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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 37 records · Page 2
All sourcesNASA NTRSDOE OSTI
NASA NTRS2018

Anomalous Transients in Chip Polymer Tantalum Capacitors

Contrary to MnO2 tantalum capacitors, transient processes in polymer tantalum capacitors after voltage application might result in anomalously high, ampere-level currents when a capacitor might appear as a short circuit for a time that is much greater than a transient time in MnO2 capacitors. In this work, conditions that cause anomalous transients in different types of polymer tantalum capacitors have been analyzed. Related phenomena that included increasing of capacitance and dissipation factors with voltage, parametric surge current test failures without damage to capacitors, and increasing leakage currents at low temperatures are described. It has been shown that anomalous transients increased substantially with applied voltage and with reduction of moisture content in capacitors caused by storage or operation at high temperatures and/or in vacuum. Different types of capacitors exhibited different level of transients and modification of conductive polymers or process of their application might decrease transient leakage currents substantially. For space applications, the risk of failures related to anomalous transients can be mitigated by special testing procedures to select parts with an acceptable level of transients and by voltage derating.

Tantalum Capacitors↗
NASA NTRS2018

NEPP Evaluation of Automotive Grade Tantalum Chip Capacitors

Automotive grade tantalum (Ta) chip capacitors are available at lower cost with smaller physical size and higher volumetric efficiency compared to military/space grade capacitors. Designers of high reliability aerospace and military systems would like to take advantage of these attributes while maintaining the high standards for long-term reliable operation they are accustomed to when selecting military-qualified established reliability tantalum chip capacitors (e.g., MIL-PRF-55365). The objective for this evaluation was to assess the long-term performance of off-the-shelf automotive grade Ta chip capacitors (i.e., manufacturer self-qualified per AEC Q-200). Two (2) lots of case size D manganese dioxide (MnO2) cathode Ta chip capacitors from 1 manufacturer were evaluated. The evaluation consisted of construction analysis, basic electrical parameter characterization, extended long-term (2000 hours) life testing and some accelerated stress testing. Tests and acceptance criteria were based upon manufacturer datasheets and the Automotive Electronics Council's AEC Q-200 qualification specification for passive electronic components. As-received a few capacitors were marginally above the specified tolerance for capacitance and ESR. X-ray inspection found that the anodes for some devices may not be properly aligned within the molded encapsulation leaving less than 1 mil thickness of the encapsulation. This evaluation found that the long-term life performance of automotive grade Ta chip capacitors is generally within specification limits suggesting these capacitors may be suitable for some space applications.

Automotive↗
NASA NTRS2021

Breakdown in Tantalum Capacitors

Failures in tantalum capacitors can be considered as a time-dependent-breakdown and reliability of all types of capacitors, including wet, MnO2 and polymer cathode parts, depends on the efficiency of self-healing that can mend parts after breakdown. A mechanism of self-healing in MnO2 capacitors is associated with oxygen reduction in the cathode layer and isolation of the breakdown site with high-resistive Mn2O3/Mn3O4 compositions. Although this mechanism is commonly accepted, details of self-healing have not been analyzed sufficiently yet, and the effects of scintillations on behavior of the parts has not been fully understood. There is a lack of data on the self-healing efficiency in different lots of capacitors. Even less is known about self-healing in polymer tantalum capacitors. In this work, different types of polymer and MnO2 capacitors have been tested for scintillation breakdown using a constant current stress (CCS) technique modified to allow detection of the amplitudes and durations of current spikes during breakdown. Characteristics of the parts and in particular leakage currents were measured to assess the efficiency of self-healing and improve screening processes for tantalum capacitors. Damaged sites were localized using infrared camera and their appearance analyzed after deprocessing and crosssectioning. Thermal effects during scintillations have been modeled, self-healing processes in polymer and MnO2 cathode capacitors discussed, and mechanisms of breakdown based on the growth of conductive filaments in the dielectric suggested.

