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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 325 records · Page 18
All sourcesNASA NTRSDOE OSTI
NASA NTRS1983

Microcircuit radiation effects databank

This databank is the collation of radiation test data submitted by many testers and serves as a reference for engineers who are concerned with and have some knowledge of the effects of the natural radiation environment on microcircuits. It contains radiation sensitivity results from ground tests and is divided into two sections. Section A lists total dose damage information, and section B lists single event upset cross sections, I.E., the probability of a soft error (bit flip) or of a hard error (latchup).

Source record↗
NASA NTRS1983

Microcircuit radiation effects databank

Radiation test data submitted by many testers is collated to serve as a reference for engineers who are concerned with and have some knowledge of the effects of the natural radiation environment on microcircuits. Total dose damage information and single event upset cross sections, i.e., the probability of a soft error (bit flip) or of a hard error (latchup) are presented.

Source record↗
NASA NTRS1982

Annual Conference on Nuclear and Space Radiation Effects, 19th, Las Vegas, NV, July 20-22, 1982, Proceedings

The results of research concerning the effects of nuclear and space radiation are presented. Topics discussed include the basic mechanisms of nuclear and space radiation effects, radiation effects in devices, and radiation effects in microcircuits, including studies of radiation-induced paramagnetic defects in MOS structures, silicon solar cell damage from electrical overstress, radiation-induced charge dynamics in dielectrics, and the enhanced radiation effects on submicron narrow-channel NMOS. Also examined are topics in SGEMP/IEMP phenomena, hardness assurance and testing, energy deposition, desometry, and radiation transport, and single event phenomena. Among others, studies are presented concerning the limits to hardening electronic boxes to IEMP coupling, transient radiation screening of silicon devices using backside laser irradiation, the damage equivalence of electrons, protons, and gamma rays in MOS devices, and the single event upset sensitivity of low power Schottky devices.

Long, D. M.↗
NASA NTRS1983

Applications of state estimation in aircraft flight-data analysis

This paper traces the evolution of the use of state estimation in the analysis of aircraft flight data and discusses some recent applications associated with airline turbulence upsets and high-angle-of-attack flight tests. A unifying mathematical framework for state estimation is reviewed, and several examples are shown that illustrate a general approach for estimating variables that are difficult to measure. It is hoped that the diversity of the applications discussed and the examples presented will make the flight-data analyst mindful of the potential advantages of using state estimation methods.

Bach, R. E., Jr.↗
NASA NTRS1984

Radiating dipole model of interference induced in spacecraft circuitry by surface discharges

Spacecraft in geosynchronous orbit can be charged electrically to high voltages by interaction with the space plasma. Differential charging of spacecraft surfaces leads to arc and blowoff discharging. The discharges are thought to upset interior, computer-level circuitry. In addition to capacitive or electrostatic effects, significant inductive and less significant radiative effects of these discharges exist and can be modeled in a dipole approximation. Flight measurements suggest source frequencies of 5 to 50 MHz. Laboratory tests indicate source current strengths of several amperes. Electrical and magnetic fields at distances of many centimeters from such sources can be as large as tens of volts per meter and meter squared, respectively. Estimates of field attenuation by spacecraft walls and structures suggest that interior fields may be appreciable if electromagnetic shielding is much thinner than about 0.025 mm (1 mil). Pickup of such fields by wires and cables interconnecting circuit components could be a source of interference signals of several volts amplitude.

Metz, R. N.↗
NASA NTRS1984

Environmental Interactions Working Group Report

Interactions between spacecraft systems and the space charged particle environment are reviewed and recommendations are presented for both near-term and far-term research considerations. Transient environment models, large space structures, solar and nuclear power systems/environment interactions, single event upsets, material degradation, and planetary missions are addressed.

Stevens, N. J.↗
NASA NTRS1985

Astronaut hazard during free-flight polar EVA

Extravehicular Activity (EVA) during Shuttle flights planned for the late 1980's includes several factors which together may constitute an astronaut hazard. Free-flight EVA is planned whereas prior United States Earth orbit EVA has used umbilical tethers carrying communications, coolant, and oxygen. EVA associated with missions like LANDSAT Retrieval will be in orbits through the auroral oval where charging of spacecraft may occur. The astronaut performing free flight EVA constitutes an independent spacecraft. The astronaut and the Shuttle make up a system of electrically isolated spacecraft with a wide disparity in size. Unique situations, such as the astronaut being in the wake of the Shuttle while traversing an auroral disturbance, could result in significant astronaut and Shuttle charging. Charging and subsequent arc discharge are important because they have been associated with operating upsets and even satellite failure at geosynchronous orbit. Spacecraft charging theory and experiments are examined to evaluate charging for Shuttle size spacecraft in the polar ionosphere.

