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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 37 records · Page 2
All sourcesNASA NTRSDOE OSTI
DOE OSTI2019

Stress and Fracture of Crystalline Silicon Cells in Solar Photovoltaic Modules – A Synchrotron X-ray Microdiffraction based Investigation

Fracture of crystalline silicon (c-Si) solar cells in photovoltaic modules is a big concern to the photovoltaics (PV) industry. Cell cracks cause performance degradation and warranty issues to the manufacturers. The roots of cell fractures lie in the manufacturing and integration process of the cells and modules as they go through a series of elevated temperature and pressure processes, involving bonding of dissimilar materials, causing residual stresses. Evaluation of the exact physical mechanisms leading to these thermomechanical stresses is highly essential to quantify them and optimize the PV modules to address them. Here we present a novel synchrotron X-ray microdiffraction based techniques to characterize the stress and fracture in the crystalline silicon PV modules. We show the detailed stress state after soldering and lamination process, using the synchrotron X-ray microdiffraction experiments. We also calculate the maximum tolerable microcrack size in the c-Si cells to sustain the residual stress after lamination. We further demonstrate the effect of these residual stresses on the cell fractures using the widely accepted fracture (4-point bending) tests. These test results show that the soldering and lamination induced localized residual stresses indeed reduce the load-carrying capacity of the c-Si cells.

14 SOLAR ENERGY↗
DOE OSTI2018

A peak position comparison method for high-speed quantitative Laue microdiffraction data processing

Indexing Laue patterns of a synchrotron microdiffraction scan can take as much as ten times longer than collecting the data, impeding efficient structural analysis using this technique. Here in this paper, a novel strategy is developed. By comparing the peak positions of adjacent Laue patterns and checking the intensity sequence, grain and phase boundaries are identified, requiring only a limited number of indexing steps for each individual grain. Using this protocol, the Laue patterns can be indexed on the fly as they are taken. The validation of this method is demonstrated by analyzing the microstructure of a laser 3D printed multi-phase/multi-grain Ni-based superalloy.

36 MATERIALS SCIENCE↗
DOE OSTI2017

Unraveling submicron-scale mechanical heterogeneity by three-dimensional X-ray microdiffraction

Shear banding is a ubiquitous phenomenon of severe plastic deformation, and damage accumulation in shear bands often results in the catastrophic failure of a material. Despite extensive studies, the microscopic mechanisms of strain localization and deformation damage in shear bands remain elusive due to their spatial-temporal complexities embedded in bulk materials. Here we conducted synchrotron-based X-ray microdiffraction (μXRD) experiments to map out the 3D lattice strain field with a submicron resolution around fatigue shear bands in a stainless steel. Both in situ and postmortem μXRD results revealed large lattice strain gradients at intersections of the primary and secondary shear bands. Such strain gradients resulted in severe mechanical heterogeneities across the fatigue shear bands, leading to reduced fatigue limits in the high-cycle regime. The ability to spatially quantify the localized strain gradients with submicron resolution through μXRD opens opportunities for understanding the microscopic mechanisms of damage and failure in bulk materials.

36 MATERIALS SCIENCE↗
DOE OSTI2019

Data-driven approach for synchrotron X-ray Laue microdiffraction scan analysis

A novel data-driven approach is proposed for analyzing synchrotron Laue X-ray microdiffraction scans based on machine learning algorithms. The basic architecture and major components of the method are formulated mathematically. It is demonstrated through typical examples including polycrystalline BaTiO 3 , multiphase transforming alloys and finely twinned martensite. The computational pipeline is implemented for beamline 12.3.2 at the Advanced Light Source, Lawrence Berkeley National Laboratory. The conventional analytical pathway for X-ray diffraction scans is based on a slow pattern-by-pattern crystal indexing process. Here, this work provides a new way for analyzing X-ray diffraction 2D patterns, independent of the indexing process, and motivates further studies of X-ray diffraction patterns from the machine learning perspective for the development of suitable feature extraction, clustering and labeling algorithms.

