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The January 2003 issue of Electronic, Electromechanical, Electric (EEE) Links is presented. The Programmable Logic Application Notes column has been reinstated in this newsletter. Written by Rich Katz of NASA's Office of Logic Design (OLD), the application notes offer technical tips intended to prevent flight design errors and enhance research, development, and use of programmable logic and elements for space flight applications. An archive of these notes columns from previous issues of EEE Links is available at http://www.klabs.org/richcontent/eeelink s/EEE Links.htm.
The Electrical, Electronic, and Electromechanical (EEE) Parts Information Management System (EPIMS) database was selected by the International Space Station Parts Control Board for providing parts information to NASA managers and contractors. Parts data is transferred to the EPIMS database by converting parts list data to the EP1MS Data Exchange File Format. In general, parts list information received from contractors and suppliers does not convert directly into the EPIMS Data Exchange File Format. Often parts lists use different variable and record field assignments. Many of the EPES variables are not defined in the parts lists received. The objective of this work was to develop an automated system for translating parts lists into the EPIMS Data Exchange File Format for upload into the EPIMS database. Once EEE parts information has been transferred to the EPIMS database it is necessary to screen parts data in accordance with the provisions of the SSQ 25002 Supplemental List of Qualified Electrical, Electronic, and Electromechanical Parts, Manufacturers, and Laboratories (QEPM&L). The SSQ 2S002 standards are used to identify parts which satisfy the requirements for spacecraft applications. An additional objective for this work was to develop an automated system which would screen EEE parts information against the SSQ 2S002 to inform managers of the qualification status of parts used in spacecraft applications. The EPIMS Database Conversion and SSQ 25002 User Interfaces are designed to interface through the World-Wide-Web(WWW)/Internet to provide accessibility by NASA managers and contractors.
The foundation of NASA's Electrical, Electronic and Electromechanical (EEE) parts program is standardization. Standardization helps to reduce the number of unknown variables present as a project or program progresses; unknown variables equate to unknown risk. NASA spacecraft are usually 'one-offs' or at least part of a very short run, and every new part that is used represents a risk that has to be understood and mitigated as necessary. This equates directly to time and cost. Standardization of component parts is used to provide a foundation of known, dependable, qualified parts upon which a safe, reliable system can be built. In addition, the evaluation and selection of parts for the standard parts list unifies the activity under one group of experts rather than having engineers on each project overlapping and duplicating efforts. Thus, the project support engineers are able to concentrate on understanding and mitigating the risks for the non standard parts required to meet specific requirements of their project. Rapid technology change is producing conditions that make any form of parts-based standardization increasingly difficult, particularly the use of Commercial Off The Shelf (COTS) parts and assemblies. There are many complications to COTS-based standardization. COTS parts change rapidly and unpredictably, often have different characteristics fiom manufacturer to manufacturer, frequently are only available through distribution, have no universal specification and have variable and unpredictable radiation characteristics. This presentation will discuss some potential approaches to COTS parts standardization. Further into the future, in three to five years perhaps, the use of COTS boards and boxes will be extensive and standardization at these levels of assembly will be necessary. In five to ten years, most major spacecraft functions will probably be performed by COTS boards. How will this be achieved? What role will the parts engineer play, if any? This presentation will borrow from the lessons of the past to suggest some scenarios for the future.
From the outside looking in, the NEPP program supports NASA's traditional approach to providing electrical, electronic, and electromechanical (EEE) assurance for space missions. Standards (military and commercial) for EEE parts are based on risk averse methodologies, drive higher costs and schedules, and, in general, provide devices that significantly lag behind commercial devices in performance aspects (speed, power efficiency, etc...). This is NOT the model most small missions realistically can use. However, when you look behind the curtain, NEPP has been considering the risk trade space for small missions for over five years and has consistently provided resources that the small mission regime would find useful. In this paper, we provide a brief overview of these resources as well as NEPP's current research/development efforts that are relevant. While we'll primarily discuss radiation assurance related issues such as data availability and usage, assurances processes for not only the radiation effects side, but also the EEE parts reliability will be touched upon.
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NASA policy and procedures are established which govern the selection, testing, and application of electrical, electronic, and electromechanical (EEE) parts. Recent advances in the state-of-the-art of electronic parts and associated technologies can significantly impact the electronic designs and reliability of NASA space transportation avionics. Significant issues that result from these advances are examined, including: recent advances in microelectronics technology (as applied to or considered for use in NASA projects); electron packaging technology advances (concurrent with, and as a result of, the development of the advanced microelectronic devices); availability of parts used in space avionics; and standardization and integration of parts activities between projects, centers, and contractors.
From the outside looking in, the NEPP program supports NASA's traditional approach to providing electrical, electronic, and electromechanical (EEE) assurance for space missions. Standards (military and commercial) for EEE parts are based on risk averse methodologies, drive higher costs and schedules, and, in general, provide devices that significantly lag behind commercial devices in performance aspects (speed, power efficiency, etc...). This is NOT the model most small missions realistically can use. However, when you look behind the curtain, NEPP has been considering the risk trade space for small missions for over five years and has consistently provided resources that the small mission regime would find useful. In this paper, we provide a brief overview of these resources as well as NEPP's current research/development efforts that are relevant. While we'll primarily discuss radiation assurance related issues such as data availability and usage, assurances processes for not only the radiation effects side, but also the EEE parts reliability will be touched upon.
