similar to the one used for SST. Further investigate the possibility of estimating surface temperature from passive microwave data (in conjunction with AVHRR clear sky samples) through the use of 'effective emissivities' and physical relationships between skin temperature and subsurface temperature. Use the general method outlined in MK93 to calculate a 12-year record of clear sky equivalent surface temperatures, or possibly all-sky snow-ice interface physical temperatures, from SMMR and SSM/I, compare these temperatures to climatologies, ECMWF modeled surface temperatures, and surface temperatures predicted by a 2-D ice model. And intercompare several ice surface retrieval methods and validate them against ground measurements from the Swiss Camp on the Greenland ice sheet. Additionally, we intend to develop a surface temperature product based on AVHRR data and possibly blended with drifting buoy and meteorological station temperatures.

Key, Jeff↗

Temperature prediction of space flight experiments by computer thermal analysis

Life sciences experiments are especially sensitive to temperature. A small temperature difference between otherwise identical samples can cause various differences in biological reaction rates. Knowledge of experimental temperatures and temperature histories help to distinguish the effects of microgravity and temperature on spaceflight experiments compared to ground based studies, and allow appropriate controls and sensitivity tests. Up to the present time, the Orbiter (Space Shuttle) has not generally provided temperature measurement instrumentation inside ambient lockers located in the Mid-deck of the Orbiter, or inside similar facilities such as Spacehab and Spacelab, but many pieces of hardware do have temperature recording capability. Most of these temperatures, however, have only been roughly measured or estimated. Such reported experimental temperatures, while accurate within a range of several degrees Celsius, are of limited utility to biological researchers. The temperature controlled lockers used in spaceflight, such as Commerical-Refrigeration Incubation Modules (C-R/IMs), severely reduce the mass and volume available for test samples and do not necessarily provide uniform thermal environments. While these test carriers avoid some of the experimental temperature variations of the ambient lockers, the number of samples which can be accommodated in these temperature controlled units is limited. In the present work, improved models of thermal prediction and control were sought. Temperatures are predicted by thermal analysis software using empirical temperatures recorded during STS-57. These temperatures are compared to data recorded throughout the mission using Ambient Temperature Recorders (ATRs) located within several payload lockers. Additional test cases are undertaken using controlled ground experiments to more precisely determine the reliability of the thermal model. The approach presented should increase the utility of various spaceflight carriers in the support of biological and material science research and ground control studies done in preparation for flight.

Birdsong, M. B.↗

High Frequency Low Amplitude Temperature Oscillations in Loop Heat Pipe Operation

The operating temperature of a loop heat pipe (LHP) with a single evaporator is governed by the compensation chamber (CC) temperature, which in turn is a finction of the evaporator power, condenser sink temperature, and ambient temperature. As the operating condition changes, the CC temperature will change during the transient but eventually reach a new steady temperature. Under certain conditions, however, the LHP never really reaches a true steady state, but instead displays an oscillatory behavior. This paper presents a study on the oscillation of the loop operating temperature with amplitudes on the order of one degree Kelvin and frequencies on the order of 10(exp -1) to 10(exp -2) Hertz. The source of the high frequency temperature oscillation is the fast movement of the vapor front in the condenser section, which usually occurs when the vapor front is near the condenser inlet or the condenser outlet. At these locations, the vapor front is unable to find a stable position for the given operating conditions, and will move back and forth. The movement of the vapor front causes the movement of the liquid in the condenser and the liquid line, leading to oscillations of the CC and the loop temperatures. Factors that affect the vapor front movement include evaporator power, condenser sink temperature, body forces and whether or the CC temperature is actively controlled. As long as there are no large thermal masses attached to the evaporator, the loop can self adjust rather quickly and the vapor front will move rapidly around the condenser inlet or outlet, leading to high frequency temperature oscillations. The amplitude of temperature oscillation is usually the largest in the liquid line, up to 20 degrees Kelvin in many cases, but diminishes to less than one degree Kelvin in the CC. Furthermore, the high frequency temperature oscillation can occur at any CC temperature when the right combination of the evaporator power and condenser sink temperature prevails.

