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NASA NTRS2000

Accelerated Thermal Cycling and Failure Mechanisms for BGA and CSP Assemblies

This paper reviews the accelerated thermal cycling test methods that are currently used by industry to characterize the interconnect reliability of commercial-off-the-shelf (COTS) ball grid array (BGA) and chip scale package (CSP) assemblies. Acceleration induced failure mechanisms varied from conventional surface mount (SM) failures for CSPs. Examples of unrealistic life projections for other CSPs are also presented. The cumulative cycles to failure for ceramic BGA assemblies performed under different conditions, including plots of their two Weibull parameters, are presented. The results are for cycles in the range of -30 C to 100 C, -55 C to 100 C, and -55 C to 125 C. Failure mechanisms as well as cycles to failure for thermal shock and thermal cycling conditions in the range of -55 C to 125 C were compared. Projection to other temperature cycling ranges using a modified Coffin-Manson relationship is also presented.

Ghaffarian, Reza↗

NASA NTRS2002

Controlling Electron Backstreaming Phenomena Through the Use of a Transverse Magnetic Field

DEEP-SPACE mission propulsion requirements can be satisfied by the use of high specific impulse systems such as ion thrusters. For such missions. however. the ion thruster will be required to provide thrust for long periods of time. To meet the long operation time and high-propellant throughput requirements, thruster lifetime must be increased. In general, potential ion thruster failure mechanisms associated with long-duration thrusting can be grouped into four areas: (1) ion optics failure; (2) discharge cathode failure; (3) neutralizer failure; and (4) electron backstreaming caused by accelerator grid aperture enlargement brought on by accelerator grid erosion. The work presented here focuses on electron backstreaming. which occurs when the potential at the center of an accelerator grid aperture is insufficient to prevent the backflow of electrons into the ion thruster. The likelihood of this occurring depends on ion source operation time. plasma density, and grid voltages, as accelerator grid apertures enlarge as a result of erosion. Electrons that enter the gap between the high-voltage screen and accelerator grids are accelerated to the energies approximately equal to the beam voltage. This energetic electron beam (typically higher than 1 kV) can damage not only the ion source discharge cathode assembly. but also any of the discharge surfaces upstream of the ion acceleration optics that the electrons happen to impact. Indeed. past backstreaming studies have shown that near the backstreaming limit, which corresponds to the absolute value of the accelerator grid voltage below which electrons can backflow into the thruster, there is a rather sharp rise in temperature at structures such as the cathode keeper electrode. In this respect operation at accelerator grid voltages near the backstreaming limit is avoided. Generally speaking, electron backstreaming is prevented by operating the accelerator grid at a sufficiently negative voltage to ensure a sufficiently negative aperture center potential. This approach can provide the necessary margin assuming an expected aperture enlargement. Operation at very negative accelerator grid voltages, however, enhances ion charge-exchange and direct impingement erosion of the accelerator grid. The focus of the work presented here is the mitigation of electron backstreaming by the use of a magnetic field. The presence of a magnetic field oriented perpendicular to the thruster axis can significantly decrease the magnitude of the backflowing electron current by significantly reducing the electron diffusion coefficient. Negative ion sources utilize this principle to reduce the fraction of electrons in the negative ion beam. The focus of these efforts has been on the attenuation of electron current diffusing from the discharge plasma into the negative ion extraction optics by placing the transverse magnetic field upstream of the extraction electrodes. In contrast. in the case of positive ion sources such as ion thrusters, the approach taken in the work presented here is to apply the transverse field downstream of the ion extraction system so as to prevent electrons from flowing back into the source. It was found in the work presented here that the magnetic field also reduces the absolute value of the electron backstreaming limit voltage. In this respect. the applied transverse magnetic field provides two mechanisms for electron backstreaming mitigation: (1) electron current attenuation and (2) backstreaming limit voltage shift. Such a shift to less negative voltages can lead to reduced accelerator grid erosion rates.

Foster, John E.↗

NASA NTRS2010

Application of the NEXT Ion Thruster Lifetime Assessment to Thruster Throttling

Ion thrusters are low thrust, high specific impulse devices with typical operational lifetimes of 10,000 to 30,000 hr over a range of throttling conditions. The NEXT ion thruster is the latest generation of ion thrusters under development. The NEXT ion thruster currently has a qualification level propellant throughput requirement of 450 kg of xenon, which corresponds to roughly 22,000 hr of operation at the highest input power throttling point. This paper will provide a brief review the previous life assessment predictions for various throttling conditions. A further assessment will be presented examining the anticipated accelerator grid hole wall erosion and related electron backstreaming limit. The continued assessment of the NEXT ion thruster indicates that the first failure mode across the throttling range is expected to be in excess of 36,000 hr of operation from charge exchange induced groove erosion. It is at this duration that the groove is predicted to penetrate the accelerator grid possibly resulting in structural failure. Based on these lifetime and mission assessments, a throttling approach is presented for the Long Duration Test to demonstrate NEXT thruster lifetime and validate modeling.

