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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 37 records · Page 2
All sourcesNASA NTRSDOE OSTI
NASA NTRS2005

Hadean Crustal Processes Revealed from Oxygen Isotopes and U-Th-Pb Depth Profiling of Pre-4.0 Ga Detrital Zircons from Western Australia

Because physical and chemical processes of the past are determined from analysis of a preserved geologic record, little is known about terrestrial crustal processes of the first 500 Ma during the so-called Hadean Eon. What is known from direct measurements has been derived almost exclusively from the study of greater than 4.0 Ga detrital zircons from the Jack Hills, Western Australia. The geochemistry of these zircons has direct application to understanding the origin and evolution of the rocks during the Hadean because: (i) U-Th-Pb age determinations by ion microprobe suggests the presence of crust as early as 4.37 Ga, or shortly after lunar formation; (ii) high-resolution U-Th-Pb zircon depth profiles reported here reveal several episodes of zircon growth in the Hadean previously unrecognized; (iii) core regions of pre-4.0 Ga zircons with igneous compositions are enriched in O-18 and contain metaluminous and peraluminous mineral inclusions, both features indicative of S-type grainitod protoliths. Study of these ancient zircons provides a unique window into the first half billion years that permits assessment of the potential of the Hadean Earth to host an emergent biosphere.

Trail, D.↗
NASA NTRS1991

The analysis of apparent optical depth profiles for interstellar absorption lines

Attention is given to the apparent optical depth method, a procedure for analyzing interstellar absorption lines. Observed absorption-line profiles are converted into profiles of apparent optical depth, and apparent column density per unit velocity. By comparing the latter for a given interstellar species having two or more absorption lines which differ in the product, the presence or absence of unresolved saturated structure in the profiles can be directly inferred. The method is illustrated using absorption-line data from the IUE satellite for the highly ionized gas toward HD 64760. Additional illustrations and a study of the method's accuracy are provided through a series of numerical simulations of multicomponent interstellar absorption situations. The method is compared to the standard growth curve method for deriving interstellar column densities. The principal value of the apparent optical depth method is that the absorption-line data are directly converted into a form that provides for direct scientific interpretations of the physical conditions in the interstellar absorbing medium as a function of velocity.

Savage, Blair D.↗
DOE OSTI2021

Active microbial biomass decreases, but microbial growth potential remains similar across soil depth profiles under deeply-vs. shallow-rooted plants

Climate-smart land management practices that replace shallow-rooted annual crop systems with deeply-rooted perennial plants can contribute to soil carbon sequestration. However, deep soil carbon accrual may be influenced by active microbial biomass and their capacity to assimilate fresh carbon at depth. Incorporating active microbial biomass, dormancy, and growth in microbially-explicit models can improve our ability to predict soil's capacity to store carbon. But, so far, the microbial parameters that are needed for such modeling are poorly constrained, especially in deep soil layers. Here, we used a lab incubation experiment and growth kinetics model to estimate how microbial parameters vary along 240 cm of soil depth in profiles under shallow- (soy) and deeply-rooted (switchgrass) plants 11 years after plant cover conversion. We also assessed resource origin and availability (total organic carbon, 14 C, extractable organic carbon, specific UV absorbance of K 2 SO 4 extractable organic C, total nitrogen, total dissolved nitrogen) along the soil profiles to examine associations between soil chemical and biological parameters. Even though root biomass was greater and rooting depth was deeper under switchgrass than soy, resource availability and microbial growth parameters were generally similar between vegetation types. Instead, depth significantly influenced soil chemical and biological parameters. For example, resource availability and total and relative active microbial biomass decreased with soil depth. Decreases in the relative active microbial biomass coincided with increased lag time (response time to external carbon inputs) along the soil profiles. Even at a depth of 210–240 cm, microbial communities were activated to grow by added resources within a day. Maximum specific growth rate decreased to a depth of 90 cm and then remained consistent in deeper layers. Our findings show that >10 years of vegetation and rooting depth changes may not be long enough to alter microbial growth parameters, and suggest that at least a portion of the microbial community in deep soils can grow rapidly in response to added resources. Our study determined microbial growth parameters that can be used in microbially-explicit models to simulate carbon dynamics in deep soil layers.

14C↗
DOE OSTI2021

High resolution depth profiling using near-total-reflection hard x-ray photoelectron spectroscopy

By adjusting the incidence angle of incoming x rays near the critical angle of x-ray total reflection, photoelectron intensity is strongly modulated due to the variation of x-ray penetration depth. Photoelectron spectroscopy combined with near-total reflection exhibits tunable surface sensitivity, providing depth-resolved information. In this Review, we first describe the experimental setup and specific data analysis process. We then review three different examples that show the broad application of this method. Furthermore, the emphasis is on its applications correlated to oxide heterostructures, especially quantitative depth analyses of compositions and electronic states. In the last part, we discuss the limitations of this technique, mostly in terms of the range of samples that can be studied.