Ku, Jentung↗

Flexible Cryogenic Temperature and Liquid-Level Probes

Lightweight, flexible probes have been developed for measuring temperatures at multiple locations in tanks that contain possibly pressurized cryogenic fluids. If the fluid in a given tank is subcritical (that is, if it consists of a liquid and its vapor), then in one of two modes of operation, the temperature measurements made by a probe of this type can be used to deduce the approximate level of the liquid. The temperature sensors are silicon diodes located at intervals along a probe. If the probe is to be used to measure a temperature gradient along a given axis in the tank, then the probe must be mounted along that axis. In the non-liquid-level-sensing temperature-measurement mode, a constant small electric current is applied to each diode and the voltage across the diode . a known function of the current and temperature . is measured as an indication of its temperature. For the purpose of this measurement, "small electric current" signifies a current that is not large enough to cause a significant increase in the measured temperature. More specifically, the probe design calls for a current of 10 A, which, in the cryogenic temperature range of interest, generates heat at a rate of only about 0.01 mW per diode. In the liquid-level-sensing mode, one applies a larger current (30 mA) to each diode so as to heat each diode appreciably (with a power of about 36 mW in the temperature range of interest). Because the liquid cools the diode faster than does the vapor, the temperature of the diode is less when diode is immersed in the liquid than when it is above the surface of the liquid. Thus, the temperature (voltage) reading from each diode can be used to determine whether the liquid level is above or below the diode, and one can deduce that the liquid level lies between two adjacent diodes, the lower one of which reads a significantly lower temperature. The aforementioned techniques for measuring temperature and deducing liquid level are not new. What is new here are the designs of the probes and of associated external electronic circuitry. In each probe, the diodes and the lead wires are embedded in a strong, lightweight, flexible polyimide strip. Each probe is constructed as an integral unit that includes a multipin input/output plug or socket for solderless connection of the lead wires to the external circuitry. The polyimide strip includes mounting tabs with holes that can accommodate rivets, screws, or other fasteners. Alternatively, a probe can be mounted by use of an epoxy. A probe can be manufactured to almost any length or width, and the diodes can be embedded at almost any desired locations along and across the polyimide strip. In designing a probe for a specific application, one seeks a compromise between (1) minimizing the number of diodes in order to minimize the complexity of input/output connections and external electronic circuitry while (2) using enough diodes to obtain the required precision. Optionally, to minimize spurious heating of the cryogenic fluid, the external circuitry can be designed to apply power to the probe only during brief measurement intervals. Assuming that the external circuitry is maintained at a steady temperature, a power-on interval of only a few seconds is sufficient to obtain accurate data on temperatures and/or the height of the liquid/vapor interface.

Haberbusch, Mark↗

Operation of SOI P-Channel Field Effect Transistors, CHT-PMOS30, under Extreme Temperatures

