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At least 307 records · Page 17

Chromatic interferometry with small frequency differences

By developing a ‘two-crystal’ method for color erasure, we can broaden the scope of chromatic interferometry to include optical photons whose frequency difference falls outside of the 400 nm to 4500 nm wavelength range, which is the passband of a PPLN crystal. We demonstrate this possibility experimentally, by observing interference patterns between sources at 1064.4 nm and 1063.6 nm, corresponding to a frequency difference of about 200 GHz.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗

Microwave–photonic low-coherence interferometry for dark zone free distributed optical fiber sensing

A microwave–photonic low-coherence interferometry (MPLCI) system is proposed for fully distributed optical fiber sensing. Assisted by an unbalanced Michelson interferometer, a low-coherence laser source is used to interrogate cascaded Fabry–Perot interferometers along with an optical fiber for a dark zone free (or spatially continuous) distributed measurement. Here, by combining the advantages of microwaves and photonics, the MPLCI system can synergistically achieve high sensitivity and high spatial resolution. Our tests have confirmed a strain resolution of 95 nε at the spatial resolution of 10 cm.

42 ENGINEERING↗

Two-step retrace error calibration removing tilt ambiguity in coherence scanning interferometry

In interferometry measurement, the retrace error often limits its high-precision metrology applications. Retrace error calibration with tilted flats can give a relation between the retrace error and the introduced tilt angles, but there is still an ambiguity between the introduced tilt angles and the tilt terms in the created retrace error. Here, we propose a novel, to the best of our knowledge, two-step calibration method to resolve this tilt ambiguity. It involves additional measurements of spherical mirror(s) with known curvature(s). The experiment shows that the curvature deviation due to the tilt ambiguity can be significantly reduced after applying the proposed method.

36 MATERIALS SCIENCE↗

Double grating shearing interferometry for X-ray free-electron laser beams

The advancements in bright and coherent X-ray free-electron lasers (XFEL) have in the last decade revolutionized diverse fields of study, leading to an ever-increasing demand in more intense X-ray pulses. The accurate knowledge of the wavefront and the focal profile of such pulses ultimately dictates much of the experimental outcome.Herewe present a singleshot shearing interferometry method to measure the wavefront of a focused hardXFELpulse.Twoidentical transmission gratings are placed near the focus, and the interference pattern of overlapping diffraction orders is analyzed, resulting in a two-dimensional reconstruction of the X-ray wavefront. The spatial resolution and wavefront sensitivity can be tuned insitu during the measurement. The method is non-invasive (i.e., the zeroth order or transmitted pulse is not modified in intensity or profile), allowing for either a simultaneous intensity measurement at high resolution or a fully characterized transmitted pulse for general experimental use.

47 OTHER INSTRUMENTATION↗

Spectral interferometry-based microwave-frequency vibrometry for integrated acoustic wave devices

Microwave phononics is a promising platform for sensing, computing, and quantum information science; thus, sensitive and high-throughput characterization tools are needed not only for device verification and optimization but also for revealing transient and nonlinear dynamics. Existing interferometric optical vibrometers for 2D mapping are challenged by operating point stabilization, surface reflectivity contrast, and long acquisition time. Here, we use spectral interferometry, which is insensitive to these factors and utilizes a continuous raster scanning scheme for vibration mapping with high throughput. We intensity-modulate our broadband light source with an electro-optic modulator to resolve vibrations at microwave frequencies. Our system requires no fast photodetector or digitizer operating in the microwave frequency range. We image the 1 GHz vibration field of a 300 × 150 µm 2 area of an entire surface acoustic wave device in 10 min with simultaneous surface profilometry. Our system has a vibration sensitivity of 120 fm/sqrt(Hz) and a linear throughput of 0.77 mm/s on the chip surface. The technique offers capabilities for characterizing a wide range of acoustic wave and micromechanical devices to better understand their behavior and performance.

47 OTHER INSTRUMENTATION↗

Redefining precision interferometry and spectroscopy with high-performance optical interference coatings

High-performance optical interference coatings have transformed precision interferometry and spectroscopy by enabling unparalleled control over light–matter interactions. This review explores recent innovations in ion-beam sputtered amorphous dielectric, as well as substrate-transferred crystalline coatings, and their impact on systems at the forefront of precision metrology. These state-of-the-art coating techniques generate multilayers with ultralow optical losses, yielding mirrors with exceptional reflectivity. Refinements in their noise performance push the ultimate limits of sensitivity, resolution, and stability in demanding laser-based metrology applications. These technologies underpin the most advanced timekeeping and spatial measurement tools, enabling high-finesse reference cavities for the world’s most precise optical atomic clocks and low-noise reflective test masses for km-baseline gravitational-wave detectors. Emerging hybrid designs combining these techniques expand access to the mid-infrared spectral region, enabling the first ultralow-optical-loss coatings in the 3000–5000 nm wavelength range for enhanced spectroscopy and trace-gas detection. We highlight how these technologies redefine coating performance metrics and set new benchmarks in quantum science, fundamental physics, and precision optical sensing.