36 MATERIALS SCIENCE↗
DOE OSTI2022

Improved quantitation of SIMS depth profile measurements of niobium via sample holder design improvements and characterization of grain orientation effects

The importance of SIMS analyses for “N-doped” impurity alloyed niobium and other surface-alloyed materials continues to increase. A major hurdle is the uncertainty of instrument calibration due to changes in sample height either from sample surface topography or from the sample holder itself. The CAMECA sample holder design allows for many types of samples to be analyzed. However, a drawback is that the holder faceplate can bend, contributing an uncertainty in the relative sensitivity factor (RSF) used to quantify the SIMS results. Here, we describe an improved sample holder having a reinforced faceplate, which prevents deflection and reduces uncertainty. Simulations show that the new design significantly reduces deflection from 10 μm to 5 nm. Sample measurements show a reduction of RSF uncertainty from this source from 4.1% to 0.95%. Grain orientation has long been suspected to affect RSF measurement as well. A bicrystal implant standard, consisting of randomly oriented and [001] grains, was successively rotated 15° between analyses. It was observed that 20% of the analyses performed on the randomly oriented grain exhibited anomalously high RSF values as well as slow sputter rates. These features were associated with the changing grain normal orientation with respect to the primary Cs + beam. The grain orientation associated with the rise in RSF was simulated and determined to be the [101] crystallographic plane, thus indicating that ion channeling was responsible for the significantly increased RSF. Focused ion beam analysis confirmed slower sputter rates for the cardinal crystallographic orientations, indicating that ion channeling occurred for each.

43 PARTICLE ACCELERATORS↗
NASA NTRS1994

A carbon-14 depth profile in the L5 chondrite Knyahinya

We report on a series of measurements of C-14 in samples of the L-chondrite Knyahinya, as a function of depth. The results show C-14 concentrations ranging from 37 to 58 dpm/kg. These measurements are compared to the levels of Ne-21, Be-10 and noble-gas ratios in this meteorite reported by Graf et al (1990). We also compare the C-14 data to the expected profile based on two sets of model calculations. The behavior of this radioisotope with depth is similar to that expected from the models, and good agreement with the profiles of other nuclides is also observed.

Jull, A. J. T.↗
NASA NTRS1973

Depth profile of Mn-53 in the lunar surface

Measurements of cosmic-ray produced Mn-53 are reported for a series of lunar surface samples down to a depth of 416 g/sq cm. These results clearly illustrate the decrease in activity with depth as the incident galactic cosmic rays are absorbed. Below 60 g/sq cm the production rate decreases exponentially with a mean length of about 220 g/sq cm. These results indicate that, at the Apollo 15 site, the lunar regolith has been unmixed, on a meter scale, for the last 5 m.y. The neutron activation technique for Mn-53, which allowed samples smaller than 200 mg to be used for these measurements, is described.

Imamura, M.↗
NASA NTRS1983

The XPS depth profiling and tribological characterization of ion-plated gold on various metals

Friction properties were measured with a gold film; the graded interface between gold and nickel substrate; and the nickel substrate. All sliding was conducted against hard silicon carbide pins in two processes. In the adhesive process, friction arises primarily from adhesion between sliding surfaces. In the abrasion process, friction occurs as a result of the hard pin sliding against the film, indenting into it, and plowing a series of grooves. Copper and 440 C stainless steel substrates were also used. Results indicate that the friction related to both adhesion and abrasion is influenced by coating depth. The trends in friction behavior as a function of film depth are, however, just the opposite. The graded interface exhibited the highest adhesion and friction, while the graded interface resulted in the lowest abrasion and friction. The coefficient of friction due to abrasion is inversely related to the hardness. The greater the hardness of the surface, the lower is the abrasion and friction. The microhardness in the graded interface exhibited the highest hardness due to an alloy hardening effect. Almost no graded interface between the vapor-deposited gold film and the substrates was detected.

Miyoshi, K.↗
NASA NTRS1983

Compositional depth profile of a native oxide LPCVD MNOS structure using X-ray photoelectron spectroscopy and chemical etching

It is pointed out that there is no report of an unambiguous analysis of the composition and interfacial structure of MNOS (metal-nitride oxide semiconductor) systems, despite the technological importance of these systems. The present investigation is concerned with a study of an MNOS structure on the basis of a technique involving the use of X-ray photoelectron spectroscopy (XPS) with a controlled stopped-flow chemical-etching procedure. XPS is sensitive to the structure of surface layers, while stopped-flow etching permits the controlled removal of overlying material on a scale of atomic layers, to expose new surface layers as a function of thickness. Therefore, with careful analysis of observed intensities at measured depths, this combination of techniques provides depth resolution between 5 and 10 A. According to the obtained data there is intact SiO2 at the substrate interface. There appears to be a thin layer containing excess bonds to silicon on top of the SiO2.

