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Results for “ELECTRICAL CIRCUITS”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 37 records · Page 2
All sourcesNASA NTRSDOE OSTI
NASA NTRS1968

Performance analysis of electrical circuits /PANE/

Automated statistical and worst case computer program has been designed to perform dc and ac steady circuit analyses. The program determines the worst case circuit performance by solving circuit equations.

Johnson, K. L.↗
NASA NTRS1993

Global surface temperatures and the atmospheric electrical circuit

To monitor future global temperature trends, it would be extremely useful if parameters nonlinearly related to surface temperature could be found, thereby amplifying any warming signal that may exist. Evidence that global thunderstorm activity is nonlinearly related to diurnal, seasonal and interannual temperature variations is presented. Since global thunderstorm activity is also well correlated with the earth's ionospheric potential, it appears that variations of ionospheric potential, that can be measured at a single location, may be able to supply valuable information regarding global surface temperature fluctuations. The observations presented enable a prediction that a 1 percent increase in global surface temperatures may result in a 20 percent increase in ionospheric potential.

Price, Colin↗
NASA NTRS2008

Chemical Detection using Electrically Open Circuits having no Electrical Connections

This paper presents investigations to date on chemical detection using a recently developed method for designing, powering and interrogating sensors as electrically open circuits having no electrical connections. In lieu of having each sensor from a closed circuit with multiple electrically connected components, an electrically conductive geometric pattern that is powered using oscillating magnetic fields and capable of storing an electric field and a magnetic field without the need of a closed circuit or electrical connections is used. When electrically active, the patterns respond with their own magnetic field whose frequency, amplitude and bandwidth can be correlated with the magnitude of the physical quantities being measured. Preliminary experimental results of using two different detection approaches will be presented. In one method, a thin film of a reactant is deposited on the surface of the open-circuit sensor. Exposure to a specific targeted reactant shifts the resonant frequency of the sensor. In the second method, a coating of conductive material is placed on a thin non-conductive plastic sheet that is placed over the surface of the sensor. There is no physical contact between the sensor and the electrically conductive material. When the conductive material is exposed to a targeted reactant, a chemical reaction occurs that renders the material non-conductive. The change in the material s electrical resistance within the magnetic field of the sensor alters the sensor s response bandwidth and amplitude, allowing detection of the reaction without having the reactants in physical contact with the sensor.

Woodward, Stanley E.↗
NASA NTRS1970

Test and Evaluation of the Surveyor 3 Television Camera Returned from the Moon by Apollo 12

Results are presented of engineering tests of the Surveyor III television camera, which resided on the moon for 2 and 1/2 years before being brought back to earth by the Apollo XII astronauts. Electric circuits, electrical, mechanical, and optical components and subsystems, the vidicon tube, and a variety of internal materials and surface coatings were examined to determine the effects of lunar exposure. Anomalies and failures uncovered were analyzed. For the most part, the camera parts withstood the extreme environment exceedingly well except where degradation of obsolete parts or suspect components had been anticipated. No significant evidence of cold welding was observed, and the anomalies were largely attributable to causes other than lunar exposure. Very little evidence of micrometeoroid impact was noted. Discoloration of material surfaces -- one of the major effects noted--was found to be due to lunar dust contamination and radiation damage. The extensive test data contained in this report are supplemented by results of tests of other Surveyor parts retrieved by the Apollo XII astronauts, which are contained in a companion report.

Source record↗
NASA NTRS1992

Isolated Fast High-Voltage Switching Circuit

Electrically isolated switching circuit supplies pulses at potentials up to 6.5 kV and currents up to 6.5 A, lasting as long as few microseconds. Turn-on time about 40 ns; turn-off time about 3 microseconds. Electrically isolated from control circuitry by means of fiber-optic signal coupling and isolated power supply. Electrical isolation protects both technician and equipment. This and similar circuits useful in such industrial and scientific applications as high-voltage, high-frequency test equipment; electrostatic-discharge test equipment; plasma-laboratory instrumentation; spark chambers; and electromagnetic-interference test equipment.