Cole, Garrett D. [University of Arizona, Tucson, A↗

Source Separation and Medium Change of Contained Chemical Explosions from Coda Wave Interferometry

Differences in the seismic coda of neighboring events can be used to investigate source location offsets and medium change with coda wave interferometry (CWI). We employ CWI to infer the known relative location between two chemical explosions in Phase I of the Source Physics Experiment (SPE). The inferred displacement between the first, SPE-1, and second, SPE-2, chemical explosion is between 6 and 18 m, with an expectation of 9.2 m, where the known separation is close to 9.4 m. We also employ CWI to find any velocity perturbation due to damage from SPE-2, by comparing its coda with the collocated third SPE chemical explosion, SPE-3. We find that damage due to SPE-2 must be confined to a spherical region with radius less than 10 m and velocity perturbation less than 25%.

58 GEOSCIENCES↗

Neutron Imaging Using Grating Interferometry: Exploiting phase contrast and dark-field imaging for <1μm feature detection in bulk materials (Summary Report)

Radiography is an important non-destructive characterization tool for many LANL missions. Contrast in conventional radiography results from attenuation of the incoming x-ray or neutron beam by the object. Neutrons have a great benefit in detecting light elements (e.g. hydrogen) in the presence of heavier elements and penetrate deeper than X-rays into many materials, but neutron radiography resolution is typically limited to ~50 μm. Cracks, voids, pores and a variety of other features smaller than this resolution are therefore undetectable in attenuation based neutron imaging. However, novel neutron imaging modalities leveraging off of interferometric methods, so-called neutron grating interferometry (NGI), are able to spatially map sub-micron features and interfacial features while also exploiting the neutron’s sensitivity to light elements and isotope specific contrast to enable material characterization otherwise impossible.

36 MATERIALS SCIENCE↗

Silicon Consortium Project: No-Go on Moir Interferometry for Measuring SEI Strain as a Probe for Calendar Life Testing

Silicon is a promising candidate as a next generation anode to replace or complement graphite electrodes due to its high energy density and low lithiation potential. When silicon is lithiated, it experiences over 300% expansion which stresses the silicon as well as its solid electrolyte interphase (SEI) leading to poor performance. The use of nano-sized silicon has helped to mitigate volume expansion and stress in the silicon, yet the silicon SEI is still both mechanically and chemically unstable. Identifying the mechanical failure mechanism of the SEI will help enhance calendar and cycle life performance through improved SEI design. In situ moiré interferometry was investigated to try and track the in-plane strain in the SEI and silicon electrode for this purpose. Moiré can detect on the order of 10 nm changes in displacement and is therefore a useful tool in the measurement of strain. As the sample undergoes small deformations, large changes in the moiré fringe allow for measurements of displacement below the diffraction limit of light. Figure 1a shows how the moiré fringe changes as the sample grating deforms. As the sample contracts or expands, the frequency of the moiré fringe changes, and this change is proportional to the strain in the sample.

36 MATERIALS SCIENCE↗

Progress Report for the Pathfinder Project: A Laser-Based / Fiber Optic IAEA Seal That Implements Spectral Interferometry

This is the first progress report for the Laser / Fiber-Optic Based IAEA Seal. This seal implements spectral interferometry, which is crucial for its resilience to tampering. Indeed, based on our understanding of telecommunications-based fiber optic technology, it is essentially impossible to tamper with the fiber without detection either immediately (with an active system) or subsequently (with a passive system).

36 MATERIALS SCIENCE↗

Measuring Black Hole Light Echoes with Very Long Baseline Interferometry

Light passing near a black hole can follow multiple paths from an emission source to an observer due to strong gravitational lensing. Photons following different paths take different amounts of time to reach the observer, which produces an echo signature in the image. The characteristic echo delay is determined primarily by the mass of the black hole, but it is also influenced by the black hole spin and inclination to the observer. In the Kerr geometry, echo images are demagnified, rotated, and sheared copies of the direct image and lie within a restricted region of the image. Echo images have exponentially suppressed flux, and temporal correlations within the flow make it challenging to directly detect light echoes from the total light curve. In this Letter, we propose a novel method to search for light echoes by correlating the total light curve with the interferometric signal at high spatial frequencies, which is a proxy for indirect emission. We explore the viability of our method using numerical general relativistic magnetohydrodynamic simulations of a near-face-on accretion system scaled to M87-like parameters. We demonstrate that our method can be used to directly infer the echo delay period in simulated data. An echo detection would be clear evidence that we have captured photons that have circled the black hole, and a high-fidelity echo measurement would provide an independent measure of fundamental black hole parameters. Our results suggest that detecting echoes may be achievable through interferometric observations with a modest space-based very long baseline interferometry mission.

79 ASTRONOMY AND ASTROPHYSICS↗