Hall, W. N.↗
NASA NTRS1984

Develop and test fuel cell powered on-site integrated total energy systems. Phase 3: Full-scale power plant development

Two 25-cell, 13 inch x 23 inch (4kW) stacks were started up to evaluate the reliability of component and stack technology developed through the end of 1983. Both stacks started up well and are running satisfactorily on hydrogen-air after 1900 hours and 800 hours, respectively. A synthetic-reformat mixing station is nearing completion, and both stacks will be operated on reformate fuel. A stack-protection control system was placed in operation for Stack No. 2, and a similar set-up is in preparation for Stack No. 1. This system serves to change operating conditions or shut the stack down to avoid deleterious effects from nonstack-related upsets. The capability will greatly improve changes of obtaining meaningful long-term test data.

Kaufman, A.↗
NASA NTRS1985

Space station trace contaminant control

Different systems for the control of space station trace contaminants are outlined. The issues discussed include: spacecabin contaminant sources, technology base, contaminant control system elements and configuration, approach to contaminant control, contaminant load model definition, spacecraft maximum allowable concentrations, charcoal bed sizing and performance characteristics, catalytic oxidizer sizing and performance characteristics, special sorbent bed sizing, animal and plant research payload problems, and emergency upset contaminant removal. It is concluded that the trace contaminant control technology base is firm, the necessary hardware tools are available, and the previous design philosophy is still applicable. Some concerns are the need as opposed to danger of the catalytic oxidizer, contaminants with very low allowable concentrations, and the impact of relaxing materials requirements.

Olcutt, T.↗
NASA NTRS1985

Historical perspective of barriers to achieving high-efficiency silicon solar cells

Early silicon solar cells were made of metallurgical-grade silicon with very low efficiency. The single-crystal silicon introduced in the mid-50's increased the efficiency to the 5% to 10% region. Throughout the 1960s the technology of the 2 x 2 cm or 2 x 4 cm space solar cell with 10% efficiency was established. In the early 1970s work related to the violet cell upset the status quo and space solar cells and cells in general became more efficient. The rest of the decade became characterized by establishing a terrestrial photovoltaic technology to support the development of a new industry. Costs per watt became the dominant consideration and frequently the efficiency was compromised. The introduction of materials and other forms of silicon dropped the efficiency and it is now a state of mine that accomplishing 10% efficiency with some alternative combination is regarded as success. Silicon solar cells are capable of delivering efficiences much greater than 10%.

Lindmayer, J.↗
NASA NTRS1984

Bipolar junction transistor models for circuit simulation of cosmic-ray-induced soft errors

This paper examines bipolar junction transistor models suitable for calculating the effects of large excursions of some of the variables determining the operation of a transistor. Both the Ebers-Moll and Gummel-Poon models are studied, and the junction and diffusion capacitances are evaluated on the basis of the latter model. The most interesting result of this analysis is that a bipolar junction transistor when struck by a cosmic particle may cause a single event upset in an electronic circuit if the transistor is operated at a low forward base-emitter bias.

Benumof, R.↗
NASA NTRS1984

Soft-error generation due to heavy-ion tracks in bipolar integrated circuits

Both bipolar and MOS integrated circuits have been empirically demonstrated to be susceptible to single-particle soft-error generation, commonly referred to as single-event upset (SEU), which is manifested in a bit-flip in a latch-circuit construction. Here, the intrinsic characteristics of SEU in bipolar (static) RAM's are demonstrated through results obtained from the modeling of this effect using computer circuit-simulation techniques. It is shown that as the dimensions of the devices decrease, the critical charge required to cause SEU decreases in proportion to the device cross-section. The overall results of the simulations are applicable to most integrated circuit designs.

