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At least 37 records · Page 2

Proceedings from the 2nd International Symposium on Formation Flying Missions and Technologies

Topics discussed include: The Stellar Imager (SI) "Vision Mission"; First Formation Flying Demonstration Mission Including on Flight Nulling; Formation Flying X-ray Telescope in L2 Orbit; SPECS: The Kilometer-baseline Far-IR Interferometer in NASA's Space Science Roadmap Presentation; A Tight Formation for Along-track SAR Interferometry; Realization of the Solar Power Satellite using the Formation Flying Solar Reflector; SIMBOL-X : Formation Flying for High-Energy Astrophysics; High Precision Optical Metrology for DARWIN; Close Formation Flight of Micro-Satellites for SAR Interferometry; Station-Keeping Requirements for Astronomical Imaging with Constellations of Free-Flying Collectors; Closed-Loop Control of Formation Flying Satellites; Formation Control for the MAXIM Mission; Precision Formation Keeping at L2 Using the Autonomous Formation Flying Sensor; Robust Control of Multiple Spacecraft Formation Flying; Virtual Rigid Body (VRB) Satellite Formation Control: Stable Mode-Switching and Cross-Coupling; Electromagnetic Formation Flight (EMFF) System Design, Mission Capabilities, and Testbed Development; Navigation Algorithms for Formation Flying Missions; Use of Formation Flying Small Satellites Incorporating OISL's in a Tandem Cluster Mission; Semimajor Axis Estimation Strategies; Relative Attitude Determination of Earth Orbiting Formations Using GPS Receivers; Analysis of Formation Flying in Eccentric Orbits Using Linearized Equations of Relative Motion; Conservative Analytical Collision Probabilities for Orbital Formation Flying; Equations of Motion and Stability of Two Spacecraft in Formation at the Earth/Moon Triangular Libration Points; Formations Near the Libration Points: Design Strategies Using Natural and Non-Natural Ares; An Overview of the Formation and Attitude Control System for the Terrestrial Planet Finder Formation Flying Interferometer; GVE-Based Dynamics and Control for Formation Flying Spacecraft; GNC System Design for a New Concept of X-Ray Distributed Telescope; GNC System for the Deployment and Fine Control of the DARWIN Free-Flying Interferometer; Formation Algorithm and Simulation Testbed; and PLATFORM: A Formation Flying, RvD and Robotic Validation Test-bench.

Source record↗

Estimation of Cyclic Error Due to Scattering in the Internal OPD Metrology of the Space Interferometry Mission

A common-path laser heterodyne interferometer capable of measuring the internal optical path difference (OPD) with accuracy of the order of 10 pm was demonstrated at JPL. To achieve this accuracy, the relative power received by the detector that is contributed by the scattering of light at the optical surfaces should be less than -97 dB. A method has been developed to estimate the cyclic error caused by the scattering of the optical surfaces. The result of the analysis is presented.

scattering↗

Novel Wide Field-of-view Laser Retroreflector for the Space Interferometry Mission

A new type of laser retroreflector has been developed for JPL's future Space Interferometry Mission. The retroreflector consists of an assembly of prisms to form multiple hollow cornercubes. This way the limited field of view (FOV) of about 60deg of a single corner can be overcome, to comply with the geometry of an optical truss.

interferometry↗

Optical path control in the MAM testbed

The Micro-Arcsecond Metrology (MAM) experiment is one of a family of ground-based testbeds that will demonstrate critical technologies for SIM, the Space Interferometry Mission.

