Results for “denoising autoencoder” — Page 2

DOE OSTI2021

Decoding the shift-invariant data: applications for band-excitation scanning probe microscopy *

A shift-invariant variational autoencoder (shift-VAE) is developed as an unsupervised method for the analysis of spectral data in the presence of shifts along the parameter axis, disentangling the physically-relevant shifts from other latent variables. Using synthetic data sets, we show that the shift-VAE latent variables closely match the ground truth parameters. The shift VAE is extended towards the analysis of band-excitation piezoresponse force microscopy data, disentangling the resonance frequency shifts from the peak shape parameters in a model-free unsupervised manner. The extensions of this approach towards denoising of data and model-free dimensionality reduction in imaging and spectroscopic data are further demonstrated. This approach is universal and can also be extended to analysis of x-ray diffraction, photoluminescence, Raman spectra, and other data sets.

36 MATERIALS SCIENCE↗

NASA NTRSDate not supplied

Compression of Solar Spectroscopic Observations: a Case Study of MgII k Spectral Line Profiles Observed by NASA’s IRIS Satellite

In this study we extract the deep features and investigate the compression of the MgII k spectral line profiles observed in quiet Sun regions by NASA’s IRIS satellite. The data set of line profiles used for the analysis was obtained on April 20th, 2020, at the center of the solar disc, and contains almost 300,000 individual MgII k line profiles after data cleaning. The data are separated into train and test subsets. The train subset was used to train the autoencoder of the varying embedding layer size. The early stopping criterion was implemented on the test subset to prevent the model from overfitting. Our results indicate that it is possible to compress the spectral line profiles more than 27 times (which corresponds to the reduction of the data dimensionality from 110 to 4) while having a 4DN average reconstruction error, which is comparable to the variations in the line continuum. The mean squared error and the reconstruction error of even statistical moments sharply decrease when the dimensionality of the embedding layer increases from 1 to 4 and almost stop decreasing for higher numbers. The observed occasional improvements in training for values higher than 4 indicate that a better compact embedding may potentially be obtained if other training strategies and longer training times are used. The features learned for the critical four-dimensional case can be interpreted. In particular, three of these four features mainly control the line width, line asymmetry, and line dip formation respectively. The presented results are the first attempt to obtain a compact embedding for spectroscopic line profiles and confirm the value of this approach, in particular for feature extraction, data compression, and denoising.

SMD↗