SEARCH · Search NASA
Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.
Single-Event Effects (SEE) testing was conducted on the AMD e9173 Graphics Processor Unit (GPU). Testing was conducted at Massachusetts General Hospital's (MGH) Francis H. Burr Proton Therapy Center.
Explore the source record for details and available documents.
A summary of tests performed at the Indiana University Cycl,oltron Facility, on the Actel A1280A circuit device is described. The intent of the study was to investigate the proton response of the hard-wired S-Module flip-flops with a large sample size. This device is sensitive to protons for S-Modules. The device's performance in the test is shown in graphs, and was typical for devices of this class.
Single-Event Effects (SEE) testing was previously conducted on the AMD v1200 System on Chip (SoC) at Massachusetts General Hospital’s (MGH) Francis H. Burr Proton Therapy Center on May 28, 2022, using 200-MeV protons.
A summary of tests performed at the Indiana University Cyclotron Facility, on the Actel RT54SX16 prototype circuit device is presented. The devices' performances in the test is shown in both a table and a graph and was typical for devices of this class. Another summary of tests performed at the Indiana University Cyclotron Facility, on the Chip Express QYH530 device is presented.The device's performance in the test is shown in a graph and tables.
Explore the source record for details and available documents.
This paper presents viewgraphs of Antifuse FPGA (Field Programmable Gate Array) for Space Applications. The topics include: 1) A32140DX TID Test; 2) A1280XL Proton Test; 3) SEU (Single Event Upsets) Rate Calculation; 4) Recent Products Test; 5) A1460A TID (Traveling Ionospheric Disturbances) Test; 6) I100 Proton Test; 7) 100/RHI100 SEU Test; 8) I100/RH100 TID Test; 9) A1020S TID Test; 10) TID Charge Pump Failure; 11) Radiation Testing; and SEE (Single Event Effects) Test Setup.
Qualification tests of the electron-proton spectrometer test unit are presented. The tests conducted were: (1) functional, (2) thermal/vacuum, (3) electromagnetic interference, (4) acoustic, (5) shock, (6) vibration, and (7) humidity. Results of each type of test are presented in the form of data sheets.
The engineering test unit of the electron-proton spectrometer was thermal/vacuum tested. The tests confirmed the thermal analysis, and verified that the thermal design would control the temperatures of the instrument.
We develop metrics for assessing the effectiveness of proton SEE data for bounding heavy-ion SEE susceptibility. The metrics range from simple geometric criteria requiring no knowledge of the test articles to bounds of SEE rates.
Protons with sufficiently high energy, provided in a broad field covering on the order of 0.1m2 can be used to perform board-level testing for single event effects (SEE). NASA has used this approach for board-level testing over the last 20 years. Although many difficulties inherent in SEE testing are simplified when using a board-level test, including reduced cost, the method is inherently risky because of the limited value of the collected data and the potential to make critical mistakes when performing SEE testing this way, leading to data of less value. Historically, NASA’s approach to proton board-level testing has been limited to lower criticality applications. However, with users both inside and outside NASA using this method for higher levels of mission assurance, we have put together a set of lessons and recommendations to improve the value of data collected using this method. Focus areas covered include test preparation, test execution, and interpretation of results.
An 18-bit first order incremental analog to digital converter (ADC) has been constructed in a 2 mu commercial CMOS process. The ADC was exposed to energetic protons at the Harvard Cyclotron Laboratory to simulate latch-up and noise behavior in low earth orbits. Results of the test indicate no latch-up problems and only a small loss in accuracy while operating in proton radiation with energies similar to the South Atlantic Anomaly.
While we have been utilizing standard fluence levels such as those listed in the JESD57 document, we have begun revisiting what an appropriate test fluence is when it comes to qualifying a device for single events. Instead of a fixed fluence level or until a specific number of events occurs, a different thought process is required.
No abstract available
This study was being undertaken to determine the single event effect susceptibility of the commercial Vishay 60-V TrenchFET power MOSFET. Heavy-ion testing was conducted at the Texas AM University Cyclotron Single Event Effects Test Facility (TAMU) and the Lawrence Berkeley National Laboratory BASE Cyclotron Facility (LBNL). In addition, initial 200-MeV proton testing was conducted at Massachusetts General Hospital (MGH) Francis H. Burr Proton Beam Therapy Center. Testing was performed to evaluate this device for single-event effects from lower-LET, lighter ions relevant to higher risk tolerant space missions.