optical interferometers optical path MAM testbed M↗

Laser System for Precise, Unambiguous Range Measurements

The Modulation Sideband Technology for Absolute Range (MSTAR) architecture is the basis of design of a proposed laser-based heterodyne interferometer that could measure a range (distance) as great as 100 km with a precision and resolution of the order of 1 nm. Simple optical interferometers can measure changes in range with nanometer resolution, but cannot measure range itself because interference is subject to the well-known integer-multiple-of-2 -radians phase ambiguity, which amounts to a range ambiguity of the order of 1 m at typical laser wavelengths. Existing rangefinders have a resolution of the order of 10 m and are therefore unable to resolve the ambiguity. The proposed MSTAR architecture bridges the gap, enabling nanometer resolution with an ambiguity range that can be extended to arbitrarily large distances. The MSTAR architecture combines the principle of the heterodyne interferometer with the principle of extending the ambiguity range of an interferometer by using light of two wavelengths. The use of two wavelengths for this purpose is well established in optical metrology, radar, and sonar. However, unlike in traditional two-color laser interferometry, light of two wavelengths would not be generated by two lasers. Instead, multiple wavelengths would be generated as sidebands of phase modulation of the light from a single frequency- stabilized laser. The phase modulation would be effected by applying sinusoidal signals of suitable frequencies (typically tens of gigahertz) to high-speed electro-optical phase modulators. Intensity modulation can also be used

Dubovitsky, Serge↗

Error Modeling of Multi-baseline Optical Truss: Application to SIM Metrology Truss Field Dependent Error - Part II

The current design of the Space Interferometry Mission (SIM) employs a 19 laser-metrology-beam system (also called L19 external metrology truss) to monitor changes of distances between the fiducials of the flight system's multiple baselines. The function of the external metrology truss is to aid in the determination of the time-variations of the interferometer baseline. The largest contributor to truss error occurs in SIM wide-angle observations when the articulation of the siderostat mirrors (in order to gather starlight from different sky coordinates) brings to light systematic errors due to offsets at levels of instrument components (which include comer cube retro-reflectors, etc.). This error is labeled external metrology wide-angle field-dependent error. Physics-based model of field-dependent error at single metrology gauge level is developed and linearly propagated to errors in interferometer delay. In this manner delay error sensitivity to various error parameters or their combination can be studied using eigenvalue/eigenvector analysis. Also validation of physics-based field-dependent model on SIM testbed lends support to the present approach. As a first example, dihedral error model is developed for the comer cubes (CC) attached to the siderostat mirrors. Then the delay errors due to this effect can be characterized using the eigenvectors of composite CC dihedral error. The essence of the linear error model is contained in an error-mapping matrix. A corresponding Zernike component matrix approach is developed in parallel, first for convenience of describing the RMS of errors across the field-of-regard (FOR), and second for convenience of combining with additional models. Average and worst case residual errors are computed when various orders of field-dependent terms are removed from the delay error. Results of the residual errors are important in arriving at external metrology system component requirements. Double CCs with ideally co-incident vertices reside with the siderostat. The non-common vertex error (NCVE) is treated as a second example. Finally combination of models, and various other errors are discussed.

comer cube retro-reflector↗

White Light Modeling, Algorithm Development, and Validation on the Micro-arcsecond Metrology Testbed

The Space Interferometry Mission (SIM) scheduled for launch in early 2010, is an optical interferometer that will perform narrow angle and global wide angle astrometry with unprecedented accuracy, providing differential position accuracies of 1uas, and 4uas global accuracies in position, proper motion and parallax. The astrometric observations of the SIM instrument are performed via delay measurements provided by three Michelson-type, white light interferometers. Two 'guide' interferometers acquire fringes on bright guide stars in order to make highly precise measurements of variations in spacecraft attitude, while the third interferometer performs the science measurement. SIM derives its performance from a combination of precise fringe measurements of the interfered starlight (a few ten-thousandths of a wave) and very precise (tens of picometers) relative distance measurements made between a set of fiducials. The focus of the present paper is on the development and analysis of algorithms for accurate white light estimation, and on validating some of these algorithms on the MicroArcsecond Testbed.

metrology↗

White light modeling, algorithm development, and validation on the micro-arcsecond metrology testbed

