Search NASA⌕ Search

SEARCH · Search NASA

Results for “Reliability Testing”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 343 records · Page 19
All sourcesNASA NTRSDOE OSTI
NASA NTRS2012

Fast Simulations of Gas Sloshing and Cold Front Formation

We present a simplified and fast method for simulating minor mergers between galaxy clusters. Instead of following the evolution of the dark matter halos directly by the N-body method, we employ a rigid potential approximation for both clusters. The simulations are run in the rest frame of the more massive cluster and account for the resulting inertial accelerations in an optimised way. We test the reliability of this method for studies of minor merger induced gas sloshing by performing a one-to-one comparison between our simulations and hydro+N-body ones. We find that the rigid potential approximation reproduces the sloshing-related features well except for two artifacts: the temperature just outside the cold fronts is slightly over-predicted, and the outward motion of the cold fronts is delayed by typically 200 Myr. We discuss reasons for both artifacts.

Roediger, E.↗
NASA NTRS2016

A Modified Edge Crack Torsion Test for Measurement of Mode III Fracture Toughness of Laminated Tape Composites

Modifications to the edge crack torsion (ECT) test are studied to improve the reliability of this test for measuring the mode-III fracture toughness, G (sub IIIc), of laminated tape fiber-reinforced polymeric (FRP) composites. First, the data reduction methods currently used in the ECT test are evaluated and deficiencies in their accuracy are discussed. An alternative data reduction technique, which uses a polynomial form to represent ECT specimen compliance solution, is evaluated and compared to FEA (finite element analysis) results. Second, seven batches of ECT specimens are tested, each batch containing specimens with a preimplanted midplane edge delamination and midplane plies with orientations of plus theta divided by minus theta, with theta ranging from 0 degrees to 90 degrees in 15-degree increments. Tests on these specimens show that intralaminar cracking occurs in specimens from all batches except for which theta = 15 degrees and 30 degrees. Tests on specimens of these two batches are shown to result in mode-III delamination growth at the intended ply interface. The findings from this study are encouraging steps towards the use of the ECT test as a standardized method for measuring G (sub IIIc), although further modification to the data reduction method is required to make it suitable for use as part of a standardized test method.

Czabaj, Michael W.↗
NASA NTRS2016

Flat H Redundant Frangible Joint Development

Orion and Commercial Crew Program (CCP) Partners have chosen to use frangible joints for certain separation events. The joints currently available are zero failure tolerant and will be used in mission safety applications. The goal is to further develop a NASA designed redundant frangible joint that will lower flight risk and increase reliability. FY16 testing revealed a successful design in subscale straight test specimens that gained efficiency and supports Orion load requirements. Approach / Innovation A design constraint is that the redundant joint must fit within the current Orion architecture, without the need for additional vehicle modification. This limitation required a design that changed the orientation of the expanding tube assemblies (XTAs), by rotating them 90deg from the standard joint configuration. The change is not trivial and affects the fracture mechanism and structural load paths. To address these changes, the design incorporates cantilevered arms on the break plate. The shock transmission and expansion of the XTA applies force to these arms and creates a prying motion to push the plate walls outward to the point of structural failure at the notched section. The 2014 test design revealed that parts could slip during functioning wasting valuable energy needed to separate the structure with only a single XTA functioning. Dual XTA functioning fully separated the assembly showing a discrepancy can be backed up with redundancy. Work on other fully redundant systems outside NASA is limited to a few patents that have not been subjected to functionality testing Design changes to prevent unwanted slippage (with ICA funding in 2015) showed success with a single XTA. The main goal for FY 2016 was to send the new Flat H RFJ to WSTF where single XTA test failures occurred back in 2014. The plan was to gain efficiency in this design by separating the Flat H RFJ with thicker ligaments with dimensions baselined in 2014. Other modifications included geometry changes to better disperse loads paths and to minimize air gaps. The design additionally added more structural strength to enhance the structural limits in static loads testing. The design also implemented a smoother load line through the assembly. Results / Knowledge Gained The new Flat H RFJ successfully fractured at WSTF with thicker ligaments and lower cord size. Where failure to separate occurred earlier, there is now excessive energy available for structural separation. The new challenge to provide some structural support to prevent secondary fracturing of the break plate remains to be completed. This future work is being funded by the JSC Engineering Directorate in 2017 to elevate the TRL on curved Flat H RFJs that configure with the Orion Service Panel Separation. Additional funding from JSC Engineering will provide new design testing to avoid secondary fracturing.

