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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 37 records · Page 2

NASA-DoD Lead-Free Electronics Project

Original Equipment Manufacturers (OEMs). depots. and support contractors have to be prepared to deal with an electronics supply chain thaI increasingly provides parts with lead-free finishes. some labeled no differently and intenningled with their SnPb counterparts. Allowance oflead-free components presents one of the greatest risks to the reliability of military and aerospace electronics. The introduction of components with lead-free lenninations, tennination finishes, or circuit boards presents a host of concerns to customers. suppliers, and maintainers of aerospace and military electronic systems such as: 1. Electrical shorting due to tin whiskers; 2. Incompatibility oflead-free processes and parameters (including higher melting points of lead-free alloys) with other materials in the system; and 3. Unknown material properties and incompatibilities that could reduce solder joint re liability.

Kessel, Kurt↗

NASA TEERM Hexavalent Chrome Alternatives Projects

The overall objective of the Hex Chrome Free Coatings for Electronics project is to evaluate and test pretreatment coating systems not containing hexavalent chrome in avionics and electronics housing applications. This objective will be accomplished by testing strong performing coating systems from prior NASA and DoD testing or new coating systems as determined by the stakeholders. The technical stakeholders have agreed that this protocol will focus specifically on Class 3 coatings. Original Equipment Manufacturers (OEMs), depots, and support contractors have to be prepared to deal with an electronics supply chain that increasingly provides parts with lead-free finishes, some labeled no differently and intermingled with their SnPb counterparts. Allowance of lead-free components presents one of the greatest risks to the reliability of military and aerospace electronics. The introduction of components with lead-free terminations, termination finishes, or circuit boards presents a host of concerns to customers, suppliers, and maintainers of aerospace and military electronic systems such as: 1. Electrical shorting due to tin whiskers 2. Incompatibility of lead-free processes and parameters (including higher melting points of lead-free alloys) with other materials in the system 3. Unknown material properties and incompatibilities that could reduce solder joint reliability

Kessel, Kurt R.↗

Test Plan to Investigate the Optimal Cure Schedule of an Epoxy Resin for Its Application as an Adhesive in Optocouplers

Epoxy resins are polymeric materials that are known for their versatility, low cost, and strong thermal and mechanical properties. They can be used as coatings, adhesives, automotive primers, and have become staples in electronics, aerospace composites and semiconductor encapsulates. Recently, LANL has experienced a decline in the quality of a specialized electronic device, called an optocoupler, which is normally acquired from commercial suppliers. Because of this, a group at LANL is exploring the feasibility of in-house manufacturing of an optocoupler that is better suited for their application. The current prototype has resulted in adhesive failure after being exposed to several thermal cycles. There is a need to investigate the possible reasons for this failure, particularly how the cure schedule of the epoxy might affect its adhesive strength over time and in cycled temperatures. To assist in this investigation, a test plan has been developed involving multiple experiments using thermomechanical analysis (TMA), dynamic mechanical analysis (DMA) and differential scanning calorimetry (DSC).

36 MATERIALS SCIENCE↗

Preliminary Radiation Analysis of the Total Ionizing Dose for the Resource Prospector Mission

NASA's Resource Prospector (RP) is a collaborative project between multiple centers and institutions to search for volatiles at the polar regions of the Moon as a potential resource for oxygen and propellant production. The mission is rated Class D and will be the first In-Situ Resource Utilization (ISRU) demonstration on the lunar surface and at the lunar poles. Given that this mission is rated Class D, the project is considering using commercial off the shelf (COTS) electronics parts to reduce cost. However, COTS parts can be more susceptible to space radiation than typical aerospace electronic parts and carry some additional risk. Thus, prior to parts selection, having a better understanding of the radiation environment can assist designers in the parts selection process. The focus of this paper is to provide a preliminary analysis of the radiation environment from launch, through landing on the surface, and some surface stay as an initial step in determining worst case mission doses to assist designers in screening out electronic parts that would not meet the potential dose levels experienced on this mission.

Rojdev, Kristina↗

Energy measurement of electron beams by Compton scattering

A method has been proposed to utilize the well-known Compton scattering process as a tool to measure the centroid energy of a high energy electron beam at the 0.01% level. It is suggested to use the Compton scattering of an infrared laser off the electron beam, and then to measure the energy of the scattered gamma-rays very precisely using solid-state detectors. The technique proposed is applicable for electron beams with energies from 200 MeV to 16 GeV using presently available lasers. This technique was judged to be the most viable of all those proposed for beam energy measurements at the nearby Continuous Electron Beam Accelerator Facility (CEBAF). Plans for a prototype test of the technique are underway, where the main issues are the possible photon backgrounds associated with an electron accelerator and the electron and laser beam stabilities and diagnostics. The bulk of my ASEE summer research has been spent utilizing the expertise of the staff at the Aerospace Electronics Systems Division at LaRC to assist in the design of the test. Investigations were made regarding window and mirror transmission and radiation damage issues, remote movement of elements in ultra-high vacuum conditions, etc. The prototype test of the proposed laser backscattering method is planned for this December.

