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At least 37 records · Page 2

E-Beam Irradiation Beamline at Jefferson Lab for Wastewater Treatment

Electron beam (e-beam) irradiation is an advanced method for removing the emerging organic contaminants in wastewater, such as 1,4-dioxane, and per- and polyfluoroalkyl sub?stances (PFAS), which have the potential to be regulated in the near future but are difficult to degrade by conventional treatment methods. This dissertation was based on a collabo?rating study between Jefferson Lab (Jlab) and Hampton Roads Sanitation District (HRSD) to evaluate the impacts of e-beam irradiation on the degradation of 1,4-dioxane and PFAS. It presents the detailed design of an e-beam irradiation beamline, the beamline simulation using general particle tracer (GPT), the installation, and the successful commissioning. The beamline is an extended section to the Upgraded Injector Test Facility (UITF) at Jlab, which is a continuous wave (CW), superconducting radio frequency (SRF) linear accelerator with an energy up to 10 MeV. To let the sample volume receive a significant and uniform dose distribution, the sample target was designed by investigating the dose distribution simulated with a Monte-Carlo code, FLUKA. The optimized beam energy was 8 MeV and the beam current for irradiation was ? 100 nA. With the use of a solenoid and a raster, the electron beam was expanded to the optimized size, 1? ? 15 mm, at the sample target. This dis?sertation also presents the irradiation experiments for 64 1,4-dioxane samples and 48 PFAS samples in different water matrices, including real wastewater, which were prepared and an?alyzed by HRSD. The absorbed doses of samples were obtained by designing a new method that combines the FLUKA simulation and dose mapping experiments. The irradiation re?sults showed that around 95% of 1,4-dioxane was removed at a low dose of ? 2 kGy, and PFAS was possibly removed at a lower dose compared to similar research. This work is a first implementation of SRF technology for wastewater irradiation. It pro?vides a valuable new research platform for wastewater remediation. This will be in support of future industrial applications of advanced SRF technologies and better understanding of the effect of e-beam irradiation on wastewater or water treatment.

Li, Xi↗

High efficiency normal conducting linac for environmental water remediation

A continuous wave (CW) electron accelerator for the treatment of industrial streams including an electron beam source, a modified high efficiency slot coupled cavity, at least one focusing magnet positioned surrounding the accelerator to contain the beam in the accelerator, an efficient radio frequency power supply means for supplying power of a radio frequency to the cavity to induce a TM01 accelerating mode in the cavity, an electron beam spreader or raster, a fixed magnet array or two-dimensional scanning magnet for deflecting the accelerated beam into a desired shape, and an exit window for extracting the deflected electron beam. The accelerator includes a graded-beta cavity to enable use with a low-power pulsed electron source. The accelerator benefits from a low wall-power loss accelerating cavity that is energized with efficient RF sources, enabling it to be operated in continuous wave mode.

Hannon, Fay↗

Electron beam irradiation of 1,4 dioxane

Electron beam irradiation produces both, reducing and oxidizing species which facilitate the reduction of contaminants found in water and wastewater. To investigate the impact of electron beam on 1,4-dioxane, a widely used solvent which has been declared as a probable human carcinogen by the U.S. Environmental Protection Agency, a beamline was designed and commissioned at the Upgraded Injector Test Facility at Jefferson Lab. Here, wastewater samples can be irradiated with a beam energy up to 10 MeV and a beam current of up to 100 nA. Beam acceleration is achieved by two superconducting radio-frequency cavities cooled by liquid helium in a cryomodule. A beam spot with a diameter of ~5 cm was produced at the target location using a pair of raster coils. Electron beam irradiation studies were performed using 1,4-dioxane in two different matrices, de-ionized water and secondary effluent wastewater, and for two concentrations, 10 microg/L and 100 microg/L. The concentration of 1,4-dioxane after irradiation was measured as a function of dose.

