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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 37 records · Page 2
All sourcesNASA NTRSDOE OSTI
DOE OSTI2021

A Systems Approach to Estimating the Uncertainty Limits of X-Ray Radiographic Metrology

Micro- and nanomanufacturing capabilities have rapidly expanded over the past decade to include complex three-dimensional (3D) structure fabrication; however, the metrology required to accurately assess these processes via part inspection and characterization has struggled to keep pace. X-ray computed tomography (CT) is considered an ideal candidate for providing the critically needed metrology on the smallest scales, especially internal features, or inaccessible regions. X-ray CT supporting micro- and nanomanufacturing often push against the poorly understood resolution and variation limits inherent to the machines, which can distort or hide fine structures. In this study, we have developed and experimentally verify a comprehensive analytical uncertainty propagation signal variation flow graph (SVFG) model for X-ray radiography in this work to better understand resolution and image variability limits on the small scale. The SVFG approach captures, quantifies, and predicts variations occurring in the system that limit metrology capabilities, particularly in the micro/nanodomain. This work is the first step to achieving full uncertainty modeling of CT reconstructions and provides insight into improving X-ray attenuation imaging systems. The SVFG methodology framework is applied to generate a complete basis set of functions describing the major sources of variation in radiographs. Five models are identified, covering variation in energy, intensity, length, blur, and position. Radiographic system experiments are defined to measure the parameters required by the SVFGs. Best practices are identified for these measurements. The SVFG models are confirmed via direct measurement of variation to predict variation within 30% on average.

47 OTHER INSTRUMENTATION↗
DOE OSTI2020

Correlation approach for quality assurance of additive manufactured parts based on optical metrology

Surface topography and surface finish are two significant factors for evaluating the quality of products in additive manufacturing (AM). AM parts are fabricated layer by layer, which is quite different from traditional formative or subtractive methods. Despite rapid progress in additive manufacturing and associated optical metrology for quality control and in-situ monitoring, limited research has been conducted to investigate the reliability of 3D surface measurement data. The surface topologies scanned by multiple optical systems demonstrated significant differences due to varying sampling mechanisms, resolutions, system noises, etc. The 3D datasets should be trustworthy in order to extract parameters for quality assurance or feedback control from 3D surface measurements. In this paper, we set up new standards to evaluate the reliability of 3D surface measurement data and analyze the variation in the topographical profile. In this study, two non-contact optical methods based on Focus Variation Microscopy (FVM) and Structured Light System (SLS) were adopted to measure the surface topography of the target components. The two optical metrology systems generated two entirely different point cloud datasets. Statistical methods were applied to test the difference between the data obtained from the two systems. By using a data analytics approach for comparison, it was found that the surface roughness estimated from the point cloud data sets of FVM and SLS has no significant difference, though the point cloud data sets were completely different. This paper provides standard validation approach to evaluate the plausibility of metrology data from in-situ real-time surface analysis for process planning of AM.

36 MATERIALS SCIENCE↗
DOE OSTI2021

Moiré metrology of energy landscapes in van der Waals heterostructures

The emerging field of twistronics, which harnesses the twist angle between two-dimensional materials, represents a promising route for the design of quantum materials, as the twist-angle-induced superlattices offer means to control topology and strong correlations. At the small twist limit, and particularly under strain, as atomic relaxation prevails, the emergent moiré superlattice encodes elusive insights into the local interlayer interaction. Here we introduce moiré metrology as a combined experiment-theory framework to probe the stacking energy landscape of bilayer structures at the 0.1 meV/atom scale, outperforming the gold-standard of quantum chemistry. Through studying the shapes of moiré domains with numerous nano-imaging techniques, and correlating with multi-scale modelling, we assess and refine first-principle models for the interlayer interaction. We document the prowess of moiré metrology for three representative twisted systems: bilayer graphene, double bilayer graphene and H-stacked MoSe 2 /WSe 2 . Moiré metrology establishes sought after experimental benchmarks for interlayer interaction, thus enabling accurate modelling of twisted multilayers.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DOE OSTI2025

Ground Truth for CSP Mirror Metrology (Full-Length)

The high optical accuracy required for concentrating solar power (CSP) systems in turn requires accurate metrology to assess mirror optical parameters during design, manufacturing, and operation. To meet this need, researchers have developed a variety of CSP optical metrology systems, which include complex calculations and calibration terms. This raises the question: How do we know these methods’ accuracy? One approach is to compare metrology system measurements against a ground truth reference.