VanNoord, Jonathan L.↗

NASA NTRS1986

Generalized parity relations for large space structures with uncertain parameters

The generalized parity relations method is a technique that can be used to detect sensor and actuator failures on a large space structure. A model of a grid structure was used to evaluate the performance of these relations. It shows their relative sensitivity to modeling errors. A method using sensor outputs and actuator inputs is required for the design of the generalized parity relations. Three different estimators are studied. The last estimator can generate relations optimized for the detection of a particular failure which are interesting when the level of sensor noise is high.

Dutilloy, J. R.↗

NASA NTRS1996

Impingement-Current-Erosion Characteristics of Accelerator Grids on Two-Grid Ion Thrusters

Accelerator grid sputter erosion resulting from charge-exchange-ion impingement is considered to be a primary cause of failure for electrostatic ion thrusters. An experimental method was developed and implemented to measure erosion characteristics of ion-thruster accel-grids for two-grid systems as a function of beam current, accel-grid potential, and facility background pressure. Intricate accelerator grid erosion patterns, that are typically produced in a short time (a few hours), are shown. Accelerator grid volumetric and depth-erosion rates are calculated from these erosion patterns and reported for each of the parameters investigated. A simple theoretical volumetric erosion model yields results that are compared to experimental findings. Results from the model and experiments agree to within 10%, thereby verifying the testing technique. In general, the local distribution of erosion is concentrated in pits between three adjacent holes and trenches that join pits. The shapes of the pits and trenches are shown to be dependent upon operating conditions. Increases in beam current and the accel-grid voltage magnitude lead to deeper pits and trenches. Competing effects cause complex changes in depth-erosion rates as background pressure is increased. Shape factors that describe pits and trenches (i.e. ratio of the average erosion width to the maximum possible width) are also affected in relatively complex ways by changes in beam current, ac tel-grid voltage magnitude, and background pressure. In all cases, however, gross volumetric erosion rates agree with theoretical predictions.

Barker, Timothy↗

NASA NTRS1998

Chip Scale Package Integrity Assessment by Isothermal Aging

Many aspects of chip scale package (CSP) technology, with focus on assembly reliability characteristics, are being investigated by the JPL-led consortia. Three types of test vehicles were considered for evaluation and currently two configurations have been built to optimize attachment processes. These test vehicles use numerous package types. To understand potential failure mechanisms of the packages, particularly solder ball attachment, the grid CSPs were subjected to environmental exposure. Package I/Os ranged from 40 to nearly 300. This paper presents both as assembled, up to 1, 000 hours of isothermal aging shear test results and photo micrographs, and tensile test results before and after 1,500 cycles in the range of -30/100 C for CSPs. Results will be compared to BGAs with the same the same isothermal aging environmental exposures.

Ghaffarian, Reza↗

NASA NTRS2009

Status of the NEXT Long-Duration Test After 23,300 Hours of Operation

The NASA s Evolutionary Xenon Thruster (NEXT) program is developing the next-generation ion propulsion system with significant enhancements beyond the state-of-the-art in ion propulsion to provide future NASA science missions with enhanced mission capabilities at a low total development cost. As part of a comprehensive thruster service life assessment utilizing both testing and analyses, a Long-Duration Test (LDT) was initiated in June 2005, to verify the NEXT propellant throughput capability to a qualification-level of 450 kg, 1.5 times the anticipated throughput requirement of 300 kg per thruster from mission analyses. The LDT is being conducted with a modified, flight-representative NEXT engineering model ion thruster, designated EM3. As of July 2009, the thruster has accumulated 23,300 h of operation with extensive durations at the following input powers: 6.9, 4.7, 1.1, and 0.5 kW. The thruster has processed 427 kg of xenon surpassing the NSTAR propellant throughput demonstrated during the extended life testing of the Deep Space 1 flight spare ion thruster and approaching the NEXT development qualification throughput goal. The NEXT LDT has demonstrated a total impulse of 16.0 10(exp 6) N/s; the highest total impulse ever demonstrated by an ion thruster. Thruster performance tests are conducted periodically over the entire NEXT throttle table with input power ranging 0.5 to 6.9 kW. Thruster performance parameters including thrust, input power, specific impulse, and thruster efficiency have been nominal with little variation to date. The NSTAR first-failure mode, accelerator aperture erosion leading to electron backstreaming, has been mitigated in the NEXT design. The severe NSTAR discharge cathode assembly erosion has been mitigated by a graphite keeper in the NEXT thruster. Tracking of the NEXT first failure mode, charge-exchange ion impingement on the accelerator grid causing hexagonal groove erosion, is consistent with model predictions and indicates thruster life greater than or equal to 750 kg throughput. This paper presents the status, performance data, and wear characteristics of the NEXT LDT to date.

