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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 37 records · Page 2
All sourcesNASA NTRSDOE OSTI
NASA NTRS2024

High Reliability at Minimum Cost

This paper investigates the minimum cost of improving the reliability of complex technical systems. The two major methods to improve reliability are redesigning the system for higher reliability or providing redundant components to replace failed elements. The costs of redesign for reliability or adding redundancy are estimated. The most cost-effective combination for high reliability can be identified. The cost of increasing the intrinsic reliability of a system can be modeled as cost proportional to 1/(system failure rate) a , where the exponent “a” measures the difficulty of increasing reliability. The “a” exponent can vary from 0.25 to about 2.5. Operational reliability can also be increased by using redundant systems. The failure rate for N parallel redundant units is (system failure rate) N . The cost of redundancy is N times the system cost. The total redundant system cost is proportional to N/(system failure rate) a . The cost of redundancy increases as N gets larger, but larger N allows a higher system failure rate, which reduces the system design cost. There is a certain N, a certain level of redundancy, that has the minimum cost to achieve the required overall redundant system failure rate. The minimum cost for the redundant system is achieved at the optimum level of redundancy. The N for minimum cost is equal to -a ln (redundant system failure rate). The minimum cost of the N redundant systems is proportional to N * (original system failure rate) a . The optimum redesigned individual system failure rate is proportional to exp (-1/a), so the greater the difficulty, the higher the optimum individual system failure rate. Increasing the intrinsic reliability of a system encounters diminishing returns and at some point it becomes more cost-effective to add redundancy. The difficulty of increasing intrinsic system reliability determines the optimum design for high reliability at minimum cost.

reliability↗
NASA NTRSDate not supplied

High Reliability at Minimum Cost

This paper investigates the minimum cost of improving the reliability of complex technical systems. The two major methods to improve reliability are redesigning the system for higher reliability or providing redundant components to replace failed elements. The costs of redesign for reliability or adding redundancy are estimated. The most cost-effective combination for high reliability can be identified. The cost of increasing the intrinsic reliability of a system can be modeled as cost proportional to 1/(system failure rate) a , where the exponent “a” measures the difficulty of increasing reliability. The “a” exponent can vary from 0.25 to about 2.5. Operational reliability can also be increased by using redundant systems. The failure rate for N parallel redundant units is (system failure rate) N . The cost of redundancy is N times the system cost. The total redundant system cost is proportional to N/(system failure rate) a . The cost of redundancy increases as N gets larger, but larger N allows a higher system failure rate, which reduces the system design cost. There is a certain N, a certain level of redundancy, that has the minimum cost to achieve the required overall redundant system failure rate. The minimum cost for the redundant system is achieved at the optimum level of redundancy. The N for minimum cost is equal to -a ln (redundant system failure rate). The minimum cost of the N redundant systems is proportional to N * (original system failure rate) a . The optimum redesigned individual system failure rate is proportional to exp (-1/a), so the greater the difficulty, the higher the optimum individual system failure rate. Increasing the intrinsic reliability of a system encounters diminishing returns and at some point it becomes more cost-effective to add redundancy. The difficulty of increasing intrinsic system reliability determines the optimum design for high reliability at minimum cost.

reliability↗
NASA NTRS1993

A dual output pressure, high reliability, long storage life gas delivery vessel assembly

A Gas Vessel Assembly has been developed that delivers purified, very low moisture content gas at two different output pressures. High pressure gas is delivered at up to 6,700 psi, and low pressure gas regulated to 130 psi is also delivered via a second outlet over a wide range of flow rates. The device is extremely lightweight (less than 1 lb) and compact, affords maximum mechanical integrity, high reliability (0.9999 at 95 percent confidence level), and offers extremely long storage life. Specialized design and fabrication techniques are employed that guarantee gas purity and negligible leakage for more than 20 years, in widely varying conditions of storage temperature, humidity, altitude, and vibration environments. The technology offers unique advantages in fast, high pressure discharge applications. For example, when combined with a cryostat, cryogenic temperatures can be achieved such as those used in missile seeker technology. The technology has many additional applications such as: emergency power sources for safety devices such as those needed in nuclear power plants, refineries, collision cushioning devices, superconductor cooling devices, emergency egress systems, miniature mechanical devices that employ gas bearings, and other areas where long storage, extremely high reliability and/or high energy density sources are required.

Maya, Isaac↗
NASA NTRS1992

Reliability prediction for a class of highly reliable digital systems

Three theorems which show that the reliability of a popular class of systems can be computed using small and simple models are presented. This class consists of systems that are assemblages of subsystems where each subsystem is a majority-voting threeplex plus spares or majority-voting fourplex plus spares. The theorems are error bounds for model reduction and simplification. The error bounds are given in terms of readily available system parameters. The three theorems have been applied to a system that has been used as an example that generates extremely large reliability models; the system considered is one version of AIPS (Advanced Information Processing System) for IAPSA (Integrated Airframe Propulsion System Architecture).

