Search NASA⌕ Search

SEARCH · Search NASA

Results for “(SIM)”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 325 records · Page 18
All sourcesNASA NTRSDOE OSTI
NASA NTRS1983

Data management applications

Kennedy Space Center's primary institutional computer is a 4 megabyte IBM 4341 with 3.175 billion characters of IBM 3350 disc storage. This system utilizes the Software AG product known as ADABAS with the on line user oriented features of NATURAL and COMPLETE as a Data Base Management System (DBMS). It is operational under the OS/VSI and is currently supporting batch/on line applications such as Personnel, Training, Physical Space Management, Procurement, Office Equipment Maintenance, and Equipment Visibility. A third and by far the largest DBMS application is known as the Shuttle Inventory Management System (SIMS) which is operational on a Honeywell 6660 (dedicated) computer system utilizing Honeywell Integrated Data Storage I (IDSI) as the DBMS. The SIMS application is designed to provide central supply system acquisition, inventory control, receipt, storage, and issue of spares, supplies, and materials.

Source record↗
NASA NTRS1985

Investigation of superlattice device structures

This report describes the investigation of growth properties, and the structure of epitaxial multilayer Si(Si(1x)Ge(x)) films grown on bulk Silicon Substrates. It also describes the fabrication and characterization of MOSFET and MESFET devices made on these epitaxial films. Films were grown in a CVD reactor using hydrides of Si and Ge with H2 and He as carrier gases. Growth temperatures were between 900 C and 1050 C with most films grown at 1000 C. Layer thickness was between 300A and 2000A and total film thickness was between 0.25 micro m and 7 micro m. The Ge content (X) in the alloy layers was between .05 and 0.2. N-type multilayer films grown on (100) p-type Si showed Hall mobility in the range 1000 to 1500 sq cm/v for an average carrier concentration of approx. 10 to the 16th power/cu cm. This is up to 50% higher than the Hall mobility observed in epitaxial Si films grown under the same conditions and with the same average carrier concentration. The mobility enhancement occurred in films with average carrier concentration (n) from 0.7 x 10 to the 16th power to 2 x 10 to the 17th power/cu cm, and total film thickness greater than 1.0 micro m. No mobility enhancement was seen in n-type multilayer films grown on (111) Si or in p-type multilayer films. The structure of the films was investigated was using SEM, TEM, AES, SIMS, and X-ray double crystal diffraction techniques. The film composition profile (AES, SIMS) showed that the transition region between layers is of the order of about 100A. The TEM examination revealed a well defined layered structure with fairly sharp interfaces and good crystalline quality. It also showed that the first few layers of the film (closest to the substrate) are uneven, most probably due to the initial growth pattern of the epitaxial film where growth occurs first in isolated islands that eventually growth and coalesce. The X-ray diffraction measurement determined the elastic strain and strain relief in the alloy layers of the film and the elastic strain in the intervening Si layers.

Gergis, I. S.↗
NASA NTRS1987

Characteristics of annealed p/n junctions between GaAs and Si(100)

Electrical characteristics of a GaAs(p)/Si(n) interface were determined from capacitance-voltage, current-voltage, and secondary ion mass spectroscopy (SIMS) measurements and compared to those on GaAs(p) epitaxial layers on GaAs(n) substrates. The comparison was made between the junctions as grown, and after an anneal at 850 C for 20 min in 10 percent forming gas under an As overpressure. For the GaAs/Si junction the ideality factor changed from 2 or larger to 1.5 and the apparent intercept voltage changed from 2.5 to 1.3 V after annealing. For the GaAs homojunction, the intercept voltage increased from 1.1 to 1.3 V. In addition, the excess current in the forward and reverse bias conditions dropped drastically in the heterojunction. No movement of the metallurgical junction was discernible to within the resolution capability of SIMS. The junction properties obtained by annealing suggest an atomic restructuring of the Si(100) interface during growth or annealing. These new results raise the possibility that the GaAs/Si interface can be made into an electrically viable junction and incorporated into active devices.