Electronic systems are required to operate under extreme temperatures in NASA planetary exploration and deep space missions. Electronics on-board spacecraft must also tolerate thermal cycling between extreme temperatures. Thermal management means are usually included in today s spacecraft systems to provide adequate temperature for proper operation of the electronics. These measures, which may include heating elements, heat pipes, radiators, etc., however add to the complexity in the design of the system, increases its cost and weight, and affects its performance and reliability. Electronic parts and circuits capable of withstanding and operating under extreme temperatures would reflect in improvement in system s efficiency, reducing cost, and improving overall reliability. Semiconductor chips based on silicon-on-insulator (SOI) technology are designed mainly for high temperature applications and find extensive use in terrestrial well-logging fields. Their inherent design offers advantages over silicon devices in terms of reduced leakage currents, less power consumption, faster switching speeds, and good radiation tolerance. Little is known, however, about their performance at cryogenic temperatures and under wide thermal swings. Experimental investigation on the operation of SOI, N-channel field effect transistors under wide temperature range was reported earlier [1]. This work examines the performance of P-channel devices of these SOI transistors. The electronic part investigated in this work comprised of a Cissoid s CHT-PMOS30, high temperature P-channel MOSFET (metal-oxide semiconductor field-effect transistor) device [2]. This high voltage, medium-power transistor is designed for geothermal well logging applications, aerospace and avionics, and automotive industry, and is specified for operation in the temperature range of -55 C to +225 C. Table I shows some specifications of this transistor [2]. The CHT-PMOS30 device was characterized at various temperatures over the range of -190 C to +225 C in terms of its voltage/current characteristic curves. The test temperatures included +22, -50, -100, -150, -175, -190, +50, +100, +150, +175, +200, and +225 C. Limited thermal cycling testing was also performed on the device. These tests consisted of subjecting the transistor to a total of twelve thermal cycles between -190 C and +225 C. A temperature rate of change of 10 C/min and a soak time at the test temperature of 10 minutes were used throughout this work. Post-cycling measurements were also performed at selected temperatures. In addition, re-start capability at extreme temperatures, i.e. power switched on while the device was soaking for a period of 20 minutes at the test temperatures of -190 C and +225 C, was investigated.

Patterson, Richard↗

Flexible Cryogenic Temperature and Liquid-Level Probes

Lightweight, flexible probes have been developed for measuring temperatures at multiple locations in tanks that contain possibly pressurized cryogenic fluids. If the fluid in a given tank is subcritical (that is, if it consists of a liquid and its vapor), then in one of two modes of operation, the temperature measurements made by a probe of this type can be used to deduce the approximate level of the liquid. The temperature sensors are silicon diodes located at intervals along a probe. If the probe is to be used to measure a temperature gradient along a given axis in the tank, then the probe must be mounted along that axis. In the temperature-measurement mode, a constant small electric current is applied to each diode and the voltage across the diode a known function of the current and temperature is measured as an indication of its temperature. For the purpose of this measurement, small electric current signifies a current that is not large enough to cause a significant increase in the measured temperature. More specifically, the probe design calls for a current of 10 A, which, in the cryogenic temperature range of interest, generates heat at a rate of only about 0.01 mW per diode. In the liquid-level-sensing mode, one applies a larger current (30 mA) to each diode so as to heat each diode appreciably (with a power of about 36 mW in the temperature range of interest). Because the liquid cools the diode faster than does the vapor, the temperature of the diode is less when the diode is immersed in the liquid than when it is above the surface of the liquid. Thus, the temperature (voltage) reading from each diode can be used to determine whether the liquid level is above or below the diode, and one can deduce that the liquid level lies between two adjacent diodes, the lower one of which reads a significantly lower temperature. The aforementioned techniques for measuring temperature and deducing liquid level are not new. What is new here are the designs of the probes and of associated external electronic circuitry. In each probe, the diodes and the lead wires are embedded in a strong, lightweight, flexible polyimide strip. Each probe is constructed as an integral unit that includes a multipin input/output plug or socket for solderless connection of the lead wires to the external circuitry. The polyimide strip includes mounting tabs with holes that can accommodate rivets, screws, or other fasteners. Alternatively, a probe can be mounted by use of an epoxy. A probe can be manufactured to almost any length or width, and the diodes can be embedded at almost any desired location along and across the polyimide strip. In designing a probe for a specific application, one seeks a compromise between (1) minimizing the number of diodes in order to minimize the complexity of input/output connections and external electronic circuitry while (2) using enough diodes to obtain the required precision. Optionally, to minimize spurious heating of the cryogenic fluid, the external circuitry can be designed to apply power to the probe only during brief measurement intervals. Assuming that the external circuitry is maintained at a steady temperature, a power-on interval of only a few seconds is sufficient to obtain accurate data on temperatures and/or the height of the liquid/vapor interface.

