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Alteration of surface of silicon solar cell with chemical etchant prior to application of antireflection (AR) coating and encapsulant FEP Teflon, reduces surface reflectivity to 2%. Reduced reflection achieved occurs at all wavelengths resulting in improved short circuit current and spectral response. Improved collection efficiency is also expected.
Spray-applied coating of semi-organic resin for solar cell surface protection
Silicon nitride deposition was studied as a method of passivation for silicon solar cell surfaces. The following three objectives were the thrust of the research: (1) the use of pecvd silicon nitride for passivation of silicon surfaces; (2) measurement techniques for surface recombination velocity; and (3) the importance of surface passivation to high efficiency solar cells.
The Microwave Anisotropy Probe (MAP), a MIDEX mission built in partnership between Princeton University and the NASA Goddard Space Flight Center (GSFC), will study the cosmic microwave background. It will be inserted into a highly elliptical earth orbit for several weeks and then use a lunar gravity assist to orbit around the second Lagrangian point (L2), 1.5 million kilometers, anti-sunward from the earth. The charging environment for the phasing loops and at L2 was evaluated. There is a limited set of data for L2; the GEOTAIL spacecraft measured relatively low spacecraft potentials (approx. 50 V maximum) near L2. The main area of concern for charging on the MAP spacecraft is the well-established threat posed by the "geosynchronous region" between 6-10 Re. The launch in the autumn of 2000 will coincide with the falling of the solar maximum, a period when the likelihood of a substorm is higher than usual. The likelihood of a substorm at that time has been roughly estimated to be on the order of 20% for a typical MAP mission profile. Because of the possibility of spacecraft charging, a requirement for conductive spacecraft surfaces was established early in the program. Subsequent NASCAP/GEO analyses for the MAP spacecraft demonstrated that a significant portion of the sunlit surface (solar cell cover glass and sunshade) could have nonconductive surfaces without significantly raising differential charging. The need for conductive materials on surfaces continually in eclipse has also been reinforced by NASCAP analyses.
The development of a process for fabricating 2 x 4 cm back surface field silicon solar cells having screen printed wraparound contacts is described. This process was specifically designed to be amenable for incorporation into the automated nonvacuum production line. Techniques were developed to permit the use of screen printing for producing improved back surface field structures, wraparound dielectric layers, and wraparound contacts. The optimized process sequence was then used to produce 1852 finished cells. Tests indicated an average conversion efficiency of 11% at AMO and 28 C, with an average degradation of maximum power output of 1.5% after boiling water immersion or thermal shock cycling. Contact adherence was satisfactory after these tests, as well as long term storage at high temperature and high humidity.
A solar array segment was recently removed from the Mir core module and returned for ground-based analysis. The segment, which is similar to the ones the Russians have provided for the FGB and Service Modules, was microscopically examined and disassembled by US and Russian science teams. Laboratory analyses have shown the segment to he heavily contaminated by an organic silicone coating, which was converted to an organic silicate film by reactions with atomic oxygen within the. orbital flight environment. The source of the contaminant was a silicone polymer used by the Russians as an adhesive and bonding agent during segment construction. During its life cycle, the array experienced a reduction in power performance from approx. 12%, when it was new and first deployed, to approx. 5%, when it was taken out of service. However, current-voltage measurements of three contaminated cells and three pristine, Russian standard cells have shown that very little degradation in solar array performance was due to the silicate contaminants on the solar cell surfaces. The primary sources of performance degradation is attributed to "thermal hot-spotting" or electrical arcing; orbital debris and micrometeoroid impacts; and possibly to the degradation of the solar cells and interconnects caused by radiation damage from high energy protons and electrons.
A front surface contact floating emitter solar cell transistor is provided in a semiconductor body (n-type), in which floating emitter sections (p-type) are diffused or implanted in the front surface. Between the emitter sections, a further section is diffused or implanted in the front surface, but isolated from the floating emitter sections, for use either as a base contact to the n-type semiconductor body, in which case the section is doped n+, or as a collector for the adjacent emitter sections.
A method is provided for detecting cracks and other imperfections in a solar cell, which includes scanning a narrow light beam back and forth across the cell in a raster pattern, while monitoring the electrical output of the cell to find locations where the electrical output varies significantly. The electrical output can be monitored on a television type screen containing a raster pattern with each point on the screen corresponding to a point on the solar cell surface, and with the brightness of each point on the screen corresponding to the electrical output from the cell which was produced when the light beam was at the corresponding point on the cell. The technique can be utilized to scan a large array of interconnected solar cells, to determine which ones are defective.
Sample solar cells were fabricated to study the effects of various back surface reflectors on the device performance. They are typical 50 micrometers thick, space quality, silicon solar cells except for variations of the back contact configuration. The back surfaces of the sample cells are polished to a mirror like finish, and have either conventional full contacts or grid finger contacts. Measurements and evaluation of various metallic back surface reflectors, as well as cells with total internal reflection, are presented. Results indicate that back surface reflectors formed using a grid finger back contact are more effective reflectors than cells with full back metallization and that Au, Ag, or Cu are better back surface reflector metals than Al.
A metallization scheme was developed which allows selective plating of silicon solar cell surfaces. The system is comprised of three layers. Palladium, through the formation of palladium silicide at 300 C in nitrogen, makes ohmic contact to the silicon surface. Nickel, plated on top of the palladium silicide layer, forms a solderable interface. Lead-tin solder on the nickel provides conductivity and allows a convenient means for interconnection of cells. To apply this metallization, three chemical plating baths are employed.