Unlu, M. S.↗
NASA NTRS1989

Isotopic study of oxygen diffusion in oxide coatings

Diffusion of oxygen in thin films of silicon dioxide was studied using oxygen isotopically enriched in oxygen of atomic mass 18 (O-18). This subject is of interest because thin films of dielectrics such as SiO2 are proposed for use as a protective coatings for solar mirrors in low Earth orbit, which is a strongly oxidizing environment. Films of this material were prepared with a direct current magnetron using reactive sputtering techniques. To produce (O-18)- enriched SiO2, a standard 3.5-in.-diameter silicon wafer was reactively sputtered using (O-18)-enriched (95 percent) oxygen as the plasma feed gas. The films were characterized using Rutherford backscattering and Secondary Ion Mass Spectrometer (SIMS) to establish stoichiometry and purity. Subsequently, the films were exposed to an air-derived oxygen plasma in a standard laboratory plasma reactor for durations of up to 10 hr. The concentration ratio of O-16 as a function of depth was determined using SIMS profiling and compared to a baseline, nonplasma exposed sample. A value for the diffusivity of oxygen near the surface of these films was obtained and found to be about 10(-15)sq cm/sec.

Gulino, Daniel A.↗
NASA NTRS1989

The application of TSIM software to act design and analysis on flexible aircraft

The TSIM software is described. This is a package which uses an interactive FORTRAN-like simulation language for the simulation on nonlinear dynamic systems and offers facilities which include: mixed continuous and discrete time systems, time response calculations, numerical optimization, automatic trimming of nonlinear aircraft systems, and linearization of nonlinear equations for eigenvalues, frequency responses and power spectral response evaluation. Details are given of the application of TSIM to the analysis of aeroelastic systems under the RAE Farborough extension FLEX-SIM. The aerodynamic and structural data for the equations of motion of a flexible aircraft are prepared by a preprocessor program for incorporation in TSIM simulations. Within the simulation, the flexible aircraft model may then be selected interactively for different flight conditions and modal reduction techniques applied. The use of FLEX-SIM is demonstrated by an example of the flutter prediction for a simple aeroelastic model. By utilizing the numerical optimization facility of TSIM, it is possible to undertake identification of required parameters in the TSIM model within the simulation.

Kaynes, Ian W.↗
NASA NTRS1991

Cosmic dust: Laboratory analyses of extremely small particles

A discussion of cosmic dust, its classification, the usefulness of its analysis, and problems associated with its analysis is presented. All measurements on stratospheric dust particles presented here were made with secondary ion mass spectrometry (SIMS). The SIMS technique turns out to be an extremely useful tool in the study of very small particles and made a number of firsts possible. The isotopic composition of cosmic dust particles were measured for the first time. It was also the first time that it was possible to measure the abundances of the rare earth elements in these particles. However, the most important advance this work represents is that both trace elemental and isotopic abundances were successfully measured in the same particles. Thus, for the first time, it is possible to compare isotopic and trace element abundance data of the same cosmic dust particles.

Stadermann, Frank J.↗
NASA NTRS1992

Analysis of LDEF experiment AO187-2: Chemically and isotopic measurements of micrometeoroids by secondary ion mass spectrometry

Numerous 'extended impacts' found in both leading and trailing edge capture cells have been successfully analyzed for the chemical composition of projectile residues by secondary ion mass spectrometry (SIMS). Most data have been obtained from the trailing edge cells where 45 of 58 impacts have been classified as 'probably natural' and the remainder as 'possibly man-made debris.' This is in striking contrast to leading edge cells where 9 of 11 impacts so far measured are definitely classified as orbital debris. Although all the leading edge cells had lost their plastic entrance foils during flight, the rate of foil failure was similar to that of the trailing edge cells, 10 percent of which were recovered intact. Ultra-violet embrittlement is suspected as the major cause of failure on both leading and trailing edges. The major impediment to the accurate determination of projectile chemistry is the fractionation of volatile and refractory elements in the hypervelocity impact and redeposition processes. This effect had been noticed in simulation experiment but is more pronounced in the Long Duration Exposure Facility (LDEF) capture cells, probably due to the higher average velocities of the space impacts. Surface contamination of the pure Ge surfaces with a substance rich in Si but also containing Mg and Al provides an additional problem for the accurate determination of impactor chemistry. The effect is variable, being much larger on surfaces that were exposed to space than in those cells that remained intact. Future work will concentrate on the analyses of more leading edge impacts and the development of new SIMS techniques for the measurement of elemental abundances in extended impacts.

