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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 37 records · Page 2
All sourcesNASA NTRSDOE OSTI
NASA NTRS2005

Virtex-II Pro PowerPC SEE Characterization Test Methods and Results

The Xilinx Vix-11 Pro is a platform FPGA that embeds multiple microprocessors within the fabric of an SRAM-based reprogrammable FPGA. The variety and quantity of resources provided by this family of devices make them very attractive for spaceflight applications. However,these devices will be susceptible to single event effects (SEE), which must be mitigated. Observations from prior testing of the Xilinx Virtex-II Pro suggest that the PowerPC core has significant vulnerability to SEES. However, these initial tests were not designed to exclusively target the functionality of the PowerPC, therefore making it difficult to distinguish processor upsets from fabric upsets. The main focus of this paper involves detailed SEE testing of the embedded PowerPC core. Due to the complexity of the PowerPC, various custom test applications, both static and dynamic, will be designed to isolate each Unit of the processor. Collective analysis of the test results will provide insight into the exact upset mechanism of the PowerPC. With this information, mitigations schemes can be developed and tested that address the specific susceptibilities of these devices. The test bed will be the Xilinx SEE Consortium Virtex-II Pro test board, which allows for configuration scrubbing, design triplication, and ease of data collection. Testing will be performed at the Indiana University Cyclotron Facility using protons of varying energy levels and fluencies. This paper will present the detailed test approach along with the results.

Petrick, David↗
NASA NTRS2007

Statistical Properties of SEE Rate Calculation in the Limits of Large and Small Event Counts

This viewgraph presentation reviews the Statistical properties of Single Event Effects (SEE) rate calculations. The goal of SEE rate calculation is to bound the SEE rate, though the question is by how much. The presentation covers: (1) Understanding errors on SEE cross sections, (2) Methodology: Maximum Likelihood and confidence Contours, (3) Tests with Simulated data and (4) Applications.

Ladbury, Ray↗
NASA NTRS2013

Space Environments and Effects Program (SEE)

The need to preserve works and NASA documented articles is done via the collection of various Space Environments and Effects (SEE) related articles. (SEE) contains and lists the various projects that are ongoing, or have been conducted with the help of NASA. The goal of the (SEE) program is to make publicly available the environment technologies that are required to design, manufacture and operate reliable, cost-effective spacecraft for the government and commercial sectors. Of the many projects contained within the (SEE) program the Lunar-E Library and Spacecraft Materials Selector (SMS) have been selected for a more user friendly means to make the tools easily available to the public. This information which is still available required a person or entity to request access from a point of contact at NASA and wait for the requested bundled software DVD via postal service. Redesigning the material presentation and availability has been mapped to a single step process with faster turnaround time via Materials and Processes Technical Information System (MAPTIS) database. This process requires users to register and be verified in order to gain access to the information contained within. Aiding in the progression of making the software tools/documents available required a combination of specialized in-house data gathering software tools and software archeology.

Yhisreal-Rivas, David M.↗
NASA NTRS2017

Strategies for SEE Hardness Assurance - From Buy-It-And-Fly-It to Bullet Proof

This part of the course first outlines the conventional Single Event Effect (SEE), radiation hardness assurance (RHA) approach, which emphasizes mission success. Next, Dr. Ladbury will discuss the challenges posed by new satellite platforms (e.g., cubesats, nanosats, etc.), where cost and schedule receive emphasis equal to if not greater than mission success. These additional pressures, along with growing demands to reduce size, weight and power, coupled with increased performance, drive many projects toward expanding their use of commercial-off-the-shelf (COTS) technologies. While this may reduce direct parts cost and procurement lead times, it undermines many cost-reduction strategies used for conventional SEE RHA and can make radiation testing and analysis one of the most significant risks or worse, a risk neglected altogether. That section will end with some approaches for restoring balance in the troika of mission success, cost, and schedule. This is captured in SEE RHA as risk management: identify the threat, evaluate the threat, and mitigate the threat.

