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At least 37 records · Page 2

Gregorian all-reflective optical system

An optical heterodyne receiver comprises a system of reflectors forming a folded Gregorian configuration for collecting a signal beam, and an optical detector located at the focus of the system. A paraboloidal primary reflector and an elipsoidal secondary reflector face each other on an optical axis with the focus of the secondary reflector coinciding with the focus of the primary reflector. An auxiliary laser generates a local oscillator beam that is combined with the signal beam after the signal beam emerges from the exit pupil (which is also the aperture stop) of the system, and the resultant is impinged on the detector. A pair of image motion compensators is located as close to the exit pupil as possible for aligning off-axis inputs to the detector.

King, W. L.

Coherent lidar wind measurements from the Space Station base using 1.5 m all-reflective optics

This paper discusses the space-based measurement of atmospheric winds from the point of view of the requirements of the optical system of a coherent CO2 lidar. A brief description of the measurement technique is given and a discussion of previous study results provided. The telescope requirements for a Space Station based lidar are arrived at through discussions of the desired system sensitivity and the need for lag angle compensation.

Bilbro, J. W.

Reflective optical system for a hemispherical field radiometer

The Radiation Measurement System (RAMS) is a project at NASA Ames Research Center to develop infrared radiometers for use in studying radiative transfer within the earth's atmosphere. These radiometers will use a liquid nitrogen cooled reference source and thermal stabilization of the optics. One of the radiometer designs calls for a hemispherical field of view, which has stimulated development of a new optical system. The system developed uses Winston cones, some of them in the reverse of the usual direction. This optical system has been optimized for the RAMS project needs and simulated on a computer for verification.

Davis, Paul K.

Optical Reflectance and Fluorescence for Detecting Nitrogen Needs in Zea mays L.

Nitrogen (N) status in field grown corn (Zea mays L.) was assessed using spectral techniques. Passive reflectance remote sensing and, both passive and active fluorescence sensing methods were investigated. Reflectance and fluorescence methods are reported to detect changes in the primary plant pigments (chlorophylls a and b; carotenoids) in higher plant species. As a general rule, foliar chlorophyll a (Chl a) and chlorophyll b (Chl b) usually exist in approx.3:l ratio. In plants under stress, Chl b content is affected before Chl a reductions occur. For reflectance, a version of the chlorophyll absorption in reflectance index (CARI) method was tested with narrow bands from the Airborne Imaging Spectroradiometer for Applications (ASIA). CARI minimizes the effects of soil background on the signal from green canopies. A modified CARI (MCARI) was used to track total Chl a levels in the red dip of the spectrum from the corn canopy. A second MCARI was used to track the auxiliary plant pigments (Chl b and the carotenoids) in the yellow/orange/red edge part of the reflectance spectrum. The difference between these two MCARI indices detected variations in N levels across the field plot canopies using ASIA data. At the leaf level, ratios of fluorescence emissions in the blue, green, red and far-red wavelengths sensed responses that were associated with the plant pigments, and were indicative of energy transfer in the photosynthetic process. N stressed corn stands could be distinguish from those with optimally applied N with fluorescence emission spectra obtained from individual corn leaves. Both reflectance and fluorescence methods are sensitive in detecting corn N needs and may be especially powerful in monitoring crop conditions if both types of information can be combined.

McMurtrey, J. E.

Spectrometer system for optical reflectance measurements

A spectrometer system includes a thermal light source for illuminating a sample, where the thermal light source includes a filament that emits light when heated. The system additionally includes a spectrograph for measuring a light spectrum from the sample and an electrical circuit for supplying electrical current to the filament to heat the filament and for controlling a resistance of the filament. The electrical circuit includes a power supply that supplies current to the filament, first electrical components that sense a current through the filament, second electrical components that sense a voltage drop across the filament, third electrical components that compare a ratio of the sensed voltage drop and the sensed current with a predetermined value, and fourth electrical components that control the current through the filament or the voltage drop across the filament to cause the ratio to equal substantially the predetermined value.

Soller, Babs R.

Systems and methods for correcting optical reflectance measurements

We disclose measurement systems and methods for measuring analytes in target regions of samples that also include features overlying the target regions. The systems include: (a) a light source; (b) a detection system; (c) a set of at least first, second, and third light ports which transmit light from the light source to a sample and receive and direct light reflected from the sample to the detection system, generating a first set of data including information corresponding to both an internal target within the sample and features overlying the internal target, and a second set of data including information corresponding to features overlying the internal target; and (d) a processor configured to remove information characteristic of the overlying features from the first set of data using the first and second sets of data to produce corrected information representing the internal target.