42 ENGINEERING↗
DOE OSTI2016

Compressional residual stress in Bastogne boudins revealed by synchrotron X-ray microdiffraction

Lattice distortions in crystals can be mapped at the micron scale using synchrotron X-ray Laue microdiffraction (μXRD). From lattice distortions the shape and orientation of the elastic strain tensor can be derived and interpreted in terms of residual stress. We apply the new method to vein quartz from the original boudinage locality at Bastogne, Belgium. Furthermore, a long-standing debate surrounds the kinematics of the Bastogne boudins. The μXRD measurements reveal a shortening residual elastic strain, perpendicular to the vein wall, corroborating the model that the Bastogne boudins formed by layer-parallel shortening and not by layer-parallel extension, as is in the geological community generally inferred by the process of boudinage.

58 GEOSCIENCES↗
DOE OSTI2016

Probing Phase Transformations and Microstructural Evolutions at the Small Scales: Synchrotron X-ray Microdiffraction for Advanced Applications in [Phase 3 Memory,] 3D IC (Integrated Circuits) and Solar PV (Photovoltaic) Devices

Synchrotron x-ray microdiffraction (μXRD) allows characterization of a crystalline material in small, localized volumes. Phase composition, crystal orientation and strain can all be probed in few-second time scales. Crystalline changes over a large areas can be also probed in a reasonable amount of time with submicron spatial resolution. However, despite all the listed capabilities, μXRD is mostly used to study pure materials but its application in actual device characterization is rather limited. This article will explore the recent developments of the μXRD technique illustrated with its advanced applications in microelectronic devices and solar photovoltaic systems. Application of μXRD in microelectronics will be illustrated by studying stress and microstructure evolution in Cu TSV (through silicon via) during and after annealing. Here, the approach allowing study of the microstructural evolution in the solder joint of crystalline Si solar cells due to thermal cycling will be also demonstrated.

36 MATERIALS SCIENCE↗
DOE OSTI2019

Microstructure and residual elastic strain at graphite nodules in ductile cast iron analyzed by synchrotron X-ray microdiffraction

The microstructure and residual elastic strain at graphite nodules (GNs) in ductile cast iron produced using either a fast or slow cooling rate have been characterized using synchrotron 3D X-ray Laue microdiffraction. The results demonstrate that thermal stress is introduced during cooling and that part of this stress is relaxed by plastic deformation of the polycrystalline ferrite matrix. It is observed that the plastic deformation is accommodated by the formation of dislocations and dislocation boundaries, which are organized in a cell structure. The dislocation density quantified based on the microstructure is most pronounced at the GN/matrix interface around small GNs in the fast cooled sample. Residual elastic strain is also present, which is mainly compressive with a maximum of 6.0–9.9 × 10 -4 near the GNs. Gradients of plastic deformation and elastic strain field around the GNs are observed. The results document for the first time that both the elastic strain field and the plastic strain field averaged over the grains around the GNs is approximately scaling with GN size and not affected by the cooling rate. The experimental data are compared with simulations by a finite element method, and agreement and disagreement are considered in detail.

36 MATERIALS SCIENCE↗
DOE OSTI2019

Thermomechanical residual stress evaluation in multi-crystalline silicon solar cells of photovoltaic modules with different encapsulation polymers using synchrotron X-ray microdiffraction

Photovoltaic (PV) module reliability issues, due to silicon cell cracking, are gaining more and more attention due to increasing demand for solar power and reduction of cell thickness to reduce cost. Recent reports show significant effect of encapsulation polymer material on cell cracks leading to the idea of tailoring encapsulation materials for more reliable PV modules. This paper investigates the effect of encapsulation modulus on the cell residual stress using Synchrotron scanning X-ray microdiffraction (µSXRD), which has been proven to be an effective technique to probe the stress in silicon solar cells, especially once they are encapsulated. The post lamination residual stress in the encapsulated multi-crystalline silicon (mc-Si) solar cells was reported for the first time using µSXRD in this manuscript and provide quantitative evaluation of the effect of encapsulation modulus on the cell residual stress. Further, simple approximate finite element (FE) model was also developed to evaluate the effect of the encapsulation polymer on the cell stress. The FE simulations predict the trend of the stress variation with encapsulation polymer modulus very well. Dynamic mechanical analysis and rheological testing of the encapsulation polymers was also performed to correlate the polymer behaviour with the experimental and simulated stresses. Both experimental and simulation results show a similar trend of significant cell stress variation with encapsulation polymer modulus. In the case of external loading, the temperature of load application is observed to be very significant as it dictates the elastic state of the encapsulant, leading to critical conclusion that the encapsulant needs to be selected based on elastic behaviour over the temperature history of the encapsulant during module fabrication and operation. Furthermore, the results and discussion presented are expected to be very useful for development of more reliable PV modules.