The objective of this paper is an assessment of high voltage electronic components required for high horsepower electric thrust vector control (TVC) systems for human spaceflight launch critical application. The scope consists of creating of a database of available Grade 1 electrical, electronic and electromechanical (EEE) parts suited to this application, a qualification path for potential non-Grade 1 EEE parts that could be used in these designs, and pathfinder testing to validate aspects of the proposed qualification plan. Advances in the state of the art in high power electric power systems enable high horsepower electric actuators, such as the electromechnical actuator (EMA) and the electro-hydrostatic actuator (EHA), to be used in launch vehicle TVC systems, dramaticly reducing weight, complexity and operating costs. Designs typically use high voltage insulated gate bipolar transistors (HV-IGBT). However, no Grade 1 HV-IGBT exists and it is unlikely that market factors alone will produce such high quality parts. Furthermore, the perception of risk, the lack of qualification methodoloy, the absence of manned space flight heritage and other barriers impede the adoption of commercial grade parts onto the critical path. The method of approach is to identify high voltage electronic component types and key parameters for parts currently used in high horsepower EMA/EHA applications, to search for higher quality substitutes and custom manufacturers, to create a database for these parts, and then to explore ways to qualify these parts for use in human spaceflight launch critical application, including grossly derating and possibly treating hybrid parts as modules. This effort is ongoing, but results thus far include identification of over 60 HV-IGBT from four manufacturers, including some with a high reliability process flow. Voltage ranges for HV-IGBT have been identified, as has screening tests used to characterize HV-IGBT. BSI BS ISO 21350 Space systems Off-the-shelf item utilization, developed from Marshall Work Instruction MWI8060.1 OFF-THE-SHELF HARDWARE UTILIZATION IN FLIGHT HARDWARE DEVELOPMENTwas found to provide guidance for including commercial off-the-shelf (COTS) hardware for use in critical applications.
NEPP Mission Statement: Provide NASA's leadership for developing and maintaining guidance for the screening, qualification, test, and reliable usage of electrical, electronic, and electromechanical (EEE) parts by NASA, in collaboration with other government Agencies and industry.
This presentation will review some past NASA presentations that had identified challenges and future trends in the assurance of Electrical, Electronic and Electromechanical (EEE) parts for spaceflight applications. It will contrast the concerns expressed in those presentations with the challenges of today and identify trends that give insight into the future. Common themes include the use of commercial parts, limited technical and physical resources, the pace of technology change and the difficulties in handling and testing individual parts as they become smaller and more complex. Some options for dealing with these challenges will be suggested to accommodate increasing numbers of smallsats, cubesats, constellations and other disruptive concepts, as space becomes more and more commercialized.
NASA analyzes electrical, electronic, and electromechanical (EEE) parts used in space vehicles to understand failure modes of these components. Operational amplifiers and transistors are two examples of EEE parts critical to NASA missions that can fail due to electrical overstress (EOS). EOS is the result of voltage or current over time conditions that exceeds a component s specification limit. The objective of this study was to provide known voltage pulses over well-defined time intervals to determine the type and extent of damage imparted to the device. The amount of current was not controlled but measured so that pulse energy was determined. The damage was ascertained electrically using curve trace plots and optically using various metallographic techniques. The resulting data can be used to build a database of physical evidence to compare to damaged components removed from flight avionics. The comparison will provide the avionics failure analyst necessary information about voltage and times that caused flight or test failures when no other electrical data is available.
James Webb Space Telescope (JWST) is the space-based observatory that will extend the knowledge gained by the Hubble Space Telescope (HST). Hubble focuses on optical and ultraviolet wavelengths while JWST focuses on the infrared portion of the electromagnetic spectrum, to see the earliest stars and galaxies that formed in the Universe and to look deep into nearby dust clouds to study the formation of stars and planets. JWST, which commenced creation in 1996, is scheduled to launch in 2018. It includes a suite of four instruments, the spacecraft bus, optical telescope element, Integrated Science Instrument Module (ISIM, the platform to hold the instruments), and a sunshield. The mass of JWST is approximately 6200 kg, including observatory, on-orbit consumables and launch vehicle adaptor. Many challenges were overcome while providing the electrical and electronic components for the Goddard Space Flight Center hardware builds. Other difficulties encountered included developing components to work at cryogenic temperatures, failures of electronic components during development and flight builds, Integration and Test electronic parts problems, and managing technical issues with international partners. This paper will present the context of JWST from a EEE (electrical, electronic, and electromechanical) perspective with examples of challenges and lessons learned throughout the design, development, and fabrication of JWST in cooperation with our associated partners including the Canadian Space Agency (CSA), the European Space Agency (ESA), Lockheed Martin and their respective associated partners. Technical challenges and lessons learned will be discussed.
