X-Ray Phase Contrast Imaging for Dynamic Material Mix Experiments, LAO-003-17, Year 3 of 3
X-ray phase contrast imaging with transmission gratings for density profile measurements has been developed and tested for dynamic experimental applications. Talbot-Lau x-ray deflectometry is a new method of measuring x-ray refraction in addition to attenuation and ultrasmall-angle scattering that has recently been developed for static imaging, primarily for medical and industrial applications. To obtain density profiles from fast-evolving systems, we must use a flash x-ray source with a spot size much larger than the continuous microfocus sources of static imaging systems, and we can obtain only a single exposure. The challenges to measuring electron density profiles of two mixed elements from a single-image, low spatial resolution system are addressed, and initial results from the first dynamic experiments with one such system, conducted on a gas launcher at the end of FY 2018 and beginning of FY 2019, are presented. In FY 2019, we designed and built a new deflectometer designed for detonator experiments to test new techniques to improve the sensitivity and reliability of the diagnostic.