14 SOLAR ENERGY↗
DOE OSTI2026

Low-Temperature Plasma-Based Metrology of Lithium-Ion Battery Electrode Materials (CRADA Final Report)

As part of the Cyclotron Road program, SirenOpt Inc. evaluated its low-temperature plasma-based metrology sensor prototype for measuring multiple critical properties of lithium-ion battery electrode materials in parallel and in real-time. Cost-effective, minimal-waste manufacturing of high-performance battery electrode materials will be vital for achieving society’s net-zero carbon emission goals. Because existing electrode metrology sensors cannot operate within most sections of manufacturing lines, manufacturers often complete hundreds of processing steps before they can test their products and detect problems. When manufacturers perform these offline tests, they typically only test a small portion of the manufactured products. Current electrode manufacturing thus often yields many low-quality products, or off-spec products that must be thrown away all together. For example, at least 6% of the total lithium-ion battery manufacturing cost (i.e., over $250 million/year for the average gigafactory) is devoted to processing defective electrodes that are not scrapped until performance tests are failed during late-stage quality control checks. Electrode variability also leads manufacturers to build extra cells into battery packs to reduce the risk of poor performance. For example, many electric vehicle (EV) manufacturers include up to 10% more cells than needed, which substantially increases the cost and weight of the final EV product. The SirenOpt sensor can potentially enable early detection of poorly manufactured electrodes and allow them to be removed earlier from manufacturing lines, which can save battery manufacturers (hundreds of) millions of dollars per year. The sensor can further be used to improve product quality by accelerating R&D and process optimization, improving quality control, and enabling real-time process control. Overall, a real-time, in-situ metrology strategy can create unprecedented opportunities for implementation of smart manufacturing practices and advanced quality and process control solutions to realize higher battery electrode throughput and performance.

25 ENERGY STORAGE↗
DOE OSTI2024

In situ Synchrotron X‐ray Metrology Boosted by Automated Data Analysis for Real‐time Monitoring of Cathode Calcination

Abstract Synchrotron X‐ray‐based in situ metrology is advantageous for monitoring the synthesis of battery materials, offering high throughput, high spatial and temporal resolution, and chemical sensitivity. However, the rapid generation of massive data poses a challenge to on‐site, on‐the‐fly analysis needed for real‐time process monitoring. Here, a weighted lagged cross‐correlation (WLCC) similarity approach is presented for automated data analysis, which merges with in situ synchrotron X‐ray diffraction metrology to monitor the calcination process of the archetypal nickel‐based cathode, LiNiO 2 . The WLCC approach, incorporating variables that account for peak shifts and width changes associated with structural transformations, enables rapid extraction of phase progression within 10 seconds from tens of diffraction patterns. Details are captured, from initial precursors to intermediates and the final layered LiNiO 2 , providing information for agile on‐site adjustments during experiments and complementing post hoc diffraction analysis by offering insights into early‐stage phase nucleation and growth. Expanding this data‐powered platform paves the way for real time calcination process monitoring and control, which is pivotal to quality control in battery cathode manufacturing.

36 MATERIALS SCIENCE↗
DOE OSTI2024

Variational quantum state preparation for quantum-enhanced metrology in noisy systems

Here, we investigate optimized quantum state preparation for quantum metrology applications in noisy environments. Using the QFI-OPT package, we simulate a low-depth variational quantum circuit (VQC) composed of a sequence of global rotations and entangling operations applied to a chain of qubits that are subject to dephasing noise. The parameters controlling the VQC are numerically optimized to maximize the quantum Fisher information, which characterizes the ultimate metrological sensitivity of a quantum state with respect to a global rotation. We find that, regardless of the details of the entangling operation implemented in the VQC, the optimal quantum states can be broadly classified into a trio of qualitative regimes, i.e., catlike, squeezed like, and product states, associated with different dephasing rates. Our findings are relevant for designing optimal state-preparation strategies for next-generation quantum sensors exploiting entanglement, such as time and frequency standards and magnetometers, aimed at achieving state-of-the-art performance in the presence of noise and decoherence.

quantum Fisher information↗
DOE OSTI2025

Universal time scalings of sensitivity in Markovian quantum metrology

Assuming Markovian time evolution of a quantum sensing system, we study the general characterization of the optimal sensitivity scalings with time, under most general quantum control protocols. We allow the estimated parameter to influence both the Hamiltonian as well as the dissipative part of the quantum master equation and focus on the asymptotic-time along with the short-time sensitivity scalings. We find that via simple algebraic conditions (in terms of the Hamiltonian, the jump operators as well as their parameter derivatives), one can characterize the four classes of metrological models that represent: quadratic-linear, quadratic-quadratic, linear-linear, and linear-quadratic time scalings. We also investigate the relevant time scales on which the transition between the two regimes appears. Additionally, we provide universal numerical methods to obtain quantitative bounds on sensitivity that are the tightest that exist in the literature. Simplicity and universality of our results make it suitable for diverse applications in quantum metrology.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DOE OSTI2021