Source record↗
NASA NTRS1992

Ion radial diffusion in an electrostatic impulse model for stormtime ring current formation

Guiding-center simulations of stormtime transport of ring-current and radiation-belt ions having first adiabatic invariants mu is approximately greater than 15 MeV/G (E is approximately greater than 165 keV at L is approximately 3) are surprisingly well described (typically within a factor of approximately less than 4) by the quasilinear theory of radial diffusion. This holds even for the case of an individual model storm characterized by substorm-associated impulses in the convection electric field, provided that the actual spectrum of the electric field is incorporated in the quasilinear theory. Correction of the quasilinear diffusion coefficient D(sub LL)(sup ql) for drift-resonance broadening (so as to define D(sub LL)(sup ql)) reduced the typical discrepancy with the diffusion coefficients D(sub LL)(sup sim) deduced from guiding-center simulations of representative-particle trajectories to a factor of approximately 3. The typical discrepancy was reduced to a factor of approximately 1.4 by averaging D(sub LL)(sup sim), D(sub LL)(sup ql), and D(sub LL)(sup rb) over an ensemble of model storms characterized by different (but statistically equivalent) sets of substorm-onset times.

Chen, Margaret W.↗
NASA NTRS1993

Solar wind-induced secondary ions and their relation to lunar surface composition

Based on previous laboratory experiments simulating solar wind sputtering of lunar surface materials, it appears that solar wind ions sputter secondary ions in sufficient numbers to be measured from low-altitude lunar orbit. Solar wind protons are hundreds of times less efficient than those used in standard secondary ion mass spectrometry; nevertheless secondary ions of Na, Mg, Al, Si, K, Ca, Mn, Ti and Fe were observed sputtered from sample simulants of mare and highland soils. These secondary ion fluxes depend both on concentration in the soil and on probability of ionization; yields of easily ionized elements such as K and Na are relatively much greater than those for the more electronegative elements and compounds. The principal geochemical indicator elements Na, Mg, Al, Si, K, Ca, Ti, Mn and Fe are nevertheless detectable. However, it has not been shown that the observed secondary ions vary strictly one-to-one with their concentrations in the geochemically distinct soil simulants used here. While we have a first order understanding of secondary ion sputtering, it is not clear that the observed ion yields can be linked with great accuracy to the simulant's composition. The simulants were analyzed by electron microprobe to establish their detailed composition. The observed secondary ion fluxes can then be compared with the microprobe results. For example Ti(+) fluxes from the three simulants correspond to the true composition with accuracies of better than 10 percent for the high-Ti basalt, and about 20 percent for the low-Ti simulant. The highlands simulant produced a statistically insignificant Ti(+) count rate. Here we discuss the results of further SIMS experiments using the ASU/Center for Solid State Science facility. With careful isolation and preparation of samples, we avoid the problems of the previous experiments. In particular, we will make use of ground-up sample to mimic the sputtering behavior of regolith, and will avoid charging by placing the soil on a conducting indium substrate. We report the results of a blind test of the SIMS technique using a sample of unknown composition.

Elphic, R. C.↗
NASA NTRS1994

Light stable isotope analysis of meteorites by ion microprobe

The main goal was to develop the necessary secondary ion mass spectrometer (SIMS) techniques to use a Cameca ims-4f ion microprobe to measure light stable isotope ratios (H, C, O and S) in situ and in non-conducting mineral phases. The intended application of these techniques was the analysis of meteorite samples, although the techniques that have been developed are equally applicable to the investigation of terrestrial samples. The first year established techniques for the analysis of O isotope ratios (delta O-18 and delta O-17) in conducting mineral phases and the measurement of S isotope ratios (delta S-34) in a variety of sulphide phases. In addition, a technique was developed to measure delta S-34 values in sulphates, which are insulators. Other research undertaken in the first year resulted in SIMS techniques for the measurement of wide variety of trace elements in carbonate minerals, with the aim of understanding the nature of alteration fluids in carbonaceous chondrites. In the second year we developed techniques for analyzing O isotope ratios in nonconducting mineral phases. These methods are potentially applicable to the measurement of other light stable isotopes such as H, C and S in insulators. Also, we have further explored the analytical techniques used for the analysis of S isotopes in sulphides by analyzing troilite in a number of L and H ordinary chondrites. This was done to see if there was any systematic differences with petrological type.