Keppel, Cynthia↗

Thermal Barrier Coatings Overview: Design, Manufacturing, and Applications in High-Temperature Industries

Today’s competitive world economy is creating an indispensable demand for increased efficiency of engineering components that operate in harsh environments (i.e., very high-temperature, corrosive, or neutron irradiation environments), for applications in the energy, automotive, aerospace, electronics, and power industries. Increased research is being done on thermal barrier coatings (TBCs) for protecting such components, since the versatility of manufacturing techniques and the scale of deployment result in increased life, economics, performance, and durability. This review focuses on the advances that led to using TBCs for component life extension and, more recently, as an integral part of advanced component design for high-temperature and other types of harsh environments, such as those found in nuclear-related applications. Furthermore, factors that led to state-of-the-art advanced coating-fabrication techniques [e.g., electron-beam physical vapor deposition (EB-PVD), plasma spray deposition, and electrophoretically deposited TBCs, as well as functionally graded material (FGM) manufacturing] have also been emphasized in current coating R&D. This review explores the current state of TBCs, i.e., the latest advances regarding their fabrication and performance, associated challenges, and recommendations for their future use in aerospace, nuclear, high-temperature, or otherwise harsh environments.

11 NUCLEAR FUEL CYCLE AND FUEL MATERIALS↗

Exposure to Carbon Nanotube Material: Assessment of Nanotube Cytotoxicity Using Human Keratinocyte Cells

Carbon nanotubes are new members of carbon allotropes similar to fullerenes and graphite. Because of their unique electrical, mechanical, and thermal properties, carbon nanotubes are important for novel applications in the electronics, aerospace, and computer industries. Exposure to graphite and carbon materials has been associated with increased incidence of skin diseases, such as carbon fiber dermatitis, hyperkeratosis, and naevi. We investigated adverse effects of single-wall carbon nanotubes (SWCNT) using a cell culture of immortalized human epidermal keratinocytes (HaCaT). After 18 h of exposure of HaCaT to SWCNT, oxidative stress and cellular toxicity were indicated by formation of free radicals, accumulation of peroxidative products, antioxidant depletion, and loss of cell viability. Exposure to SWCNT also resulted in ultrastructural and morphological changes in cultured skin cells. These data indicate that dermal exposure to unrefined SWCNT may lead to dermal toxicity due to accelerated oxidative stress in the skin of exposed workers.

Keratinocytes/drug effects↗

Reversible two-way tuning of thermal conductivity in an end-linked star-shaped thermoset

Polymeric thermal switches that can reversibly tune and significantly enhance their thermal conductivities are desirable for diverse applications in electronics, aerospace, automotives, and medicine; however, they are rarely achieved. Here, we report a polymer-based thermal switch consisting of an end-linked star-shaped thermoset with two independent thermal conductivity tuning mechanisms—strain and temperature modulation—that rapidly, reversibly, and cyclically modulate thermal conductivity. The end-linked star-shaped thermoset exhibits a strain-modulated thermal conductivity enhancement up to 11.5 at a fixed temperature of 60 °C (increasing from 0.15 to 2.1 W m –1 K –1 ). Additionally, it demonstrates a temperature-modulated thermal conductivity tuning ratio up to 2.3 at a fixed stretch of 2.5 (increasing from 0.17 to 0.39 W m –1 K –1 ). When combined, these two effects collectively enable the end-linked star-shaped thermoset to achieve a thermal conductivity tuning ratio up to 14.2. Moreover, the end-linked star-shaped thermoset demonstrates reversible tuning for over 1000 cycles. The reversible two-way tuning of thermal conductivity is attributed to the synergy of aligned amorphous chains, oriented crystalline domains, and increased crystallinity by elastically deforming the end-linked star-shaped thermoset.