White, Allan L.↗
NASA NTRS1987

A latent fault Markov model for a highly reliable triplex computer system

A Markov model of a highly reliable triplex system was constructed to evaluate the probability of system failure as a function of the propagation of latent faults. It is found that if the propagation rate of latent faults is extremely high, they do not significantly affect the probability of system failure, while if the propagation rate is extremely low, the survivability of the system is improved. The propagation rate that is most harmful to the survivability of the system is determined as a function of the duration of the flight. A decrease in the probability of system failure due to latency is noted if the probability of any two faults giving the same output is extremely low.

Swern, Frederic L.↗
NASA NTRS1988

Validation of highly reliable, real-time knowledge-based systems

Knowledge-based systems have the potential to greatly increase the capabilities of future aircraft and spacecraft and to significantly reduce support manpower needed for the space station and other space missions. However, a credible validation methodology must be developed before knowledge-based systems can be used for life- or mission-critical applications. Experience with conventional software has shown that the use of good software engineering techniques and static analysis tools can greatly reduce the time needed for testing and simulation of a system. Since exhaustive testing is infeasible, reliability must be built into the software during the design and implementation phases. Unfortunately, many of the software engineering techniques and tools used for conventional software are of little use in the development of knowledge-based systems. Therefore, research at Langley is focused on developing a set of guidelines, methods, and prototype validation tools for building highly reliable, knowledge-based systems. The use of a comprehensive methodology for building highly reliable, knowledge-based systems should significantly decrease the time needed for testing and simulation. A proven record of delivering reliable systems at the beginning of the highly visible testing and simulation phases is crucial to the acceptance of knowledge-based systems in critical applications.

Johnson, Sally C.↗
NASA NTRS1972

Techniques for generating highly reliable redundant systems.

A simple heuristic algorithm for designing highly reliable modularly redundant computer systems under complexity constraints is presented. The technique, which produces near optimal solutions, is intuitively appealing and easy to apply. The algorithms performance is shown to compare very well with the optimal solution obtained via a computerized model for dynamic programming.

White, J. B.↗
NASA NTRS1973

Modeling of a bubble-memory organization with self-checking translators to achieve high reliability.

Study of the design and modeling of a highly reliable bubble-memory system that has the capabilities of: (1) correcting a single 16-adjacent bit-group error resulting from failures in a single basic storage module (BSM), and (2) detecting with a probability greater than 0.99 any double errors resulting from failures in BSM's. The results of the study justify the design philosophy adopted of employing memory data encoding and a translator to correct single group errors and detect double group errors to enhance the overall system reliability.

Bouricius, W. G.↗
NASA NTRS1974

New development in high reliability strapdown platforms using TDF sensors

New development in high reliability strapdown navigation platform using two-degree-of-freedom sensors and redundancy concept is presented in this paper. The development is based on the assumption that each axis of the sensor can fail without affecting the remaining axis. The systems reliability is investigated, the optimum redundancy configurations are proposed, a technique of sensor performance management is developed for the proposed systems.

Tsuei, Y. D.↗
NASA NTRS2015

Reliability and Failure in NASA Missions: Blunders, Normal Accidents, High Reliability, Bad Luck

NASA emphasizes crew safety and system reliability but several unfortunate failures have occurred. The Apollo 1 fire was mistakenly unanticipated. After that tragedy, the Apollo program gave much more attention to safety. The Challenger accident revealed that NASA had neglected safety and that management underestimated the high risk of shuttle. Probabilistic Risk Assessment was adopted to provide more accurate failure probabilities for shuttle and other missions. NASA's "faster, better, cheaper" initiative and government procurement reform led to deliberately dismantling traditional reliability engineering. The Columbia tragedy and Mars mission failures followed. Failures can be attributed to blunders, normal accidents, or bad luck. Achieving high reliability is difficult but possible.

accidents↗
NASA NTRS2022

Statistical Distribution of Gear Surface Fatigue Lives at High Reliability

The reliability of gears is important for a wide variety of applications, and the gearing community has a desire for better prediction of fatigue life at very high reliability. To improve predictions, a set of 950 NASA-conducted gear surface fatigue test results were gathered, pooled together using the general standardized Weibull variate, and then fit to a Weibull three-parameter distribution. An iterative fitting method was developed and then applied to the gear fatigue data to determine the values of the distribution parameters. Additional analyses were done using bearing and gear data that demonstrate a trend of increasing minimum life coefficient as correlated to the timeframe of the fatigue testing, and material cleanliness is proposed as a primary explanation for such correlation. It is noted that this observed trend supports published findings from analytical modeling and experimental studies that improvements to material cleanliness improves minimum fatigue life. Further use and study of the three-parameter Weibull distribution is recommended as a tool to quantify fatigue life most accurately in the high reliability regime.

gear↗
NASA NTRS1977

Standard high-reliability integrated circuit logic packaging

A family of standard, high-reliability hardware used for packaging digital integrated circuits is described. The design transition from early prototypes to production hardware is covered and future plans are discussed. Interconnections techniques are described as well as connectors and related hardware available at both the microcircuit packaging and main-frame level. General applications information is also provided.

Slaughter, D. W.↗