During the Apollo missions many mechanisms, equipment, and surfaces were contaminated by lunar dust and often negatively affected. The methods used to clear these devices of dust proved ineffective, which led to premature failure in some cases. Systems being designed for upcoming missions to the Moon will need to address the performance degradation risk of dust contamination. Surfaces at risk include thermal control surfaces, solar cells, camera and sensor optics, seals, metal joints and tools, and space suit assemblies. To improve state of the art dust mitigation approaches, the dust mitigation team at NASA Glenn Re-search Center (GRC) explored the effects imposed on substrates during cleaning activities in the presence of lunar dust. The Uniform Dust Deposition System (UDDS) was used to conduct a study of various cleaning techniques on different substrates. Test substrates and cleaning media were selected to represent a wide range of structural and functional materials. Substrates included orthofabric, thermal radiator coating, aluminum, quartz glass, silicone rubber, aluminized Mylar, and FEP. Cleaning materials included cloth wipes, tapes, a brush, and a pliable cleaner concept. Cleaning material / substrate pairs were rated on cleaning efficiency, substrate damage, cleaning material longevity, and ease of use. The best performing cleaning method varied based on application.
During the Apollo missions many mechanisms, equipment, and surfaces were contaminated by lunar dust and often negatively affected. The methods used to clear these devices of dust proved ineffective, which led to premature failure in some cases. Systems being designed for upcoming missions to the Moon will need to address the performance degradation risk of dust contamination. Surfaces at risk include thermal control surfaces, solar cells, camera and sensor optics, seals, metal joints and tools, and space suit assemblies. To improve state of the art dust mitigation approaches, the dust mitigation team at NASA Glenn Research Center (GRC) explored the effects imposed on substrates during cleaning activities in the presence of lunar dust. The Uniform Dust Deposition System (UDDS) was used to conduct a study of various cleaning techniques on different substrates. Test substrates and cleaning media were selected to represent a wide range of structural and functional materials. Substrates included orthofabric, thermal radiator coating, aluminum, quartz glass, silicone rubber, aluminized Mylar, and FEP. Cleaning materials included cloth wipes, tapes, a brush, and a pliable cleaner concept. Cleaning material / substrate pairs were rated on cleaning efficiency, substrate damage, cleaning material longevity, and ease of use. The best performing cleaning method varied based on application.
For spacecraft in low Earth orbit (LEO), contamination can occur from thruster fuel, sputter contamination products and from products of silicone degradation. This paper describes laboratory testing in which solar cell materials and thermal control surfaces were exposed to simulated spacecraft environmental effects including contamination, atomic oxygen, ultraviolet radiation and thermal cycling. The objective of these experiments was to determine how the interaction of the natural LEO environmental effects with contaminated spacecraft surfaces impacts the performance of these materials. Optical properties of samples were measured and solar cell performance data was obtained. In general, exposure to contamination by thruster fuel resulted in degradation of solar absorptance for fused silica and various thermal control surfaces and degradation of solar cell performance. Fused silica samples which were subsequently exposed to an atomic oxygen/vacuum ultraviolet radiation environment showed reversal of this degradation. These results imply that solar cells and thermal control surfaces which are susceptible to thruster fuel contamination and which also receive atomic oxygen exposure may not undergo significant performance degradation. Materials which were exposed to only vacuum ultraviolet radiation subsequent to contamination showed slight additional degradation in solar absorptance.
The conventional surface photovoltage (SPV) method is extended to the measurement of the minority carrier diffusion length in diffused semiconductor junctions of the type used in a silicon solar cell. The minority carrier diffusion values obtained by the SPV method agree well with those obtained by the X-ray method. Agreement within experimental error is also obtained between the minority carrier diffusion lengths in solar cell diffusion junctions and in the same materials with n-regions removed by etching, when the SPV method was used in the measurements.
Shallow-homojunction GaAs solar cells are fabricated with a back-surface field (BSF) produced by a GaAs/Al(0.2)Ga(0.8)As heterostructure. These cells exhibit higher open-circuit voltages and conversion efficiencies than control cells made with a p-GaAs/p(+)-GaAs BSF. Conversion efficiencies of over 22 percent (AM1, total area) have been obtained with this new structure. The use of a higher bandgap material below the active region not only provides an enhanced BSF but will also permit the implementation of two solar-cell designs: a GaAs cell with a back-surface reflector and an AlGaAs cell that can be used as the upper cell in tandem configurations.
Poly(vinylidene fluoride) (PVF) film protects solar cells on Mars surface from radiation and prevents degradation of solar cell surfaces by Martian dust storms. PVF films may replace glass or quartz windows on solar cell arrays used to generate power on earth.
Computer-controlled ink-jet-assisted metallization of the front surface of solar cells with metalorganic silver inks offers a maskless alternative method to conventional photolithography and screen printing. This method can provide low cost, fine resolution, reduced process complexity, avoidance of degradation of the p-n junction by firing at lower temperature, and uniform line film on rough surface of solar cells. The metallization process involves belt furnace firing and thermal spiking. With multilayer ink jet printing and firing, solar cells of about 5-6 percent efficiency without antireflection (AR) coating can be produced. With a titanium thin-film underlayer as an adhesion promoter, solar cells of average efficiency 8.08 percent without AR coating can be obtained. This efficiency value is approximately equal to that of thin-film solar cells of the same lot. Problems with regard to lower inorganic content of the inks and contact resistance are noted.
The operating temperature is reduced and the output of a solar cell is increased by using a solar cell which carries electrodes in a grid finger pattern on its back surface. These electrodes are sintered at the proper temperature to provide good ohmic contact. After sintering, a reflective material is deposited on the back surface by vacuum evaporation. Thus, the application of the back surface reflector is separate from the back contact formation. Back surface reflectors formed in conjunction with separate grid finger configuration back contacts are more effective than those formed by full back metallization of the reflector material.