42 ENGINEERING↗

Manufacturing of Complex Silicon–Carbon Structures: Exploring Si x C y Materials

This paper reports on the manufacturing of complex three-dimensional Si/C structures via a chemical vapor deposition method. The structure and properties of the grown materials were characterized using various techniques including scanning electron microscopy, aberration-corrected transmission electron microscopy, confocal Raman spectroscopy, and X-ray photoelectron spectroscopy. The spectroscopy results revealed that the grown materials were composed of micro/nanostructures with various compositions and dimensions. These included two-dimensional silicon carbide (SiC), cubic silicon, and various SiC polytypes. The coexistence of these phases at the nano-level and their interfaces can benefit several Si/C-based applications ranging from ceramics and structural applications to power electronics, aerospace, and high-temperature applications. With an average density of 7 mg/cm 3 , the grown materials can be considered ultralightweight, as they are three orders of magnitude lighter than bulk Si/C materials. This study aims to impact how ceramic materials are manufactured, which may lead to the design of new carbide materials or Si/C-based lightweight structures with additional functionalities and desired properties.

36 MATERIALS SCIENCE↗

A Concept for the Use and Integration of Super-Conducting Magnets in Structural Systems in General and Maglev Guideway Mega-Structures in Particular

Recent breakthroughs in several different fields now make it possible to incorporate the use of superconducting magnets in structures in ways which enhance the performance of structural members or components of structural systems in general and Maglev guideway mega-structures in particular. The building of structural systems which connect appropriately scaled superconducting magnets with the post-tensioned tensile components of beams, girders, or columns would, if coupled with 'state of the art' structure monitoring, feedback and control systems, and advanced computer software, constitute a distinct new generation of structures that would possess the unique characteristic of being heuristic and demand or live-load responsive. The holistic integration of powerful superconducting magnets in structures so that they do actual structural work, creates a class of 'technologically endowed' structures that, in part - literally substitute superconductive electric power and magnetism for concrete and steel. The research and development engineering, and architectural design issues associated with such 'technologically endowed' structural system can now be conceptualized, designed, computer simulates built and tested. The Maglev guideway mega-structure delineated herein incorporates these concepts, and is designed for operation in the median strip of U.S. Interstate Highway 5 from San Diego to Seattle an Vancouver, and possibly on to Fairbanks, Alaska. This system also fits in the median strip of U.S. Interstate Highway 55 and 95 North-South, and 80 and 10, East-West. As a Western Region 'Peace Dividend' project, it could become a National or Bi-National research, design and build, super turnkey project that would create thousands of jobs by applying superconducting, material science, electronic aerospace and other defense industry technologies to a multi-vehicle, multi-use Maglev guideway megastructure that integrates urban mass transit Lower Speed (0-100 mph), High Speed (100-200 mph), Super Speed (200-400 mph), and Hypersonic evacuated tube (400-10,000 mph) Maglev systems.

Ussery, Wilfred T.↗

Characterization of Infrared Diode Laser Beams and Atmospheric CO Imaging Instrument

During June-August 1997 Dr. Jonathan Miles participated in the ASEE-sponsored summer faculty research program at NASA Langley Research Center (LaRC). The Aerospace Electronic Systems Division (AESD), Sensor Systems Branch (SSB), at NASA LARC had proposed a new mission, GEOstationary TROpospheric Pollution SATellite (GEO TROPSAT), to address critical science questions of tropospheric chemistry. The troposphere is a complex system, comprising "point" and distributed sources of natural and anthropogenic origin; complicated transport processes, both lateral and vertical; and photochemistry driven by UV flux, temperature, atmospheric composition, and other variables. GEO TROPSAT would be implemented about a geostationary Earth orbital (GEO) position at the equator between 600 and 80" West longitude to observe the Americas and large portions of the oceans of either coast. This mission would advance our knowledge of the atmosphere by capturing the wide temporal and spatial variability of tropospheric phenomena which is undetectable from low Earth orbit. A pre-prototype imaging carbon monoxide (CO) imaging system operating within a narrow waveband about 4.7 [Lm was built, demonstrated, and evaluated. This system applies the gas-filter correlation radiometry (GFCR) technique and produces digitized images comprising 4096 pixels, each representing a single CO mixing ratio measurement inferred from radiometric data. Associated tasks accomplished included specification for the next-generation prototype system to operate in the 2.3-@tm waveband; characterization of a 64x64, InSb focal-plane-array (FPA) imager; design, fabrication, and assembly of a filter wheel; and software development. Laboratory evaluation of this system involved imaging of a test cell placed in the path of radiant flux emanating from a blackbody source used to simulate the radiant energy reflected by Earth in real application. The cell was evacuated for system balancing and then charged with measured quantities of CO to provide a means for system characterization. Two related research efforts were undertaken during the term of the study reported here - continued development of an atmospheric CO imaging instrument and characterization of diode-laser beams. Both efforts were successful and are described within the body of this report. A second objective was to provide a means for undergraduate ISAT majors to become involved with the research described, to be afforded the opportunity to learn the technologies associated with the work performed. Two ISAT students gained a comprehensive understanding and interest in missions supported by NASA through direct involvement in this project. Many more students were exposed to these technologies through demonstrations, laboratory tours, and explanations provided in lectures.

