The degradation mechanism of Ti-Pd-Ag solar cell contacts by an accelerated electrochemical testing technique
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Shalaby, H.↗
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Leakage Currents in Low-Voltage PME and BME Ceramic Capacitors
Introduction of BME capacitors to high-reliability electronics as a replacement for PME capacitors requires better understanding of changes in performance and reliability of MLCCs to set justified screening and qualification requirements. In this work, absorption and leakage currents in various lots of commercial and military grade X7R MLCCs rated to 100V and less have been measured to reveal difference in behavior of PME and BME capacitors in a wide range of voltages and temperatures. Degradation of leakage currents and failures in virgin capacitors and capacitors with introduced cracks has been studied at different voltages and temperatures during step stress highly accelerated life testing. Mechanisms of charge absorption, conduction and degradation have been discussed and a failure model in capacitors with defects suggested.
base metal electrode capacitor (BME)↗
Study of the thermal degradation mechanism of a composite propellant
The current experimental program was designed to systematically investigate the role of the oxidizer in the thermal degradation process of composite propellants. The scanning electron microscope (SEM) was used to examine the failure sites in thermally degraded propellant samples. The formulation variables tested were oxidizer purity, oxidizer particle size, and oxidizer to binder bonding agent. The binder, a saturated hydrocarbon, was kept constant throughout the experiments. The oxidizers were: AP, chlorate-doped AP, arsenate-doped AP, and phosphate-doped AP. The oxidizer particle size distribution was 60% of the large fraction and 40% of the small fraction. The bonding agent, when present, was used at the 0.15% level. The data showed that both the oxidizer purity and particle size had an important affect on the thermal degradation process. The affect of the oxidizer particle size was more noticeable at the higher temperature and stress levels. An examination of the failure site, by SEM, of propellants subject to these latter conditions indicated that the fracturing of the large oxidizer particles led to the propellant cracking.
Schmidt, W. G.↗
Hydrogen depolarized carbon dioxide concentrator performance improvements and cell pair structural tests
The investigations and testing associated with the CO2 removal efficiency and voltage degradation of a hydrogen depolarized carbon oxide concentrator are reported. Also discussed is the vibration testing of a water vapor electrolysis cell pair. Performance testing of various HDC cell pairs with Cs2CO3 electrolyte provided sufficient parametric and endurance data to size a six man space station prototype CO2 removal system as having 36 HDC cell pairs, and to verify a life capability exceeding six moths. Testing also demonstrated that tetramethylammonium carbonate is an acceptable HDC electrolyte for operating over the relative humidity range of 30 to 90 percent and over a temperature range of 50 to 80 F.
Huddleston, J. D.↗
The 1.1 micrometer and visible emission semiconductor diode lasers
In (AlGa)As, the first of three alloy systems studied, Continuous Wave (CW) operation was obtained at room temperature at a wavelength as low as 7260 A. Reliability in this system was studied in the incoherent mode. Zinc doped devices had significant degradation, whereas Ge or Ge plus Zi doped devices had none. The Al2O3 facet coatings were shown to significantly reduce facet deterioration in all types of lasers, longer wavelength units of that type having accumulated (at the time of writing) 22,000 hours with little if any degradation. A CL study of thin (AlGa)As layers revealed micro fluctuation in composition. A macro-scale fluctuation was observed by electroreflectance. An experimental and theoretical study of the effect of stripe width on the threshold current was carried out. Emission below 7000 A was obtained in VPE grown Ga(AsP) (In,Ga)P with CW operation at 10 C. Lasers and LED's were made by LPE in (InGa) (AsP). Laser thresholds of 5 kA/cm2 were obtained, while LED efficiences were on the order of 2%. Incoherent life test over 6000 hours showed no degradation.