commercial-off-the-shelf (COTS)↗
NASA NTRS2017

Strategies for SEE Hardness Assurance From Buy-It-And-Fly-It to Bullet Proof

This part of the course first outlines the conventional Single Event Effect (SEE), radiation hardness assurance (RHA) approach, which emphasizes mission success. Next, Dr. Ladbury will discuss the challenges posed by new satellite platforms (e.g., cubesats, nanosats, etc.), where cost and schedule receive emphasis equal to if not greater than mission success. These additional pressures, along with growing demands to reduce size, weight and power, coupled with increased performance, drive many projects toward expanding their use of commercial-off-the-shelf (COTS) technologies. While this may reduce direct parts cost and procurement lead times, it undermines many cost-reduction strategies used for conventional SEE RHA and can make radiation testing and analysis one of the most significant risksor worse, a risk neglected altogether. That section will end with some approaches for restoring balance in the troika of mission success, cost, and schedule. This is captured in SEE RHA as risk management: identify the threat, evaluate the threat, and mitigate the threat.

commercial-off-the-shelf (COTS)↗
NASA NTRS2018

NASA Electronic Parts and Packaging (NEPP) Field Programmable Gate Array (FPGA) Single Event Effects (SEE) Test Guideline Update

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic versus mission specific device evaluation, single event latch-up (SEL) test and analysis, SEE response visibility enhancement during radiation testing, mitigation evaluation (embedded and user-implemented), unreliable design and its affects to SEE Data, testing flushable architectures versus non-flushable architectures, intellectual property core (IP Core) test and evaluation (addresses embedded and user-inserted), heavy-ion energy and linear energy transfer (LET) selection, proton versus heavy-ion testing, fault injection, mean fluence to failure analysis, and mission specific system-level single event upset (SEU) response prediction. Most sections within the guidelines manual provide information regarding best practices for test structure and test system development. The scope of this manual addresses academic versus mission specific device evaluation and visibility enhancement in IP Core testing.

Test guidelines↗
NASA NTRS1974

Seeing - Its cause and cure

Following Fried, the statistics of images formed by an annular telescope aperture looking through the turbulent atmosphere are calculated; the deleterious effect of a central obscuration is much larger in the presence of seeing that for the telescope alone. A method of optimizing resolution through the atmosphere is explained in detail, with particular attention to the requirements for image-motion compensation; under ideal conditions, about a factor-of-four increase in effective resolution over conventional photography can be obtained. The effective resolution can be large or smaller than the 'seeing disk', depending on the recorded signal-to-noise ratio. Some common misconceptions about image structure and motion, and various unsound proposals for beating the seeing, are criticized.

Young, A. T.↗
NASA NTRS1978

The wavelength dependence of seeing

The deleterious effects of atmospheric inhomogeneities on telescope angular resolution (seeing effects) were studied at a wavelength of 10 microns with an imaging upconverter. Seeing was found to be systematically better by a factor of 1.9 at 10 microns than in the visible, in good agreement with theoretical predictions. A discussion of the theory of astronomical seeing is included.

Boyd, R. W.↗
NASA NTRS1980

The effects of seeing on the reflected spectrum of Uranus and Neptune

The results of a redetermination of the rotational periods of Uranus and Neptune, based on spectrograms obtained with the coude spectrograph of the 5 m Hale telescope, are presented. The effects of image motion on the shape of the spectral lines reflected by a planet rotating as a solid body and coherently scattering solar light, has been studied analytically. A general relation between the seeing transformed velocities at any point on the disk and those at the equator is established. It is shown that, for the case of Gaussian seeing, the brightness continuum of the smeared disk contains all the information required to derive the shape of the reflected lines. The shift, change in r.m.s. width, and asymmetry of the seeing transformed lines at the equator have been numerically evaluated for the brightness distribution of Uranus determined from Stratoscope II.

Muench, G.↗
NASA NTRS1986

Test processing system (SEE)

The SEE data processing system, developed in 1985, manages and process test results. General information is provided on the SEE system: objectives, characteristics, basic principles, general organization, and operation. Full documentation is accessible by computer using the HELP SEE command.

Gaulene, P.↗
NASA NTRS1999

NASA's Space Environments and Effects (SEE) Program: Contamination Engineering Technology Development

ABSTRACT The return of the Long Duration Exposure Facility (LDEF) in 1990 brought a wealth of space exposure data on materials, paints, solar cells, etc. and data on the many space environments. The effects of the harsh space environments can provide damaging or even disabling effects on spacecraft, its materials, and its instruments. In partnership with industry, academia, and other government agencies, National Aeronautics & Space Administration's (NASA's) Space Environments & Effects (SEE) Program defines the space environments and provides technology development to accommodate or mitigate these harmful environments on the spacecraft. This program provides a very comprehensive and focused approach to understanding the space environment, to define the best techniques for both flight and ground-based experimentation, to update the models which predict both the environments and the environmental effects on spacecraft, and finally to ensure that this information is properly maintained and inserted into spacecraft design programs. This paper will describe the current SEE Program and will present SEE contamination engineering technology development and risk mitigation for future spacecraft design.

