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At least 37 records · Page 2

Off-Line Testing for Bridge Faults in CMOS Domino Logic Circuits

Bridge faults, especially in CMOS circuits, have unique characteristics which make them difficult to detect during testing. This paper presents a technique for detecting bridge faults which have an effect on the output of CMOS Domino logic circuits. The faults are modeled at the transistor level and this technique is based on analyzing the off-set of the function during off-line testing.

Bennett, K.

Exclusive-or logic circuit has useful properties

Single, simple exclusive-or logic connective eliminates excessive hardware and the number of interconnections between logic modules. This circuit performs the necessary switching for the exclusive-or operation and amplifies, restores, and inverts the signal.

Batte, W. G.

Standard high-reliability integrated circuit logic packaging

A family of standard, high-reliability hardware used for packaging digital integrated circuits is described. The design transition from early prototypes to production hardware is covered and future plans are discussed. Interconnections techniques are described as well as connectors and related hardware available at both the microcircuit packaging and main-frame level. General applications information is also provided.

Slaughter, D. W.

Tri-state logic circuit

A line driver including a pair of complementary transistors having their conduction paths serially connected between an operating and a reference potential and their bases connected through a first switch to a signal input terminal. A second switch is connected between the common base connection and the common connection of the conduction paths. With the second switch open and the first closed, an output voltage, responsive to the input signal, corresponding to first or second binary values is obtained. When the second switch is closed and the first opened, the transistor pair is turned off, disconnecting the line driver from its load, thereby providing tri-state logic operation.

Pryor, Richard Lee

Logic circuit exhibits optimum performance

Performance of circuits are compared to determine the optimum circuit configuration for implementation into microelectronic functions. Comparison is made in terms of power drain, propagation time, and component variations with temperature and load.

Husson, C.

Efficient digital comparison technique for logic circuits

Tolerance compare technique indicates discompare only when numerical difference value exceeds prescribed limit. Algorithm involving binary number properties is defined, in lieu of arithmetic operation which requires relatively complex circuitry. Extension of algorithm may be made to encompass tolerances other than one unit.

Mccarthy, C. E.

Development of beam leaded low power logic circuits

The technologies of low power TTL and beam lead processing were merged into a single product family. This family offers the power and thermal advantages of low power(54L), while providing the additional reliability advantages of beam leads. The reduction in the power and heat levels also allows the system designer to take advantage, through beam lead, multichip assemblies, of increased package density to reduce system size and weight.

Smith, B. W.

Complementary MOS four-phase logic circuits

Technique can provide four-phase clock signal from single-phase clock and requires only one power supply voltage. This arrangement saves considerable power compared to circuits having load resistor between power supply and ground.

Petersen, H. L.

Optical flip-flops and sequential logic circuits using a liquid crystal light valve

This paper is concerned with the application of optics to digital computing. A Hughes liquid crystal light valve is used as an active optical element where a weak light beam can control a strong light beam with either a positive or negative gain characteristic. With this device as the central element the ability to produce bistable states from which different types of flip-flop can be implemented is demonstrated. In this paper, some general comments are first presented on digital computing as applied to optics. This is followed by a discussion of optical implementation of various types of flip-flop. These flip-flops are then used in the design of optical equivalents to a few simple sequential circuits such as shift registers and accumulators. As a typical sequential machine, a schematic layout for an optical binary temporal integrator is presented. Finally, a suggested experimental configuration for an optical master-slave flip-flop array is given.

Fatehi, M. T.

Recent Results on SEU Hardening of SiGe HBT Logic Circuits

A viewgraph presentation on SEU tolerant SiGe HBT technology is shown. The topics include: 1) Introduction; 2) TID and SEU in SiGe Technology; 3) RHBD Techniques; 4) Experiment; 5) Heavy-Ion Data and Analysis; and 6) Summary.

Krithivasan, Ramkumar

Electronic circuits

Twenty-nine circuits and circuit techniques developed for communications and instrumentation technology are described. Topics include pulse-code modulation, phase-locked loops, data coding, data recording, detection circuits, logic circuits, oscillators, and amplifiers.

Source record

Laser Scanner Tests For Single-Event Upsets

Microelectronic advanced laser scanner (MEALS) is opto/electro/mechanical apparatus for nondestructive testing of integrated memory circuits, logic circuits, and other microelectronic devices. Multipurpose diagnostic system used to determine ultrafast time response, leakage, latchup, and electrical overstress. Used to simulate some of effects of heavy ions accelerated to high energies to determine susceptibility of digital device to single-event upsets.

Kim, Quiesup

Fluid logic control circuit operates nutator actuator motor

Fluid logic control circuit operates a pneumatic nutator actuator motor. It has no moving parts and consists of connected fluid interaction devices. The operation of this circuit demonstrates the ability of fluid interaction devices to operate in a complex combination of series and parallel logic sequence.

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