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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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Minority carrier trapping centers introduced by irradiation of n-type germanium analyzed, particularly effect of donor species on production, recovery and annealing of defects
Metal-oxide-silicon capacitor and radiochemical analyses of anion in sodium contamination failure mode
Defect impurity relation in electron damaged p-type silicon and electron irradiation effect on float zone n-type silicon
Annealing of fast neutron damage in impurity conducting n-type Ge, noting small activation energy in resistivity below 10 degrees K
Electron mobility measurements in n-type SiC polytypes noting temperature dependence
Quantum oscillation of magnetoresistivity in n-type mercury telluride crystals, obtaining electron mass
Conduction band structure in n-type strontium titanate investigated by measuring oscillatory magnetoresistance in high magnetic fields
Cobalt 60 gamma radiation effects on Metal Oxide Semiconductors /MOS/ with p-type and n-type silicon substrates
A new effect is being developed which significantly improves the conversion efficiency of antireflection-coated metal-oxide-semiconductor (AMOS) solar cells. The effect, a marked increase in the open-circuit voltage, is produced by the addition of an oxide layer to the semiconductor. Cells using gold on n-type gallium arsenide have been made with efficiencies up to 15% in terrestrial sunlight. All processing steps are amenable to the use of low-cost polycrystalline films of GaAs in place of the single crystals now used.
A new fabrication process is being developed which significantly improves the efficiency of metal-semiconductor solar cells. The resultant effect, a marked increase in the open-circuit voltage, is produced by the addition of an interfacial layer oxide on the semiconductor. Cells using gold on n-type gallium arsenide have been made in small areas (0.17 sq cm) with conversion efficiencies of 15% in terrestrial sunlight.
Millimeter wave semiconductor isolator using circular waveguide with coaxial n-type InSb in longitudinal magnetic field
Process makes microscopic, low-resistance electrical contacts on hexagonal n-type silicon carbide crystals used for microelectronic devices. A vacuum deposition of aluminum is etched to expose the bare silicon carbide where the electrical contacts are made. Sputtering alternating layers of tantalum and gold forms the alloy film.
In technique for fabrication of strip lasers, current constriction is accomplished by diffusing blocking regions into n-type substrate prior to growth. Current flow is controlled by blocking layers, which results in reduction of threshold current and better heat dissipation.
A two-band conduction model is used to determine the properties of shallow-type impurity semiconductors in the presence of microwave and dc magnetic fields as a function of temperature. Measurements using cavity perturbation techniques are employed to determine the properties of n-type InSb and theoretical and experimental results between 4 and 300 K are compared. The hot-electron effect was found to be insignificant between 77 and 300 K, and the scattering mechanisms are dominated by acoustic and polar modes over the same temperature range.-
Matters pertaining to semiconductor device fabrication were studied in terms of the influence of gravity on the production of dislocations in silicon wafers during thermal cycling in a controlled ambient where no impurities are present and oxidation is minimal. Both n-type and p-type silicon wafers having a diameter of 1.25 in to 1.5 in, with fixed orientation and resistivity values, were used. The surface dislocation densities were measured quantitatively by the Sirtl etch technique. The results show two significant features of the plastic flow phenomenon as it is related to gravitational stress: (1) the density of dislocations generated during a given thermal cycle is directly related to the duration of the cycle; and (2) the duration of the thermal cycle required to produce a given dislocation density is inversely related to the equilibrium temperature. Analysis of the results indicates that gravitational stress is instrumental in process-induced defect generation.
The growth of a carrier wave propagating through a negative differential mobility semiconducting sample is discussed under nonuniform dc bias conditions. A simple analytical expression for the overall numerical gain is given in terms of current density and of the input and output carrier wave velocities only. Applications to n-type GaAs are discussed.
The growth of a carrier wave propagating through a negative-differential-mobility semiconducting sample is discussed under nonuniform dc bias conditions. A simple analytical expression for the over-all numerical gain is given in terms of current density and of the input and output carrier-wave velocities only. Applications to n-type GaAs are discussed.
Changes in both magnitude and temperature dependence of the piezoresistance of electron-irradiated n-type silicon, induced by the latter's oxygen-vacancy complex (A center), are shown to be due to the fact that the presence of the A center causes the total conduction-band electron concentration to change with an applied stress. This change in electron concentration leads to an additional piezoresistance contribution that is expected to be important in certain many-valley semiconductors. This offers the possibility of tailoring the thermal variations of semiconductor mechanical sensors to more desirable values over limited temperature ranges.