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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 343 records · Page 19
All sourcesNASA NTRSDOE OSTI
NASA NTRS1993

Single event test methodology for integrated optoelectronics

A single event upset (SEU), defined as a transient or glitch on the output of a device, and its applicability to integrated optoelectronics are discussed in the context of spacecraft design and the need for more than a bit error rate viewpoint for testing and analysis. A methodology for testing integrated optoelectronic receivers and transmitters for SEUs is presented, focusing on the actual test requirements and system schemes needed for integrated optoelectronic devices. Two main causes of single event effects in the space environment, including protons and galactic cosmic rays, are considered along with ground test facilities for simulating the space environment.

Label, Kenneth A.↗
NASA NTRS1992

Single event phenomena: Testing and prediction

Highly integrated microelectronic devices are often used to increase the performance of satellite systems while reducing the system power dissipation, size, and weight. However, these devices are usually more susceptible to radiation than less integrated devices. In particular, the problem of sensitivity to single event upset and latchup is greatly increased as the integration level is increased. Therefore, a method for accurately evaluating the susceptibility of new devices to single event phenomena is critical to qualifying new components for use in space systems. This evaluation includes testing devices for upset or latchup and extrapolating the results of these tests to the orbital environment. Current methods for testing devices for single event effects are reviewed, and methods for upset rate prediction, including a new technique based on Monte Carlo simulation, are presented.

Kinnison, James D.↗
NASA NTRS1997

Antifuse FPGA for Space Applications

This paper presents viewgraphs of Antifuse FPGA (Field Programmable Gate Array) for Space Applications. The topics include: 1) A32140DX TID Test; 2) A1280XL Proton Test; 3) SEU (Single Event Upsets) Rate Calculation; 4) Recent Products Test; 5) A1460A TID (Traveling Ionospheric Disturbances) Test; 6) I100 Proton Test; 7) 100/RHI100 SEU Test; 8) I100/RH100 TID Test; 9) A1020S TID Test; 10) TID Charge Pump Failure; 11) Radiation Testing; and SEE (Single Event Effects) Test Setup.

Wang, Jih-Jong↗
NASA NTRS1999

Cassini Environmental Test and Analysis Program Summary

This paper presents an overview of the Cassini Project's environmental test and analysis program during thc spacecraft development phase - October 1989 to launch on October 1997. It describes the program's objectives and requirements, summarizes the approach used to achieve them, and provides the margins that were achieved in the final design. Assembly and system level environmental tests that were performed included dynamic, thermal, electromagnetic compatibility (EMC), and magnetic tests. Analysis was used to verify that the environmental requirements of radiation, solid particles including micrometeoroids, and single event effects have been satisfied. The environmental program implemented on Cassini satisfied the spirit and intent of the requirements imposed by the Project during the spacecraft's development. The lessons learned from the Cassini environmental program are discussed.

Hoffman, Alan R.↗
NASA NTRS1998

Device SEE Susceptibility Update: 1996-1998

This eighth Compendium continues the previous work of Nichols, et al, on single event effects (SEE) first published in 1985. Because the compendium has grown so voluminous, this update only presents data not publised in previous compendia.

Coss, J. R.↗
NASA NTRS1998

Overview of Device SEE Susceptibility from Heavy Ions

A fifth set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications (1,2,3,4) in December issues for 1985, 1987, 1989, and 1991. Trends in SEE susceptibility (including soft errors and latchup) for state-of-the-art parts are evaluated.

Nichols, D. K.↗
NASA NTRS2003

A NASA Perspective and Validation and Testing of Design Hardening for the Natural Space Radiation Environment (GOMAC Tech 03)

With the dearth of dedicated radiation hardened foundries, new and novel techniques are being developed for hardening designs using non-dedicated foundry services. In this paper, we will discuss the implications of validating these methods for the natural space radiation environment issues: total ionizing dose (TID) and single event effects (SEE). Topics of discussion include: Types of tests that are required, Design coverage (i.e., design libraries: do they need validating for each application?) A new task within NASA to compare existing design. This latter task is a new effort in FY03 utilizing a 8051 microcontroller core from multiple design hardening developers as a test vehicle to evaluate each mitigative technique.

Day, John H.↗
NASA NTRS2004

The Dynamics of the Atmospheric Radiation Environment at Aviation Altitudes

Single Event Effects vulnerability of on-board computers that regulate the: navigational, flight control, communication, and life support systems has become an issue in advanced modern aircraft, especially those that may be equipped with new technology devices in terabit memory banks (low voltage, nanometer feature size, gigabit integration). To address this concern, radiation spectrometers need to fly continually on a multitude of carriers over long periods of time so as to accumulate sufficient information that will broaden our understanding of the very dynamic and complex nature of the atmospheric radiation environment regarding: composition, spectral distribution, intensity, temporal variation, and spatial variation.

