Interactive CAD Layout of Reflection-Based Mirror Metrology Systems
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Brimigion, Felicia Marie↗
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An Approach to Retrieve BRDF from Satellite and Airborne Measurements of Surface-Reflected Radiance Based on Decoupling of Atmospheric Radiative Transfer and Surface Reflection
Bi-directional Reflection Distribution Function (BRDF) defines anisotropy of the surface reflection. It is required to specify the boundary condition for radiative transfer (RT) modeling. Measurements of reflected radiance by satellite- and air-borne sensors provide information about anisotropy of surface reflection. Atmospheric correction needs to be performed to derive BRDF from the reflected radiance. Common approach for BRDF retrievals consists of the use of kernel-based BRDF and RT modeling that needs to be done anew at every step of the iterative process. The kernels’ weights are obtained by minimization of the difference between measured and modeled radiance. This study develops a new method of retrieving kernel-based BRDF that requires RT calculations to be done only once. The method employs the exact analytical expression of radiance at any atmospheric level through the solutions of two auxiliary atmosphere-only RT problems and the surface-reflected radiance at the surface level. The latter is related to BRDF and solutions of the auxiliary RT problems by a Fredholm integral equation of the second kind. The approach requires to perform RT calculations one time before the iterations. It can use observations taken at different atmospheric conditions assuming that surface conditions remain unchanged during the time span of observations. The algorithm accurately catches zero weights of the kernels that may be a concern if the number of kernels is greater than 3 in current mainstream approaches. The study presents numerical tests of the BRDF retrieval algorithm for various surface and atmospheric conditions.
Radkevich, Alexander↗
Ultra-low reflectance broadband omni-directional anti-reflection coating
An anti-reflection coating has an average total reflectance of less than 10%, for example less than 5.9% such as from 4.9% to 5.9%, over a spectrum of wavelengths of 400-1100 nm and a range of angles of incidence of 0-90 degrees with respect to a surface normal of the anti-reflection coating. An anti-reflection coating has a total reflectance of less than 10%, for example less than 6% such as less than 4%, over an entire spectrum of wavelengths of 400-1600 nm and an entire range of angles of incidence of 0-70 degrees with respect to a surface normal of the anti-reflection coating.
Chhajed, Sameer↗
Measuring the complex optical conductivity of graphene by Fabry-Pérot reflectance spectroscopy [Determination of the optical index for few-layer graphene by reflectivity spectroscopy]
Here, we have experimentally studied the optical refractive index of few-layer graphene through reflection spectroscopy at visible wavelengths. A laser scanning microscope (LSM) with a coherent supercontinuum laser source measured the reflectivity of an exfoliated graphene flake on a Si/SiO 2 substrate, containing monolayer, bilayer and trilayer areas, as the wavelength of the laser was varied from 545nm to 710nm. The complex refractive index of few-layer graphene, n-ik, was extracted from the reflectivity contrast to the bare substrate and the Fresnel reflection theory. Since the SiO 2 thickness enters to the modeling as a parameter, it was precisely measured at the location of the sample. It was found that a common constant optical index cannot explain the wavelength-dependent reflectivity data for single-, double- and three-layer graphene simultaneously, but rather each individual few-layer graphene possesses a unique optical index whose complex values were precisely and accurately determined from the experimental data.
73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗
Inverse problems-based maximum likelihood estimation of ground reflectivity for selected regions of interest from stripmap SAR data [Regularized maximum likelihood estimation of ground reflectivity from stripmap SAR data]
In this study, we derive a comprehensive forward model for the data collected by stripmap synthetic aperture radar (SAR) that is linear in the ground reflectivity parameters. It is also shown that if the noise model is additive, then the forward model fits into the linear statistical model framework, and the ground reflectivity parameters can be estimated by statistical methods. We derive the maximum likelihood (ML) estimates for the ground reflectivity parameters in the case of additive white Gaussian noise. Furthermore, we show that obtaining the ML estimates of the ground reflectivity requires two steps. The first step amounts to a cross-correlation of the data with a model of the data acquisition parameters, and it is shown that this step has essentially the same processing as the so-called convolution back-projection algorithm. The second step is a complete system inversion that is capable of mitigating the sidelobes of the spatially variant impulse responses remaining after the correlation processing. We also state the Cramer-Rao lower bound (CRLB) for the ML ground reflectivity estimates.We show that the CRLB is linked to the SAR system parameters, the flight path of the SAR sensor, and the image reconstruction grid.We demonstrate the ML image formation and the CRLB bound for synthetically generated data.
