X-ray based displacement and strain measurements for hostile environments
A completely new method of non-contacting, hostile environment displacement and strain measurement based on the focus and scanning of x-rays, has been developed and demonstrated. The new technique has the ability to overcome many of the limitations associated with available methods. The system is based on the focus and scanning of low energy, hard x-rays such as those emanating from table top copper or molybdenum sources. The x-rays are focused into a narrow and intense line image which can be swept onto targets that fluoresce secondary x-ray radiation. By monitoring the secondary radiation intensity and comparing it with the focused x-ray image's position as it is swept over the target edge, the position of the target edge relative to the focused image can be determined. The present system has a resolution of 0.5 micron, which has been shown to be limited by bearing backlash (or 'yaw' error) in the linear translation table. Its use has been demonstrated in the presence of an open flame with a resultant target temperature in excess of 2000 degrees Fahrenheit (1000 degrees Celsius). Strain measurements have been conducted in a laboratory environment at both room temperature and at a specimen temperature of 1300 degrees Fahrenheit, with an accuracy of within 20 microstrain (primarily a function of the 0.5 micron resolution limit). The main advantage of the technique lies in the penetrating, non-refractive nature of x-rays, which are virtually immune to the presence of refracting gas layers, smoke, flame or intense thermal radiation.