Wurzbach, J. A.↗
NASA NTRS1975

Reaction of sulfur dioxide with modified 440C, studied by Auger electron spectroscopy and depth profiling

Auger electron spectroscopy and sputtering were used to study the interaction of SO2 with modified 440C, which is a nominally 77-wt%-Fe, 14-wt%-Cr, and 4-wt%-Mo bearing steel with C, S, Si, Ni, V, P, and Mn making up the balance. The sample was polycrystalline. Three temperatures were used: room temperature, 500 C, and 600 C. The reaction time was varied from 30 minutes to 2 hours. A surface cleaned of oxides was the starting point for each reaction. For reactions at 500 C, the major constituents Cr, O, Fe, and S were present in the surface film. At 600 C, the principal constituents of the film were Cr, O, and S with no Fe present. Therefore, a transition in film composition occurred between 500 and 600 C. Oxides were the primary constituents of the films at both temperatures. Room-temperature reactions indicated that SO2 adsorbed dissociatively, with approximately equal quantities of S and O on the surface. For the same reaction time (1 hr) and pressure, a strong temperature dependence of film thickness was observed. The film formed at 600 C was approximately seven times thicker than that formed at 500 C.

Ferrante, J.↗
NASA NTRS1974

Depth profiles of Mn-53 in lunar rocks and soils

Results of measurements of cosmic-ray-produced Mn-53 taken down the length of the Apollo 16 deep drill core are presented. They indicate that the lunar regolith has been unmixed, on a meter scale, for the past 5 million years at the location of this core. The data are in agreement with earlier Mn-53 measurements on the Apollo 15 drill core. Mn-53 activity profiles in 14310, 12002, and 14321 are compared to each other; all three rocks have probably been on the lunar surface long enough to saturate their solar cosmic-ray-produced Mn-53 (half-life = 3.7 m.y.) activity.

Imamura, M.↗
NASA NTRS1977

Depositional history of core section 74001 - Depth profiles of maturity, FeO, and metal

Samples from every 0.5-cm interval of soil in core section 74001 have been studied by ferromagnetic resonance (FMR) and magnetic techniques. The values of the FMR maturity index show that the 74001 samples are very immature (the index ranges from 0.14 to 0.29 units) and have not seen appreciable, if any, surface exposure since their deposition. In fact, the small amount of fine-grained metal in the 74001 samples is probably not acquired as a result of their exposure to the micrometeoroid flux at the lunar surface. Thus, the black-glass soil of 74001 was deposited very rapidly, probably in a single episode or several closely spaced episodes of lunar fire fountaining. The average concentration of FeO and its standard deviation for all the 74001 samples are 22.5 + or - 0.3 wt.%. Since the FeO concentration is so uniform, no large variations in the major-element chemistry of 74001 are expected, with the possible exception of the volatile elements. The concentration of coarse-grained metal, which is measured magnetically, and its standard deviation are 0.15 + or - 0.01 wt.%. The coarse-grained metal probably precipitated contemporaneously with the silicate and oxide phases in the black-glass droplets.

Morris, R. V.↗
NASA NTRS1984

Be-10 and Cl-36 depth profiles in an Apollo 15 drill core

The present study of galactic cosmic ray production profiles by means of tandem accelerator mass spectrometry has measured cosmic ray-produced Be-10 and Cl-36, whose half-attenuation lengths are respectively calculated to be 120 and 132 g/sq cm. The measured half-attenuation lengths for Be-10 are noted to be slightly longer than predicted by the Reedy-Arnold (1972) theoretical model. Secondary thermal neutron production from Cl-35 is invoked as an explanation for the flatter and deeper maximum seen in the Cl-36 profile.

Nishiizumi, K.↗
NASA NTRS1984

Al-26 depth profile in Apollo 15 drill core

Accelerator mass spectrometry is used in a study of galactic cosmic ray production profiles based on cosmic ray-produced Al-26 in the Apollo 15 long core. The results, which are in general agreement with earlier nondestructive counting data, are of significantly higher precision, yet systematically lower. The half-attenuation length for Al-26 production is presently calculated to be 122 g/sq cm, after normalizing the data to average chemical composition.

Nishiizumi, K.↗
NASA NTRS1984

A simple method of obtaining concentration depth-profiles from X-ray diffraction

The construction of composition profiles from X-ray intensity bands was investigated. The intensity band-to-composition profile transformation utilizes a solution which can be easily evaluated. The technique can be applied to thin films and thick speciments for which the variation of lattice parameters, linear absorption coefficient, and reflectivity with composition are known. A deconvolution scheme with corrections for the instrumental broadening and ak-alfadoublet is discussed.

Wiedemann, K. E.↗