Mcsween, Harry Y., Jr.↗
NASA NTRS1994

Orthopyroxene as a recorder of lunar crust evolution: An ion microprobe investigations of Mg-suite norites

The lunar Mg suite, which includes dunites, troctolites, and norites, could make up 20-30% of the Moon's crust down to a depth of 60 km. The remainder is largely anorthositic. This report focuses on norites because we have found that the chemical characteristics of orthopyroxene are effective recorders of their parental melt compositions. Many of the samples representing the Mg suite are small and unrepresentative. In addition, they are cumulates and thus are difficult to study by whole-rock techniques. Therefore, we decided to study these rocks by SIMS techniques to analyze a suite of trace elements in orthopyroxene. The 12 norite samples were selected from a recent compilation by Warren who attempted to select the best candidate samples from the standpoint of their pristine character. Our present database includes greater than 300 superior Electromagnetic Pulse (EMP) analyses and greater than 50 scanning ion mass spectroscopy (SIMS) analyses for 8 Rare Earth Elements (REE), Zr, Y, and Sr. The Mg#s for the parental melts calculated from Mg#s in orthopyroxene show that most melts have Mg#s in the range of 0.36-0.60. This compares with a range of Mg#s for lunar volcanic picritic glass beads of 0.4-0.68. Therefore, although the cumulate whole-rock compositions of the Mg suite can be extremely magnesian, the calculated parental melts are not anomalously high in Mg. A chemical characteristic of the Mg-suite norites that is more difficult to explain is the high KREEP content of the calculated parental melts. The REE contents for the calculated norite parental melts have REE that match or exceed the high-K KREEP component of Warren. Therefore, mixing of a KREEP component and a picritic melt cannot, by itself, explain the high estimated REE contents of the melts parental to norites. Advanced crystallization following KREEP incorporation, especially of plagiclase, may also be required.

Papike, J. J.↗
NASA NTRS1996

Preparation of Flight Operations and IWS Integration of the CELIAS Experiment on the SOHO Spacecraft

During this annual progress report time period, the following activities took place: (1) Generation of several versions of the CELIAS (STOF/SEM/CTOF/MTOF/DPU) commissioning timeline for the first 180 days after launch. These were written and submitted by A. Galvin after consultation (phone, fax, e-mail, meetings) with the CELIAS Instrument Manager and Lead-Co-I's. (2) Identification of several problems with the CELIAS portion of the Project Data Base (PDB). (3) Meetings with the Flight Operations Team regarding PDB, critical commands, etc. (4) Attend Science Operations Working Group (SOWG) Meetings (November 1994, February 1995, May 1995) and Flight Operations Review Meeting (July 1995). (5) Participate in Flight Operation Simulations SIM 1 (November 14-18, 1994), SIM 2 (May 1-4, 1995) and SIM3 (August 7-11, 1995). (6) Participate in the Ground System Compatibility Test Rehearsal (April 24- 28, 1995), GSCT #2 (May 30-June 14, 1995), GSCT #3 (September 12-22, 1995), and GSCT #4b (October 30-November 5, 1995). A small portion of the documentation for the above cited activities is appended.

Ipavich, Fred↗
NASA NTRS1996

Preparation of Flight Operations and IWS Integration of the CELIAS Experiment on the SOHO Spacecraft

During this reporting time period, the following activities took place: (1) generation of several versions of the CELIAS (STOF/SEM/CTOF/MTOF/DPU) commissioning timeline for the first 180 days after launch; (2) identification of several problems with the CELIAS portion of the Project Data Base (PDB); (3) attendance of the Science Operations Working Group (SOWG) Meetings (November 1994, February 1995, May 1995) and Flight Operations Review Meeting (July 1995); (4) participation in Flight Operation Simulations SIM 1 (November 14-18, 1994), SIM 2 (May 1-4, 1995) and SIM3 (August 7-11, 1995); and (5) participation in the Ground System Compatibility Test Rehearsal (April 24-28) 1995), GSCT #2 (May 30-June 14, 1995), GSCT #3 (September 12-22 1995), and GSCT #4b (October 30-November 5, 1995).

Ipavich, Fred↗
NASA NTRS1996

Dopant Incorporation Efficiency in CVD Silicon Carbide Epilayers

In order to ensure reproducible and reliable SiC semiconductor device characteristics, controlled dopant incorporation must be accomplished. Some of the many factors which greatly influence dopant incorporation are the site-competition effect, SiC(0001) substrate polarity, substrate temperature, and the dopant-source reactor concentration. In this paper, dopant incorporation is considered and compared for various dopants in the context of dopant incorporation efficiency. By using secondary ion mass spectrometry (SIMS), the relative dopant incorporation efficiencies were calculated by dividing the SIMS determined dopant concentration in the resulting epitaxial layer by the intentional gas phase dopant concentration used during the SiC CVD. Specifically, the relative magnitudes of dopant incorporation efficiencies for nitrogen, phosphorus, and boron in 6H-SiC (0001) Si-face epitaxial layers are compared as a function of the site-competition effect and the dopant-source reactor concentrations. This serves as a first approximation for comparison of the relative 'doping potencies' of some common dopants used in SiC CVD epitaxial growth.