14 SOLAR ENERGY↗
DOE OSTI2014

Structural Dynamics of GaN Microcrystals in Evolutionary Selection Selective Area Growth probed by X-ray Microdiffraction

A method to grow high quality, single crystalline semiconductor material irrespective of the substrate would allow a cost-effective improvement to functionality and performance of optoelectronic devices. Recently, a novel type of substrate-insensitive growth process called Evolutionary Selection Selective Area Growth (ES-SAG) has been proposed. Here we report the use of X-ray microdiffraction to study the structural properties of GaN microcrystals grown by ES-SAG. Utilizing high resolution in both direct and reciprocal spaces, we have unraveled structural dynamics of GaN microcrystals in growth structures of different dimensions. It has been found that the geometric proportions of the growth constrictions play an important role: 2.6 mm and 4.5 mm wide growth tunnels favor the evolutionary selection mechanism, contrary to the case of 8.6 mm growth tunnels. It was also found that GaN microcrystal ensembles are dominated by slight tensile strain irrespective of growth tunnel shape.

CHARACTERIZATION AND ANALYTICAL TECHNIQUES↗
DOE OSTI2013

System of laser pump and synchrotron radiation probe microdiffraction to investigate optical recording process

We have developed a system of laser-pump and synchrotron radiation probe microdiffraction to investigate the phase-change process on a nanosecond time scale of Ge{sub 2}Sb{sub 2}Te{sub 5} film embedded in multi-layer structures, which corresponds to real optical recording media. The measurements were achieved by combining (i) the pump-laser system with a pulse width of 300 ps, (ii) a highly brilliant focused microbeam with wide peak-energy width ({Delta}E/E {approx} 2%) made by focusing helical undulator radiation without monochromatization, and (iii) a precise sample rotation stage to make repetitive measurements. We successfully detected a very weak time-resolved diffraction signal by using this system from 100-nm-thick Ge{sub 2}Sb{sub 2}Te{sub 5} phase-change layers. This enabled us to find the dependence of the crystal-amorphous phase change process of the Ge{sub 2}Sb{sub 2}Te{sub 5} layers on laser power.

36 MATERIALS SCIENCE↗
DOE OSTI2014

In-situ microscale through-silicon via strain measurements by synchrotron x-ray microdiffraction exploring the physics behind data interpretation

In-situ microscale thermomechanical strain measurements have been performed in combination with synchrotron x-ray microdiffraction to understand the fundamental cause of failures in microelectronics devices with through-silicon vias. The physics behind the raster scan and data analysis of the measured strain distribution maps is explored utilizing the energies of indexed reflections from the measured data and applying them for beam intensity analysis and effective penetration depth determination. Moreover, a statistical analysis is performed for the beam intensity and strain distributions along the beam penetration path to account for the factors affecting peak search and strain refinement procedure.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗
DOE OSTI2022

Depth-resolved Laue microdiffraction with coded apertures

A rapid data acquisition and reconstruction method is introduced to image the crystalline structure of materials and the associated strain and orientations at micrometre resolution using Laue diffraction. The method relies on scanning a coded aperture across the diffracted X-ray beam from broadband illumination and a reconstruction algorithm to resolve Laue microdiffraction patterns as a function of depth along the incident illumination path. It provides rapid access to full diffraction information for sub-micrometre volume elements in bulk materials. Both the theory and the experimental validation of this imaging approach are presented in this report.