Li, Xi↗

Electron spectroscopy analysis

The Surface Science Laboratories at the University of Alabama in Huntsville (UAH) are equipped with x-ray photoelectron spectroscopy (XPS or ESCA) and Auger electron spectroscopy (AES) facilities. These techniques provide information from the uppermost atomic layers of a sample, and are thus truly surface sensitive. XPS provides both elemental and chemical state information without restriction on the type of material that can be analyzed. The sample is placed into an ultra high vacuum (UHV) chamber and irradiated with x-rays which cause the ejection of photoelectrons from the sample surface. Since x-rays do not normally cause charging problems or beam damage, XPS is applicable to a wide range of samples including metals, polymers, catalysts, and fibers. AES uses a beam of high energy electrons as a surface probe. Following electronic rearrangements within excited atoms by this probe, Auger electrons characteristic of each element present are emitted from the sample. The main advantage of electron induced AES is that the electron beam can be focused down to a small diameter and localized analysis can be carried out. On the rastering of this beam synchronously with a video display using established scanning electron microscopy techniques, physical images and chemical distribution maps of the surface can be produced. Thus very small features, such as electronic circuit elements or corrosion pits in metals, can be investigated. Facilities are available on both XPS and AES instruments for depth-profiling of materials, using a beam of argon ions to sputter away consecutive layers of material to reveal sub-surface (and even semi-bulk) analyses.

Gregory, John C.↗

Measurement techniques using the electron beam profile scanner at the Fermilab Main Injector

This work presents techniques for non-invasive transverse profile measurements of high-intensity proton beams using an Electron Beam Profile Scanner (EBPS). The EBPS utilizes low-energy electrons as a probe to analyze the transverse size of proton beams, allowing for potential analysis on a single-bunch basis. Recent upgrades to the Fermilab Main Injector have enhanced beam power on target to 1 MW, with future developments targeting 2 MW. The higher beam power has increased the demand for non-invasive diagnostics, as invasive methods can disrupt operations.The techniques presented include 1) the slow scan technique, which serves as a proof of concept for the probe beam, 2) the one-shot scan technique for measuring horizontal beam profiles, and 3) the raster scan technique for analyzing horizontal beam profiles as a function of the longitudinal distribution of the beam. The profiles obtained will be crucial for studying and understanding instabilities in high-power, high-intensity proton beams. This will contribute to optimizing the operation of high-power proton accelerators by minimizing beam loss, activation, and damage to both the diagnostics and the accelerator components.

Mwaniki, Matilda [IIT, Chicago]↗

Towards Construction of a Novel Nanometer-Resolution MeV-STEM for Imaging Thick Frozen Biological Samples

Driven by life-science applications, a mega-electron-volt Scanning Transmission Electron Microscope (MeV-STEM) has been proposed here to image thick frozen biological samples as a conventional Transmission Electron Microscope (TEM) may not be suitable to image samples thicker than 300–500 nm and various volume electron microscopy (EM) techniques either suffering from low resolution, or low speed. The high penetration of inelastic scattering signals of MeV electrons could make the MeV-STEM an appropriate microscope for biological samples as thick as 10 μm or more with a nanoscale resolution, considering the effect of electron energy, beam broadening, and low-dose limit on resolution. The best resolution is inversely related to the sample thickness and changes from 6 nm to 24 nm when the sample thickness increases from 1 μm to 10 μm. To achieve such a resolution in STEM, the imaging electrons must be focused on the specimen with a nm size and an mrad semi-convergence angle. This requires an electron beam emittance of a few picometers, which is ~1000 times smaller than the presently achieved nm emittance, in conjunction with less than 10 -4 energy spread and 1 nA current. We numerically simulated two different approaches that are potentially applicable to build a compact MeV-STEM instrument: (1) DC (Direct Current) gun, aperture, superconducting radio-frequency (SRF) cavities, and STEM column; (2) SRF gun, aperture, SRF cavities, and STEM column. Beam dynamic simulations show promising results, which meet the needs of an MeV-STEM, a few-picometer emittance, less than 10 -4 energy spread, and 0.1–1 nA current from both options. Also, we designed a compact STEM column based on permanent quadrupole quintuplet, not only to demagnify the beam size from 1 μm at the source point to 2 nm at the specimen but also to provide the freedom of changing the magnifications at the specimen and a scanning system to raster the electron beam across the sample with a step size of 2 nm and the repetition rate of 1 MHz. This makes it possible to build a compact MeV-STEM and use it to study thick, large-volume samples in cell biology.