Haberbusch, Mark↗

Magnetic Properties of Fe-49Co-2V Alloy and Pure Fe at Room and Elevated Temperatures

The National Aeronautics and Space Administration (NASA) has a need for soft magnetic materials for fission power and ion propulsion systems. In this work the magnetic properties of the soft magnetic materials Hiperco 50 (Fe-49wt%Cr-2V) and CMI-C (commercially pure magnetic iron) were examined at various temperatures up to 600 C. Toroidal Hiperco 50 samples were made from stacks of 0.35 mm thick sheet, toroidal CMI-C specimens were machined out of solid bar stock, and both were heat treated prior to testing. The magnetic properties of a Hiperco 50 sample were measured at various temperatures up to 600 C and then again after returning to room temperature; the magnetic properties of CMI-C were tested at temperatures up to 400 C. For Hiperco 50 coercivity decreased as temperature increased, and remained low upon returning to room temperature; maximum permeability improved (increased) with increasing temperature and was dramatically improved upon returning to room temperature; remanence was not significantly affected by temperature; flux density at H = 0.1 kA/m increased slightly with increasing temperature, and was about 20% higher upon returning to room temperature; flux density at H = 0.5 kA/m was insensitive to temperature. It appears that the properties of Hiperco 50 improved with increasing temperature due to grain growth. There was no significant magnetic property difference between annealed and aged CMI-C iron material; permeability tended to decrease with increasing temperature; the approximate decline in the permeability at 400 C compared to room temperature was 30%; saturation flux density, B(sub S), was approximately equal for all temperatures below 400 C; B(sub S) was lower at 400 C.