47 OTHER INSTRUMENTATION↗
Spatially resolved methane band photometry of Jupiter. I - Absolute reflectivity and center-to-limb variations in the 6190-, 7250-, and 8900-A bands. II - Analysis of the south equatorial belt and south tropical zone reflectivity
Spatially resolved measurements of the absolute reflectivity and center to limb variations of Jupiter in the 6190, 7250 and 8900 A methane bands and nearby continuum regions are presented and analyzed for the south equatorial belts (SEBs) and south tropical zone (STrZ). It is found that the polar hoods, equatorial zone, Red Spot and north tropical zone have highest methane reflectivities, with the temperate zones and polar regions having low reflectivity and the STrZ and SEBs having intermediate values. The data on the SEB and STrZ are analyzed in terms of diffuse reflecting-scattering and two-cloud models of the vertical distribution of aerosols in the Jovian atmosphere. To fit observations, the STrZ cloud top must have between 0.55 and 0.43 bar total pressure and optical depth between 1.5 and 2.5. The reflecting-scattering models are not suitable for the SEBs. The SEB upper cloud is deeper, cloud thickness is less and the lower cloud is deeper than in the STrZ. A forward scattering haze layer accounts for limb darkening in the continuum.
West, R. A.↗
Two-Layer Anti-Reflection Coatings with Optimized Sub-Bandgap Reflection for Solar Modules
The efficiency of a crystalline silicon solar module decreases as its operating temperature rises. Module cooling is possible via selective reflection of sub-bandgap photons so that they are not parasitically absorbed. Selecting from a library of common dielectrics, we numerically optimize the design of two-layer mirrors at the outer glass surface of a crystalline Si solar cell module. The mirrors are designed to maximize the annual energy yield of a module by both reflecting light below the bandgap and enhancing the transmission of light above the bandgap. Combined ray-tracing and finite element simulations determine the power output and temperature of the module over time. Since any two-layer mirror would replace a conventional single-layer glass anti-reflection coating on the module glass, we study the ability of a two-layer structure to improve on a single-layer coating. The best two-layer designs improve the annual energy yield over a module with a glass anti-reflection coating and reduce the module operating temperature.
14 SOLAR ENERGY↗
Experimental study of high-order reflections on volume reflection holographic gratings
Samples of volume reflection gratings with a wide range of periods are obtained using a holographic setup with prism coupling of radiation into the recording layer of a photopolymer material. High-order reflections on these gratings are experimentally detected. The dependence of the characteristics of observed reflections on the grating parameters and recording conditions are discussed, and the experimental and calculated wavelengths of the reflections are compared. (paper)
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
Modeling Spectrally-Selective Reflection for Thermal Management in Monofacial and Bifacial Modules
Parasitic absorption in photovoltaic modules is a major source of waste heat, which drives operating temperatures 20-30K above ambient. Spectrally-selective sub-bandgap reflection can reduce parasitic absorption, thereby improving module efficiency and power output. Here, we investigate the performance of 1-D spectrally-selective mirrors in monofacial Al BSF and PERC modules, and bifacial PERC modules. In monofacial modules, these mirrors offer >1.2% increase in energy yield compared to single-layer anti-reflection coatings, while cooling by over 1K on average. Mirrors reduced bifacial module parasitic absorption by up to 34 W/m2 out of 1240 W/m2 incident.
41 EE - Solar Energy Technologies Office (EE-4S)↗
Broadband anti-reflective coatings for cosmic microwave background experiments
The desire for higher sensitivity has driven ground-based cosmic microwave background (CMB) experiments to employ ever larger focal planes, which in turn require larger reimaging optics. Practical limits to the maximum size of these optics motivates the development of quasi-optically-coupled (lenslet-coupled), multi-chroic detectors. These detectors can be sensitive across a broader bandwidth compared to waveguide-coupled detectors. However, the increase in bandwidth comes at a cost: the lenses (up to ~700 mm diameter) and lenslets (~5 mm diameter, hemispherical lenses on the focal plane) used in these systems are made from high-refractive-index materials (such as silicon or amorphous aluminum oxide) that reflect nearly a third of the incident radiation. In order to maximize the faint CMB signal that reaches the detectors, the lenses and lenslets must be coated with an anti-reflective (AR) material. The AR coating must maximize radiation transmission in scientifically interesting bands and be cryogenically stable. Such a coating was developed for the third generation camera, SPT-3G, of the South Pole Telescope (SPT) experiment, but the materials and techniques used in the development are general to AR coatings for mm-wave optics. The three-layer polytetra uoroethylene-based AR coating is broadband, inexpensive, and can be manufactured with simple tools. The coating is field tested; AR coated focal plane elements were deployed in the 2016-2017 austral summer and AR coated reimaging optics were deployed in 2017-2018.