The Space Interferometry Mission (SIM), scheduled for launch in early 2010, is an optical interferometer that will perform narrow angle and global wide angle astrometry with unprecedented accuracy, providing differential position accuracies of 1uas, and 4uas global accuracies in position, proper motion and parallax. SIM astrometric measurements are synthesized from pathlength delay measurements provided by three Michelson-type, white light interferometers. Two of the interferometers are used for making precise measurements of variations in the spacecraft attitude, while the third interferometer performs the science measurement. The ultimate performance of SIM relies on a combination of precise fringe measurements of the interfered starlight with picometer class relative distance measurements made between a set of fiducials that define the interferometer baseline vectors. The focus of the present paper is on the development and analysis of algorithms for accurate white light fringe estimation, and on the preliminary validation of these algorithms on the Micro-Arcsecond Testbed (MAM).

Shen, Janice TsaePyng↗

Optical monitoring of protein crystal growth

The possibility of using various optical techniques for detecting the onset of nucleation in protein crystal growth was investigated. Direct microscopy, general metrologic techniques, light scattering, ultraviolet absorption, and interferometry are addressed along with techniques for determining pH value. The necessity for collecting basic data on the optical properties of the growth solution as a prerequisite to the evaluation of monitoring techniques is pointed out.

Choudry, A.↗

Nano-Newton Electrostatic Force Actuators for Femto-Newton-Sensitive Measurements: System Performance Test in the LISA Pathfinder Mission

Electrostatic force actuation is a key component of the system of geodesic reference test masses (TM) for the LISA orbiting gravitational wave observatory and in particular for performance at low frequencies, below 1 mHz, where the observatory sensitivity is limited by stray force noise. The system needs to apply forces of order 10 −9 N while limiting fluctuations in the measurement band to levels approaching 10 −15 N=Hz 1/2 . We present here the LISA actuation system design, based on audio-frequency voltage carrier signals, and results of its in-flight performance test with the LISA Pathfinder test mission. In LISA, TM force actuation is used to align the otherwise free-falling TM to the spacecraft-mounted optical metrology system, without any forcing along the critical gravitational wave-sensitive interferometry axes. In LISA Pathfinder, on the other hand, the actuation was used also to stabilize the TM along the critical x axis joining the two TM, with the commanded actuation force entering directly into the mission’s main differential acceleration science observable. The mission allowed demonstration of the full compatibility of the electrostatic actuation system with the LISA observatory requirements, including dedicated measurement campaigns to amplify, isolate, and quantify the two main force noise contributions from the actuation system, from actuator gain noise and from low frequency “in band” voltage fluctuations. These campaigns have shown actuation force noise to be a relevant, but not dominant, noise source in LISA Pathfinder and have allowed performance projections for the conditions expected in the LISA mission.

M. Armanos↗

Technology for Space Optical Interferometry

Optical interferometers are expected to provide the next great leap forward in space based astronomy beyond the Hubble Space Telescope. Various systems are envisioned, ranging from large orbiting structures to lunar based facilities to separated spacecraft flying in formation. Regardless of the specific architecture, these systems will present unprecedented challenges in the measurement and control of optical surfaces, hence driving the technological state-of-the-art in the areas of laser metrology and alignment and stabilization of optomechanical systems.

interferometry↗

Results from SIM's Thermo-Opto-Mechanical (TOM3) Testbed

Future space-based optical interferometers, such as the Space Interferometer Mission Planet Quest (SIM), require thermal stability of the optical wavefront to the level of picometers in order to produce astrometric data at the micro-arc-second level. In SIM, the internal path of the interferometer will be measured with a small metrology beam whereas the starlight fringe position is estimated from a large concentric annular beam. To achieve the micro-arc-second observation goal for SIM, it is necessary to maintain the optical path difference between the central and the outer annulus portions of the wavefront of the front-end telescope optics to a few tens of picometers. The Thermo-Opto-Mecha nical testbed (TOM3) was developed at the Jet Propulsion Laboratory to measure thermally induced optical deformations of a full-size flight-like beam compressor and siderostat, the two largest optics on SIM, in flight-like thermal environments. A Common Path Heterodyne Interferometer (COPHI) developed at JPL was used for the fine optical path difference measurement as the metrology sensor. The system was integrated inside a large vacuum chamber in order to mitigate the atmospheric and thermal disturbances. The siderostat was installed in a temperature-controlled thermal shroud inside the vacuum chamber, creating a flight-like thermal environment. Detailed thermal and structural models of the test articles (siderostat and compressor) were also developed for model prediction and correlation of the thermal deformations. Experimental data shows SIM required thermal stability of the test articles and good agreement with the model predictions.