De Groh, Henry C., III↗

The Effect of Temperature on the Preservation of Volatile-Rich Lunar Samples

Introduction. The Moon’s south pole is a high-priority target for human exploration and scientific study. This interest is, in part, due to the presence of Permanently Shadowed Regions (PSRs), which could contain high concentrations of unique volatiles at cryogenic temperatures [1]. Returned samples from PSRs may include a unique combination of rocks, regolith, and volatile species, providing unprecedented insights into the history of the Solar System and the potential for resource utilization on the Moon. However, because PSR samples are cryogenic up-on collection, lunar polar sample return will eventually require cold stowage for the journey from the Moon to Earth. Without cold stowage, PSR sample return will likely result in phase changes and chemical reactions within the volatile component of the sample, which would negatively impact the resulting scientific studies of those samples. This abstract summarizes the initial results from an ongoing characterization of analog PSR samples at a range of temperatures, with the goal of defining the temperatures needed for a flight cold stowage freezer. Background. Based on remote sensing observations of the Moon [2], south polar PSRs range in temperature from ~120K for small and/or shallow PSRs to ~20K at the most extreme locations in large, deep PSRs. A range of volatiles have been hypothesized to exist at the surface or subsurface of the lunar poles [3-5 and others]. This hypothesis was verified when the LCROSS mission impacted the <50-K PSR in the crater Cabeus, detecting a range of volatiles from water to low condensation temperature species such as H2S and methane [6]. Species such as H2S and ammonia (also detected by LCROSS) are also highly reactive, and increase the likelihood of chemical reactions at elevated (non-cryogenic) temperatures. At the Johnson Space Center’s Planetary Exploration and Astromaterials Research Laboratory (JSC-PEARL), we have developed a volatile-bearing lunar simulant that incorporates several of the species detected by LCROSS [Table 1] mixed cryogenically with the USGS Lunar Highlands Type (LHT) regolith simulant. The new volatile-regolith simulant will be used to assess the degree of sample alteration at room temperature, -20°C, -80°C, and -196°C (liquid nitro-gen), over a two-week period. Room temperature samples represent those likely to be returned during initial missions without cold stowage, -20°C provides an analog to Apollo cold curated samples, -80°C is the temperature of multiple flight payload freezers (e.g., MELFI), and -196°C is analogous to lunar PSRs. Two weeks is an approximation of the time between sample collection and Earth return for initial Artemis missions. Over this period of time, sample head-space gases will be analyzed using a Universal Gas Analyzer (UGA, a type of mass spectrometer) coupled with a Baratron pressure sensor. After testing, the regolith component of the simulant will be purged of volatiles and preserved for future electron beam and/or FTIR analysis. Experimental Procedure. Volatile-regolith simulants will be produced as an initial homogenous batch; this batch will then be distributed into aliquots (gas chromatography/GC vials or cryo vials), ensuring that each sample has the same starting composition and conditions [Fig. 1]. In addition to the “full” simulant shown in Table 1, less complex simulant compositions will be used as baseline and control samples [Table 2]. Aliquots will be produced in triplicate for each simulant composition, storage temperature, and date of sampling. Headspace gases in all Day 0 samples will be analyzed by the UGA immediately. Cold storage samples for future analytical days will be placed in freezers appropriate to their target temperatures (-20°C, -80°C, -196°C). For ambient-temperature samples, regolith and regolith-water samples will be stored in a fume hood, while the full simulant will be stored in a sealed Parr vessel for safety; no other simulants (RWCM/ RWCM+) will be stored at ambient temperature for this test. Samples will be analyzed by UGA in this manner on each Analysis Day outlined in Table 2. Analytical Data. The UGA measures the partial pressures in a single sample aliquot over a set mass range of 0-105 atomic mass units (AMU) [Figure 2]; this set range was selected to slightly exceed the mass of the highest-mass expected reaction product (H2SO4). The Baratron complements the UGA by measuring the total pressure in the headspace of a sample vial. Coupled together, the quantitative abundances of gases will be monitored throughout the test. UGA analyses of the triplicate samples for each storage temperature, day, and simulant composition will be averaged, and standard deviations for each will be calculated. The compositions of starting species (shown in Table 1) will be characterized as a function of time, and the presence of any new compounds (reaction products) will be monitored as well. Total pressures will be recorded for each sample analysis, and any samples that show signs of leakage (e.g., a significant reduction in pressure or simulant volatiles) will be discarded. Anticipated Results. Testing is planned to begin in January 2022. The resulting data will allow compositional and phase changes in the volatile component of the simulants to be determined. Both the reduction in initial compounds and the addition of reaction products are expected to be observed. In addition, the relative efficacy of the different temperatures at pre-serving the initial composition of the simulants will be quantified. Finally, the regolith component of each sample will be argon-purged and stored in a controlled environment for future laboratory analysis. Compositional and morphological changes in the regolith are expected for samples above 0°C. This test will be repeated three times over the course of 2022. Understanding the effect of temperature on both the volatile and regolith components of analog lunar materials will allow requirements for a cold stowage freezer to be developed. The implementation of cold stowage for lunar polar missions will maximize the preservation of returned samples, enabling ground-breaking lunar and Solar System volatiles science for decades to come.

J L Mitchell↗

Development of Luminescence Lifetime-Based Surface Temperature Mapping for Environmental Barrier Coatings

Luminescence lifetime-based temperature mapping for thermal barrier coatings (TBCs) has been previously demonstrated up to temperatures approaching 1200 °C. Advantages of this method include insensitivities to reflected radiation and emissivity uncertainties. Because of a push towards greater efficiency turbine engine operation using higher turbine inlet temperatures, there is an ongoing movement from TBC-coated superalloy turbine engine components to SiC/SiC ceramic matrix composite components protected by environmental barrier coatings (EBCs). The useful application of luminescence lifetime-based temperature mapping to EBCs requires a significant increase in high temperature capability from below 1200 °C up into the 1300 to 1500 °C temperature range where the much higher background thermal radiation is a challenging issue. In addition, the luminescing sensing layer must exhibit thermochemical compatibility with the EBC. To meet these requirements, Er-doped Y 2 SiO 5 was selected as the luminescing sensor layer material both for its enhanced temperature sensitivity above 1300 °C and its compatibility with rare-earth disilicate EBC topcoats. Both localized spot temperature measurements as well as luminescence lifetime imaging-based temperature mapping were demonstrated up to 1560 °C for Er-doped Y 2 SiO 5 disks. In addition, temperature mapping capability was demonstrated from a 15 µm thick Er-doped Y 2 SiO 5 layer at the surface of a Sc 2 Si 2 O 7 based EBC topcoat. Both localized spot and temperature mapping by luminescence lifetime imaging were demonstrated up to 1380 °C (upper temperature limit of this slurry-based layered EBC) with excellent suppression of background thermal radiation and no degradation of the Er-doped Y 2 SiO 5 temperature sensing surface layer. The source of the novel enhanced temperature sensitivity above 1300 °C will be discussed as well as a path towards compatibility between sensing layer and EBC topcoat to higher temperatures.