tantalum polymer capacitors↗
DOE OSTI2025

Capacitor Design for Self-Resonant Coils for Long-Distance Wireless Power Transfer System

In this paper, an integrated capacitor design is proposed for higher-order resonant tank topologies for self-resonant coils, such as series, parallel, LCC, LLC, etc. The capacitor is one of the large, lossy, and thermally vulnerable components of a high-frequency resonant tank, and designing a high-voltage, thermally stable resonant capacitor can be highly challenging. Designing the extremely high-voltage capacitor as an integral part of the coil reduces the size and complexity of the coil assembly. This paper proposes a low-loss PCB-based high-voltage capacitor design to achieve that target, which can be implemented as an integral part of the coil. The proposed capacitor designs are simulated using Multiphysics FEA and tested experimentally. A 23 kV, 133 pF capacitor prototype was built and tested as part of a 1 kW long-distance wireless charging system. The test results verify the capacitor’s voltage, current, and thermal resiliency performance.

Mohammad, Mostak [ORNL] (ORCID:0000000256388783)↗
NASA NTRS1983

High frequency, high power capacitor development

A program to develop a special high energy density, high power transfer capacitor to operate at frequency of 40 kHz, 600 V rms at 125 A rms plus 600 V dc bias for space operation. The program included material evaluation and selection, a capacitor design was prepared, a thermal analysis performed on the design. Fifty capacitors were manufactured for testing at 10 kHz and 40 kHz for 50 hours at Industrial Electric Heating Co. of Columbus, Ohio. The vacuum endurance test used on environmental chamber and temperature plate furnished by Maxwell. The capacitors were energized with a special power conditioning apparatus developed by Industrial Electric Heating Co. Temperature conditions of the capacitors were monitored by IEHCo test equipment. Successful completion of the vacuum endurance test series confirmed achievement of the main goal of producing a capacitor or reliable operation at high frequency in an environment normally not hospitable to electrical and electronic components. The capacitor developed compared to a typical commercial capacitor at the 40 kHz level represents a decrease in size and weight by a factor of seven.

White, C. W.↗
NASA NTRS1995

High energy density electrolytic capacitor

Recently a new type of electrolytic capacitor was developed. This capacitor, the Evans Hybrid, combines an electrolytic capacitor anode with an electrochemical capacitors cathode. The resulting capacitor has four times the energy density of other electrolytic capacitors, with comparable electrical performance. The prototype, a 480 micro F, 200 V device, had an energy density exceeding 4 J/cc. Now, a 680 micro F, 50 V, MIL-style all tantalum device has been constructed and is undergoing qualification testing. Pending a favorable outcome, work will begin on other ratings. Potential for commercially significant development exists in applying this technology to aluminum-based electrolytic capacitors. It is possible to at least double the energy density of aluminum electrolytics, while using existing manufacturing methods, and without adding material expense. Data presented include electrical characteristics and performance measurements of the 200 V and 50 V Hybrid capacitors and results of ongolng qualification status of the MJL-style tantalum.

Evans, David A.↗
NASA NTRS1996

High Energy Density Electrolytic Capacitor

A new type of electrolytic capacitor which combines an electrolytic capacitor anode with an electrochemical capacitor cathode was developed. The resulting capacitor has a four time higher energy density than standard electrolytic capacitors, with comparable electric performance. The prototype, a 480 microFarad, 200 V device, has an energy density exceeding 4 J/cc. Now a 680 microFarad 50 V, MIL-style all tantalum device has been constructed and is undergoing qualification testing. Pending a favorable outcome, work will begin on other ratings. The potential for commercially significant development exists in applying this technology to aluminum-based electrolytic capacitors. It is possible to at least double the energy density of aluminum electrolytics, while using existing manufacturing methods, and without adding material expense. Data presented include electrical characteristics and performance measurements of the 200 V and 50 V hybrid capacitors and results from ongoing qualification testing of the MIL-style tantalum capacitors.

