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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 361 records · Page 20

Comparison of NASCAP modelling results with lumped circuit analysis

Engineering design tools that can be used to predict the development of absolute and differential potentials by realistic spacecraft under geomagnetic substorm conditions are described. Two types of analyses are in use: (1) the NASCAP code, which computes quasistatic charging of geometrically complex objects with multiple surface materials in three dimensions; (2) lumped element equivalent circuit models that are used for analyses of particular spacecraft. The equivalent circuit models require very little computation time, however, they cannot account for effects, such as the formation of potential barriers, that are inherently multidimensional. Steady state potentials of structure and insulation are compared with those resulting from the equivalent circuit model.

Stang, D. B.↗

Cost optimization in low volume VLSI circuits

The relationship of integrated circuit (IC) cost to electronic system cost is developed using models for integrated circuit cost which are based on design/fabrication approach. Emphasis is on understanding the relationship between cost and volume for custom circuits suitable for NASA applications. In this report, reliability is a major consideration in the models developed. Results are given for several typical IC designs using off the shelf, full custom, and semicustom IC's with single and double level metallization.

Cook, K. B., Jr.↗

Computer-aided prediction of high-frequency performance limits in silicon bipolar integrated circuits

A circuit model for an existing silicon integrated bipolar junction transistor (IBJT) is used to evaluate presently achievable high frequency circuit performance. The relationship between circuit model and processing parameters are semi-quantitatively explored to make predictions on the frequency response, which can be achieved through realistic device fabrication modifications. A new figure of merit is introduced, which is defined as the signal frequency at which an integrated bipolar junction transistor can deliver a power gain of G. The most sensitive parameter influencing attainable high frequency IBJT performance is base resistance.

Burns, J. L.↗

Flip-flop resolving time test circuit

Integrated circuit (IC) flip-flop resolving time parameters are measured by wafer probing, without need of dicing or bonding, throught the incorporation of test structures on an IC together with the flip-flop to be measured. Several delays that are fabricated as part of the test circuit, including a voltage-controlled delay with a resolution of a few picosecs, are calibrated as part of the test procedure by integrating them into, and out of, the delay path of a ring oscillator. Each of the delay values is calculated by subtracting the period of the ring oscillator with the delay omitted from the period with the delay included. The delay measurement technique is sufficiently general for other applications. The technique is illustrated for the case of the flip-flop parameters of a 5-micron feature size NMOS circuit.

Rosenberger, F.↗

Rapid Circuit Breadboarding

Cost of one-of-a-kind circuit board reduced. Circuits assembled quickly by using prototyping board in conjunction with copper-clad circuit board that has same hole pattern.

Ethridge, E. C.↗

Characterization of silicon-gate CMOS/SOS integrated circuits processed with ion implantation

The double layer metallization technology applied on p type silicon gate CMOS/SOS integrated circuits is described. A smooth metal surface was obtained by using the 2% Si-sputtered Al. More than 10% probe yield was achieved on solar cell controller circuit TCS136 (or MSFC-SC101). Reliability tests were performed on 15 arrays at 150 C. Only three arrays failed during the burn in, and 18 arrays out of 22 functioning arrays maintained the leakage current below 100 milli-A. Analysis indicates that this technology will be a viable process if the metal short circuit problem between the two metals can be reduced.

Woo, D. S.↗

Computer modeling of batteries from non-linear circuit elements

A simple non-linear circuit model for battery behavior is given. It is based on time-dependent features of the well-known PIN change storage diode, whose behavior is described by equations similar to those associated with electrochemical cells. The circuit simulation computer program ADVICE was used to predict non-linear response from a topological description of the battery analog built from advice components. By a reasonable choice of one set of parameters, the circuit accurately simulates a wide spectrum of measured non-linear battery responses to within a few millivolts.

Waaben, S.↗

V-band low-noise integrated circuit receiver

A compact low-noise V-band integrated circuit receiver has been developed for space communication systems. The receiver accepts an RF input of 60-63 GHz and generates an IF output of 3-6 GHz. A Gunn oscillator at 57 GHz is phaselocked to a low-frequency reference source to achieve high stability and low FM noise. The receiver has an overall single sideband noise figure of less than 10.5 dB and an RF to IF gain of 40 dB over a 3-GHz RF bandwidth. All RF circuits are fabricated in integrated circuits on a Duroid substrate.

Chang, K.↗

Analysis of cold flow reestablishment time in a circuit breaker nozzle

The deblocking process in a circuit breaker nozzle is similar to the flow starting process in a shock tunnel, and the computer uses this analogy to solve for the deblocking process by utilizing a diaphragm at the throat of a nozzle. At time equal to zero the diaphragm is broken and the throat area increases with time. It is a rarity to have the area as a function of both time and distance. Experimental data obtained from the RPI calibration shock tunnel are utilized to verify some of the calculated results with the area being a function of distance and the agreement is found to be good. The circuit breaker designer can utilize the computer simulation to estimate the deblocking time, an important parameter in the design of circuit breakers.

