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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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21 records · Page 2

Novel and effective surface passivation for high efficiency n- and p-type Silicon solar cell

The project objective was to develop a novel Si surface passivation method using chalcogens, sulfur (S) and/or selenium (Se), as passivating elements, to withstand industry-standard high temperature contacting and metallization schemes for p-type Si based passivated emitter and rear contact (p-PERC) solar cells. The back surface passivation of PERC cells has been improved drastically with the invention and successful application of an Al 2 O 3 passivation layer. However, the front n + diffused junction surface is still poorly passivated by the standard amorphous silicon nitride (SiNx) anti-reflection coating (ARC) layer. This project sought to address the passivation challenges of both front n+ emitter and undiffused p-Si back surface. Improved p-PERC solar cell performance with open circuit voltage (V OC ) > 680 mV and efficiency of 22% were targeted to validate superior defect passivation properties as compared to standard SiO 2 / Al 2 O 3 passivation. During this project, we systematically investigated process-structure-properties-performance relationships of this novel advanced defect passivation approach. The S/Se passivation was carried out by reacting industrial Czochralski (Cz) Si wafers in H 2 S and H 2 Se gases in a chemical vapor deposition (CVD) reactor at temperatures up to 700°C. After an exhaustive optimization of the process parameters (temperature, time, and gas concentration), we established an optimized process and demonstrated extremely low surface recombination velocities (SRVs) of 1.5 cm/s and 8 cm/s on n-type and p-type Si, respectively, by S-passivation. In-depth surface and interface characterization were performed using soft x-ray and photoelectron spectroscopies (XPS, UPS, XES), combined with capacitance-voltage-frequency (C-V-f) measurements, to decipher the surface chemical/electronic structure and interface defect state densities. These measurements provided critical understanding of the defect passivation mechanism and elucidated the presence of surface S-Si bonds, a reduction of surface dipoles, and low interface state densities (D it ) < 10 11 cm -2 ev -1 . We also found that the Se-passivation is inferior to the S-passivation (by at least one order of magnitude in SRV). Application of the optimized S-passivation to the n+ diffused emitter surface led to a low surface recombination current density, J0 ≈ 40 fA/cm 2 (~ 1/4 of the industry-standard SiNx-passivation), and high implied V OC (686 mV) in p-PERC solar cell structures. The S-passivation process also was found to improve the bulk quality of the p-type Si, better than the SiO 2 or Al 2 O 3 passivation processes. After successful demonstration of efficient passivation of Si surface defects by S, we extensively studied the air, thermal, and illumination stability of the passivation structure. S-passivation itself degrades in air due to competing reactions with moisture and oxygen to form oxides, which can be eliminated by a SiNx capping layer (also acting as a anti-reflective coating). After SiNx process optimization, we demonstrated illumination and thermally stable S-passivation with SRV < 5 cm/s and J 0 < 80 fA/cm 2 . These enhancements in Si passivation, incorporated into p-PERC cells, achieved an efficiency of 19.93% with V OC = 649 mV, using manufacturing metallization and contacting schemes. The low cell performance (cell V OC is much less than the implied V OC = 686 mV, anticipated from surface passivation) was identified due to degradation of S-passivation during the metal firing step (out-diffusion of S from the Si interface to the SiNx surface). The S-passivation of Si surfaces shows significant promise with excellent passivation quality, essential for high performance (high V OC , high efficiency) solar cells. Integration of this innovative defect passivation into devices, however, demands further development of the capping layer, low temperature (<700°C) metallization process, and/or engineering of advanced device structures. Surface passivation-dominated advanced Si solar cells, such as tunnel oxide passivated contacts and Si heterojunctions, are increasingly of interest due to their high-performance potential and will have a growing photovoltaic market share in the near future.

14 SOLAR ENERGY↗

White Paper on Case Study of Safe Installation of Second-Life Energy Storage System

This technical report provides for a case study for the safe installation of a second-life, or repurposed, battery, that has been reconfigured for use as a stationary energy storage systems (ESS). Driven by legislative requirements such as California Senate Bill 615 and projections that retired EV batteries could meet a substantial portion of U.S. grid ESS needs beginning in 2035, the repurposing of EV batteries is anticipated to grow significantly. However, safety concerns arise from the effects of aging, unknown prior usage history, and changes in thermal runaway behavior, which may increase failure risks compared to new batteries. NFPA 855, the predominant U.S. standard for ESS installation, mandates that second-life batteries meet all requirements for new batteries, with repurposers complying with UL 1974 in addition to obtaining UL 9540 and UL 1973 listings. These are certifications that few repurposers have achieved and represent a regulatory barrier to entry for the market as a whole.

47 OTHER INSTRUMENTATION↗

Pull Force Evaluation of CCS Insulated End Caps

Insulated end caps installed on DC pins of Combined Charging System (CCS) inlets have been identified as potential debris sources within electric vehicle supply equipment (EVSE) connectors, increasing the risk of electric shock and fire hazards. Although standards such as IEC 62196-1:2022 specify mechanical pull-force requirements for these end caps, it remains unclear whether these requirements provide adequate robustness under real-world conditions. To address this concern, the National Charging Experience (ChargeX) Consortium's Hardware Task Force conducted evaluations of insulated end caps used in OEM CCS inlets. This study assesses the performance of insulated end caps used in OEM CCS inlets, specifically those installed on DC pins, using the procedures defined in IEC 62196-1:2022 (Section Sign) 26.7 and SAE J3400, supplemented by additional experimental conditioning. To ensure relevance to real-world conditions, NLR collaborated with charging network operators (CNOs) to guide the selection of charging inlet samples. Material analyses of the insulated end cap samples were conducted to confirm that the tested materials reflected the types and properties commonly observed in the field. The selected samples underwent temperature and humidity conditioning followed by pull-force testing to evaluate the end-cap integrity. Although SAE J3400 inlets were not directly tested due to limited diversity in available field data, the underlying end-cap principles between CCS and SAE J3400 are comparable, allowing the study's insights to be relevant to both technologies. Overall, this study provides a structured evaluation framework to inform potential refinements to mechanical pull-force requirements in charging standards.

33 ADVANCED PROPULSION SYSTEMS↗