Over the past decade, electronic, electrical, and electromechanical (EEE) parts for space applications have undergone significant changes, largely driven by CubeSat and commercial space developers pushing the boundaries on the utilization of commercial parts in space. Global product shortages and shipping delays are still impacting space flight project deadlines. Many projects have turned to automotive grade resistors as an alternate to their MILSPEC counterparts to fulfill requirements. In addition, automotive grade resistors may offer designers a wider range of parts to consider. A recent NASA study recommended the use of high-volume manufactured commercial components for space applications provided these components show evidence of stringent fabrication controls and thorough reliability monitoring practices. Automotive grade components have stringent qualification requirements per the Automotive Electronic Council (AEC). However, the end user usually does not have insight into the practices the manufacturer may use to reduce/eliminate infant mortality nor for compliance to all datasheet specifications. Screening, Life and Accelerated Life testing on a set of standard automotive-grade chip resistors is proposed to evaluate the reliability of these components. Requirements from both the AEC-Q (Automotive Electronic Council Qualification) and EEE-INST-002 (Instructions for EEE Parts Selection, Screening, Qualification, and Derating) for resistors is compared and discussed. The resistors have been tested by using a modified methodology from EEEINST-002 to evaluate their reliability for space flight projects. The findings of this study indicate that the underlying degradation mechanisms at rated temperature and power are best represented by power law models with a fitted exponent between 0 and 1. A linear model is more conservative which compensates for potential model uncertainty given the wide range of design and materials used in automotive resistors, while still providing useful long-term resistance drift estimates. No electrical anomalies or failures were observed throughout the 1000-hour Life Tests other than small in tolerance resistance drift aging. Degradation models were utilized to quantify and extrapolate the long-term resistance drift under operating conditions for the components. The models demonstrated that some automotive-grade resistors are likely to operate 10 years at nominal usage conditions while others might fail earlier.
Over the past decade, electronic, electrical, and electromechanical (EEE) parts for space applications have undergone significant changes, largely driven by CubeSat and commercial space developers pushing the boundaries on the utilization of commercial parts in space. Global product shortages and shipping delays are still impacting space flight project deadlines. Many projects have turned to automotive grade resistors as an alternate to their MIL-SPEC counterparts to fulfill requirements. In addition, automotive grade resistors may offer designers a wider range of parts to consider. A recent NASA study recommended the use of high-volume manufactured commercial components for space applications provided these components show evidence of stringent fabrication controls and thorough reliability monitoring practices [1]. Automotive grade components have stringent qualification requirements per the Automotive Electronic Council (AEC). However, the end user usually does not have insight into the practices the manufacturer may use to reduce/eliminate infant mortality nor for compliance to all datasheet specifications. Screening, Life and Accelerated Life testing on a set of standard automotive-grade chip resistors is proposed to evaluate the reliability of these components. Requirements from both the AEC-Q (Automotive Electronic Council Qualification) and EEE-INST-002 (Instructions for EEE Parts Selection, Screening, Qualification, and Derating) for resistors is compared and discussed. The resistors have been tested by using a modified methodology from EEE-INST-002 to evaluate their reliability for space flight projects. The findings of this study indicate that the underlying degradation mechanisms at rated temperature and power are best represented by power law models with a fitted exponent between 0 and 1. A linear model is more conservative which compensates for potential model uncertainty given the wide range of design and materials used in automotive resistors, while still providing useful long-term resistance drift estimates. No electrical anomalies or failures were observed throughout the 1,000-hour Life Tests other than small in tolerance resistance drift aging. Degradation models were utilized to quantify and extrapolate the long-term resistance drift under operating conditions for the components. The models demonstrated that some automotive-grade resistors are likely to operate 10 years at nominal usage conditions while others might fail earlier.
The NASA Parts Project Office (NPPO) comprehensive data system to support all NASA Electric, Electronic, and Electromechanical (EEE) parts management and technical data requirements is described. A phase delivery approach is adopted, comprising four principal phases. Phases 1 and 2 support Space Station Freedom (SSF) and use a centralized architecture with all data and processing kept on a mainframe computer. Phases 3 and 4 support all NASA centers and projects and implement a distributed system architecture, in which data and processing are shared among networked database servers. The Phase 1 system, which became operational in February of 1990, implements a core set of functions. Phase 2, scheduled for release in 1991, adds functions to the Phase 1 system. Phase 3, to be prototyped beginning in 1991 and delivered in 1992, introduces a distributed system, separate from the Phase 1 and 2 system, with a refined semantic data model. Phase 4 extends the data model and functionality of the Phase 3 system to provide support for the NASA design community, including integration with Computer Aided Design (CAD) environments. Phase 4 is scheduled for prototyping in 1992 to 93 and delivery in 1994.
The early space probes provided our first detailed look at the planets, and demonstrated the critical role played by parts technology. The advanced orbital platform under development, the Space Station Freedom (which represents a pivotal step in the space program) contains about 5 million Electrical, Electronic and Electromechanical (EEE) parts. Thus, EEE parts continue to be crucial to mission success. The NASA EEE parts program establishes and directs policy and integration throughout the Agency. The EEE program structure, issues and solutions are described. The challenge presented by advanced electronic devices is discussed.