Evans, David A.↗
NASA NTRS2000

Ruthenium Oxide Electrochemical Super Capacitor Optimization for Pulse Power Applications

Electrical actuator systems are being pursued as alternatives to hydraulic systems to reduce maintenance time, weight and costs while increasing reliability. Additionally, safety and environmental hazards associated with the hydraulic fluids can be eliminated. For most actuation systems, the actuation process is typically pulsed with high peak power requirements but with relatively modest average power levels. The power-time requirements for electrical actuators are characteristic of pulsed power technologies where the source can be sized for the average power levels while providing the capability to achieve the peak requirements. Among the options for the power source are battery systems, capacitor systems or battery-capacitor hybrid systems. Battery technologies are energy dense but deficient in power density; capacitor technologies are power dense but limited by energy density. The battery-capacitor hybrid system uses the battery to supply the average power and the capacitor to meet the peak demands. It has been demonstrated in previous work that the hybrid electrical power source can potentially provide a weight savings of approximately 59% over a battery-only source. Electrochemical capacitors have many properties that make them well-suited for electrical actuator applications. They have the highest demonstrated energy density for capacitive storage (up to 100 J/g), have power densities much greater than most battery technologies (greater than 30kW/kg), are capable of greater than one million charge-discharge cycles, can be charged at extremely high rates, and have non-explosive failure modes. Thus, electrochemical capacitors exhibit a combination of desirable battery and capacitor characteristics.

Merryman, Stephen A.↗
NASA NTRS2007

Reliability Effects of Surge Current Testing of Solid Tantalum Capacitors

Solid tantalum capacitors are widely used in space applications to filter low-frequency ripple currents in power supply circuits and stabilize DC voltages in the system. Tantalum capacitors manufactured per military specifications (MIL-PRF-55365) are established reliability components and have less than 0.001% of failures per 1000 hours (the failure rate is less than 10 FIT) for grades D or S, thus positioning these parts among electronic components with the highest reliability characteristics. Still, failures of tantalum capacitors do happen and when it occurs it might have catastrophic consequences for the system. This is due to a short-circuit failure mode, which might be damaging to a power supply, and also to the capability of tantalum capacitors with manganese cathodes to self-ignite when a failure occurs in low-impedance applications. During such a failure, a substantial amount of energy is released by exothermic reaction of the tantalum pellet with oxygen generated by the overheated manganese oxide cathode, resulting not only in destruction of the part, but also in damage of the board and surrounding components. A specific feature of tantalum capacitors, compared to ceramic parts, is a relatively large value of capacitance, which in contemporary low-size chip capacitors reaches dozens and hundreds of microfarads. This might result in so-called surge current or turn-on failures in the parts when the board is first powered up. Such a failure, which is considered as the most prevalent type of failures in tantalum capacitors [I], is due to fast changes of the voltage in the circuit, dV/dt, producing high surge current spikes, I(sub sp) = Cx(dV/dt), when current in the circuit is unrestricted. These spikes can reach hundreds of amperes and cause catastrophic failures in the system. The mechanism of surge current failures has not been understood completely yet, and different hypotheses were discussed in relevant literature. These include a sustained scintillation breakdown model [1-3]; electrical oscillations in circuits with a relatively high inductance [4-6]; local overheating of the cathode [5,7, 8]; mechanical damage to tantalum pentoxide dielectric caused by the impact of MnO2 crystals [2,9, 10]; or stress-induced-generation of electron traps caused by electromagnetic forces developed during current spikes [11]. A commonly accepted explanation of the surge current failures is that at unlimited current supply during surge current conditions, the self-healing mechanism in tantalum capacitors does not work, and what would be a minor scintillation spike if the current were limited, becomes a catastrophic failure of the part [l, 12]. However, our data show that the scintillation breakdown voltages are significantly greater that the surge current breakdown voltages, so it is still not clear why the part, which has no scintillations, would fail at the same voltage during surge current testing (SCT).