Pearson, Steven D.↗
NASA NTRS2003

NASA's Space Environments and Effects (SEE) Program

This viewgraph presentation gives a broad overview of NASA's Space Enivronments and Effects (SEE) Program. The purpose of the program is to protect spacecraft and their systems from damage by radiation, spacecraft charging, micrometeoroids, contamination, and other hazards posed by aerospace environments. The presentation profiles SEE activities to address each of these hazards. SEE is responsible for overseeing research and product development with a variety of partners.

Kauffman, Billy↗
NASA NTRS2011

Single Event Effects (SEE) Testing of Embedded DSP Cores within Microsemi RTAX4000D Field Programmable Gate Array (FPGA) Devices

Motivation for this work is: (1) Accurately characterize digital signal processor (DSP) core single-event effect (SEE) behavior (2) Test DSP cores across a large frequency range and across various input conditions (3) Isolate SEE analysis to DSP cores alone (4) Interpret SEE analysis in terms of single-event upsets (SEUs) and single-event transients (SETs) (5) Provide flight missions with accurate estimate of DSP core error rates and error signatures.

Perez, Christopher E.↗
NASA NTRS2014

Single-Event Effect Report for EPC Series eGaN FETs: The Effect of Load Conditions on Destructive SEE

Recent testing of Enhanced Power Conversion (EPC) eGaN FET devices design for power use has shown that the devices are susceptible to Single-Event Effects (SEE) that degrade or destroy the device. The exact mechanism of the SEE is not known. The testing so far has been in the static condition, in the fully off condition, and with minimal load conditions. These conditions may not be worst case. This report presents the results of a study that tests some of the load conditions for SEE. The EPC2012 and EPC1012 were chosen for the test. The tests were performed the TAMU radiation effects facility in May and June of 2013.

Scheick, Leif↗
NASA NTRS2014

Single-Event Effect Report for EPC Series eGaN FETs: Comparison of EPC1000 and EPC2000 Series Devices for Destructive SEE

Recent testing of the EPC1000 series eGaN FETs has shown sensitivity to Single Event Effects (SEE) that are destructive. These effects are most likely the failure of the very thin gate structure in HEMT architecture. EPC has recently changed the doping of the substrate to improve the performance and the SEE response. This testing compares the SEE response of both devices.

Scheick, Leif↗
NASA NTRS2019

Radiation Single Event Effects (SEE) Impact on Complex Avionics Architecture Reliability

The NASA Engineering and Safety Center (NESC) has an urgent need to understand how system-level reliability of an avionics architecture is compromised when portions of the architecture are temporarily unavailable due to single event effects (SEE). The proposed activity parametrically evaluated these SEE impacts on system reliability based on mission duration, upset rate and recovery times for a representative redundant architecture. The key stakeholders for this study are NASA programs and projects that expect to use avionics architectures with electrical, electronic and electromechanical (EEE) parts susceptible to SEE when exposed to the mission expected radiation environment.

Hodson, Robert F.↗
NASA NTRS2017

Towards a Qualification Data Set: Expanded SEE Data on the P2020 Processor

Earlier P2020 SEE data are compared and expanded to a recent die revision, significantly increasing samples tested by protons by five devices, and by heavy ions by five devices. Earlier tested SEE types are found to be fairly similar in register, L1 cache, L2 cache, and CPU crashes. New test methods give SEE performance for the flash memory controller, watchdog circuit, and a built-in Ethernet port on the P2020 processor. Results from heavy ion and proton tests are presented, with data separated over a large number of specific error types and test programs.

Vartanian, Sargeh↗
NASA NTRS2021

SEE Test Report for Arizona Microtek AZ88923 High Speed Limiting Post Amplifier

The primary purpose of this testing is to characterize the Texas Instruments AZ88923 post amplifier for susceptibility to single-event latchup (SEL) and other destructive Single-Event Effects (SEE). These data will be used to assess the destructive SEE risk for the OSIRIS-REx Laser Altimeter (OLA). A secondary goal is to assess the susceptibility of the post amplifier to single-event transients (SET) and other nondestructive SEE. In particular, the loss-of-signal feature could give rise to some significant anomalies. However, it is not used on OLA.

Raymond Ladbury↗