Herman, Daniel A.↗

NASA NTRS1983

Reliability considerations in the placement of control system components

This paper presents a methodology, along with applications to a grid type structure, for incorporating reliability considerations in the decision for actuator placement on large space structures. The method involves the minimization of a criterion that considers mission life and the reliability of the system components. It is assumed that the actuator gains are to be readjusted following failures, but their locations cannot be changed. The goal of the design is to suppress vibrations of the grid and the integral square of the grid modal amplitudes is used as a measure of performance of the control system. When reliability of the actuators is considered, a more pertinent measure is the expected value of the integral; that is, the sum of the squares of the modal amplitudes for each possible failure state considered, multiplied by the probability that the failure state will occur. For a given set of actuator locations, the optimal criterion may be graphed as a function of the ratio of the mean time to failure of the components and the design mission life or reservicing interval. The best location of the actuators is typically different for a short mission life than for a long one.

Montgomery, R. C.↗

NASA NTRS2006

Thermal Cycle Reliability of PBGA/CCGA 717 I/Os

Status of thermal cycle test results for a nonfunctional daisy-chained peripheral ceramic column grid array (CCGA) and its plastic ball grid array (PBGA) version. both having 560 I/Os. were presented in last year's conference. Test results included environmental data for three different thermal cycle regimes (-55 C/125 C, -55 C/100 C, and -50 C /75 C). Update information on these - especially failure type for assemblies with high and low solder volumes-were presented. The thermal cycle test procedure followed those recommended IPC-9701 for tin-lead solder joint assemblies. Revision A of this specification covers guideline thermal cycle requirements for Pb-free solder joints. Some background information discussed during release of this specification with its current guideline recommendations were also presented. In a recent reliability investigation a fully populated CCGA with 717 I/Os was also considered for assembly reliability. evaluation. The functional package is a field-programmable gate array that has much higher processing power than its previous version. This new package is smaller in dimension, has no interposer, and has a thinner column wrapped with copper for reliability improvement. This paper will also present thermal cycle test results for this package assembly and its plastic version with 728 I/Os. both of which were exposed to three different cycle regimes. Two cycle profiles were those specified by IPC- 9701A for tin-lead, i.e. -55 to 100 C and -55 to 125 C and one was a cycle profile specified by Mil-Std-883, i.e.. -65 C/150 C which is generally used for ceramic hybrid packages. Per IPC-9701 A, test vehicles were built using daisy chain packages and were continuously monitored. The effects of many process and assembly variables-including corner staking commonly used for improving resistance to mechanical loading such as drop and vibration loads--were also considered as part of the test matrix. Optical photomicrographs were taken at various thermal cycle intervals to document damage progress and behavior. Representative samples of these along with cross-sectional photomicrographs at higher magnification taken by scanning electron microscopy (SEM) to determine crack propagation and failure analyses for packages are also presented.

staking↗

NASA NTRS1983

Investigation of accelerated stress factors and failure/degradation mechanisms in terrestrial solar cells

Results of an ongoing research program into the reliability of terrestrial solar cells are presented. Laboratory accelerated testing procedures are used to identify failure/degradation modes which are then related to basic physical, chemical, and metallurgical phenomena. In the most recent tests, ten different types of production cells, both with and without encapsulation, from eight different manufacturers were subjected to a variety of accelerated tests. Results indicated the presence of a number of hitherto undetected failure mechanisms, including Schottky barrier formation at back contacts and loss of adhesion of grid metallization. The mechanism of Schottky barrier formation is explained by hydrogen, formed by the dissociation of water molecules at the contact surface, diffusing to the metal semiconductor interface. This same mechanism accounts for the surprising increase in sensitivity to accelerated stress conditions that was observed in some cells when encapsulated.