Teverovsky, Alexander↗
NASA NTRSDate not supplied

A Study on Effect of Tuning Capacitor in Dynamic Radioisotope Power Systems

This study presents the effect of tuning capacitors on the power factor and power output of a gas spring-based free-piston Stirling convertor—Advanced Stirling convertor—when the convertor runs on a forced-oscillation type controller. More specifically, this paper studies how off-nominal tuning capacitance values affects the Stirling convertor in terms of the piston stability and electrical power output, when the convertor is operated by forced-oscillation type controller, such as an alternating current bus controller, and operating conditions of the convertor are unchanged. It has been widely known that tuning capacitors are important circuit components to stabilize the piston amplitude of the free-piston Stirling convertors and correct the power factor for high electrical power output. Recent modeling analysis conducted by NASA Glenn Research Center, however, suggests that while the stability of the convertor is affected by the tuning capacitor value, the power factor and the electrical power output are not affected by the tuning capacitor value, as long as the convertor is controlled by a forced-oscillation controller and the convertor operating conditions, such as the hot-end/cold-end temperatures, piston amplitude, and operating frequency, are unchanged. To verify the modeling analysis results, a test setup is devised where the convertor is controlled by a forced-oscillation controller and the piston amplitude, hot-end temperature, and charge pressure are controlled to 4mm, 760˚C, and 485psig, respectively, while the tuning capacitor value is changed from its nominal value, 840μF to 1040μF and 1240μF. Furthermore, the vibration test results of the same convertor with the three tuning capacitor values are also presented in this paper to show the effect of the tuning capacitor value on the convertor stability. The test results suggest that when the convertor is controlled by a forced-oscillation, the tuning capacitor value determines the convertor stability but not the power factor nor electrical power output. Therefore, the tuning capacitance value in forced-oscillation controllers should be determined based on the convertor stability, system mass, and volume.

Free-Piston Stirling Convertor Controller↗
NASA NTRSDate not supplied

Degradation of Aluminum and Tantalum Wet Electrolytic Capacitors during High Temperature Storage

Aluminum electrolytic capacitors (AEC) are available to higher ranges of capacitance and voltage compared to tantalum electrolytic capacitors (TEC). However, evaporation of the electrolyte during operation or storage of conventional AEC that is accelerated with temperature does not allow use of these parts in space electronics. Instead, for systems requiring large value capacitors and high operating voltages, designers must use banks of TECs that increases substantially the size and weight of electronic modules. Development of hermetically sealed AECs might be beneficial for space systems provided the necessary reliability is assured. Increase in leakage current during storage of AEC is well known and is often explained by dissolution of aluminum oxide in electrolyte. However, other possible mechanisms of this effect have not been discussed. Although hermetically sealed TEC have been used in space systems for years, there is a lack of information about the effects of storage on their characteristics that is of great interest as a comparison for aluminum capacitors. This work explores degradation of AC characteristics (capacitance, dissipation factor, and equivalent series resistance) and DC characteristics (leakage and absorption currents) in different types of aluminum and tantalum hermetically sealed capacitors during long-term storage at high temperatures (100 °C, 125 °C, and 150 °C). It is shown that leakage currents are degrading in both types of capacitors, but this degradation is reversible after bias application. Mechanisms of degradation are discussed, and explanations based on the processes common for both types of capacitors are suggested. Problems associated with assessments of hermeticity and evaporation of the electrolyte in hermetically sealed capacitors are analyzed.