Ladany, I.↗
Single-Event Effect Report for EPC Series eGaN FETs: EPC1001, EPC1010, EPC1014, EPC1012
Heavy ion testing of newly available GaN FETs from EPC were tested in March of 2012 at TAM. The EPC1010, EPC1001, EPC1012, and EPC1014 were tested for general radiation response from gold and xenon ions. Overall the devices showed radiation degradation commensurate with breakdown in isolation oxides, and similar testing by EPC and Microsemi agrees with these data. These devices were the first generation production of the device called Gen1. Gen2 parts are scheduled for later in the third quarter of FY2012
Scheick, Leif↗
Micrometeorite Impact Test of Flex Solar Array Coupon
Spacecraft with solar arrays operate throughout the near earth environment and are increasingly planned for outer planet missions. An often overlooked test condition for solar arrays that is applicable to these missions is micrometeorite impacts and possibly electrostatic discharge (ESD) events resulting from these impacts. The Marshall Space Flight Center (MSFC) is partnering with Space Systems/Loral, LLC (SSL) to examine the results of simulated micrometeorite impacts on the electrical performance of an advanced, lightweight flexible solar array design. The test is performed at NASA MSFC's Microlight Gas Gun Facility. The SSL-provided coupons consist of three strings, each string with two solar cells in series. Five impacts will be induced at various locations on a powered test coupon under different string voltage (0 volts - 150 volts) and string current (1.1 amperes - 1.65 amperes) conditions. The maximum specified test voltage and current represent margins of 1.5 times for both voltage and current. The test parameters are chosen to demonstrate new array design robustness to any ESD event caused by plasma plumes resulting from a simulated micrometeorite impact. A second unpowered coupon will undergo two impacts: one impact on the front side and one impact on the back side. Following the impact testing, the second coupon will be exposed to a thermal cycle test to determine possible damage propagation and further electrical degradation due to thermally-induced stress. The setup, checkout, and results from the impact testing are discussed. The challenges for impact testing include precise coupon alignment to control impact location; pressure management during the impact process; and measurement of the true transient electrical response during impact on the powered coupon. Results from pre- and post-test visual and electrical functional testing are also discussed.
Wright, K. H.↗
Single-Event Effect Report for EPC Series eGaN FETs: EPC1001, EPC1010, EPC1014, EPC1012
Heavy ion testing of newly available GaN FETs from EPC were tested in March of 2012 at TAM. The EPC1010, EPC1001, EPC1012, and EPC1014 were tested for general radiation response from gold and xenon ions. Overall the devices showed radiation degradation commensurate with breakdown in isolation oxides, and similar testing by EPC and Microsemi agrees with these data. These devices were the first generation production of the device called Gen1. Gen2 parts are scheduled for later in the third quarter of FY2012
Scheick, Leif↗
Effect of Post-HALT Annealing on Leakage Currents in Solid Tantalum Capacitors
Degradation of leakage currents is often observed during life testing of tantalum capacitors and is sometimes attributed to the field-induced crystallization in amorphous anodic tantalum pentoxide dielectrics. However, degradation of leakage currents and the possibility of annealing of degraded capacitors have not been investigated yet. In this work the effect of annealing after highly accelerated life testing (HALT) on leakage currents in various types of solid tantalum capacitors was analyzed. Variations of leakage currents with time during annealing at temperatures from 125 oC to 180 oC, thermally stimulated depolarization (TSD) currents, and I-V characteristics were measured to understand the conduction mechanism and the reason for current degradation. Annealing resulted in a gradual decrease of leakage currents and restored their initial values. Repeat HALT after annealing resulted in reproducible degradation of leakage currents. The observed results are explained based on ionic charge instability (drift/diffusion of oxygen vacancies) in the tantalum pentoxide dielectrics using a modified Schottky conduction mechanism.
Teverovsky, Alexander↗
Successful completion of a cyclic ground test of a mercury ion auxiliary propulsion system
An engineering model Ion Auxiliary Propulsion System (IAPS) 8-cm thruster (S/N 905) has completed a life test at NASA Lewis Research Center. The mercury ion thruster successfully completed and exceeded the test goals of 2557 on/off cycles and 7057 hr of operation at full thrust. The final 1200 cycles and 3600 hr of the life test were conducted using an engineering model of the IAPS power electronics unit (PEU) and breadboard digital controller and interface unit (DCIU). This portion of the test is described in this paper with a charted history of thruster operating parameters and off-normal events. Performance and operating characteristics were constant throughout the test with only minor variations. The engineering model power electronics unit operated without malfunction; the flight software in the digital controller and interface unit was exercised and verified. Post-test inspection of the thruster revealed facility enhanced accelerator grid erosion but overall the thruster was in good condition. It was concluded that the thruster performance was not drastically degraded by time or cycles. Additional cyclic testing is currently under consideration.