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
X-ray Reflected Spectra from Accretion Disk Models. III. A Complete Grid of Ionized Reflection Calculations
We present a new and complete library of synthetic spectra for modeling the component of emission that is reflected from an illuminated accretion disk. The spectra were computed using an updated version of our code xillver that incorporates new routines and a richer atomic data base. We offer in the form of a table model an extensive grid of reflection models that cover a wide range of parameters. Each individual model is characterized by the photon index Gamma of the illuminating radiation, the ionization parameter zeta at the surface of the disk (i.e., the ratio of the X-ray flux to the gas density), and the iron abundance A(sub Fe) relative to the solar value. The ranges of the parameters covered are: 1.2 <= Gamma <= 3.4, 1 <= zeta <= 104, and 0.5 <= A(sub Fe) <= 10. These ranges capture the physical conditions typically inferred from observations of active galactic nuclei, and also stellar-mass black holes in the hard state. This library is intended for use when the thermal disk flux is faint compared to the incident power-law flux. The models are expected to provide an accurate description of the Fe K emission line, which is the crucial spectral feature used to measure black hole spin. A total of 720 reflection spectra are provided in a single FITS file suitable for the analysis of X-ray observations via the atable model in xspec. Detailed comparisons with previous reflection models illustrate the improvements incorporated in this version of xillver.
X-ray↗
Surface Reflectance of Mars Observed by CRISM-MRO: 1. Multi-angle Approach for Retrieval of Surface Reflectance from CRISM Observations (mars-reco)
This article addresses the correction for aerosol effects in near-simultaneous multiangle observations acquired by the Compact Reconnaissance Imaging Spectrometer for Mars (CRISM) aboard the Mars Reconnaissance Orbiter. In the targeted mode, CRISM senses the surface of Mars using 11 viewing angles, which allow it to provide unique information on the scattering properties of surface materials. In order to retrieve these data, however, appropriate strategies must be used to compensate the signal sensed by CRISM for aerosol contribution. This correction is particularly challenging as the photometric curve of these suspended particles is often correlated with the also anisotropic photometric curve of materials at the surface. This article puts forward an innovative radiative transfer based method named Multi-angle Approach for Retrieval of Surface Reflectance from CRISM Observations (MARS-ReCO). The proposed method retrieves photometric curves of surface materials in reflectance units after removing aerosol contribution. MARS-ReCO represents a substantial improvement regarding previous techniques as it takes into consideration the anisotropy of the surface, thus providing more realistic surface products. Furthermore, MARS-ReCO is fast and provides error bars on the retrieved surface reflectance. The validity and accuracy of MARS-ReCO is explored in a sensitivity analysis based on realistic synthetic data. According to experiments, MARS-ReCO provides accurate results (up to 10 reflectance error) under favorable acquisition conditions. In the companion article, photometric properties of Martian materials are retrieved using MARS-ReCO and validated using in situ measurements acquired during the Mars Exploration Rovers mission.
CRISM/MRO↗
Cr/B{sub 4}C multilayer mirrors: Study of interfaces and X-ray reflectance
We present an experimental study of the effect of layer interfaces on the x-ray reflectance in Cr/B{sub 4}C multilayer interference coatings with layer thicknesses ranging from 0.7 nm to 5.4 nm. The multilayers were deposited by magnetron sputtering and by ion beam sputtering. Grazing incidence x-ray reflectometry, soft x-ray reflectometry, and transmission electron microscopy reveal asymmetric multilayer structures with a larger B{sub 4}C-on-Cr interface, which we modeled with a 1–1.5 nm thick interfacial layer. Reflectance measurements in the vicinity of the Cr L{sub 2,3} absorption edge demonstrate fine structure that is not predicted by simulations using the currently tabulated refractive index (optical constants) values for Cr.