Alexander Teverovsky↗
NASA NTRS2018

Cracking Problems and Mechanical Characteristics of PME and BME Ceramic Capacitors

Most failures in MLCCs are caused by cracking that create shorts between opposite electrodes of the parts. A use of manual soldering makes this problem especially serious for space industry. Experience shows that different lots of ceramic capacitors might have different susceptibility to cracking under manual soldering conditions. This simulates a search of techniques that would allow revealing capacitors that are most robust to soldering-induced stresses. Currently, base metal electrode (BME) capacitors are introduced to high-reliability applications as a replacement of precious metal electrode (PME) parts. Understanding the difference in the susceptibility to cracking between PME and BME capacitors would facilitate this process. This presentation gives a review of mechanical characteristics measured in-situ on MLCCs that includes flexural strength, Vickers hardness, indentation fracture toughness, and the board flex testing and compare characteristics of BME and PME capacitors. A history case related to cracking in PME capacitors that caused flight system malfunctions and mechanisms of failure are considered. Possible qualification tests that would allow evaluation of the resistance of MLCCs to manual soldering are suggested and perspectives related to introduction of BME capacitors discussed.

Reliability↗
NASA NTRS2014

Humidity Testing of PME and BME Ceramic Capacitors with Cracks

Cracks in ceramic capacitors are one of the major causes of failures during operation of electronic systems. Humidity testing has been successfully used for many years to verify the absence of cracks and assure quality of military grade capacitors. Traditionally, only precious metal electrode (PME) capacitors were used in high reliability applications and the existing requirements for humidity testing were developed for this type of parts. With the advance of base metal electrode (BME) capacitors, there is a need for assessment of the applicability of the existing techniques for the new technology capacitors. In this work, variety of different PME and BME capacitors with introduced cracks were tested in humid environments at different voltages and temperatures. Analysis of the test results indicates differences in the behavior and failure mechanisms for BME and PME capacitors and the need for different testing conditions.

reliability↗
NASA NTRS2016

Deformation of Cases in High Capacitance Value Wet Tantalum Capacitors under Environmental Stresses

Internal gas pressure in hermetic wet tantalum capacitors is created by air, electrolyte vapor, and gas generated by electrochemical reactions at the electrodes. This pressure increases substantially with temperature and time of operation due to excessive leakage currents. Deformation of the case occurs when the internal pressure exceeds pressure of the environments and can raise significantly when a part operates in space. Contrary to the cylinder case wet tantalum capacitors that have external sealing by welding and internal sealing provided by the Teflon bushing and crimping of the case, no reliable internal sealing exists in the button case capacitors. Single seal design capacitors are used for high capacitance value wet tantalum capacitors manufactured per DLA L&M drawings #04003, 04005, and 10011, and require additional analysis to assure their reliable application in space systems. In this work, leakage currents and case deformation of button case capacitors were measured during different environmental test conditions. Recommendations for derating, screening and qualification testing are given. This work is a continuation of a series of NEPP reports related to quality and reliability of wet tantalum capacitors.

Tantalum Capacitors↗
NASA NTRS2020

Popcorning Failures in Polymer and MnO2 Tantalum Capacitors

Popcorning is a well-known effect in plastic encapsulated microcircuits (PEM) and it occurs in chip tantalum capacitors. The sensitivity of components to the presence of moisture during soldering is characterized by the moisture sensitivity level (MSL); however, contrary to PEMs, there is no standard procedure for establishing MSL for tantalum capacitors.The effect of absorbed moisture on soldering related degradation and failures in tantalum capacitors have not been studied properly yet, and there is no sufficient information regarding the difference in the sensitivity to soldering between polymer and MnO2 capacitors. In this work, 16 types of polymer and 9 types of MnO2 tantalum capacitors with different moisture content have been tested before and after reflow soldering. The level of moisture release during soldering has been estimated and thermo-mechanical analysis used to assess deformation of capacitorsduring soldering simulations. Results show that moisture uptake in similar parts is approximately two times greater in polymer than in MnO2 capacitors. Cracking of the case and degradation of parameters can occur in both types of parts, but MnO2 capacitors are much more likely to fail catastrophically with a short circuit and possible ignition during the first power-on cycle. This type of failure in MnO2 capacitors is lot-related, can occur even at derated voltages and relatively low levels of moisture sorption that corresponds to room conditions. Baking before soldering is an effective measure to prevent failures even in lots susceptible to popcorning damage.