interferometry↗

Development Towards a Space Qualified Laser Stabilization System in Support of Space-Based Optical Interferometers

We report on the development, functional performance and space-qualification status of a laser stabilization system supporting a space-based metrology source used to measure changes in optical path lengths in space-based stellar interferometers. The Space Interferometry Mission (SIM) and Deep Space 3 (DS-3) are two missions currently funded by the National Aeronautics and Space Administration (NASA) that are space-based optical interferometers. In order to properly recombine the starlight received at each telescope of the interferometer it is necessary to perform high resolution laser metrology to stabilize the interferometer. A potentially significant error source in performing high resolution metrology length measurements is the potential for fluctuations in the laser gauge itself. If the laser frequency or wavelength is changing over time it will be misinterpreted as a length change in one of the legs of the interferometer. An analysis of the frequency stability requirement for SIM resulted in a fractional frequency stability requirement of square root (S(sub y)(f)) = <2 x 10(exp -12)/square root(Hz) at Fourier frequencies between 10 Hz and 1000 Hz. The DS-3 mission stability requirement is further increased to square root (S(sub y)(f)) = <5 x 10(exp -14)/Square root(Hz) at Fourier frequencies between 0.2 Hz and 10 kHz with a goal of extending the low frequency range to 0.05 Hz. The free running performance of the Lightwave Electronics NPRO lasers, which are the baseline laser for both SIM and DS-3 vary in stability and we have measured them to perform as follows (9 x l0(exp -11)/ f(Hz))(Hz)/square root(Hz)) = <( square root (S(sub y)(f)) = <(1.3 x l0(exp -8)/ f(Hz))/Square root(Hz). In order to improve the frequency stability of the laser we stabilize the laser to a high finesse optical cavity by locking the optical frequency of the laser to one of the transmission modes of the cavity. At JPL we have built a prototype space-qualifiable system meeting the stability requirements of SIM, which has been delivered to one of the SIM testbeds. We have also started on the development of a system to meet the stability needs of DS-3.