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
Extraction of spectral hemispherical reflectance (albedo) of surfaces from nadir and directional reflectance data
A radiative transfer model is used to investigate how the error of spectral hemispherical reflectance data obtained from nadir reflectance values varies with wavelength, solar zenith angle, leaf area index, and leaf orientation distribution. Several techniques employing multiple off-nadir view angles taken in azimuth planes are found to accurately infer spectral hemispherical reflectances, and to be well suited to sensor systems that scan in a known azimuth plane or view fore and aft in a known azimuth plane. The effects of errors in hemispherical reflectance on terrestrial energy budget and productivity calculations is also considered.
Kimes, D. S.↗
Spatial averaging errors in creating hemispherical reflectance (albedo) maps from directional reflectance data
Spatial averaging errors which may occur when creating hemispherical reflectance maps for different cover types from direct nadir technique to estimate the hemispherical reflectance are assessed by comparing the results with those obtained with a knowledge-based system called VEG (Kimes et al., 1991, 1992). It was found that hemispherical reflectance errors provided by using VEG are much less than those using the direct nadir techniques, depending on conditions. Suggestions are made concerning sampling and averaging strategies for creating hemispherical reflectance maps for photosynthetic, carbon cycle, and climate change studies.
Kimes, D. S.↗
Comparison of Measurements and FluorMOD Simulations for Solar Induced Chlorophyll Fluorescence and Reflectance of a Corn Crop under Nitrogen Treatments [SIF and Reflectance for Corn]
The FLuorescence Explorer (FLEX) satellite concept is one of six semifinalist mission proposals selected in 2006 for pre-Phase studies by the European Space Agency (ESA). The FLEX concept proposes to measure passive solar induced chlorophyll fluorescence (SIF) of terrestrial ecosystems. A new spectral vegetation Fluorescence Model (FluorMOD) was developed to include the effects of steady state SIF on canopy reflectance. We used our laboratory and field measurements previously acquired from foliage and canopies of corn (Zea mays L.) under controlled nitrogen (N) fertilization to parameterize and evaluate FluorMOD. Our data included biophysical properties, fluorescence (F) and reflectance spectra for leaves; reflectance spectra of canopies and soil; solar irradiance; plot-level leaf area index; and canopy SIF emissions determined using the Fraunhofer Line Depth principal for the atmospheric telluric oxygen absorption features at 688 nm (O2-beta) and 760 nm (O2-alpha). FluorMOD simulations implemented in the default "look-up-table" mode did not reproduce the observed magnitudes of leaf F, canopy SIF, or canopy reflectance. However, simulations for all of these parameters agreed with observations when the default FluorMOD information was replaced with measurements, although N treatment responses were underestimated. Recommendations were provided to enhance FluorMOD's potential utility in support of SIF field experiments and studies of agriculture and ecosystems.
Middleton, Elizabeth M.↗
Anti- reflective device having an anti-reflection surface formed of silicon spikes with nano-tips
Described is a device having an anti-reflection surface. The device comprises a silicon substrate with a plurality of silicon spikes formed on the substrate. A first metallic layer is formed on the silicon spikes to form the anti-reflection surface. The device further includes an aperture that extends through the substrate. A second metallic layer is formed on the substrate. The second metallic layer includes a hole that is aligned with the aperture. A spacer is attached with the silicon substrate to provide a gap between an attached sensor apparatus. Therefore, operating as a Micro-sun sensor, light entering the hole passes through the aperture to be sensed by the sensor apparatus. Additionally, light reflected by the sensor apparatus toward the first side of the silicon substrate is absorbed by the first metallic layer and silicon spikes and is thereby prevented from being reflected back toward the sensor apparatus.
Bae, Youngsman↗
Anti-reflective device having an anti-reflective surface formed of silicon spikes with nano-tips
Described is a device having an anti-reflection surface. The device comprises a silicon substrate with a plurality of silicon spikes formed on the substrate. A first metallic layer is formed on the silicon spikes to form the anti-reflection surface. The device further includes an aperture that extends through the substrate. A second metallic layer is formed on the substrate. The second metallic layer includes a hole that is aligned with the aperture. A spacer is attached with the silicon substrate to provide a gap between an attached sensor apparatus. Therefore, operating as a Micro-sun sensor, light entering the hole passes through the aperture to be sensed by the sensor apparatus. Additionally, light reflected by the sensor apparatus toward the first side of the silicon substrate is absorbed by the first metallic layer and silicon spikes and is thereby prevented from being reflected back toward the sensor apparatus.
Bae, Youngsam↗