Capacitor↗
NASA NTRSDate not supplied

A Study on Effect of Tuning Capacitor in Dynamic Radioisotope Power Systems

This study presents the effect of the tuning capacitor on stability and electrical power output of a gas-bearing based free-piston Stirling convertor (FPSC) when operating on a fixed-frequency type controller. It has been widely accepted that the tuning capacitor is an important circuit component of the FPSC to stabilize piston amplitude and maximize electrical power output by correcting the power factor. Models suggest the stability of the FPSC is strongly coupled to the tuning capacitance, while the coupling to the electrical power output is weak. This applies to cases where the operating frequency of the FPSC is fixed by a fixed-frequency controller and other operating conditions, such as the hot-end and cold-end temperatures, piston amplitude, and pressure are constant. To verify the modeling analysis results, an Advanced Stirling Convertor (ASC) was controlled by an AC power supply and the piston amplitude, hot-end temperature, cold-end temperature, and pressure are actively controlled to 4.3mm, 760˚C, 40˚C and 485psig, respectively, while the tuning capacitor value was changed from 840μF to 1040μF and 1240μF. Furthermore, the vibration test results of the ASC with different tuning capacitor values are also presented to show the effect of the tuning capacitor on stability. The experimental test results verified that the effect of tuning capacitor on electrical power output is negligible while the effect on stability is rather noticeable. Therefore, the ideal tuning capacitor value should be selected based on required stability of the FPSC.

Free-Piston Stirling Convertor Controller↗
NASA NTRSDate not supplied

A Study on Effect of Tuning Capacitor in Dynamic Radioisotope Power Systems

This study presents the effect of the tuning capacitor on the stability and electrical power output of a gas spring-based free-piston Stirling convertor (FPSC) when the FPSC runs on a forced-oscillation type controller. It has been widely accepted that the tuning capacitor is an important circuit component of the FPSC to stabilize piston amplitude and maximize electrical power output by correcting the power factor. Recent modeling analysis, however, suggests that while the effect on the stability is significant, the effect on the electrical power output is almost negligible as long as the operating frequency the FPSC is fixed by a forced-oscillation controller and operating conditions, such as the hot-end/cold-end temperatures, piston amplitude, and pressure, are unchanged. To verify the modeling analysis results, Advanced Stirling Convertor (ASC) is controlled by an AC power supply and the piston amplitude, hot-end temperature, cold-end temperature, and pressure are actively controlled to 4.3mm, 760˚C, 40˚C and 485psig, respectively, while the tuning capacitor value is changed from 840μF to 1040μF and 1240μF. Furthermore, the vibration test results of the ASC with the three tuning capacitor values are also presented to show the effect of the tuning capacitor on stability. The test results suggest that when the FPSC operates at a fixed frequency, the effect of tuning capacitor on electrical power output is negligible while the effect on stability is rather significant. Therefore, the tuning capacitor value should be selected toward the highest stability.

Free-Piston Stirling Convertor Controller↗
NASA NTRS1981

Development of an 1100 deg F capacitor

The feasibility of developing a high temperature capacitor for 1100 F operation which is as small and light as conventional capacitors for normal operating temperatures is discussed. Pyrolyic boron nitride (PBN) was selected for the dielectric. The PBN capacitors were made by slicing and lapping material from thick blocks and then sputtering thin film electrodes. These capacitors had breakdown strengths of 7,000 volts per mil and a dissipation factor of less than 0.001 at 1100 F. Additional processing improvements were made after testing a multi-layer or stacked PBN capacitor for 1,000 hours at 1100 F. Sputter etching the wafers before depositing electrodes resulted in a reduction in dissipation factor. A sputtered boron nitride film applied to the outer electrode surfaces produced a more stable capacitor. A design for a 0.1 mu F capacitor and a summary of PBN wafer fabrication costs are given.

Stapleton, R. E.↗