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NASA NTRS1975

Preferential concentration of certain elements in smaller aerosols emitted from aircraft engines

Aerosols from aircraft engines were collected with an eight-stage cascade sampler for a period of 24 h. The aerosol samples from each stage were analyzed for their elemental composition using the proton-induced X-ray emission (PIXE) technique. Seventeen elements (Si, P, S, Cl, K, Ca, Ti, V, Fe, Ni, Cu, Zn, Br, Sr, Nb, Sn, and Pb) were positively identified and quantitated at each stage. Six elements (S, Ca, Fe, Zn, Sn, and Pb) showed a fractional concentration increase with decreasing aerosol size. Similar, but less well-defined, trends were also observed for V and Ni. Silicon and chlorine, on the other hand, showed an opposite trend. Neutron-activation analysis of bulk aerosol samples collected every 2 h over the same period showed a correlation between concentration of Si, Ca, V, Ti, Zn, Br, and Sn and the density of air traffic at the airport. Analysis of the aviation-fuel samples by PIXE indicates that major fractions of Pb, Sn, Br, Zn, Ni, Fe, V, Ca, and S observed in these aerosol studies come from the aircraft engine exhaust.

Jolly, R. K.↗

NASA NTRS1973

Results of the Apollo 15 and 16 X-ray experiment

Except for some minor modifications the Apollo 16 X-ray fluorescence experiment was similar to that flown aboard Apollo 15. The Apollo 16 provided data for a number of features not previously covered such as Mare Cognitum, Mare Nubium, Ptolemaeus, Descartes, Mendeleev, and other areas. Many data points were obtained by the X-ray experiments, so that comparisons could be drawn between Apollo 15 and 16 flights. The agreement was generally within about 10%. Al/Si concentration ratios ranged from 0.38% in Mare Cognitum to 0.67% in the Descartes area highlands. A comparison of the Apollo 16 data Al/Si values with optical albedo values along the ground tracks showed the same positive correlation as in the Apollo 15 flight. A reexamination of the detector and collimator geometries showed that the spatial resolution was better by almost a factor of two than the initial estimates.

Adler, I.↗

NASA NTRS1974

The Apollo X-ray fluorescence spectrometer

The Apollo X-ray fluorescence spectrometer was a part of a geochemical package flown on the Apollo 15 and 16 missions. The device was to map the concentrations of aluminum, magnesium, and silicon in the lunar regolith along the spacecraft ground track. A functional description of the spectrometer is given and the telemetry data format is discussed together with the pulse height analyzer, the pulse shape discriminator, questions of in-flight calibration, and the flight results.

Jagoda, N.↗

NASA NTRS1974

Temperature dependence of emission measure in solar X-ray plasmas. 1: Non-flaring active regions

X-ray and ultraviolet line emission from hot, optically thin material forming coronal active regions on the sun may be described in terms of an emission measure distribution function, Phi (T). A relationship is developed between line flux and Phi (T), a theory which assumes that the electron density is a single-valued function of temperature. The sources of error involved in deriving Phi (T) from a set of line fluxes are examined in some detail. These include errors in atomic data (collisional excitation rates, assessment of other mechanisms for populating excited states of transitions, element abundances, ion concentrations, oscillator strengths) and errors in observed line fluxes arising from poorly - known instrumental responses. Two previous analyses are discussed in which Phi (T) for a non-flaring active region is derived. A least squares method of Batstone uses X-ray data of low statistical significance, a fact which appears to influence the results considerably. Two methods for finding Phi (T) ab initio are developed. The coefficients are evaluated by least squares. These two methods should have application not only to active-region plasmas, but also to hot, flare-produced plasmas.

Phillips, K. J. H.↗

NASA NTRS1975

Air pollution source identification

The techniques available for source identification are reviewed: remote sensing, injected tracers, and pollutants themselves as tracers. The use of the large number of trace elements in the ambient airborne particulate matter as a practical means of identifying sources is discussed. Trace constituents are determined by sensitive, inexpensive, nondestructive, multielement analytical methods such as instrumental neutron activation and charged particle X-ray fluorescence. The application to a large data set of pairwise correlation, the more advanced pattern recognition-cluster analysis approach with and without training sets, enrichment factors, and pollutant concentration rose displays for each element is described. It is shown that elemental constituents are related to specific source types: earth crustal, automotive, metallurgical, and more specific industries. A field-ready source identification system based on time and wind direction resolved sampling is described.

Fordyce, J. S.↗

NASA NTRS1976

Effect of interfacial oxide layers on the current-voltage characteristics of Al-Si contacts

Aluminum-silicon contacts with very thin interfacial oxide layers and various surface impurity concentrations are studied for both n and p-type silicon. To determine the surface impurity concentrations on p(+)-p and n(+)-n structures, a modified C-V technique was utilized. Effects of interfacial oxide layers and surface impurity concentrations on current-voltage characteristics are discussed based on the energy band diagrams from the conductance-voltage plots. The interfacial oxide and aluminum layer causes image contrasts on X-ray topographs.