Zoutendyk, J. A.↗
NASA NTRS1984

Computing in the presence of soft bit errors

It is shown that single-event-upsets (SEUs) due to cosmic rays are a significant source of single bit error in spacecraft computers. The physical mechanism of SEU, electron hole generation by means of Linear Energy Transfer (LET), it discussed with reference made to the results of a study of the environmental effects on computer systems of the Galileo spacecraft. Techniques for making software more tolerant of cosmic ray effects are considered, including: reducing the number of registers used by the software; continuity testing of variables; redundant execution of major procedures for error detection; and encoding state variables to detect single-bit changes. Attention is also given to design modifications which may reduce the cosmic ray exposure of on-board hardware. These modifications include: shielding components operating in LEO; removing low-power Schottky parts; and the use of CMOS diodes. The SEU parameters of different electronic components are listed in a table.

Rasmussen, R. D.↗
NASA NTRS1986

Guidelines for SEU-Resistant Integrated Circuits

Paper presents recent results of continuing program for increasing resistance of integrated circuits to single-event upset (SEU). Results based on study of test data for heavy-ion SEU in more than 180 different types of devices. (Some devices perform identical functions but made by different processes.) Program also examines developments in mathematical models for SEU.

Nichols, D. K.↗
NASA NTRS1986

Field Funneling and Range Straggling in Silicon Detectors

Magnitudes of field funneling and range straggling determined in silicon-surface-barrier (Schottky-barrier) charged-particle detectors (SSBD's) through meaurement of charges collected from alpha-particle tracks. Method used extended to straightforward measurement of charge collection from heavy-ion tracks in these and other semiconductor devices. Such measurements used to assess single-event upsets in integratedcircuit chips, with view toward making them resistant to radiation. Field funneling and range straggling measured with electronic system in which charge collected from individual ions measured and recorded by multichannel analyzer.

Zoutendyk, J. A.↗
NASA NTRS1985

Automatic Fastening Large Structures: a New Approach

The external tank (ET) intertank structure for the space shuttle, a 27.5 ft diameter 22.5 ft long externally stiffened mechanically fastened skin-stringer-frame structure, was a labor intensitive manual structure built on a modified Saturn tooling position. A new approach was developed based on half-section subassemblies. The heart of this manufacturing approach will be 33 ft high vertical automatic riveting system with a 28 ft rotary positioner coming on-line in mid 1985. The Automatic Riveting System incorporates many of the latest automatic riveting technologies. Key features include: vertical columns with two sets of independently operating CNC drill-riveting heads; capability of drill, insert and upset any one piece fastener up to 3/8 inch diameter including slugs without displacing the workpiece offset bucking ram with programmable rotation and deep retraction; vision system for automatic parts program re-synchronization and part edge margin control; and an automatic rivet selection/handling system.

Lumley, D. F.↗
NASA NTRS1985

Fault models

A major problem in the qualification of integrated circuit cells and in the development of adequate tests for the circuits is to lack of information on the nature and density of fault models. Some of this information is being obtained from the test structures. In particular, the Pinhole Array Capacitor is providing values for the resistance of gate oxide shorts, and the Addressable Inverter Matrix is providing values for parameter distributions such as noise margins. Another CMOS fault mode, that of the open-gated transistor, is examined and the state of the transistors assessed. Preliminary results are described for a number of open-gated structures such as transistors, inverters, and NAND gates. Resistor faults are applied to various CMOS gates and the time responses are noted. The critical value for the resistive short to upset the gate response was determined.

Sayah, H. R.↗
NASA NTRS1984

Development of an advanced pitch active control system for a wide body jet aircraft

An advanced PACS control law was developed for a commercial wide-body transport (Lockheed L-1011) by using modern control theory. Validity of the control law was demonstrated by piloted flight simulation tests on the NASA Langley visual motion simulator. The PACS design objective was to develop a PACS that would provide good flying qualities to negative 10 percent static stability margins that were equivalent to those of the baseline aircraft at a 15 percent static stability margin which is normal for the L-1011. Also, the PACS was to compensate for high-Mach/high-g instabilities that degrade flying qualities during upset recoveries and maneuvers. The piloted flight simulation tests showed that the PACS met the design objectives. The simulation demonstrated good flying qualities to negative 20 percent static stability margins for hold, cruise and high-speed flight conditions. Analysis and wind tunnel tests performed on other Lockheed programs indicate that the PACS could be used on an advanced transport configuration to provide a 4 percent fuel savings which results from reduced trim drag by flying at negative static stability margins.

Guinn, Wiley A.↗