temperature measurement↗

Deformation mechanisms of NiAl cyclicly deformed near the brittle-to-ductile transformation temperature

One of the ongoing challenges of the aerospace industry is to develop more efficient turbine engines. Greater efficiency entails reduced specific strength and larger temperature gradients, the latter of which means higher operating temperatures and increased thermal conductivity. Continued development of nickel-based superalloys has provided steady increases in engine efficiency and the limits of superalloys have probably not been realized. However, other material systems are under intense investigation for possible use in high temperature engines. Ceramic, intermetallic, and various composite systems are being explored in an effort to exploit the much higher melting temperatures of these systems. NiAl is considered a potential alternative to conventional superalloys due to its excellent oxidation resistance, low density, and high melting temperature. The fact that NiAl is the most common coating for current superalloy turbine blades is a tribute to its oxidation resistance. Its density is one-third that of typical superalloys and in most temperature ranges its thermal conductivity is twice that of common superalloys. Despite these many advantages, NiAl requires more investigation before it is ready to be used in engines. Binary NiAl in general has poor high-temperature strength and low-temperature ductility. On-going research in alloy design continues to make improvements in the high-temperature strength of NiAl. The factors controlling low temperature ductility have been identified in the last few years. Small, but reproducible ductility can now be achieved at room temperature through careful control of chemical purity and processing. But the mechanisms controlling the transition from brittle to ductile behavior are not fully understood. Research in the area of fatigue deformation can aid the development of the NiAl system in two ways. Fatigue properties must be documented and optimized before NiAl can be applied to engineering systems. More importantly though, probing the deformation mechanisms operating in fatigue will lead to a better understanding of NiAl's unique characteristics. Low cycle fatigue properties have been reported on binary NiAl in the past year, yet those studies were limited to two temperature ranges: room temperature and near 1000 K. Eventually, fatigue property data will be needed for a wide range of temperatures and compositions. The intermediate temperature range near the brittle-to-ductile transition was chosen for this study to ascertain whether the sharp change occurring in monotonic behavior also occurs under cyclic conditions. An effort was made to characterize the dislocation structures which evolved during fatigue testing and comment on their role in the deformation process.

Antolovich, Stephen D.↗

Determination of plasma temperatures and luminosities using multiple extreme-ultraviolet and X-ray filters

We carefully examine the techniques used to infer temperatures of stellar coronal plasmas from the count rates of several broadband instruments in the X-ray and extreme-ultraviolet spectral ranges. In particular, we determine to what extent temperatures can be constrained and the corresponding uncertainties in the luminosities and emission measures lowered by fitting simultaneously count rates from the Einstein imaging proportional counter (IPC), the ROSAT Position Sensitive Proportional Counter (PSPC), the ROSAT Wide Field Camera (WFC) (both filters), and the EXOSAT Low Energy Telescope (LET) with the 3-Lex filter. We use published plasma emissivities with solar photospheric abundances. Since it has been found that single-temperature plasmas do not fit IPC data well, we assume a two-temperature plasma model. We find that, even with count rates from all of the above filters and overly optimistic error estimates, it is still not possible to determine a unique two-temperature solution. However, since the use of count rates from many filters can reduce substantially the number of possible solutions, temperature solutions determined by other means can be tested. We carry out such an analysis on a set of 18 nearby late-type stars to determine possible two-temperature solutions using multifilter photometry, and we compare these results with the temperature solutions derived by Schmitt et al. (1990) using IPC spectral data. In general, the two-temperature fits derived from the IPC spectral data are inconsistent with our results, with our data implying that, for many stars, the two temperatures derived by the IPC may be too low by about a factor of 2. The EXOSAT transmission grating Spectrometer (TGS) spectra of capella and sigma(exp 2) CrB support this conclusion. For Procyon and 70 Oph, though, the presence of a temperature component cooler than a million degress (not detected by the IPC) is deduced. While our analysis suggests the existence of more than one temperature in the coronae of late-type stars, in many instances our WFC data appear to be inconsistent with the presence of significant emission measure over a broad temperature distribution. This, together with the success of two-temperature plasmas in fitting IPC and TGS data, implies that for many stars, the coronal emission measure distribution may in fact be dominated by two distinct temperature regimes.