Porter, W. A.↗

NASA NTRS1971

Studies of positive-ion composition in the equatorial D-region ionosphere.

Evaluation of two daytime D-region positive-ion composition measurements performed at Thumba, India, for solar zenith angles of 53.2 and 27.8 deg. Comparison of upleg ram with downleg wake data shows a large increase in the concentration of heavy ions 48(+), NO(+) . H2O; 55(+), H3O(+) . (H2O)2; and M(+) greater than 65(+) for the downleg reduced shock condition. Peak concentrations of 48(+) and 55(+) occur at unit optical depth for Lyman alpha radiation. The ion 37(+), H3O(+) . H2O, is dominant for chi = 27.8 deg, but not for chi = 53.2 deg, consistent above 80 km with an origin from the X-ray production of O2(+). Laboratory measurements have shown that the ion, NO(+), can be transferred to heavy hydrates 48(+), 55(+), and M(+) greater than 65(+) by a reaction chain starting with NO(+) + X + M = NO(+) . X + M, where X can be O2, N2, CO2 or a combination of all three, depending on the rate of reaction. This chain, together with a similar reaction scheme starting with O2(+) and ending in 19(+), 37(+), and heavier clusters, is used to provide a consistent explanation for the hydrated ions observed in the D region.

Goldberg, R. A.↗

NASA NTRS1971

A focusing collector for long wavelength X-ray astronomy.

Rocket studies of the low-energy X-ray sky conducted so far suffer from serious experimental problems. Therefore, an apparatus was design ed to overcome the outstanding experimental problems. The instrument developed was successfully flown in an Aerobee-170 rocket. The new device utilizes a grazing incidence paraboloid as an energy concentrator and low-pass filter. The effective bandpass of the instrument from 100 to 280 eV is determined by the combination of the counter window transmission and the mirror reflectivity.

Yentis, D. J.↗

NASA NTRS1974

Determination of rare-earth elements in Luna 16 regolith sample by chemical spectral method

An analysis was made of regolith from layer A of the Luna 16 sample for rare earth elements, by a chemical spectral method. Chemical and ion exchange concentrations were used to determine the content of 12 elements and Y at the level 0.001 to 0.0001 percent with 10 to 15 percent reproducibility of the emission determination. Results within the limits of reproducibility agree with data obtained by mass spectra, activation, and X-ray fluorescent methods.

Stroganova, N. S.↗

NASA NTRS1974

Observation of oxide particles below the apparent oxygen solubility limit in tantalum

The apparent solubility of oxygen in polycrystalline tantalum as determined by the X-ray diffraction lattice parameter technique is about 1.63 at. pct at 820 C. However, oxide particles were identified in samples containing as low as 0.5 at. pct oxygen. These particles were present at the grain boundaries and within the grains. The number of oxide particles increased with increasing oxygen concentration in tantalum. The presence of oxide particles suggests that the true solubility in the polycrystalline tantalum metal is probably lower than that reported in the literature.

Stecura, S.↗

NASA NTRS1973

Observation of oxide particles below the apparent oxygen solubility limit in tantalum

The apparent solubility of oxygen in polycrystalline tantalum as determined by the X-ray diffraction lattice parameter technique is about 1.63 atomic percent at 820 C. However, oxide particles were identified in samples containing as low as 0.5 atomic percent of oxygen. These oxide particles were present at the grain boundaries and within the grains. The number of oxide particles increased with increasing oxygen concentration in tantalum. The presence of oxide particles suggests that the true solubility of oxygen in the polycrystalline tantalum metal is probably significantly lower than that reported in the literature.

Stecura, S.↗

NASA NTRS1972

Investigation of superconducting interactions and amorphous semiconductors

Research papers on superconducting interactions and properties and on amorphous materials are presented. The search for new superconductors with improved properties was largely concentrated on the study of properties of thin films. An experimental investigation of interaction mechanisms revealed no new superconductivity mechanism. The properties of high transition temperature, type 2 materials prepared in thin film form were studied. A pulsed field solenoid capable of providing fields in excess of 300 k0e was developed. Preliminary X-ray measurements were made of V3Si to determine the behavior of cell constant deformation versus pressure up to 98 kilobars. The electrical properties of amorphous semiconducting materials and bulk and thin film devices, and of amorphous magnetic materials were investigated for developing radiation hard, inexpensive switches and memory elements.