Leone, S. A.↗

Ladder supported ring bar circuit

An improved slow wave circuit especially useful in backward wave oscillators includes a slow wave circuit in a waveguide. The slow wave circuit is comprised of rings disposed between and attached to respective stubs. The stubs are attached to opposing sidewalls of the waveguide. To the end that opposed, interacting magnetic fields will be established to provide a very high coupling impedance for the slow wave structure, axially orientated bars are connected between rings in alternate spaces and adjacent to the attachment points of stubs. Similarly, axial bars are connected between rings in the spaces which do not include bars and at points adjacent to the attachment of bars.

Kosmahl, H. G.↗

Source-circuit design overview

The source circuit is the fundamental electrical building block of a large central-station array; it consists of a series-parallel network of solar cells that develops full system voltage. The array field is generally made up of a large number of parallel source circuits. Source-circuit electrical configuration is driven by a number of design considerations, which must be considered simultaneously. Array fault tolerance and hot spot heating endurance are examined in detail.

Ross, R. G., Jr.↗

Theoretical and experimental studies of error in square-law detector circuits

Square law detector circuits to determine errors from the ideal input/output characteristic function were investigated. The nonlinear circuit response is analyzed by a power series expansion containing terms through the fourth degree, from which the significant deviation from square law can be predicted. Both fixed bias current and flexible bias current configurations are considered. The latter case corresponds with the situation where the mean current can change with the application of a signal. Experimental investigations of the circuit arrangements are described. Agreement between the analytical models and the experimental results are established. Factors which contribute to differences under certain conditions are outlined.

Stanley, W. D.↗

Circuit for Lifetime and Surface-Recombination Measurements

Test circuit for silicon solar cells suppresses spurious effects. New circuit increases accuracy of measurements of recombination lifetime and effective surface recombination velocity in silicon solar cell. Fast electronic switch, circuit grounds forward-biased cell so rapidly transient voltage to be measured not affected significantly.

Lindholm, F. A.↗

Soldering Tool for Integrated Circuits

Many connections soldered simultaneously in confined spaces. Improved soldering tool bonds integrated circuits onto printed-circuit boards. Intended especially for use with so-called "leadless-carrier" integrated circuits.

Takahashi, Ted H.↗

Prototyping and implementing flight qualifiable semicustom CMOS P-well bulk integrated circuits in the JPL environment

Presently, there are many difficulties associated with implementing application specific custom or semi-custom (standard cell based) integrated circuits (ICs) into JPL flight projects. One of the primary difficulties is developing prototype semi-custom integrated circuits for use and evaluation in engineering prototype flight hardware. The prototype semi-custom ICs must be extremely cost-effective and yet still representative of flight qualifiable versions of the design. A second difficulty is encountered in the transport of the design from engineering prototype quality to flight quality. Normally, flight quality integrated circuits have stringent quality standards, must be radiation resistant and should consume minimal power. It is often not necessary or cost effective, however, to impose such stringent quality standards on engineering models developed for systems analysis in controlled lab environments. This article presents work originally initiated for ground based applications that also addresses these two problems. Furthermore, this article suggests a method that has been shown successful in prototyping flight quality semi-custom ICs through the Metal Oxide Semiconductor Implementation Service (MOSIS) program run by the University of Southern California's Information Sciences Institute. The method has been used successfully to design and fabricate through the MOSIS three different semi-custom prototype CMOS p-well chips. The three designs make use of the work presented and were designed consistent with design techniques and structures that are flight qualifiable, allowing one hour transfer of the design from engineering model status to flight qualifiable foundry-ready status through methods outlined in this article.

Olson, E. M.↗

Four quadrant control circuit for a brushless three-phase dc motor

A control circuit is provided for a brushless three-phase dc motor which affords four quadrant control from a single command. The control circuit probes acceleration of the motor in both clockwise and counterclockwise directions and braking and generation in both clockwise and counterclockwise directions. In addition to turning on individual transistors of the transistor pairs connected to the phase windings of the motor for 120 deg periods while the other transistor of that pair is off, the control circuit also provides, in a future mode of operation, turning the two transistors of each pair on and off alternately at a phase modulation frequency during such a 120 deg period. A feedback signal is derived which is proportional to the motor current and which has a polarity consistent with the command signal, such that negative feedback results.

Nola, Frank J.↗

In-circuit fault injector user's guide

A fault injector system, called an in-circuit injector, was designed and developed to facilitate fault injection experiments performed at NASA-Langley's Avionics Integration Research Lab (AIRLAB). The in-circuit fault injector (ICFI) allows fault injections to be performed on electronic systems without special test features, e.g., sockets. The system supports stuck-at-zero, stuck-at-one, and transient fault models. The ICFI system is interfaced to a VAX-11/750 minicomputer. An interface program has been developed in the VAX. The computer code required to access the interface program is presented. Also presented is the connection procedure to be followed to connect the ICFI system to a circuit under test and the ICFI front panel controls which allow manual control of fault injections.

Padilla, Peter A.↗

Adjustable, Audible Continuity Tester For Delicate Circuits

Unit adjustable to resistances up to 35 ohms. Adjustable, audible electrical-continuity tester gives audible indication. Used safely on circuit boards in which semiconductor components installed, and on complementary metal oxide/semiconductor integrated circuits. Tester compact and circuit simple. Built from inexpensive standard components.

Mcalister, William B.↗