EUV and Hard X-ray Hartmann Wavefront Sensing for Optical Metrology, Alignment and Phase Imaging

For more than 15 years, Imagine Optic have developed Extreme Ultra Violet (EUV) and X-ray Hartmann wavefront sensors for metrology and imaging applications. These sensors are compatible with a wide range of X-ray sources: from synchrotrons, Free Electron Lasers, laser-driven betatron and plasma-based EUV lasers to High Harmonic Generation. In this paper, we first describe the principle of a Hartmann sensor and give some key parameters to design a high-performance sensor. We also present different applications from metrology (for manual or automatic alignment of optics), to soft X-ray source optimization and X-ray imaging.

20 metrology↗
DOE OSTI2023

AGR 5/6/7 Disassembly and Metrology

AGR 5/6/7 Disassembly and Metrology background, disassembly obervations on graphite holders and fuel compacts, metrology fuel compacts and graphite holders, and summary.

11 NUCLEAR FUEL CYCLE AND FUEL MATERIALS↗
DOE OSTI2020

Adapting the Electron Beam from SEM as a Quantitative Heating Source for Nanoscale Thermal Metrology

The electron beam (e-beam) in the scanning electron microscopy (SEM) provides an appealing mobile heating source for thermal metrology with spatial resolution of ~1 nm, but the lack of systematic quantification of the e-beam heating power limits such application development. Here, we systemically study e-beam heating in LPCVD silicon nitride (SiN x ) thin-films with thickness ranging from 200 to 500 nm from both experiments and complementary Monte Carlo simulations using the CASINO software package. There is good agreement about the thickness-dependent e-beam energy absorption of thin-film between modeling predictions and experiments. Using the absorption results, we then demonstrate adapting the e-beam as a quantitative heating source by measuring the thickness-dependent thermal conductivity of SiN x thin-films, with the results validated to within 7% by a separate Joule heating experiment. The results described here will open a new avenue for using SEM e-beams as a mobile heating source for advanced nanoscale thermal metrology development.

42 ENGINEERING↗
DOE OSTI2022

Preparation of metrological states in dipolar-interacting spin systems

Abstract Spin systems are an attractive candidate for quantum-enhanced metrology. Here we develop a variational method to generate metrological states in small dipolar-interacting spin ensembles with limited qubit control. For both regular and disordered spatial spin configurations the generated states enable sensing beyond the standard quantum limit (SQL) and, for small spin numbers, approach the Heisenberg limit (HL). Depending on the circuit depth and the level of readout noise, the resulting states resemble Greenberger-Horne-Zeilinger (GHZ) states or Spin Squeezed States (SSS). Sensing beyond the SQL holds in the presence of finite spin polarization and a non-Markovian noise environment. The developed black-box optimization techniques for small spin numbers ( N ≤ 10) are directly applicable to diamond-based nanoscale field sensing, where the sensor size limits N and conventional squeezing approaches fail.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DOE OSTI2020

Phase estimation algorithm for the multibeam optical metrology

Unitary Fourier transform lies at the core of the multitudinous computational and metrological algorithms. Here we show experimentally how the unitary Fourier transform-based phase estimation protocol, used namely in quantum metrology, can be translated into the classical linear optical framework. The developed setup made of beam splitters, mirrors and phase shifters demonstrates how the classical coherence, similarly to the quantum coherence, poses a resource for obtaining information about the measurable physical quantities. Our study opens route to the reliable implementation of the small-scale unitary algorithms on path-encoded qudits, thus establishing an easily accessible platform for unitary computation.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DOE OSTI2025

Mechanical design of a parallel flexure-based RADSI instrument for curved x-ray mirror metrology

Modern synchrotron x-ray beamlines demand reflective optics with higher surface profile accuracy to achieve diffraction-limited focusing. This necessitates advanced metrology instruments capable of delivering repeatable measurements in the nanometer to sub-nanometer range. Slope ranges exceeding 15 mrad (0.86°) and greater pose significant challenges for mirror metrology using conventional interferometric methods. Here, to address this, we present a new relative angle determinable stitching interferometry instrument featuring a parallel flexure-based mechanical design. This approach enhances vibration and thermal stability while maintaining a compact and lightweight system. Initial measurements of a cylindrical mirror with a 16 m radius of curvature and a slope range of 5 mrad demonstrate nanometer-level repeatability. Comprehensive system characterization suggests the potential for achieving sub-nanometer repeatability with further refinement to the instrument.