Wood, Brian E.↗

Apparatus and Method for Measuring Air Temperature Ahead of an Aircraft for Controlling a Variable Inlet/Engine Assembly

The apparatus and method employ remote sensing to measure the air temperature a sufficient distance ahead of the aircraft to allow time for a variable inlet/engine assembly to be reconfigured in response to the measured temperature, to avoid inlet unstart and/or engine compressor stall. In one embodiment, the apparatus of the invention has a remote sensor for measuring at least one air temperature ahead of the vehicle and an inlet control system for varying the inlet. The remote sensor determines a change in temperature value using at least one temperature measurement and prior temperature measurements corresponding to the location of the aircraft. The control system uses the change in air temperature value to vary the inlet configuration to maintain the position of the shock wave during the arrival of the measured air in the inlet. In one embodiment, the method of the invention includes measuring at least one air temperature ahead of the vehicle, determining an air temperature at the vehicle from prior air temperature measurements, determining a change in temperature value using the air temperature at the vehicle and the at least one air temperature measurement ahead of the vehicle, and using the change in temperature value to-reposition the airflow inlet, to cause the shock wave to maintain substantially the same position within the inlet as the airflow temperature changes within the inlet.

Gary, Bruce L.↗

Loop Heat Pipe Operation Using Heat Source Temperature for Set Point Control

The LHP operating temperature is governed by the saturation temperature of its reservoir. Controlling the reservoir saturation temperature is commonly accomplished by cold biasing the reservoir and using electrical heaters to provide the required control power. Using this method, the loop operating temperature can be controlled within +/- 0.5K. However, because of the thermal resistance that exists between the heat source and the LHP evaporator, the heat source temperature will vary with its heat output even if LHP operating temperature is kept constant. Since maintaining a constant heat source temperature is of most interest, a question often raised is whether the heat source temperature can be used for LHP set point temperature control. A test program with a miniature LHP has been carried out to investigate the effects on the LHP operation when the control temperature sensor is placed on the heat source instead of the reservoir. In these tests, the LHP reservoir is cold-biased and is heated by a control heater. Tests results show that it is feasible to use the heat source temperature for feedback control of the LHP operation. Using this method, the heat source temperature can be maintained within a tight range for moderate and high powers. At low powers, however, temperature oscillations may occur due to interactions among the reservoir control heater power, the heat source mass, and the heat output from the heat source. In addition, the heat source temperature could temporarily deviate from its set point during fast thermal transients. The implication is that more sophisticated feedback control algorithms need to be implemented for LHP transient operation when the heat source temperature is used for feedback control.

