Phase shifts and local charge neutrality in semiconductors.
Schroedinger equation in semiconductor with N atoms containing dislocation, vacancy or other defect, noting phase shift and local charge neutrality
CRYSTAL DISLOCATION↗
SEARCH · Search NASA
Results for “semiconductor”
Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.
Effect of electrostatic field gradient in semiconductors with diffused impurities.
Electrostatic field gradient effect in semiconductors with diffused impurities investigated, using basic diffusion theory
SEMICONDUCTOR↗
Dangling bonds and dislocations in semiconductors.
Dangling bonds and dislocations in semiconductors, noting existence of core charge dependent localized state in gap caused by local decrease in atom density
CRYSTAL DISLOCATION↗
Basic Research in Semiconductor Detector- Dosimeter Characteristics, as Applied to the Problems of Whole Body Dosimetry Annual Progress Report
Preparation of lithium-drifted semiconductor nuclear particle detectors
DETECTOR↗
High reliability screening of semiconductor and integrated circuit devices Final report
High reliability screening of semiconductor and integrated circuit devices
SEMICONDUCTOR DEVICE↗
The status of ultrachemical analysis for semiconductors Final report
Atomic absorption and emission spectroscopy, and neutron activation for ultratrace chemical analysis of materials for semiconductor
TRACE ELEMENT↗
Anisotropic electron distribution in pure semiconductors in the neighborhood of the avalanche
Anisotropic electron distribution in pure semiconductors in neighborhood of avalanche
ELECTRON AVALANCHE↗
Crystal field spectra of 3dn impurities in II-VI and III-V compound semiconductors
Crystal field spectra of energy level state impurities in periodic groups II to VI and III to V compound semiconductors
ABSORPTION SPECTRUM↗
High reliability screening of semiconductor and integrated circuit devices
Destructive and nondestructive testing, results, and specifications for reliability of integrated circuit and semiconductor devices
NONDESTRUCTIVE TESTING↗
Investigation of electrical conductivity in amorphous semiconductors Semiannual report
Electric conductivity and electron transport mechanisms in amorphous semiconductors
ELECTRIC CONDUCTIVITY↗
An experimental investigation of radiation effects in semiconductors Semiannual status report, Jul. 1 - Dec. 31, 1963
Production mechanisms of radiation induced defects in semiconductors
CRYSTAL STRUCTURE DEFECT↗
Energy for electron - hole pair generation in silicon by protons using lithium drifted semiconductor detectors
Energy for electron-hole pair generation in silicon by protons using lithium drifted semiconductor detectors
ENERGY ABSORPTION↗
Surface effects in semiconductors due to evaporation techniques
Fabrication induced surface instabilities in semiconductor devices
SEMICONDUCTOR DEVICE↗
Evaluation of semiconductor devices using the scanning electron microscope
Scanning electron microscope for evaluating failure mechanisms in semiconductor devices, and for three-dimensional representation of biological specimens
FLAW DETECTION↗
Semiconductor diffusion technology
Production capability for specific monolithic and hybrid semiconductor circuits and standard test mask incorporating transistor and resistor patterns
MASK↗
An experimental investigation of radiation effects in semiconductors Semiannual status report, 1 Jan. - 30 Jun. 1967
Radiation effects on semiconductors, and recombination lifetimes in gamma-irradiated, boron-doped silicon
RECOMBINATION↗
Transition metal impurities in semiconductors
Crystal field theory applied transition metal impurities in semiconductors
CRYSTAL↗