36 MATERIALS SCIENCE↗
DOE OSTI2020

Metrology of Time-Domain Soft X-Ray Attosecond Pulses and Reevaluation of Pulse Durations of Three Recent Experiments

Attosecond pulses in the soft x-ray (SXR) to water-window energy region offer the tools for creating and studying target-specific localized inner-shell electrons or holes in materials, enabling monitoring or controlling charge and energy flows in a dynamic system on attosecond timescales. Recently, a number of laboratories have reported generation of continuum harmonics in the hundred-electron-volt to kilovolt region with few-cycle long-wavelength mid-infrared lasers. These harmonics have the bandwidth to support pulses with durations of a few to a few-ten attoseconds. But harmonics generated in a gas medium have attochirps that cannot be fully compensated by materials over a broad spectral range; thus, realistically what are the typical shortest attosecond pulses that one can generate? To answer this question, it is essential that the temporal attosecond pulses be accurately characterized. By reanalyzing the soft x-ray attosecond metrology reported in three recent experiments using a newly developed broadband phase retrieval algorithm, we demonstrate here that the generated attosecond pulses in the first two papers have durations of about 60 as, longer than what they have reported. Similarly, the duration from the third experiment is retrieved to be about half of the 322-as upper limit cited in that work. We also introduce the autocorrelation (AC) of the streaking spectrogram. By comparing the ACs from the experiments and from the retrieved SXR pulses, the accuracy of the retrieved results can be directly visualized. Our retrieval method is fast and accurate, and it shall provide a powerful tool for the metrology of the emerging few-ten-attosecond pulses.

74 ATOMIC AND MOLECULAR PHYSICS↗
DOE OSTI2023

Phase-Space Geometry and Optimal State Preparation in Quantum Metrology with Collective Spins

We revisit well-known protocols in quantum metrology using collective spins and propose a unifying picture for optimal state preparation based on a semiclassical description in phase space. We show how this framework allows for quantitative predictions of the timescales required to prepare various metrologically useful states, and that these predictions remain accurate even for moderate system sizes, surprisingly far from the classical limit. Furthermore, this framework allows us to build a geometric picture that relates optimal (exponentially fast) entangled probe preparation to the existence of separatrices connecting saddle points in phase space. We illustrate our results with the paradigmatic examples of the two-axis countertwisting and twisting-and-turning Hamiltonians, where we provide analytical expressions for all the relevant optimal timescales. Finally, we propose a generalization of these models to include p-body collective interaction (or p-order twisting), beyond the usual case of p = 2. Using our geometric framework, we prove a no-go theorem for the local optimality of these models for p > 2.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DOE OSTI2026

Geometric invariants of quantum metrology

Here, we establish a conservation law for the Quantum Fisher Information Matrix (QFIM) expressed as follows; when the QFIM is constructed from a set of observables closed under commutation, i.e., a Lie algebra, the spectrum of the QFIM is invariant under unitary dynamics generated by these same operators. Each Lie algebra therefore endows any quantum state with a fixed “budget” of metrological sensitivity—an intrinsic resource that we show, like optical squeezing in interferometry, cannot be amplified by symmetry-preserving operations. The Uhlmann curvature tensor naturally inherits the same symmetry group, and so quantum incompatibility is similarly fixed. As a result, a metrological analog to Liouville's theorem appears; statistical distances, volumes, and curvatures are invariant under the evolution generated by the Lie algebra. We discuss this as it relates to the quantum analogs of classical optimality criteria. This enables one to efficiently classify useful classes of quantum states at the level of Lie algebras through geometric invariants.

Wilson, Christopher [University of Colorado, Bould↗
DOE OSTI2023

Biphoton spectral quantum interference for information processing and delay metrology

Broadband time-energy entangled photons feature strong temporal correlations with potential for precision delay metrology, but previous work has leveraged only time-of-flight information ultimately limited by the detection jitter and resolution of the time-tagging electronics. Firstly, our work pushes the entanglement-based nonlocal delay metrology from the conventional time-of-flight measurement to a new direction—two-photon interferometry with subpicosecond sensitivity independent of detection resolution. Next, we show the selective sensitivity of frequency-bin encoded Bell states to the sum and difference of biphoton-delays by using a novel reconfigurable setup capable of switching between the Bell states by successively employing single and dual spectral-line pumps.

Seshadri, Suparna↗