Brown, Chris↗
NASA NTRS2017

Battery Data MI Importer Template Quick Start Guide

In order to ensure the persistent availability and reliability of test data generated over the course of the project, the M-SHELLS Project has decided to store acquired test data, as well as associated pedigree information, in the Granta Materials Intelligence (MI) database. To facilitate that effort, an importer template and associated graphical user interface (GUI) software have been developed, with this guide providing the operating instructions for their use. The template and automation software GUI are contained in the BatteryDataImporter.xlsm Excel workbook, and are to be used to import M-SHELLS summary, or pedigree, data and the associated raw test data results into an importer template-based file, formatted in such a way as to be ready for immediate upload to the Test Data: Battery Performance table of the Granta MI database. The provided GUI enables the user to select the appropriate summary data file(s), with each file containing the required information to identify any associated raw test data file(s) to be processed. In addition to describing the setup and operation of the importer template and GUI software, this guide also provides instructions for uploading processed data to the database and for viewing the data following upload.

Levinson, Laurie H.↗
NASA NTRS2017

A Year in the Life of the NASA Electronic Parts and Packaging (NEPP) Program

NEPP Mission Statement: Provide NASAs leadership for developing and maintaining guidance for the screening, qualification, test, and reliable usage of electrical, electronic, and electromechanical (EEE) parts by NASA, in collaboration with other government Agencies and industry.

NASA Electronic Parts and Packaging (NEPP) Program↗
NASA NTRS2018

A Single Thread to Fortran Coarray Transition Process for the Control Algorithm in the Space Radiation Code HZETRN

Exa-scale computing is the direction by industry and government are going to generate solutions to problems they deem necessary. Computing hardware is being developed to achieve the transition from Peta-scale to Exa-scale with more CPUs (Central Processing Units) that have more cores per CPU and more accelerators (GPGPUs (General Purpose Graphics Processing Units) and MICs (Many Integrated Cores)) per node. To fully utilize the hardware available now and in the future, algorithms must become multi-threaded. There are a few methods to generate multi-threaded software such as MPI (Message Passing Interface) and OpenMP (Multi-Processing) / OpenACC (ACCelerator). This paper concentrates on using Coarray Fortran to convert the Fortran 95 based HZETRN (High Z and Energy TRaNsport) code's control algorithm from a single threaded code to a multithreaded code. The resultant Coarray code was 32.5 times faster (with a theoretical speed-up of 74.5 times) than the single threaded version on the hardware tested, as reliable as the Fortran 95 version, and, as it uses native Fortran, was as maintainable as the Fortran 95 version. The Coarray code can be maintained by the same project engineers and scientists who created the original single threaded code. This transition process can be utilized on a C language based code with a compiler that has the UPC (Universal Parallel C) extensions to C.

Singleterry, Robert C., Jr.↗
NASA NTRS2019

NASA Electronic Parts and Packaging (NEPP) Program Focus, Strategic Collaborations, and Our Path to the Future

NASA Electronic Parts and Packaging (NEPP) Program Overview Mission Statement: Provide NASA's leadership for developing and maintaining guidance for the screening, qualification, test, and reliable use of EEE parts by NASA, in collaboration with other government agencies and industry. The NASA Electronic Parts Assurance Group (NEPAG) is a core portion of NEPP.

NASA Electronic Parts and Packaging (NEPP) Program↗
NASA NTRS2019

Cracking Problems in Low-Voltage Chip Ceramic Capacitors

Cracking remains the major reason of failures in multilayer ceramic capacitors (MLCCs) used in in space electronics. Due to a tight quality control of space-grade components, the probability that as manufactured capacitors have cracks is relatively low, and cracking is often occurs during assembly, handling and the following testing of the systems. Majority of capacitors with cracks are revealed during the integration and testing period, but although extremely rarely, defective parts remain undetected and result in failures during the mission. This situation is aggravated by manual soldering and rework that are often used during low volume production of circuit boards for space. Although failures of MLCCs are often attributed to the post-manufacturing stresses, in many cases they are due to a combination of certain deviations in the manufacturing processes that result in hidden defects in the parts and excessive stresses during assembly and use. This report gives an overview of design, manufacturing and testing processes of MLCCs focusing on elements related to cracking problems. The existing and new screening and qualification procedures and techniques are briefly described and assessed by their effectiveness in revealing cracks. The capability of different test methods to simulate stresses resulting in cracking, mechanisms of failures in capacitors with cracks, and possible methods of selecting the most robust to manual soldering stresses capacitors are discussed.

testing↗
NASA NTRS2019

NASA Electronic Parts and Packaging (NEPP) Program: Overview and Technology Focus Areas - Responsive Technology Assurance for Civil Space

NASA Electronic Parts and Packaging (NEPP) Program Overview and Technology Highlights – The NEPP Program provides NASA's leadership for developing and maintaining guidance for the screening, qualification, test, and reliable use of electrical, electronic, and electromechanical parts by NASA, in collaboration with other government agencies and industry. The NASA Electronic Parts Assurance Group (NEPAG) is a core portion of NEPP. This presentation highlights key focus areas for 2019.

