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Reflection coefficient of symmetric parallel plate waveguide operating in TEM mode illuminating lossless dielectric layer, using wedge diffraction and geometrical optics methods
Conducting flap effects on reflection coefficient of parallel-plate waveguide illuminating conducting sheet
Full-wave calculations of VLF reflection coefficients from D region electron density profiles
Reflection coefficient of ground-plane mounted transverse electromagnetic mode parallel-plate waveguide illuminating conducting sheet
Reflection coefficient and admittance of circular aperture in ground plane covered by dielectric or plasma slab
Morse's equation for the radiation impedance of a vibrating rigid piston is extended to give the generalized radiation impedances of all modes in circular and annular ducts which have arbitrary wall admittance and which terminate in an infinite baffle. The extended equation is reduced to a single infinite integral which is a function of the mode radiation directivity factors. An infinite matrix equation is derived which relates the generalized mode reflection coefficients to the radiation impedances. Results are presented which show that the duct-wall admittance is a significant parameter in the effect of duct-determination reflections and that mode-coupling reflection effects may be more important than direct-mode reflection effects.
Reflectance measurements were made of several metals illuminated from various angles with light at 14 wavelengths in the interval 46.5-283 A. The metals, Rh, Os, Pt and Au were deposited as 125 A films on a binding substrate through electron beam epitaxy. Measurements were made with a grazing incidence monochromator and a reflectometer. The data generally showed lowered reflectance with increasing angles of illumination and shorter wavelengths. The reflectance peak, however, was located at wavelengths of 100-160 A, particularly at large grazing incidences. The wavelengths correspond with the 5p to epsilon-d transition in all of the elements. Rh displayed the highest overall reflectance, and both Rh and Os were more efficient than Au or Pt.
Reflectance of wedge angle parallel plate waveguides in transverse electromagnetic mode illuminating reflecting sheet
Basis functions were studied and identified that provide efficient and accurate solutions for the induced patch currents and the reflection phase in microstrip reflect arrays. The integral equation of an infinite array of microstrip elements in the form of patches or crossed dipoles excited by a uniform plane wave is solved by the method-of-moments. Efficient choices of entire domain basis functions that yield accurate results have been described.
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Infrasound data and balloon trajectories. These data were collected during the OSIRIS-REx sample return capsule re-entry.
Far field diffraction pattern of corner reflector for normally incident monochromatic light, considering polarization characteristics
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The intensity, time-delay, and frequency content of radar echoes from the Magellan altimetry system are reduced to several parameters that are of great use in addressing many geological issues of the surface of Venus. These parameters include planetary radius, power reflection coefficient (reflectivity, both uncorrected and corrected for diffuse scattering), rms slope, and scattering functions (the behavior of backscatter as a function of incidence angle). Because the surface of Venus often reflects radio energy in unpredictable ways, models of radar scattering and their associated algorithms occasionally fail to accurately solve for the above surface parameters. Methods for identifying possible 'problem' altimetry data footprints, and techniques for resolving some key ambiguities are presented.
The Boreal Ecosystem-Atmospheric Study (BOREAS) TE-9 (Terrestrial Ecology) team collected several data sets related to chemical and photosynthetic properties of leaves in boreal forest tree species. Spectral reflection coefficients of the forest understory at the ground level, in three boreal forest sites of Northern Manitoba (56 N latitude and 98 W longitude), were obtained and analyzed in 1994. In particular, angular variation of the reflection coefficients in the old jack pine and young jack pine forests, as well as nadir reflection coefficient in the young aspen forest, were investigated. The complexity of understory composition and the light patterns limited quantitative conclusions; however, a number of interesting trends in the behavior of the measured values can be inferred. In particular, the unique spectral profiles of lichens show very strongly in the old jack pine understory, yet are definitely less conspicuous for young jack pine, and virtually absent in the aspen forest. The angular variation of the reflection coefficient by the young pine understory seems to be significantly toned down by fine-structured branches and their shadows. Our study also indicates how difficult the ground reflection coefficient problem in a forest is, compared to certain previously investigated areas that have a more uniform appearance, such as prairie grassland, bare soil, or agricultural crops. This is due to several factors, generally typical of a forest environment, that may influence the overall understory reflection coefficient, including: (1) a strong diversity of the forest floor due to the presence of dead tree trunks, holes in the ground, patches of different types of vegetation or litter, etc.; (2) pronounced 3-D structures at the ground level, such as shrubs, bushes, and young trees; and (3) an irregular shadow mosaic, which not only varies with the time of the day, causing intensity variations, but likely also effectively modifies the spectrum of the illuminating light and hence the reflection coefficient signal as well The data are stored in tabular ASCII files. The data files are available on a CD-ROM (see document number 20010000884), or from the Oak Ridge National Laboratory (ORNL) Distributed Active Archive Center (DAAC).
A simple waveguide measurement technique is presented to determine the complex dielectric constant of a dielectric material. The dielectric sample is loaded in a shorted x-band rectangular waveguide. Using a network analyzer; the reflection coefficient of the shorted waveguide (loaded with sample) is measured. Using the Finite Element Method (FEM), the exact reflection coefficient of the shorted waveguide (loaded with sample) is determined as a function of the dielectric constant. Matching the measured value of the reflection coefficient with the reflection coefficient calculated using the FEM utilizing the Newton-Raphson Method, an estimate of the dielectric constant of a dielectric material is obtained. A comparison of estimated values of dielectric constant obtained from simple waveguide modal theory and the present approach is presented.