Francisco, David R.↗
Successful completion of a cyclic ground test of a mercury Ion Auxiliary Propulsion System
An engineering model Ion Auxiliary Propulsion System (IAPS) 8-cm thruster (S/N 905) has completed a life test at NASA Lewis Research Center. The mercury ion thruster successfully completed and exceeded the test goals of 2557 on/off cycles and 7057 hr of operation at full thrust. The final 1200 cycles and 3600 hr of the life test were conducted using an engineering model of the IAPS power electronics unit (PEU) and breadboard digital controller and interface unit (DCIU). This portion of the test is described in this paper with a charted history of thruster operating parameters and off-normal events. Performance and operating characteristics were constant throughout the test with only minor variations. The engineering model power electronics unit operated without malfunction; the flight software in the digital controller and interface unit was exercised and verified. Post-test inspection of the thruster revealed facility enhanced accelerator grid erosion but overall the thruster was in good condition. It was concluded that the thruster performance was not drastically degraded by time or cycles. Additional cyclic testing is currently under consideration.
Francisco, David R.↗
Cycle life status of SAFT VOS nickel-cadmium cells
The SAFT prismatic VOS Ni-Cd cells have been flown in geosynchronous orbit since 1977 and in low earth orbit since 1983. Parallel cycling tests are performed by several space agencies in order to determine the cycle life for a wide range of temperature and depth of discharge (DOD). In low Earth orbit (LEO), the ELAN program is conducted on 24 Ah cells by CNES and ESA at the European Battery Test Center at temperatures ranging from 0 to 27 C and DOD from 10 to 40 percent. Data are presented up to 37,000 cycles. One pack (X-80) has achieved 49,000 cycles at 10 C and 23 percent DOD. The geosynchronous orbit simulation of a high DOD test is conducted by ESA on 3 batteries at 10 C and 70, 90, and 100 percent DOD. Thirty-one eclipse seasons are completed, and no signs of degradation have been found. The Air Force test at CRANE on 24 Ah and 40 Ah cells at 20 C and 80 percent DOD has achieved 19 shadow periods. Life expectancy is discussed. The VOS cell technology could be used for the following: (1) in geosynchronous conditions--15 yrs at 10-15 C and 80 percent DOD; and (2) in low earth orbit--10 yrs at 5-15 C and 25-30 percent DOD.
Goualard, Jacques↗
Subsonic Dynamic Stability Tests of a Sample Return Entry Vehicle
An investigation has been conducted in the NASA Langley 20-Foot Vertical Spin Tunnel (VST) to determine the subsonic dynamic stability characteristics of a proposed atmospheric entry vehicle for sample return missions. In particular, the effects of changes in aft-body geometry on stability were examined. Freeflying tests of a dynamically scaled model with various geometric features were conducted, including cases in which the model was perturbed to measure dynamic response. Both perturbed and non-perturbed runs were recorded as motion time histories using the VST optical data acquisition system and reduced for post-test analysis. In addition, preliminary results from a static force and moment test of a similar model in the Langley 12-Foot Low Speed Tunnel are presented. Results indicate that the configuration is dynamically stable for the baseline geometry, but exhibits degraded dynamic behavior for the geometry modifications tested.
Fremaux, C. Michael↗
Evaluation of Commercial Automotive-Grade BME Capacitors
Three Ni-BaTiO3 ceramic capacitor lots with the same specification (chip size, capacitance, and rated voltage) and the same reliability level, made by three different manufacturers, were degraded using highly accelerated life stress testing (HALST) with the same temperature and applied voltage conditions. The reliability, as characterized by mean time to failure (MTTF), differed by more than one order of magnitude among the capacitor lots. A theoretical model based on the existence of depletion layers at grain boundaries and the entrapment of oxygen vacancies has been proposed to explain the MTTF difference among these BME capacitors. It is the conclusion of this model that reliability will not be improved simply by increasing the insulation resistance of a BME capacitor. Indeed, Ni-BaTiO3 ceramic capacitors with a smaller degradation rate constant K will always give rise to a longer reliability life
capacitor↗
Evaluation of Commercial Automotive-Grade BME Capacitors
Three Ni-BaTiO3 ceramic capacitor lots with the same specification (chip size, capacitance, and rated voltage) and the same reliability level, made by three different manufacturers, were degraded using highly accelerated life stress testing (HALST) with the same temperature and applied voltage conditions. The reliability, as characterized by mean time to failure (MTTF), differed by more than one order of magnitude among the capacitor lots. A theoretical model based on the existence of depletion layers at grain boundaries and the entrapment of oxygen vacancies has been proposed to explain the MTTF difference among these BME capacitors. It is the conclusion of this model that reliability will not be improved simply by increasing the insulation resistance of a BME capacitor. Indeed, Ni-BaTiO3 ceramic capacitors with a smaller degradation rate constant K will always give rise to a longer reliability life.