Stassinopoulos, Epaminondas G.↗
NASA NTRS2005

Virtex-II Pro PowerPC SEE Characterization Test Methods and Results

The Xilinx Vix-11 Pro is a platform FPGA that embeds multiple microprocessors within the fabric of an SRAM-based reprogrammable FPGA. The variety and quantity of resources provided by this family of devices make them very attractive for spaceflight applications. However,these devices will be susceptible to single event effects (SEE), which must be mitigated. Observations from prior testing of the Xilinx Virtex-II Pro suggest that the PowerPC core has significant vulnerability to SEES. However, these initial tests were not designed to exclusively target the functionality of the PowerPC, therefore making it difficult to distinguish processor upsets from fabric upsets. The main focus of this paper involves detailed SEE testing of the embedded PowerPC core. Due to the complexity of the PowerPC, various custom test applications, both static and dynamic, will be designed to isolate each Unit of the processor. Collective analysis of the test results will provide insight into the exact upset mechanism of the PowerPC. With this information, mitigations schemes can be developed and tested that address the specific susceptibilities of these devices. The test bed will be the Xilinx SEE Consortium Virtex-II Pro test board, which allows for configuration scrubbing, design triplication, and ease of data collection. Testing will be performed at the Indiana University Cyclotron Facility using protons of varying energy levels and fluencies. This paper will present the detailed test approach along with the results.

Petrick, David↗
NASA NTRS2005

Expecting the Unexpected: Radiation Hardened Software

Radiation induced Single Event Effects (SEEs) are a serious problem for spacecraft flight software, potentially leading to a complete loss of mission. Conventional risk mitigation has been focused on hardware, leading to slow, expensive and outdated on-board computing devices, increased power consumption and launch mass. Our approach is to look at SEEs from a software perspective, and to explicitly design flight software so that it can detect and correct the majority of SEES. Radiation hardened flight software will reduce the significant residual residual risk for critical missions and flight phases, and enable more use of inexpensive and fast COTS hardware.

Penix, John↗
NASA NTRS2008

Using Space Weather Variability in Evaluating the Environment Design Specifications for NASA'S Constellation Program

Spectral models of solar particle events and trapped radiation belts are necessary for the design requirements of total ionizing radiation dose, single event effects, and spacecraft charging. Space radiation and plasma environment specifications for hardware design are necessarily conservative to assure system robustness for a wide range of space environments.

Coffey, Victoria N.↗
NASA NTRS2008

Exploration Technology Developments Program's Radiation Hardened Electronics for Space Environments (RHESE) Project Overview

Primary Objective: 1) A computational tool to accurately predict electronics performance in the presence of space radiation in support of spacecraft design: a) Total dose; b) Single Event Effects; and c) Mean Time Between Failure. (Developed as successor to CR ME96.) Secondary Objectives: 2) To provide a detailed description of the natural radiation environment in support of radiation health and instrument design: a) In deep space; b) Inside the magnetosphere; and c) Behind shielding.

Keys, Andrew S.↗
NASA NTRS2008

Phillips SA8016BW 2.5 GHz Synthesizer SEE Testing

This viewgraph presentation reviews the Single Event Effects (SEE) testing of the Phillips SA8016BW 2.5 GHz Synthesizer that was chose by the GLAST Program for Frequency Generation. Included in this are diagrams of the phased-locked loop (PLL), the synthesizer, and heater.

Carts, Marty↗
NASA NTRS2007

Model for Cumulative Solar Heavy Ion Energy and LET Spectra

A probabilistic model of cumulative solar heavy ion energy and lineary energy transfer (LET) spectra is developed for spacecraft design applications. Spectra are given as a function of confidence level, mission time period during solar maximum and shielding thickness. It is shown that long-term solar heavy ion fluxes exceed galactic cosmic ray fluxes during solar maximum for shielding levels of interest. Cumulative solar heavy ion fluences should therefore be accounted for in single event effects rate calculations and in the planning of space missions.

Xapsos, Mike↗
NASA NTRS2008

Are Current SEE Test Procedures Adequate for Modern Devices and Electronics Technologies?

Believe it or not, this has been a simplistic look at starting a checklist for SEE testing. Given a memory that has 68 operating modes, when a SEU occurs that changes the mode, just how do you determine what's going on? Laser and microbeam tests can help, but not easily for modern packaged devices. Expanding this approach to other more complex devices such as ADCs or processors as well as analog devices should be considered. The recommendation is to use the existing text standards as the starting point. Just make your own checklist for the device/technology/issues being considered. At HEART 2007, we presented some of the burgeoning challenges associated with single event effect(SEE) testing of modern commercial memories: a) Package, device complexity, test fixture, and data analysis issues were discussed; b) "Complete" SEE Characterization would take 15 years; c) Qualification test costs have a greater than 4 times increase over the last decade. In this talk, we continue to explore the roles of technology with an emphasis on the existing SEE Test Procedures and some of the concerns related to modern devices. The primary objective of the briefing is to provide some overarching guidance concerning the many considerations involved in the formulation of a SEE test plan provided in a " Checklist" format.we note that there is no such thing as a complete check list and that the best approach is to develop a flexible test plan that takes into account the device type and functions, the device technology, circuit and package design, and, of course, test facility and beam characteristics.

LaBel, Kenneth A.↗