Rizzi, Anthony↗
NASA NTRS1986

Solenoid-Simulation Circuit

Electrical properties of solenoids imitated for tests of control circuits. Simulation circuit imitates voltage and current responses of two engine-controlling solenoids. Used in tests of programs of digital engine-control circuits, also provides electronic interface with circuits imitating electrical properties of pressure sensors and linear variable-differential transformers. Produces voltages, currents, delays, and discrete turnon and turnoff signals representing operation of solenoid in engine-control relay. Many such circuits used simulating overall engine circuitry.

Simon, R. A.↗
NASA NTRS2007

Spectrometer system for optical reflectance measurements

A spectrometer system includes a thermal light source for illuminating a sample, where the thermal light source includes a filament that emits light when heated. The system additionally includes a spectrograph for measuring a light spectrum from the sample and an electrical circuit for supplying electrical current to the filament to heat the filament and for controlling a resistance of the filament. The electrical circuit includes a power supply that supplies current to the filament, first electrical components that sense a current through the filament, second electrical components that sense a voltage drop across the filament, third electrical components that compare a ratio of the sensed voltage drop and the sensed current with a predetermined value, and fourth electrical components that control the current through the filament or the voltage drop across the filament to cause the ratio to equal substantially the predetermined value.

Soller, Babs R.↗
NASA NTRS2002

Method and Apparatus for Obtaining a Precision Thickness in Semiconductor and Other Wafers

A method and apparatus for processing a wafer comprising a material selected from an electrical semiconducting material and an electrical insulating material is presented. The wafer has opposed generally planar front and rear sides and a peripheral edge, wherein said wafer is pressed against a pad in the presence of a slurry to reduce its thickness. The thickness of the wafer is controlled by first forming a recess such as a dimple on the rear side of the wafer. A first electrical conducting strip extends from a first electrical connection means to the base surface of the recess to the second electrical connector. The first electrical conducting strip overlies the base surface of the recess. There is also a second electrical conductor with an electrical potential source between the first electrical connector and the second electrical connector to form. In combination with the first electrical conducting strip, the second electrical conductor forms a closed electrical circuit, and an electrical current flows through the closed electrical circuit. From the front side of the wafer the initial thickness of the wafer is reduced by lapping until the base surface of the recess is reached. The conductive strip is at least partially removed from the base surface to automatically stop the lapping procedure and thereby achieve the desired thickness.

Okojie, Robert S.↗
NASA NTRS1995

Electrical short circuit and current overload tests on aircraft wiring

The findings of electrical short circuit and current overload tests performed on commercial aircraft wiring are presented. A series of bench-scale tests were conducted to evaluate circuit breaker response to overcurrent and to determine if the wire showed any visible signs of thermal degradation due to overcurrent. Three types of wire used in commercial aircraft were evaluated: MIL-W-22759/34 (150 C rated), MIL-W-81381/12 (200 C rated), and BMS 1360 (260 C rated). A second series of tests evaluated circuit breaker response to short circuits and ticking faults. These tests were also meant to determine if the three test wires behaved differently under these conditions and if a short circuit or ticking fault could start a fire. It is concluded that circuit breakers provided reliable overcurrent protection. Circuit breakers may not protect wire from ticking faults but can protect wire from direct shorts. These tests indicated that the appearance of a wire subjected to a current that totally degrades the insulation looks identical to a wire subjected to a fire; however the 'fire exposed' conductor was more brittle than the conductor degraded by overcurrent. Preliminary testing indicates that direct short circuits are not likely to start a fire. Preliminary testing indicated that direct short circuits do not erode insulation and conductor to the extent that ticking faults did. Circuit breakers may not safeguard against the ignition of flammable materials by ticking faults. The flammability of materials near ticking faults is far more important than the rating of the wire insulation material.

Cahill, Patricia↗
NASA NTRS1975

Leak detector

A detector for sensing a leaking of fluid pressures is reported. The detector is characterized by an hermetically sealed housing confining therewithin a first normalized pressure, a connector for coupling the housing in direct communication with a suspected leak established within a substantially sealed body, an electrical circuit having a first or normalized configuration and including a pair of circuit completing electrical contacts and means mounting at least one contact of said pair of contacts on a flexible wall of the housing supporting the contact for movement from a first position along a linear path to a second position in response to an altering of the pressure confined within the housing for thereby altering the configuration of the circuit.

Sawyer, J. T.↗