Yang, Ye

Systems and Methods for Correcting Optical Reflectance Measurements

We disclose measurement systems and methods for measuring analytes in target regions of samples that also include features overlying the target regions. The systems include: (a) a light source; (b) a detection system; (c) a set of at least first, second, and third light ports which transmit light from the light source to a sample and receive and direct light reflected from the sample to the detection system, generating a first set of data including information corresponding to both an internal target within the sample and features overlying the internal target, and a second set of data including information corresponding to features overlying the internal target; and (d) a processor configured to remove information characteristic of the overlying features from the first set of data using the first and second sets of data to produce corrected information representing the internal target.

Yang, Ye

Satellite measurements of cloud reflectance and optical thickness

The cloud reflectance and the optical thickness have been computed with the aid of atmospheric models from the first eleven months (April 1970-February 1971) of backscattered ultraviolet (BUV) data over the Pacific Ocean. Both the cloud and the optical thickness are derived from the 380 nm channel by assuming that the entire IFOV (200 km) is filled by stratiform clouds. The analysis shows a large variability in the cloud reflectance in both the intertropic conversion zone (ITCZ) and the high latitudes. It is also found that for 90 percent of the time in the tropics, the clouds have an optical thickness of less than 10. An analysis of clouds with optical thickness between 10 and 20 shows that in the tropics the minimum frequency coincides with the dry zone at 2.5 deg S and the maximum frequency for clouds of optical thickness 10-20 is greater in summer than in winter and irrespective of the season; 50 percent of the time the clouds have an optical thickness less than 13.

Ahmad, Z.

Electro-optical terrain reflectance modeling - A perspective

Electro-optical terrain reflectance modeling is one of the components required in the overall capability to simulate remote sensing measurement systems as an aid to the sensor or information processing designer. Given that sensor fields-of-view may vary from a few centimeters to several meters and that measurement devices may be placed at varying heights above the terrain surface, modeling of complex combinations of terrain classes or media with respect to both vertical and horizontal scales may be required. This paper addresses the issue of combining modeling approaches for different classes of materials in the optical regime and recommends a more formal approach to the radiative characterization of media properties as well as the calculation of the bidirectional reflectance distribution functions.

Smith, J. A.

AWG Filter for Wavelength Interrogator

A wavelength interrogator is coupled to a circulator which couples optical energy from a broadband source to an optical fiber having a plurality of sensors, each sensor reflecting optical energy at a unique wavelength and directing the reflected optical energy to an AWG. The AWG has a detector coupled to each output, and the reflected optical energy from each grating is coupled to the skirt edge response of the AWG such that the adjacent channel responses form a complementary pair response. The complementary pair response is used to convert an AWG skirt response to a wavelength.

Black, Richard J.

Reflecting Schmidt/Littrow Prism Imaging Spectrometer

High resolution achieved with wide field of view. Imaging Spectrometer features off-axis reflecting optics, including reflecting "slit" that also serves as field flattener. Only refracting element is prism. By scanning slit across object or scene and timing out signal, both spectral and spatial information in scene are obtained.

Breckinridge, J. B.

An efficient approach for computing the geometrical optics field reflected from a numerically specified surface

An approach for computing the geometrical optic fields reflected from a numerically specified surface is presented. The approach includes the step of deriving a specular point and begins with computing the reflected rays off the surface at the points where their coordinates, as well as the partial derivatives (or equivalently, the direction of the normal), are numerically specified. Then, a cluster of three adjacent rays are chosen to define a 'mean ray' and the divergence factor associated with this mean ray. Finally, the ampilitude, phase, and vector direction of the reflected field at a given observation point are derived by associating this point with the nearest mean ray and determining its position relative to such a ray.

Mittra, R.

Optically controlled reflection modulator using GaAs-AlGaAs n-i-p-i/multiple-quantum-well structures

An optically controlled reflection modulator has been demonstrated that consists of a combination of a GaAs-AlGaAs n-i-p-i doping structure with a multiple-quantum-well structures on top of a distributed Bragg reflector, all grown by MBE. A modulation of approximately 60 percent is obtained on the test structure, corresponding to a differential change of absorption coefficient in the quantum wells of approximately 7500/cm. Changes in reflectance can be observed with a control beam power as low as 1.5 microW. This device structure has the potential of being developed as an optically addressed spatial light modulator for optical information processing.

Law, K.-K.

Reflectance and optical constants for Cer-Vit from 250 to 1050 A

The reflectance for a bowl-feed polished Cer-Vit sample was measured at nine wavelengths and five angles of incidence from 15 to 85 deg. Optical constants were derived by the reflectance-vs-angle-of-incidence method and compared to previously reported values for ultralow-expansion fused silica and several other glasses. Surface-roughness corrections of the reflectance data and optical constants are discussed.

Osantowski, J. F.