Lathrop, J. W.↗

NASA NTRS2017

Update of the NEXT Ion Thruster Service Life Assessment with Post-Test Correlation to the Long Duration Test

The service life assessment for NASA's Evolutionary Xenon Thruster is updated to incorporate the results from the successful and voluntarily early completion of the 51,184 hour long duration test which demonstrated 918 kg of total xenon throughput. The results of the numerous post-test investigations including destructive interrogations have been assessed against all of the critical known and suspected failure mechanisms to update the life and throughput expectations for each major component. Analysis results of two of the most acute failure mechanisms, namely pit-and-groove erosion and aperture enlargement of the accelerator grid, are not updated in this work but will be published at a future time after analysis completion.

ion engines↗

NASA NTRS1993

An advancing-front Delaunay-triangulation algorithm designed for robustness

The following topics, which are associated with computational fluid dynamics, are discussed: unstructured mesh generation; the advancing front methodology; failures of the advancing front methodology; Delaunay triangulation; the Tanamua-Merriam algorithm; Yet Another Grid Generator (YAGG); and advancing front-Delaunay triangulation. The discussion is presented in viewgraph form.

D J Mavriplis↗

NASA NTRS2010

NASA's Evolutionary Xenon Thruster (NEXT) Project Qualification Propellant Throughput Milestone: Performance, Erosion, and Thruster Service Life Prediction After 450 kg

The NASA s Evolutionary Xenon Thruster (NEXT) program is tasked with significantly improving and extending the capabilities of current state-of-the-art NSTAR thruster. The service life capability of the NEXT ion thruster is being assessed by thruster wear test and life-modeling of critical thruster components, such as the ion optics and cathodes. The NEXT Long-Duration Test (LDT) was initiated to validate and qualify the NEXT thruster propellant throughput capability. The NEXT thruster completed the primary goal of the LDT; namely to demonstrate the project qualification throughput of 450 kg by the end of calendar year 2009. The NEXT LDT has demonstrated 28,500 hr of operation and processed 466 kg of xenon throughput--more than double the throughput demonstrated by the NSTAR flight-spare. Thruster performance changes have been consistent with a priori predictions. Thruster erosion has been minimal and consistent with the thruster service life assessment, which predicts the first failure mode at greater than 750 kg throughput. The life-limiting failure mode for NEXT is predicted to be loss of structural integrity of the accelerator grid due to erosion by charge-exchange ions.

Herman, Daniel A.↗

NASA NTRS2010

Status of the NASA's Evolutionary Xenon Thruster (NEXT) Long-Duration Test After 30,352 Hours of Operation

The NASA s Evolutionary Xenon Thruster (NEXT) program is tasked with significantly improving and extending the capabilities of current state-of-the-art NSTAR thruster. The service life capability of the NEXT ion thruster is being assessed by thruster wear test and life-modeling of critical thruster components, such as the ion optics and cathodes. The NEXT Long-Duration Test (LDT) was initiated to validate and qualify the NEXT thruster propellant throughput capability. The NEXT thruster completed the primary goal of the LDT; namely to demonstrate the project qualification throughput of 450 kg by the end of calendar year 2009. The NEXT LDT has demonstrated 30,352 hr of operation and processed 490 kg of xenon throughput--surpassing the NSTAR Extended Life Test hours demonstrated and more than double the throughput demonstrated by the NSTAR flight-spare. Thruster performance changes have been consistent with a priori predictions. Thruster erosion has been minimal and consistent with the thruster service life assessment, which predicts the first failure mode at greater than 750 kg throughput. The life-limiting failure mode for NEXT is predicted to be loss of structural integrity of the accelerator grid due to erosion by charge-exchange ions.

Herman, Daniel A.↗

NASA NTRSDate not supplied

Evaluating Subgrid-Scale Properties of Low Clouds over the Beaufort Sea in Arctic System Reanalysis using ARISE Airborne In Situ Observations

Arctic low clouds influence the evolution of the Arctic system through their effects on radiative fluxes, boundary layer mixing, stability, turbulence, humidity, and precipitation. Unfortunately, atmospheric models and retrospective analysis (reanalysis) products struggle to accurately simulate the occurrence and properties of low clouds in the Arctic. To better understand the magnitude and possible causes of this problem, we analyze the disagreements between the Arctic System Reanalysis version 2 (ASR) and data taken during the September 2014 Arctic Radiation-IceBridge Sea and Ice Experiment (ARISE) airborne campaign conducted over the Beaufort Sea. Previous analysis of grid scale-averaged meteorological variables revealed a lack of cloud water produced in ASR, related to warm/dry biases, a failure to produce sufficient cloud water in conditions that are observed to be favorable for large cloud water values, and sampling issues with the ARISE flight paths. However, ARISE collected meteorological observations at one second intervals, offering spatial data resolution comparable to the subgrid scale of ASR. Subgrid scale properties and processes must be parameterized in conventional atmospheric models and reanalyses such as ASR, and often rely on assumed distributions of meteorological variables about the grid box mean state. To enable an examination of the realism of ASR’s subgrid scale properties, we use high resolution data from ARISE determine the “subgrid scale” distributions of cloud water and thermodynamic variables in the real atmosphere. Preliminary results show that the subgrid scale distribution of thermodynamic variables about the grid scale mean resembles the triangular distribution assumed in many bulk microphysical parameterization schemes, but also with tails resembling Gaussian distributions. The main goal is to understand the partitioning of the total available atmospheric water into water vapor and cloud water. Models typically covert some percentage of total water in a grid box to cloud water based on the estimated amount of supersaturation from the assumed vapor distribution. The ARISE measurements can reveal the relationship between subgrid scale supersaturation and the partition between cloud water and water vapor.