36 MATERIALS SCIENCE↗
DOE OSTI2024

Characterization of sub-micrometre-sized voids in fixed human brain tissue using scanning X-ray microdiffraction

Using a 5 µm-diameter X-ray beam, we collected scanning X-ray microdiffraction in both the small-angle (SAXS) and the wide-angle (WAXS) regimes from thin sections of fixed human brain tissue from Alzheimer's subjects. The intensity of scattering in the SAXS regime of these patterns exhibits essentially no correlation with the observed intensity in the WAXS regime, indicating that the structures responsible for these two portions of the diffraction patterns, which reflect different length scales, are distinct. SAXS scattering exhibits a power-law behavior in which the log of intensity decreases linearly with the log of the scattering angle. The slope of the log–log curve is roughly proportional to the intensity in the SAXS regime and, surprisingly, inversely proportional to the intensity in the WAXS regime. We interpret these observations as being due to the presence of sub-micrometre-sized voids formed during dehydration of the fixed tissue. The SAXS intensity is due largely to scattering from these voids, while the WAXS intensity derives from the secondary structures of macromolecular material surrounding the voids. The ability to detect and map the presence of voids within thin sections of fixed tissue has the potential to provide novel information on the degradation of human brain tissue in neurodegenerative diseases.

Chemistry↗
DOE OSTI2018

Probing Plasticity and Strain-Rate Effects of Indium Submicron Pillars Using Synchrotron Laue X-ray Microdiffraction

We present that mechanical behaviors and especially the strain-rate responses at the nanoscales of low melting temperature metals, such as indium have not been much studied. Indium is one of the key materials or alloy-components in advanced microelectronics and nanotechnology industry, and understanding their mechanical behaviors at nanoscales becomes increasingly important to ensure lifetime reliability of their applications in novel nanoscale devices or advanced systems (for packaging at the nanoscales, for instance). Synchrotron X-ray microdiffraction has been utilized to examine defect structures of nanoscale materials as well as their strain-rate responses. Nanoscale or advanced microelectronics packaging, for instance, require acceptable levels of drop test results. For these low melting temperature materials especially, this technique offers a unique advantage as conventional methods such as TEM and EBSD will expose the structure to high energy electron beams that may significantly alter the microstructure and defect structure during analysis. Using this approach, we found interesting differences in term of X-ray peak broadening after deformation with different strain rates, which could indicate differences in plasticity mechanisms in the submicron pillars of indium, which could be important for its applications in nanodevices. Finally, understanding these differences could lead to better control of mechanical properties of low melting temperature metals at the nanoscales and thus have important implications for nanodevice reliability.

36 MATERIALS SCIENCE↗
DOE OSTI2018

Microstructure Evolution in Ion-Irradiated Oxidized Zircaloy-4 Studied with Synchrotron Radiation Microdiffraction and Transmission Electron Microscopy

The corrosion process (oxidation and hydriding) of zirconium alloy fuel cladding is one of the limiting factors on fuel rod lifetime, particularly for Zircaloy-4. The corrosion rate of this alloy shows indeed a great acceleration at high burnup in light water reactors (LWRs). Understanding the corrosion behavior under irradiation for this alloy is an important technological issue for the safety and efficiency of LWRs. In particular, understanding the effect of irradiation on the metal and oxide layers is a key parameter in the study of corrosion behavior of zirconium alloys. In this study, Zircaloy-4 samples underwent helium and proton ion irradiation up to 0.3 dpa, forming a uniform defect distribution up to 1 pm deep. Both as-received and precorroded samples were irradiated to compare the effect of metal irradiation to that of oxide layer irradiation. After irradiation, samples were corroded to study the impact of irradiation defects in the metal and in preexisting oxide layers on the formation of new oxide layers. Synchrotron X-ray microdiffraction and microfluorescence were used to follow the evolution of oxide crystallographic phases, texture, and stoichiometry both in the metal and in the oxide. In particular, the tetragonal oxide phase fraction, which has been known to play an important role in corrosion behavior, was mapped in both unirradiated and irradiated metals at the submicron scale and appeared to be significantly affected by irradiation. These observations, complemented with electron microscopy analyses on samples in carefully chosen areas of interest, were combined to fully characterize changes caused by irradiation in metal and oxide phases of both alloys.

