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309 records · Page 18

Friction Stir Weld Inspection Through Conductivity Imaging Using Shaped Field MWM(TM)-Arrays

Friction Stir Welds (FSW) of A1 2195-T8 and A1 2219-T8, provided by Lockheed Martin Michoud Operations, were inspected for lack-of-penetration (LOP) defects using a custom designed MWM-Array, a multi-element eddy-current sensor. MWM electrical conductivity mapping demonstrated high sensitivity to LOP as small as 0.75 mm (0.03 in.), as confirmed by metallographic data that characterized the extent of LOP defects. High sensitivity and high spatial resolution was achieved via a 37-element custom designed MWM-Array allowing LOP detection using the normalized longitudinal component of the MWM measured conductivity. This permitted both LOP detection and correlation of MWM conductivity features with the LOP defect size, as changes in conductivity were apparently associated with metallurgical features within the near-surface layer of the LOP defect zone. MWM conductivity mapping reveals information similar to macroetching as the MWM-Array is sensitive to small changes in conductivity due to changes in microstructure associated with material thermal processing, in this case welding. The electrical conductivity measured on the root side of FSWs varies across the weld due to microstructural differences introduced by the FSW process, as well as those caused by planar flaws. Weld metal, i.e., dynamically recrystallized zone (DXZ), thermomechanically affected zone (TMZ), heat-affected zone (HAZ), and parent metal (PM) are all evident in the conductivity maps. While prior efforts had met with limited success for NDE of dissimilar alloy, A12219 to A12195 FSW, the new custom designed multi-element MWM-Array achieved detection of all LOP defects even in dissimilar metal welds.

Goldfine, Neil↗

Friction Stir Weld Inspection Through Conductivity Imaging Using Shaped Field MWM(Registered Trademark) - Arrays

Friction Stir Welds (FSW) of Al 2195-T8 and Al 2219-T8, provided by Lockheed Martin Michoud Operations, were inspected for lack-of-penetration (LOP) defects using a custom designed MWM-Array, a multi-element eddy-current sensor. MWM (registered trademark) electrical conductivity mapping demonstrated high sensitivity to LOP as small as 0.75 mm (0.03 in.), as confirmed by metallographic data that characterized the extent of LOP defects. High sensitivity and high spatial resolution was achieved via a 37-element custom designed MWM-Array allowing LOP detection using the normalized longitudinal component of the MWM measured conductivity. This permitted both LOP detection and correlation of MWM conductivity features with the LOP defect size, as changes in conductivity were apparently associated with metallurgical features within the near-surface layer of the LOP defect zone. MWM conductivity mapping reveals information similar to macro-etching as the MWM-Array is sensitive to small changes in conductivity due to changes in microstructure associated with material thermal processing, in this case welding. The electrical conductivity measured on the root side of FSWs varies across the weld due to microstructural differences introduced by the FSW process, as well as those caused by planar flaws. Weld metal, i.e., dynamically recrystallized zone (DXZ), thermomechanically affected zone (TMZ), heat-affected zone (HAZ), and parent metal (PM) are all evident in the conductivity maps. While prior efforts had met with limited success for NDE (Nondestructive Evaluation) of dissimilar alloy, Al2219 to Al2195 FSW, the new custom designed multi-element MWM-Array achieved detection of all LOP defects even in dissimilar metal welds.

Goldfine, Neil↗

Friction-Stir Welding - Heavy Inclusions in Bi-metallic welds of Al 2219/2195

Heavy Inclusions (HI) were detected for the first time by radiographic examination in aluminum alloy 2219forging/2195plate (advancing/retreating side) Friction Sir Welds (FSW) for the Space Shuttle External Tank (ET) Program. Radiographic HI indications appear as either small (approx.0.005"-0.025") individual particles or clusters of small particles. Initial work was performed to verify that the HI was not foreign material or caused by FSW pin tool debris. That and subsequent elemental analysis determined that the HI were large agglomerations of Al2Cu (theta phase), which is the strengthening precipitate in Al2219. A literature search on that subject determined that the agglomeration of phase has also been found in Al2219 bead on plate FSW [Ref. 1]. Since this was detected in ET space flight hardware, an investigative study of the effect of agglomerated theta phase particles in FSW Al2219f/2195p was performed. Numerous panels of various lengths were welded per ET weld procedures and radiographically inspected to determine if any HI was detected. Areas that had HI were sampled for room temperature and cyclic cryogenic (-423F) tensile testing and determined no significant adverse affect on mechanical properties when compared to test specimens without HI and historical data. Fracture surface examination using the Scanning Electron Microscope (SEM) revealed smaller phase agglomerations undetectable by radiographic inspection dispersed throughout the Al2219f/2195p FSW. This indicates that phase agglomeration is inherent to the Al2219f/2195p FSW process and only rarely creates agglomerations large enough to be detected by radiography. HI has not been observed in FSW of plate to plate material for either Al2219 or AL2195.

Rietz, Ward W., Jr.↗