36 MATERIALS SCIENCE↗

Simultaneous Conoscopic Holography and Raman Spectroscopy

A new instrument was developed for chemical characterization of surfaces that combines the analytical power of Raman spectroscopy with the three-dimensional topographic information provided by conoscopic holography. The figure schematically depicts the proposed hybrid instrument. The output of the conoscopic holographic portion of the instrument is a topographical map of the surface; the output of the Raman portion of the instrument is hyperspectral Raman data, from which the chemical and/or biological composition of the surface would be deduced. By virtue of the basic principles of design and operation of the instrument, the hyperspectral image data would be inherently spatially registered with the topographical data. In conoscopic holography, the object and reference beams of classical holography are replaced by the ordinary and extraordinary components generated by a single beam traveling through a birefringent, uniaxial crystal. In the basic conoscopic configuration, a laser light is projected onto a specimen and the resulting illuminated spot becomes a point source of diffuse light that propagates in every direction. The laser beam is rasterscanned in two dimensions (x and y) perpendicular to the beam axis (z), and at each x,y location, the pattern of interference between the ordinary and extraordinary rays is recorded. The recorded interferogram constitutes the conoscopic hologram. Of particular significance for the proposed instrument is that the conoscopic hologram contains information on the z coordinate (height) of the illuminated surface spot. Hence, a topographical map of the specimen is constructed point-by-point by rastering the laser beam in the x and y directions and correlating the x and y coordinates with the z information obtained from the interferograms. Conoscopic imaging is an established method, and conoscopic laboratory instruments for surface metrology are commercially available. In Raman spectroscopy of a surface, one measures the spectrum of laser light scattered inelastically from a laser-illuminated spot on the surface. The wavelengths of the inelastically scattered light differ from that of the incident laser beam by amounts that correspond to the energies of molecular vibrations. The resulting vibrational spectrum can be used to identify the molecules. Raman spectroscopy is a standard laboratory technique for identifying mineralogical, biological, and other specific chemical compositions.

Schramm, Harry F.↗

Adaptive sampling for accelerating neutron diffraction-based strain mapping *

Abstract Neutron diffraction is a useful technique for mapping residual strains in dense metal objects. The technique works by placing an object in the path of a neutron beam, measuring the diffracted signals and inferring the local lattice strain values from the measurement. In order to map the strains across the entire object, the object is stepped one position at a time in the path of the neutron beam, typically in raster order, and at each position a strain value is estimated. Typical dwell times at neutron diffraction instruments result in an overall measurement that can take several hours to map an object that is several tens of centimeters in each dimension at a resolution of a few millimeters, during which the end users do not have an estimate of the global strain features and are at risk of incomplete information in case of instruments outages. In this paper, we propose an object adaptive sampling strategy to measure the significant points first. We start with a small initial uniform set of measurement points across the object to be mapped, compute the strain in those positions and use a machine learning technique to predict the next position to measure in the object. Specifically, we use a Bayesian optimization based on a Gaussian process regression method to infer the underlying strain field from a sparse set of measurements and predict the next most informative positions to measure based on estimates of the mean and variance in the strain fields estimated from the previously measured points. We demonstrate our real-time measure-infer-predict workflow on additively manufactured steel parts—demonstrating that we can get an accurate strain estimate even with 30%–40% of the typical number of measurements—leading the path to faster strain mapping with useful real-time feedback. We emphasize that the proposed method is general and can be used for fast mapping of other material properties such as phase fractions from time-consuming point-wise neutron measurements.

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗

Semiconductor Laser With Two-Dimensional Beam Steering

Modification of monolithic semiconductor injection laser capable of one-dimensional electronic beam steering enables deflection of beam in second direction. Such laser chip provides beam pointing or raster scanning for applications in optical communications, data processing, image scanning, and optical ranging.

Katz, J.↗

Photocurrent Imaging Detects Solar-Module Defects

Raster-scanned laser beam excites photocurrents in thin-film amorphous silicon devices. Solar-cell laser scanner uses two galvanometer-driven mirrors to scan laser-beam spot over surface of module or cell under test. Position signals from scan controllers used to index storage of photocurrent signal data in scan-converter image memory. Stored image displayed on television monitor.

Kim, Q.↗

Additive manufacturing

A nanofluid laser entrainment additive manufacturing apparatus, system and method including a substrate, a dilute nanofluid of inert gas suspended nanoparticles on the substrate, a focused energy beam that irradiates the nanoparticles to selectively melt the nanoparticles, and a raster system that raster scans the focused energy beam across the inert gas suspended nanoparticles to create predetermined shapes by additive manufacturing.