Miles, Jonathan J.↗

The Test and Evaluation of a Non-Chromate Finishing Agent

This research is focused on the design, development and implementation of an industry, military and commercial standard testing cell for surface coatings, which focuses on advanced non-chromate materials technology and their commercialization. Currently, within both private and commercial sectors, chromates are used in the corrosion prevention. processes. However, there is a great demand for chromate-free systems that are able to provide equal protection. At the end of this effort, it is intended that a patented alternative to chromate conversion coatings would be tested and processed for commercialization. Thus far, research studies have been concerned primarily with current corrosion knowledge and testing methods. Corrosion can be classified into five categories: The first type is uniform corrosion which is dominated by a uniform thinning due to an even and regular loss of metal. The second type is called localized corrosion in which most of the loss occurs in discrete areas. The third type, metallurgically influenced corrosion is a form of attack where metallurgy plays a significant role. The fourth type, titled mechanically assisted degradation is a form of attack where velocity, abrasion, and hydrodynamics control the corrosion process. The last type of corrosion is defined as environmentally induced cracking which occurs when cracks are produced under specific, premeditated stress. Oddly enough, with these varying classifications, there are not as many standardized corrosion testing sites. Two of the most common testing methods for corrosion are salt spray testing and filiform. Although neither has proven to be absolute, in terms of the resulting observations, our research aims to help provide data that may be used to support the standardization for corrosion testing. We would acquire and use a Singleton Cyclic Corrosion Testing Chamber. Singleton test chambers perform a wide range of commonly used catalytic corrosion tests. They are used throughout the industry, some of which are - automotive, aerospace, electronic and many more. In addition to this, Singleton test chambers are fully expandable to accommodate cyclic corrosion testing needs. Singleton chambers are also designed for complete compliance and conformity with ASTM (American Society for Testing and Materials), military and commercial standards.

Gulley, H.↗

Diels-Alder Trapping of Photochemically Generated o-Xylenols: Application in the Synthesis of Novel Organic Molecules and Polymers

Bis(o-xylenol) equivalents are useful synthetic intermediates in the construction of polymers and hydroxyl substituted organic molecules which can organize by hydrogen bonded self-assembly into unique supramolecular structures. These polymers and supramolecular materials have potential use as coatings and thin films in aerospace, electronic and biomedical applications.

Meador, Michael A.↗

Web Growth Used to Confine Screw Dislocations to Predetermined Lateral Positions in 4H-SiC Epilayers

Silicon-carbide- (SiC-) based power devices could enable substantial aerospace electronics benefits over today's silicon-based electronics. However, present-day SiC wafers contain electrically harmful dislocations (including micropipes) that are unpredictably distributed in high densities across all commercial 4H- and 6H-SiC wafers. The NASA Glenn Research Center recently demonstrated a crystal growth process that moves SiC wafer dislocations to predetermined lateral positions in epitaxial layers so that they can be reproducibly avoided during subsequent SiC electronic device fabrication. The process starts by reactive ion etching mesa patterns with enclosed trench regions into commercial on-axis (0001) 4H- or 6H-SiC substrates. An example of a pregrowth mesa geometry with six enclosed triangular-shaped trench regions is shown. After the etch mask is stripped, homoepitaxial growth is carried out in pure stepflow conditions that enable thin cantilevers to grow laterally from the tops of mesas whose pregrowth top surfaces are not threaded by substrate screw dislocations. The image in the bottom figure shows the postgrowth structure that forms after the lateral cantilevers expand to coalesce and completely roof over each of the six triangular trench regions. Atomic force microscope (AFM) measurements of the roof revealed that three elementary screw dislocation growth spirals, each shown in the AFM insets of the bottom image on the previous page, formed in the film roof at three respective points of cantilever film coalescence. The image above shows the structure following an etch in molten potassium hydroxide (KOH) that produced surface etch pits at the dislocation defects. The larger KOH etch pits--S1, S2, and S3--shown in this image correspond to screw dislocations relocated to the final points of cantilever coalescence. The smaller KOH etch pits are consistent with epilayer threading edge dislocations from the pregrowth substrate mesa (P1, P3, and P4) and a final cantilever coalescence point (P2). No defects (i.e., no etch pits) are observed in other cantilevered portions of the film surface. On the basis of the principle of dislocation Burgers vector conservation, we hypothesize that all vertically propagating substrate dislocations in an enclosed trench region become combined into a single dislocation in the webbed film roof at the point of final roof coalescence. The point of final roof coalescence, and therefore the lateral location of a webbed roof dislocation, can be designed into the pregrowth mesa pattern. Screw dislocations with predetermined lateral positions can then be used to provide the new growth steps necessary for growing a 4H/6H-SiC epilayer with a lower dislocation density than the substrate. Devices fabricated on top of such films can be positioned to avoid the preplaced dislocations.