Ku, Jentung↗

Climate Change: A New Metric to Measure Changes in the Frequency of Extreme Temperatures using Record Data

Consensus on global warming is the result of multiple and varying lines of evidence, and one key ramification is the increase in frequency of extreme climate events including record high temperatures. Here we develop a metric- called "record equivalent draws" (RED)-based on record high (low) temperature observations, and show that changes in RED approximate changes in the likelihood of extreme high (low) temperatures. Since we also show that this metric is independent of the specifics of the underlying temperature distributions, RED estimates can be aggregated across different climates to provide a genuinely global assessment of climate change. Using data on monthly average temperatures across the global landmass we find that the frequency of extreme high temperatures increased 10-fold between the first three decades of the last century (1900-1929) and the most recent decade (1999-2008). A more disaggregated analysis shows that the increase in frequency of extreme high temperatures is greater in the tropics than in higher latitudes, a pattern that is not indicated by changes in mean temperature. Our RED estimates also suggest concurrent increases in the frequency of both extreme high and extreme low temperatures during 2002-2008, a period when we observe a plateauing of global mean temperature. Using daily extreme temperature observations, we find that the frequency of extreme high temperatures is greater in the daily minimum temperature time-series compared to the daily maximum temperature time-series. There is no such observable difference in the frequency of extreme low temperatures between the daily minimum and daily maximum.

Munasinghe, L.↗

Active Control of the Operating Temperature in a Loop Heat Pipe with Two Evaporators and Two Condensers

The operating temperature of a loop heat pipe (LHP) with multiple evaporators is a function of the total heat load, heat load distribution among evaporators, condenser temperature and ambient temperature. Because of the many variables involved, the operating temperature also showed more hystereses than an LHP with a single evaporator. Tight temperature control can be achieved by controlling its compensation chamber (CC) temperatures at the desired set point. This paper describes a test program on active control of the operating temperature in an LHP with two evaporators and two condensers. Temperature control was achieved by heating one or both CC's. Tests performed included start-up, power cycle, sink temperature cycle, CC temperature cycle, and capillary limit. Test results show that, regardless one or two CC's were heated to the set point temperature, one of CC's was always flooded with liquid. The loop could operate successfully at the desired set point temperature under most conditions, including some fast transients. At low heat loads, however, the CC temperature could suddenly increase above the set point temperature, possibly due to a sudden change of the vapor content inside the evaporator core.

Ku, Jentung↗

High-Temperature Probe Station Developed to Characterize Microwave Devices Through 500 C

A photograph and a block diagram of the high-temperature probe station are shown. The system consists of the ceramic heater mounted on a NASA shuttle tile insulator, a direct current power supply, a personal-computer-based data acquisition and temperature controller, microwave probes, a microscope, and a network analyzer. The ability to perform microwave tests at high temperatures is becoming necessary. There is now a need for sensors and communication circuits that can operate at 500 C and above for aircraft engine development and monitoring during flight. To address this need, researchers have fabricated devices using wide bandgap semiconductors such as SiC with targeted operating temperatures of 500 to 600 C. However, the microwave properties of these devices often change drastically with temperature, so any designs that are intended to be used in such an environment must be characterized at high temperatures. For some reliability, lifetime, and direct-current testing, the device under test can be packaged and characterized in an oven. However, for RF and microwave measurements, it is usually not possible to establish a calibrated reference plane at the device terminals within a package. In addition, the characteristics of the package would vary over a 500 C temperature range, and this would have to be accounted for when the data were analyzed. A high temperature probe station allows circuits and devices to be characterized through on wafer measurements across a broad temperature range with known reference plane. The conventional, commercially available thermal wafer-probe stations that are used to evaluate microwave devices across a controlled temperature range have a typical upper limit of 200 C. Standalone thermal heating chucks are available with an extended upper temperature range of 300 to 400 C. To effectively characterize devices at temperatures up to and surpassing 500 C, Glenn researchers developed a custom probe station. In the past, custom probe stations have been developed to test devices under other extreme environments, such as cryogenic temperatures as low as 37 K. Similarly, this custom probe station was specifically modified for high-temperature use. It allows devices to be measured quickly and flexibly, without the use of wire bonds and test fixtures. The probe station is shown making scattering parameter measurements from 1 to 50 GHz with a Hewlett-Packard 8510C Network Analyzer. There is a half-wafer of silicon directly on top of the heater to provide a uniform heated platform for our sample. A quarter wafer of silicon carbide forms the substrate for our test circuit of several transmission lines.

Downey, Alan N.↗