Matthews, Manyalibo Joseph↗

Simultaneous 10 kHz three-dimensional CH 2 O and tomographic PIV measurements in a lifted partially-premixed jet flame

High-speed, three-dimensional (3D) scalar-velocity field measurements are demonstrated in a lifted partially-premixed dimethyl-ether/air jet flame using simultaneous laser-induced fluorescence (LIF) of formaldehyde (CH 2 O) and tomographic particle image velocimetry (TPIV). The 3D LIF measurements are performed by raster scanning the laser beam from a 100 kHz pulse-burst laser across the probe volume using an acousto-optic deflector. The volumetric reconstruction of the LIF signal from ten parallel planes provides quasi-instantaneous 3D LIF measurements that are synchronized with 10 kHz TPIV measurements. Here, the temporally resolved CH 2 O-LIF and velocity field data are used to analyze Lagrangian particle trajectories and displacement speeds at the base of the lifted flame. The particle trajectories reveal flow structures that are difficult to observe in an Eulerian reference frame. Positive and negative displacement speeds are observed at the CH 2 O-LIF surfaces at the inner and outer regions of the jet flame with a maximum displacement speed of approximately eight times the laminar flame speed of a stoichiometric dimethyl-ether/air mixture. The observations in present study support formation of lean premixed flames near the flame base whose role in flame stabilization should be investigated in more detail.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

Sidelooking laser altimeter for a flight simulator

An improved laser altimeter for a flight simulator which allows measurement of the height of the simulator probe above the terrain directly below the probe tip is described. A laser beam is directed from the probe at an angle theta to the horizontal to produce a beam spot on the terrain. The angle theta that the laser beam makes with the horizontal is varied so as to bring the beam spot into coincidence with a plumb line coaxial with the longitudinal axis of the probe. A television altimeter camera observes the beam spot and has a raster line aligned with the plumb line. Spot detector circuit coupled to the output of the TV camera monitors the position of the beam spot relative to the plumb line.

Webster, L. D.↗

Increasing the deuterated potassium dihydrogen phosphate crystal laser resistance by an additional conditioning with nanosecond pulses

Laser conditioning with 355-nm sub-nanosecond laser light is a well-known procedure to increase the bulk laser-induced damage resistance of deuterated potassium dihydrogen phosphate (DKDP) crystals. In this study, we investigate a new process to further increase the bulk damage resistance of DKDP crystals by performing additional conditioning with a 6.7-ns 355-nm laser after first conditioning with a 500-ps 355-nm laser. Here, damage tests (using both small and large beams) show that the second nanosecond conditioning raster increased the fluence required to produce the same density (large beam test) and probability (small beam test) of bulk damage by ∼30%.

Crystals↗

Miniaturized Environmental Scanning Electron Microscope for In Situ Planetary Studies

The exploration of remote planetary surfaces calls for the advancement of low power, highly-miniaturized instrumentation. Instruments of this nature that are capable of multiple types of analyses will prove to be particularly useful as we prepare for human return to the moon, and as we continue to explore increasingly remote locations in our Solar System. To this end, our group has been developing a miniaturized Environmental-Scanning Electron Microscope (mESEM) capable of remote investigations of mineralogical samples through in-situ topographical and chemical analysis on a fine scale. The functioning of an SEM is well known: an electron beam is focused to nanometer-scale onto a given sample where resulting emissions such as backscattered and secondary electrons, X-rays, and visible light are registered. Raster scanning the primary electron beam across the sample then gives a fine-scale image of the surface topography (texture), crystalline structure and orientation, with accompanying elemental composition. The flexibility in the types of measurements the mESEM is capable of, makes it ideally suited for a variety of applications. The mESEM is appropriate for use on multiple planetary surfaces, and for a variety of mission goals (from science to non-destructive analysis to ISRU). We will identify potential applications and range of potential uses related to planetary exploration. Over the past few of years we have initiated fabrication and testing of a proof-of-concept assembly, consisting of a cold-field-emission electron gun and custom high-voltage power supply, electrostatic electron-beam focusing column, and scanning-imaging electronics plus backscatter detector. Current project status will be discussed. This effort is funded through the NASA Research Opportunities in Space and Earth Sciences - Planetary Instrument Definition and Development Program.