Seidel, David J.↗

Metrology of Large Parts

As discussed in the first chapter of this book, there are many different methods to measure a part using optical technology. Chapter 2 discussed the use of machine vision to measure macroscopic features such as length and position, which was extended to the use of interferometry as a linear measurement tool in chapter 3, and laser or other trackers to find the relation of key points on large parts in chapter 4. This chapter looks at measuring large parts to optical tolerances in the sub-micron range using interferometry, ranging, and optical tools discussed in the previous chapters. The purpose of this chapter is not to discuss specific metrology tools (such as interferometers or gauges), but to describe a systems engineering approach to testing large parts. Issues such as material warpage and temperature drifts that may be insignificant when measuring a part to micron levels under a microscope, as will be discussed in later chapters, can prove to be very important when making the same measurement over a larger part. In this chapter, we will define a set of guiding principles for successfully overcoming these challenges and illustrate the application of these principles with real world examples. While these examples are drawn from specific large optical testing applications, they inform the problems associated with testing any large part to optical tolerances. Manufacturing today relies on micrometer level part performance. Fields such as energy and transportation are demanding higher tolerances to provide increased efficiencies and fuel savings. By looking at how the optics industry approaches sub-micrometer metrology, one can gain a better understanding of the metrology challenges for any larger part specified to micrometer tolerances. Testing large parts, whether optical components or precision structures, to optical tolerances is just like testing small parts, only harder. Identical with what one does for small parts, a metrologist tests large parts and optics in particular to quantify their mechanical properties (such as dimensions, mass, etc); their optical prescription or design (i.e. radius of curvature, conic constant, vertex location, size); and their full part shape. And, just as with small parts, a metrologist accomplishes these tests using distance measuring instruments such as tape measures, inside micrometers, coordinate measuring machines, distance measuring interferometers; angle measuring instruments such as theodolites, autocollimators; and surface measuring instruments including interferometers, stylus profilers, interference microscopes, photogrammetric cameras, or other tools. However, while the methodology may be similar, it is more difficult to test a large object for the simple reason that most metrologists do not have the necessary intuition. The skills used to test small parts or optics in a laboratory do not extrapolate to testing large parts in an industrial setting any more than a backyard gardener might successfully operate a farm. But first, what is a large part? A simple definition might be the part's size or diameter. For optics and diffuse surface parts alike, the driving constraint is ability to illuminate the part's surface. For reflective convex mirrors, large is typically anything greater than 1 meter. But, for refractive optics, flats or convex mirrors, large is typically greater than 0.5 meter. While a size definition is simple, it may be less than universal. A more nuanced definition might be that a large part is any component which cannot be easily tested in a standard laboratory environment, on a standard vibration isolated table using standard laboratory infrastructure. A micro-switch or a precision lens might be easily measured to nanometer levels under a microscope in a lab, but a power turbine spline or a larger telescope mirror will not fit under that microscope and may not even fit on the table.

Stahl, H. Philip↗

Wavefront Sensing Analysis of Grazing Incidence Optical Systems

Wavefront sensing is a process by which optical system errors are deduced from the aberrations in the image of an ideal source. The method has been used successfully in near-normal incidence, but not for grazing incidence systems. This innovation highlights the ability to examine out-of-focus images from grazing incidence telescopes (typically operating in the x-ray wavelengths, but integrated using optical wavelengths) and determine the lower-order deformations. This is important because as a metrology tool, this method would allow the integration of high angular resolution optics without the use of normal incidence interferometry, which requires direct access to the front surface of each mirror. Measuring the surface figure of mirror segments in a highly nested x-ray telescope mirror assembly is difficult due to the tight packing of elements and blockage of all but the innermost elements to normal incidence light. While this can be done on an individual basis in a metrology mount, once the element is installed and permanently bonded into the assembly, it is impossible to verify the figure of each element and ensure that the necessary imaging quality will be maintained. By examining on-axis images of an ideal point source, one can gauge the low-order figure errors of individual elements, even when integrated into an assembly. This technique is known as wavefront sensing (WFS). By shining collimated light down the optical axis of the telescope and looking at out-of-focus images, the blur due to low-order figure errors of individual elements can be seen, and the figure error necessary to produce that blur can be calculated. The method avoids the problem of requiring normal incidence access to the surface of each mirror segment. Mirror figure errors span a wide range of spatial frequencies, from the lowest-order bending to the highest order micro-roughness. While all of these can be measured in normal incidence, only the lowest-order contributors can be determined through this WFS technique.

Rohrbach, Scott↗

Wide angle astrometric demonstration on the micro-arcsecond metrology testbed for the space interferometry mission

The Space Interferometry Mission (SIM) requires fringe measurements to the level of picometers in order to produce astrometric data at the micro-arc-second level. To be more specific, it is necessary to measure both the position of the starlight central fringe and the change in the internal optical path of the interferometer to a few hundreds of picometers. The internal path is measured with a small heterodyne metrology beam, whereas the starlight fringe position is estimated with a CCD sampling a large concentric annular beam. One major challenge for SIM is to align the metrology beam with the starlight beam to keep the consistency between these two sensors at the system level while articulating the instrument optics over the field of view.

metrology↗