reliability↗
Radiation Effects on Current Field Programmable Technologies
Manufacturers of field programmable gate arrays (FPGAS) take different technological and architectural approaches that directly affect radiation performance. Similar y technological and architectural features are used in related technologies such as programmable substrates and quick-turn application specific integrated circuits (ASICs). After analyzing current technologies and architectures and their radiation-effects implications, this paper includes extensive test data quantifying various devices total dose and single event susceptibilities, including performance degradation effects and temporary or permanent re-configuration faults. Test results will concentrate on recent technologies being used in space flight electronic systems and those being developed for use in the near term. This paper will provide the first extensive study of various configuration memories used in programmable devices. Radiation performance limits and their impacts will be discussed for each design. In addition, the interplay between device scaling, process, bias voltage, design, and architecture will be explored. Lastly, areas of ongoing research will be discussed.
Katz, R.↗
Effects of Strain Rate and Surface Finish on Tensile Properties in High Pressure Hydrogen — A Case Study for LP-DED NASA HR-1
NASA has advanced NASA HR-1 as a solution for liquid rocket engine components that operate in hydrogen rich environments using various AM techniques. The NASA HR-1 for AM applications was specifically formulated for high ductility in high pressure gaseous hydrogen environment in addition to high strength and low cycle fatigue (LCF) resistance. NASA HR-1 meets materials requirements for liquid rocket engine components, including good hydrogen resistance, high conductivity, good LCF performance, and high elongation and strength for components in medium heat flux environments. NASA has completed fabrication of several subscale and full-scale channel wall nozzles in LP-DED NASA HR-1 and completed hot-fire testing. This includes refinement of the process to produce thin-walls and various channel geometries to meet the requirements for channel wall nozzle applications. The main objective of this investigation is to better understand the effects of tensile test strain rate and specimen surface finish on the amount of tensile ductility degradation in high pressure gaseous hydrogen environments. Performing smooth tensile tests in high pressure hydrogen and nitrogen environments can serve as a rapid and economical screening method to determine the relative susceptibility of materials to HEE. This paper presents the tensile test results for LP-DED NASA HR-1 in hydrogen and details the material evaluation on the effects of strain rate and surface finish condition on surface cracking behavior and fracture characteristics. The resistance to HEE for LP-DED NASA HR-1 and the wrought alloy is compared under the same testing conditions. Loss of tensile ductility is quantified in terms of changes in elongation at failure in hydrogen to compare HEE susceptibility. The most suitable strain rate and specimen surface finish condition for future HEE screening testing at MSFC are recommended.
Additive manufacturing↗
Liquid chromatographic analysis of a formulated ester from a gas-turbine engine test
Size exclusion chromatography (SEC) utilizing mu-Bondagel and mu-Styragel columns with a tetrahydrofuran mobile phase was used to determine the chemical degradation of lubricant samples from a gas-turbine engine test. A MIL-L-27502 candidate, ester-based lubricant was run in a J57-29 engine at a bulk oil temperature of 216 C. In general, the analyses indicated a progressive loss of primary ester, additive depletion, and formation of higher molecular weight material. An oil sample taken at the conclusion of the test showed a reversal of this trend because of large additions of new oil. The high-molecular-weight product from the degraded ester absorbed strongly in the ultraviolet region at 254 nanometers. This would indicate the presence of chromophoric groups. An analysis of a similar ester lubricant from a separate high-temperature bearing test yielded qualitatively similar results.
Jones, W. R., Jr.↗