SEARCH · Search NASA
Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.
A set of space environmental test specifications has been defined for spaceborne computer modules and is identified in IEEE P1156.4,.
Design and implementation of a testbed for testing and verifying IEEE 1451-compatible sensor systems with network performance monitoring is of significant importance. The performance parameters measurement as well as decision support systems implementation will enhance the understanding of sensor systems with plug-and-play capabilities. The paper will present the design aspects for such a testbed environment under development at University of Houston in collaboration with NASA Stennis Space Center - SSST (Smart Sensor System Testbed).
Radio Frequency Interference contamination for Earth Observation satellites is an on-growing problem, but the situation is not properly reported. A new IEEE standard is being developed to quantify the amount of RFI in the frequency bands used by remote sensing satellites. This standard will allow for a proper monitoring of the RFI trends in each frequency band
The Challenge Task As a result of climate change, extreme hydrometeorological events are becoming increasingly frequent. Flood rapid mapping products play an important role in informing flood emergency response and management. These maps are generated quickly from remote sensing data during or after an event to show the extent of flooding. They provide important information for emergency response, and damage assessment. The aim of this challenge is to develop data fusion algorithms that generate flood maps by processing spatial data from a variety of sources. The goal of this IEEE challenge (sponsored by NASA and CNES) is to design and develop an algorithm that will combine multi-source data to classify flood surface water extent–that is, water and non-water areas. Provided data sources include optical and SAR remote sensing images as well as a digital terrain model. The output is a gridded flood map where each grid cell is labeled water or non-water. The difficulty of detecting flooded areas can vary greatly depending on the conditions in the area of interest and the event. This data fusion challenge has two tracks representing this variance.
Explore the source record for details and available documents.
Explore the source record for details and available documents.
Among other challenges from NASA's X2000 Technology Development Program, affordability and miniaturizaton are prominent criteria, which 1) preclude the traditional solutions for mission reliability that rely on customer-built hardware and extensive component/subsystem replication, and 2) call for commercial-of-the-shelf (COTS) based approaches incorporating novel, practical fault tolerance techniques.
The present conference discusses topics in VLSI components and their packaging, signal processing, uses of cartographic data, data transmission, advanced avionics architectures, fiber-optics, information control and display, image processing, airborne radar and fire control, navigation, air data, Kalman filtering, power generation and control, spacecraft power structures, aircraft flying qualities, flight management, fault-tolerant computer architectures, actuation technologies, self-repairing flight control system technology, multivariable control, stability and control methods, and AFTI/F-16 flight test reports. Also discussed are the ADA/JOVIAL language and its applications, software acquisition and testing, advanced software concepts, software management, computer graphics and visual systems softwear, ADA in embedded avionics, 16- and 32-bit architectures, voice interaction applications, human/machine systems analysis, human factors and AI, mental workloads and displays, pilot acceleration protection research, communications system technology, space communications, reliability and maintainability, managerial techniques, engineering management, EM compatibility and nuclear hardening, expert systems, AI language/knowledge representation, expert system implementation, machine vision/optical processing, and advanced AI concepts and architectures.
The effects of nuclear and space radiation on the performance of electronic devices are discussed in reviews and reports of recent investigations. Topics addressed include the basic mechanisms of radiation effects, dosimetry and energy-dependent effects, sensors in and for radiation environments, EMP/SGEMP/IEMP phenomena, radiation effects on isolation technologies, and spacecraft charging and space radiation effects. Consideration is given to device radiation effects and hardening, hardness assurance and testing techniques, IC radiation effects and hardening, and single-event phenomena.
Various papers on nuclear science are presented. The general topics addressed include: basic mechanics of radiation effects, dosimetry and energy-dependent effects, hardness assurance and testing techniques, spacecraft charging and space radiation effects, EMP/SGEMP/IEMP phenomena, device radiation effects and hardening, radiation effects on isolation technologies, IC radiation effects and hardening, and single-event phenomena.
Various papers on nuclear and space radiation effects are presented. The general topics addressed include: basic mechanisms of radiation effects, dosimetry and energy-dependent effects, hardness assurance and testing techniques, single-event upset and latchup, isolation technologies, device and integrated circuit effects and hardening, spacecraft charging and electromagnetic effects.
Three papers are presented on the following topics: (1) a cerebellar-model associative memory as a generalized random-access memory; (2) theories of the cerebellum - two early models of associative memory; and (3) intelligent network management and functional cerebellum synthesis.
Various papers on nuclear science are presented. The general topics addressed are: basic mechanisms of radiation effects, dosimetry and energy-dependent effects, isolation technologies, device radiation response and hardening, microcircuit radiation response and hardening, single-event phenomena, hardness assurance and testing techniques, spacecraft charging, space environments and effects.
A nonlinear distributed parameter model for the NASA-Institute of Electrical and Electronics Engineers' Spacecraft Control Laboratory Experiment (SCOLE) configuration is considered. A linear feedback control law is proposed that points the line of sight of the antenna to any given target direction and at the same time stabilizes the oscillations of the entire flexible configuration.
The papers presented in this volume provide an overview of recent theoretical and experimental research related to nuclear and space radiation effects. Topics dicussed include single event phenomena, radiation effects in particle detectors and associated electronics for accelerators, spacecraft charging, and space environments and effects. The discussion also covers hardness assurance and testing techniques, electromagnetic effects, radiation effects in devices and integrated circuits, dosimetry and radiation facilities, isolation techniques, and basic mechanisms.
The ANSI/IEEE Standard 854-1987 for floating-point arithmetic is interpreted by converting the lexical descriptions in the standard into mathematical conditional descriptions organized in tables. The standard is represented in higher-order logic within the framework of the HOL (Higher Order Logic) system. The paper is divided in two parts with the first part the interpretation and the second part the description in HOL.
This report summarizes the use of SX series devices and their JTAG 1149.1 circuitry. 'JTAG' circuitry was originally designed to standardize testing of boards via a simple control port interface electrically without having to use devices such as a bed of nails tester. JTAG is also used for other functions such as executing built-in-test sequences, identifying devices, or, through custom instructions, other functions designed in by the chip designer. The JTAG circuitry is designed for test only; it has no functional use in the integrated circuit during normal operations. The JTAG circuitry and the mode of the device is controlled by a circuit block known as the 'TAP controller,' which is a sixteen-state state machine along with various registers. The controller is normally in an operational state known as TEST-LOGIC-RESET. In this state, the device is held in a fully functional, operating mode. However, a Single Event Upset (SEU) may remove the TAP controller from this state, causing a loss of control of the integrated circuit, unless certain precautions are taken, such as grounding the optional JTAG TRST signal.
This report summarizes the use of SX series devices and their JTAG 1149.1 circuitry. 'JTAG' circuitry was originally designed to standardize testing of boards via a simple control port interface electrically without having to use devices such as a bed of nails tester. JTAG is also used for other functions such as executing built-in-test sequences, identifying devices, or, through custom instructions, other functions designed in by the chip designer. The JTAG circuitry is designed for test only; it has no functional use in the integrated circuit during normal operations. The JTAG circuitry and the mode of the device is controlled by a circuit block known as the 'TAP controller,' which is a sixteen-state state machine along with various registers. The controller is normally in an operational state known as TEST-LOGIC-RESET. In this state, the device is held in a fully functional, operational mode. However, a Single Event Upset (SEU) may remove the TAP controller from this state, causing a loss of control of the integrated circuit, unless certain precautions are taken, such as grounding the optional JTAG TRST signal.