ion-irradiation↗
DOE OSTI2019

Stress evolution in silicon nanowires during electrochemical lithiation using in situ synchrotron X-ray microdiffraction

Silicon is a promising material for lithium-ion batteries. However, it expands by 300% on lithiation, leading to fracture. Nanostructuring of silicon is expected to be a promising method to improve the mechanical strength of the silicon electrodes. In the present work, a unique battery test cell was designed and fabricated to study the in situ stress evolution in the silicon nanowire (SiNW) electrode during electrochemical lithiation using synchrotron X-ray microdiffraction. The stress in the SiNWs at pristine state and during lithiation was evaluated using energy scans. The average stress in the pristine nanowires was found to be ~40 MPa tensile, which changed to ~325 MPa compressive on lithiation. Further, the deviatoric stress state in the SiNWs during lithiation was evaluated using Laue diffraction and the lithiated nanowires were found to be in triaxial stress state with high shear stresses. In conclusion, the technique and the findings provide new and more in-depth understanding of the stress evolution in the SiNWs during electrochemical lithiation.

36 MATERIALS SCIENCE↗
DOE OSTI2018

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

In this paper, we describe a detailed procedure for acquiring and processing x-ray microfluorescence (μXRF), and Laue and powder microdiffraction two-dimensional (2D) maps at beamline 12.3.2 of the Advanced Light Source (ALS), Lawrence Berkeley National Laboratory. Measurements can be performed on any sample that is less than 10 cm x 10 cm x 5 cm, with a flat exposed surface. The experimental geometry is calibrated using standard materials (elemental standards for XRF, and crystalline samples such as Si, quartz, or Al 2 O 3 for diffraction). Samples are aligned to the focal point of the x-ray microbeam, and raster scans are performed, where each pixel of a map corresponds to one measurement, e.g. , one XRF spectrum or one diffraction pattern. The data are then processed using the in-house developed software XMAS, which outputs text files, where each row corresponds to a pixel position. Representative data from moissanite and an olive snail shell are presented to demonstrate data quality, collection, and analysis strategies.

36 MATERIALS SCIENCE↗
DOE OSTI2016

Synchrotron Microdiffraction Study of Heavy-Ion-Irradiated Uranium-Molybdenum Dispersion Fuel

There has been an ongoing effort by the Department of Energy Office of Material Management and Minimization to convert research and test reactors from high-enriched to low-enriched uranium fuels. Uranium-molybdenum alloy fuel dispersed in an aluminum matrix (UMo-Al dispersion fuel) has emerged as the leading candidate fuel for converting the remaining high-power research reactors in Europe. One of the primary barriers to using this fuel type is the deleterious reaction of UMo with Al. Depending on the operating temperature of the reactor, this interaction layer can be amorphous under irradiation and allows for the accumulation of fission gas products in large bubbles, leading to unacceptable swelling of the fuel. Therefore, detailed characterization of the phases that form within the fuel and in the interaction layer is critical to understanding, and controlling, UMo-Al dispersion fuel behavior under irradiation. Furthermore, the phase stability of the UMo fuel is of great importance, as the alpha-UMo phase has undesirable swelling compared to the metastable gamma-UMo phase. Heavy ion irradiation was used to reproduce the interaction layer that develops in-reactor. Samples of both the fuel and interaction layer formed under ion irradiation were examined using the high-energy x-ray microdiffraction technique at the Advanced Photon Source (APS) at Argonne National Laboratory to examine the microstructure of the interaction layer. The high-resolution phase information obtained in this experiment provides a valuable basis for understanding the evolution of UMo-Al dispersion fuel under irradiation and as input for computational studies to improve predictive capabilities. Phase information for in-pile fuels can currently be determined from TEM samples (limited sample volume, limiting statistics), or by extrapolation from SEMEDS analysis. (authors)

11 NUCLEAR FUEL CYCLE AND FUEL MATERIALS↗