Jason Brant Dodson↗

NASA NTRS2008

NASA DOD Lead Free Electronics Project

The primary'technical objective of this project is to undertake comprehensive testing to generate information on failure modes/criteria to better understand the reliability of: Packages (e.g., Thin Small Outline Package [TSOP], Ball Grid Array [BGA], Plastic Dual In-line Package [PDIPD assembled and reworked with lead-free alloys Packages (e.g., TSOP, BGA, PDIP) assembled and reworked with mixed (lead/lead-free) alloys.

Kessel, Kurt R.↗

NASA NTRS2003

Magnetic Field Would Reduce Electron Backstreaming in Ion Thrusters

The imposition of a magnetic field has been proposed as a means of reducing the electron backstreaming problem in ion thrusters. Electron backstreaming refers to the backflow of electrons into the ion thruster. Backstreaming electrons are accelerated by the large potential difference that exists between the ion-thruster acceleration electrodes, which otherwise accelerates positive ions out of the engine to develop thrust. The energetic beam formed by the backstreaming electrons can damage the discharge cathode, as well as other discharge surfaces upstream of the acceleration electrodes. The electron-backstreaming condition occurs when the center potential of the ion accelerator grid is no longer sufficiently negative to prevent electron diffusion back into the ion thruster. This typically occurs over extended periods of operation as accelerator-grid apertures enlarge due to erosion. As a result, ion thrusters are required to operate at increasingly negative accelerator-grid voltages in order to prevent electron backstreaming. These larger negative voltages give rise to higher accelerator grid erosion rates, which in turn accelerates aperture enlargement. Electron backstreaming due to accelerator-gridhole enlargement has been identified as a failure mechanism that will limit ionthruster service lifetime. The proposed method would make it possible to not only reduce the electron backstreaming current at and below the backstreaming voltage limit, but also reduce the backstreaming voltage limit itself. This reduction in the voltage at which electron backstreaming occurs provides operating margin and thereby reduces the magnitude of negative voltage that must be placed on the accelerator grid. Such a reduction reduces accelerator- grid erosion rates. The basic idea behind the proposed method is to impose a spatially uniform magnetic field downstream of the accelerator electrode that is oriented transverse to the thruster axis. The magnetic field must be sufficiently strong to impede backstreaming electrons, but not so strong as to significantly perturb ion trajectories. An electromagnet or permanent magnetic circuit can be used to impose the transverse magnetic field downstream of the accelerator-grid electrode. For example, in the case of an accelerator grid containing straight, parallel rows of apertures, one can apply nearly uniform magnetic fields across all the apertures by the use of permanent magnets of alternating polarity connected to pole pieces laid out parallel to the rows, as shown in the left part of the figure. For low-temperature operation, the pole pieces can be replaced with bar magnets of alternating polarity. Alternatively, for the same accelerator grid, one could use an electromagnet in the form of current-carrying rods laid out parallel to the rows.

Foster, John E.↗

NASA NTRS2009

NASA-DoD Lead-Free Electronics Project

In response to concerns about risks from lead-free induced faults to high reliability products, NASA has initiated a multi-year project to provide manufacturers and users with data to clarify the risks of lead-free materials in their products. The project will also be of interest to component manufacturers supplying to high reliability markets. The project was launched in November 2006. The primary technical objective of the project is to undertake comprehensive testing to generate information on failure modes/criteria to better understand the reliability of: (1) Packages (e.g., Thin Small Outline Package [TSOP], Ball Grid Array [BGA], Plastic Dual In-line Package [PDIP]) assembled and reworked with solder interconnects consisting of lead-free alloys (2) Packages (e.g., TSOP, BGA, PDIP) assembled and reworked with solder interconnects consisting of mixed alloys, lead component finish/lead-free solder and lead-free component finish/SnPb solder

Kessel, Kurt↗