Powell, J. Anthony↗

A Risk Analysis Tool for Estimating the Risk of Electrical Failures Due to Human Induced Defects

Aerospace electrical systems are required to withstand and adequately operate in extremely harsh environments that include, for example, high radiation exposure, temperature extremes, intense vibrational stress and drastic temperature cycling. The nature of aerospace electronics also demands high reliability since, with very few exceptions, there is no chance for hardware servicing or repairs. Common risk mitigation techniques for this type of situation are to perform a Reliability Analysis of the system throughout the development cycle, and to use electrical components that are regarded as “high reliability” because of additional controls and requirements applied in their design, manufacturing and testing. Unfortunately, studies have shown that even though these techniques are used, many systems fail to meet mission requirements well before the predicted lifetimes. This paper presents the analysis of failures of electrical parts, experienced during various stages of system development, at NASA Goddard Space Flight Center, Greenbelt MD, between the years 2001 and 2013. These components were subjected to qualification, screening and testing in which the goal was to ensure that the components would survive the stresses of the mission. The analysis categorizes failures by part type and failure mechanisms. One of the results of the analysis was the realization that a surprising proportion of failures experienced during system integration and testing were caused by human error (i.e. human induced defect). Further analysis included the determination of root failure mechanisms and any influencing factors contributing to these failures. The major causes of these defects were attributed to electrostatic damage (ESD), electrical overstress (EOS), mechanical overstress (MOS), and thermal overstress (TOS). Finally, the study proposes a risk analysis tool which incorporates these major causes for the failures, termed error-producing conditions (EPCs), and a proportionality factor representing the number of each type of failure that has occurred at the facility under study. These factors are quantified and used to communicate the risk of human induced defects for the assembly, integration and testing of space hardware based on the system’s electrical parts list. The new risk identification can trigger risk-mitigating actions more effectively, based on the presence of component categories or other hazardous conditions that have a history of failure due to human error.

Majewicz, Peter J.↗

Alternative Setup for Long-Duration Low-Duty-Cycle 600°C Ambient Testing of SiC Integrated Circuits

A scalable, compact oven testbed system for simultaneously evaluating a multitude of high temperature integrated circuits (ICs) for prolonged operating times of up to 600 °C has been prototyped. The new testbed system enables long-duration high temperature testing in sufficient statistical quantities consistent with standard aerospace electronics engineering standards. This setup is comprised of multiple compact ovens housing chips or packages mounted to ceramic circuit boards. Each oven is a compact 15.2 cm length by 15.2 cm width by 12.7 cm depth with a maximum 400 Watts of heating power. The custom-made silicon oxide ceramic heating block inside each oven is based on a 3D printed design adapted for the easy insertion of the IC device under test (DUT). This innovative design provides the quick insertion of ICs with or without a ceramic package into a 600 °C environment by utilizing a movable 11.43 cm long ceramic substrate with electrical traces extending from the oven hot zone to external standard plastic-based board connectors. Another key oven design feature is the minimization of the DUT exposure to electromagnetic interference (EMI) by utilizing a filtered DC power source to reduce heating element noise. Additionally, the ovens can be configured in a parallel arrangement allowing global data monitoring over a single industrial RS422 serial port. This feature is important for scaling up to test multiple ICs semi-simultaneously. A USB serial port is provided to independently control the operating parameters of each oven such as the oven target temperature and oven ramp rate. The oven temperature can reach up to 600 °C with a confirmed +/- 4 °C maximum deviation across the test zone region. The ramp rate can be programmed from 1 °C/minute up to 10 °C/minute. Furthermore, a programmable switchboard is used to interface with the DUT. This switchboard comprises a National Instruments Peripheral Component Interconnect eXtension for Instrumentation (NI PXI) system and a breakout board to send and receive power, analog or digital test signals. By using this unique oven testbed system, a variety of ICs can now be tested in parallel using the same test components configured for a diverse set of requirements.

DC Powered Oven↗