Janocko, M. A.↗

NASA NTRS1977

Lunar elemental analysis obtained from the Apollo gamma-ray and X-ray remote sensing experiment

Gamma-ray and X-ray spectrometers carried in the service modules of the Apollo 15 and Apollo 16 spacecraft were employed for compositional mapping of the lunar surface. The measurements involved the observation of the intensity and characteristic energy distribution of gamma rays and X-rays emitted from the lunar surface. A large-scale compositional map of over 10 percent of the lunar surface was obtained from an analysis of the observed spectra. The objective of the X-ray experiment was to measure the K spectral lines from Mg, Al, and Si. Spectra were obtained and the data were reduced to Al/Si and Mg/Si intensity ratios and ultimately to chemical ratios. Analyses of the results have indicated (1) that the Al/Si ratios are highest in the lunar highlands and considerably lower in the maria, and (2) that the Mg/Si concentrations generally show the opposite relationship. The objective of the gamma-ray experiment was to measure the natural and cosmic-ray-induced activity emission spectrum. At this time, the elemental abundances for Th, U, K, Fe, Ti, Si, and O have been determined over a number of major lunar regions. Regions of relatively high natural radioactivity were found in the Mare Imbrium and Oceanus Procellarum regions.

Trombka, J. I.↗

NASA NTRS1975

Sodium ions at defect sites at SiO2/Si interfaces as determined by X-ray photoelectron spectroscopy

X-ray photoelectron spectroscopy (XPS) is described in its application as a probe for studying defects such as sodium in SiO2 films. A general description is given of key experimental methods in XPS. Techniques are described for applying and monitoring a fixed bias at the surface of the oxide during the XPS measurement. These methods are shown to be capable of detecting extremely small Na and Cu concentrations in undoped samples (less than 10 to the 11th power per cu cm). In deliberately Na-doped samples, five spectral peaks are distinctly observed and related to different defect states at the vacuum/SiO2 and SiO2/Si interfaces. By applying a bias-temperature stress during the XPS measurements, these peaks change in relative intensity and can be related to the motion of the Na(+) ions between different states occurring at the two interfaces. An attempt is made to correlate the observations with previously reported models.

Grunthaner, F. J.↗

NASA NTRS2026

Thermal Inspection for the Assessment of Adhesively Bonded Metal Adherends

Certification of adhesively bonded structures is currently a challenge for aircraft manufacturers. The ability to certify bonds in primary structure can reduce dependence on fasteners and this will enable more efficient manufacturing. For example, drilling holes and installing fasteners in bonded joints can be a potentially significant bottleneck in airframe manufacturing. In addition, fasteners increase the airframe weight and can add stress concentration areas. Reducing fastener count can accelerate manufacturing and improve aircraft performance. NASA is currently investigating nondestructive evaluation (NDE) techniques to assess bond integrity. For example, bond thickness influences bond strength and therefore NDE techniques are being investigated to determine bond thickness. For bonded metal structures, there is a large difference in the thermal diffusivity between the 7075 aluminum alloy metal adherends and aircraft grade adhesive. Multi-layered thermal models show a large variation in the thermal response for bondline adhesive thicknesses that vary from 100 to 300 microns for adherend thicknesses of 0.163 cm. Experimental through-transmission thermal measurements reveal promise to quantitatively characterize the bondline thickness. Results were validated with X-ray computed tomography and optical microscopy measurements, and influence of porosity on the thermal model and measurements are investigated.

X-ray computed tomography↗

NASA NTRS2026

Thermal Inspection for the Assessment of Adhesively Bonded Metal Adherents

bondline thickness↗

NASA NTRS1964

On the x-ray emission in the aurora zones

The X-radiation, occurring in the aurora zone, was first revealed in the summer of 1952 [1,2] rockets above 50 km. This radiation is mainly concentrated between the 62 and 77° geomagnetic latitude, with a maximum near 67.5°. It is generated at fast electron collisions with upper atmosphere particles.

PLANET↗

NASA NTRS1973

Hard cosmic X-ray sources.

A review of the observational status of X-ray sources detected in the 20 to 500 keV range is presented. Of the approximately 115 sources listed in the March 1972 edition of the UHURU 2-6 keV sky survey catalog, about 15 sources have been studied in hard X rays. Most of the data have been obtained from balloons, although the OSO-3, and more recently the OSO-7, have contributed. With the exception of CEN A, the SMC, and possibly M-87, all the sources detected at higher energies are galactic and heavily concentrated in the galactic plane. The Crab Nebula has been measured to about 500 keV in continuous emission and a component at the 33-msec pulsar period comprising about 20% of the total emission has been detected to 10 MeV. Objects such as SCO-1 and CYG-2 are characterized by an exponential spectrum, which varies over a 10-min time scale about a factor of two, and a flatter spectrum extending to above 40 keV which exhibits independent variability.

Peterson, L. E.↗