radiation effects↗
NASA NTRSDate not supplied

The State of NEPP NASA Electronic Parts & Packaging Program

The presentation is about the NASA Electronic Parts & Packaging (NEPP) Program. The mission statement of NEPP, “Provide NASA’s leadership for developing and maintaining guidance for the screening, qualification, test, and reliable use of EEE parts by NASA, in collaboration with other government agencies and industry” is dissected and explained using examples.

manufacturing↗
NASA NTRSDate not supplied

Zircon (U-TH)/He Impact Crater Thermochronometry and the Effects of Shock Microstructures on Helium Diffusion Kinetics

Accurate age determinations of hyper-velocity impact and cratering events remains difficult and often controversial, while less than half of all known impact craters are regarded as accurately and precisely dated. Besides 40Ar/39Ar and U-Pb methods, zircon (U-Th)/He dating of impactites is a burgeoning technique to date large- to medium-sized impact structures. Zircon (U-Th)/He ages can be fully reset in minutes at 1000°C, T commonly reached in and directly adjacent to impact melt domains, whereas complete resetting of zircon (U-Th)/He at <300°C, which might be encountered near the crater margins or persist in post-impact hydrothermal systems, may take >103-4 years. However, there is a critical need to test the reliability of (U-Th)/He impact dating in shock deformed zircon, and to quantify helium diffusion kinetics in well-characterized grains with a broad spectrum of shock-induced defect substructures. For this purpose, we investigated samples from two impact structures, the 66 Ma Chicxulub multi-ring basin and the 15 Ma Ries complex crater, to compare zircon diffusion kinetics from impact structures with varying parameters, including size, age, and hydrothermal system longevity. Shock microstructures were characterized by backscattered-electron (BSE) imaging prior to determination of diffusion step-heating fractional release experiments using light-bulb furnace with prograde and retrograde incrementally 10°C steps from 300°C to 600°C. We find that zircon with low-level shock microstructures exhibit no significant deviation from helium diffusion kinetics of undamaged zircon. In contrast, zircon grains with planar deformation features and granular textures classified by SEM are characterized by a dramatic decrease in helium retentivity, similar to radiation damage, due to the reduction in the effective domain size and the introduction of fast diffusion pathways. This likely renders shocked grains more susceptible to impact-induced hydrothermal resetting. Hence, characterization of impact microstructure is critical for determining accurate impact ages, but also offers the opportunity to determine the magnitude and duration of post-impact hydrothermal circulation.

Catherine Ross↗
NASA NTRSDate not supplied

Zircon (U-Th)/He Impact Crater Thermochronometry and the Effects of Shock Microstructures on Helium Diffusion Kinetics

Accurate and precise age determination of impact cratering events remains challenging and often contentious; less than half of all known craters are regarded as accurately and precisely dated. Zircon (U-Th)/He (ZHe) dating of impactites can be employed to date medium to large impact structures as ZHe ages can be fully reset in minutes at T >1000°C, a plausible scenario in the central melt pool. In contrast, complete resetting of ZHe at 200-300°C, encountered near the crater margins or due to post-impact hydrothermal overprinting, may take >103-6 years. To test the reliability of ZHe impact dating, we have quantified the effects of shock-induced microstructures on helium diffusion kinetics in well-characterized variably shocked zircon. We investigated samples from two impact structures, the Chicxulub multi-ring crater and Ries complex crater, to compare diffusion kinetics from structures with different size, age, and hydrothermal system longevity. Shock microstructures were characterized by backscattered-electron imaging prior to determining the He diffusion kinetics by prograde and retrograde fractional-release experiments via light-bulb furnace with incremental step-heating (10°C) from 300°C to 600°C. Next, we examine the internal interconnectivity and sizes of the diffusion domains by EBSD. While we found that zircon with few shock microstructures exhibited no marked deviation from helium diffusion kinetics of undamaged zircon, zircon grains with planar microstructures and granular textures are characterized by a dramatic decrease in helium retentivity due to the reduction in the effective domain size and the introduction of interconnected fast diffusion pathways. A subset of grains were ZHe dated and showed that less deformed grains yielded a weighted mean age within error of the accepted impact ages, while the grains with planar microstructures or granular textures gave systematically younger ages. These new diffusion data and ZHe ages demonstrate that highly shocked grains are unsuitable for ZHe impact crater dating. Therefore, detailed characterization of impact-induced microstructures is critical for determining accurate ZHe impact ages and offers the possibility of investigating post-impact hydrothermal circulation.

Zircon↗