Gaskin, Jessica↗

All polymer microfluidic chips—A fixed target sample delivery workhorse for serial crystallography

The development of x-ray free electron laser (XFEL) light sources and serial crystallography methodologies has led to a revolution in protein crystallography, enabling the determination of previously unobtainable protein structures and near-atomic resolution of otherwise poorly diffracting protein crystals. However, to utilize XFEL sources efficiently demands the continuous, rapid delivery of a large number of difficult-to-handle microcrystals to the x-ray beam. A recently developed fixed-target system, in which crystals of interest are enclosed within a sample holder, which is rastered through the x-ray beam, is discussed in detail in this Perspective. The fixed target is easy to use, maintains sample hydration, and can be readily modified to allow a broad range of sample types and different beamline requirements. Recent innovations demonstrate the potential of such microfluidic-based fixed targets to be an all-around “workhorse” for serial crystallography measurements. In conclusion, this Perspective will summarize recent advancements in microfluidic fixed targets for serial crystallography, examine needs for future development, and guide users in designing, choosing, and utilizing a fixed-target sample delivery device for their system.

59 BASIC BIOLOGICAL SCIENCES↗

Finite Element Models for Electron Beam Freeform Fabrication Process

Electron beam freeform fabrication (EBF3) is a member of an emerging class of direct manufacturing processes known as solid freeform fabrication (SFF); another member of the class is the laser deposition process. Successful application of the EBF3 process requires precise control of a number of process parameters such as the EB power, speed, and metal feed rate in order to ensure thermal management; good fusion between the substrate and the first layer and between successive layers; minimize part distortion and residual stresses; and control the microstructure of the finished product. This is the only effort thus far that has addressed computer simulation of the EBF3 process. The models developed in this effort can assist in reducing the number of trials in the laboratory or on the shop floor while making high-quality parts. With some modifications, their use can be further extended to the simulation of laser, TIG (tungsten inert gas), and other deposition processes. A solid mechanics-based finite element code, ABAQUS, was chosen as the primary engine in developing these models whereas a computational fluid dynamics (CFD) code, Fluent, was used in a support role. Several innovative concepts were developed, some of which are highlighted below. These concepts were implemented in a number of new computer models either in the form of stand-alone programs or as user subroutines for ABAQUS and Fluent codes. A database of thermo-physical, mechanical, fluid, and metallurgical properties of stainless steel 304 was developed. Computing models for Gaussian and raster modes of the electron beam heat input were developed. Also, new schemes were devised to account for the heat sink effect during the deposition process. These innovations, and others, lead to improved models for thermal management and prediction of transient/residual stresses and distortions. Two approaches for the prediction of microstructure were pursued. The first was an empirical approach involving the computation of thermal gradient, solidification rate, and velocity (G,R,V) coupled with the use of a solidification map that should be known a priori. The second approach relies completely on computer simulation. For this purpose a criterion for the prediction of morphology was proposed, which was combined with three alternative models for the prediction of microstructure; one based on solidification kinetics, the second on phase diagram, and the third on differential scanning calorimetry data. The last was found to be the simplest and the most versatile; it can be used with multicomponent alloys and rapid solidification without any additional difficulty. For the purpose of (limited) experimental validation, finite element models developed in this effort were applied to three different shapes made of stainless steel 304 material, designed expressly for this effort with an increasing level of complexity. These finite element models require large computation time, especially when applied to deposits with multiple adjacent beads and layers. This problem can be overcome, to some extent, by the use of fast, multi-core computers. Also, due to their numerical nature coupled with the fact that solid mechanics- based models are being used to represent the material behavior in liquid and vapor phases as well, the models have some inherent approximations that become more pronounced when dealing with multi-bead and multi-layer deposits.

Chandra, Umesh↗

Broadband coherent anti-Stokes Raman scattering (BCARS) microscopy for rapid, label-free biological imaging

Broadband coherent anti-Stokes Raman scattering (BCARS) microscopy is a label-free imaging approach that provides detailed chemical information at high spatial resolution in a sample through nonlinear, coherent excitation of molecular vibrations and detection of Raman spectra. While its utility for biological imaging has been demonstrated, many aspects of this technique must mature before it can be widely adopted. One of the areas of required improvement is imaging speed—most BCARS implementations involve sample rastering, which limits imaging speed. Beam scanning can provide faster BCARS imaging but presents some unique challenges. Here, we describe a beam-scanning BCARS microscopy system that improves spatial resolution twofold and imaging speed by fivefold over a previous beam-scanning implementation. These enhancements were enabled by an improvement in supercontinuum power and the use of a sCMOS camera for its high data transfer rate and low read noise. Implementation of the sCMOS camera required correction for the significant pixel-to-pixel background and photon response nonuniformity. Here, we report on the method that we implemented for calibrating and correcting the pixel-to-pixel differences in sCMOS camera noise.

Dixon, Jessica Z. [Georgia Institute of Technology↗