Larkin, D. J.↗
NASA NTRS1997

The scientific basis for the space interferometry mission

The space interferometry mission (SIM), for launch in 2004, is expected to determine the positions of point sources to a global accuracy of 4 microarcsec, and an accuracy of 1 microarcsec over small angles. The instrument will reach 200 mag in 3 x 10(exp 4) s and has a nominal lifetime of five years. A nulling capability will be provided and synthesis imaging and near-infrared capabilities are being considered. These capabilities will extend those of the Hipparcos mission by almost three orders of magnitude in every sense. The NASA's expectation for the scientific return from the SIM mission is outlined in terms of the areas of stellar physics, galactic structure and extragalactic astrophysics, including the distance scale problem.

Peterson, Deane↗
NASA NTRS1998

Contamination Control Considerations for the Next Generation Space Telescope (NGST)

The NASA Space Science Program, in its ongoing mission to study the universe, has begun planning for a telescope that will carry on the Hubble Space Telescope's exploration. This telescope, the 'Next Generation Space Telescope' (NGST), will be 6-8 meters in diameter, will be radiatively cooled to 30-60 Kelvin in order to enable extremely deep exposures at near infrared wavelengths, and will operate for a lifetime of 5-10 years. The requirement will be to measure wavelengths from 1-5 microns, with a goal to measure wavelengths from 0.6-30 microns. As such, NGST will present a new contamination control challenge. The Goddard Space Flight Center (GSFC) performed one of three preliminary feasibility studies for the NGST, presenting a telescope with an 8 meter, deployable primary mirror and a deployable secondary mirror. The telescope would be radiatively cooled, with the optical telescope assembly (OTA) and the science instrument module (SIM) isolated from the warmer spacecraft support module (SSM). The OTA and the SIM would also be shielded from sunlight with an enormous, inflatable sun-shield. The GSFC telescope was designed for launch on an Atlas HAS, which would require launching the telescope in a stowed configuration, with the SSM, antennae, sun-shield, primary mirror 'petals', and secondary mirror deployed once on-orbit. The launch configuration and deployment scenario of an exposed telescope measuring near infrared and cooled to 30-60 K are the factors presenting contamination hazards to the NGST mission. Preliminary science requirements established are: less than 20% reflectance decrease on optical surfaces over the wavelength range, and less than 0.3% obscuration of optical surfaces. In order to meet these requirements, NGST must be built and launched with careful attention to contamination control. Initial contamination control design options include strict selecting of materials and baking out of hardware down to the component level, minimizing or eliminating exposure of the OTA to sunlight or earth albedo during deployment and early on-orbit operations, cleaning of the primary and secondary mirrors at the launch site, cleaning of the launch vehicle fairing, locating thrusters and vents on the warm side of the sun shield only, and the possibility of including a deployable cover if that is shown to be necessary.

Wooldridge, Eve M.↗
NASA NTRS1999

Modeling Surface Structure Derived from Laser Altimeter Return Waveforms Using High-Resolution Elevation Data

The upcoming generation of operational spaceborne laser altimeters (i.e VCL and GLAS) record the interaction of emitted laser radiation with terrestrial surfaces in the form of a digitized waveform. We show that we can accurately model return laser altimeter waveforms as the sum of the reflections from individual surfaces within laser footprints. In one case, we predict return waveforms using high resolution elevation data generated by a small-footprint laser altimeter in a dense tropical forest. We compare over 3000 modeled and recorded waveform pairs using the Pearson correlation. The modeled and recorded waveforms are highly correlated, with a mean correlation of 0.90 and a median of 0.95. The mean correlation is highly dependent on the relative positions of the data sets. By shifting the relative locations of the two compared data sets, we infer that the data are colocated to within 0.4$\sim$m horizontally and 0.12$\sim$m vertically. The high degree of correlation shows that we can reliably synthesize the vertical structure information measured by medium-large footprint laser altimeters for complex, dense vegetation.

Blair, J. Bryan↗