LASER Tech Briefs, Spring 1994
Topics in this Laser Tech Brief include: Electronic Components and Circuits. Electronic Systems, Physical Sciences, Materials, Mechanics, Fabrication Technology, and books and reports.
Schnirring, Bill↗
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NASA Tech Briefs, July 1991
Topics include: New Product Ideas; NASA TU Services; Electronic Components and Circuits; Electronic Systems; Physical Sciences; Materials; Computer Programs; Mechanics; Machinery; Fabrication Technology; Mathematics and Information Sciences; Life Sciences.
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LASER Tech Briefs, Summer 1994
This issue of LASER Tech Briefs include: Electronic Components and Circuits. Electronic Systems, Physical Sciences, Materials, Computer Programs, Mechanics, Machinery, and Fabrication Technology.
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LASER Tech Briefs, Fall 1994
Topics in this issue of LASER Tech briefs include: Electronic Components and Circuits. Electronic Systems, Physical Sciences, Materials, Computer Programs, Fabrication Technology, Mathematics and Information Sciences, and Life Sciences
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LASER Tech Briefs, February 1995
Topics included in this issue of LASER Tech Briefs are: Electronic Components and Circuits. Electronic Systems, Physical Sciences, Materials, Mechanics, Fabrication, and Mathematics and Information Sciences, and
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Optoelectronic device with a support member
Optoelectronic devices with a support member and methods of manufacturing or assembling the same are provided. An example of an optoelectronic device according to the present disclosure includes a substrate and an optical component and an electronic component disposed thereon or therein. The optoelectronic device further includes a ferrule coupled to the optical fiber and an optical socket receiving the ferrule therein. The optoelectronic device includes a support member disposed between the substrate and the optical socket such that the optical socket is spaced from the substrate by the support member.
42 ENGINEERING↗
Ulysses observations of electron and proton components in a magnetic cloud and related wave activity
In addition to a smooth rotation of the magnetic field vector, magnetic clouds have a low proton temperature T(sub p). Their expansion in the solar wind leads to depletion and therefore the ion component cools down. It has been shown recently that the electron component in magnetic clouds behaves differently: when the cloud expands, electron temperature Te anti correlates with density and therefore Te increases in the cloud, creating favorable conditions for the rise of ion-acoustic waves. For the magnetic cloud observed by Ulysses on June 10 - 12, 1993 at 4.64 AU at S 32.5 deg, we present observations for both electron and proton components and related plasma wave activity. Our results confirm the anti correlation between T(sub e) and electron density and also exhibit a high ratio of T(sub e)/T(sub P) in the cloud. Since Landau damping is not effective for T(sub e)/T(sub p) much greater than 1, Doppler shifted ion acoustic waves are expected in the cloud. Calculation of ion acoustic wave frequencies in the cloud and comparison with observed wave activity confirm this expectation. As in our previous work, we show that the electron component in the cloud obeys a polytropic law with gamma is less than 1 (gamma approximately equals 0.3-0.4). The dynamics of the magnetic cloud are determined to a large degree by the dominating electron pressure.
Osherovich, V. A.↗
Synthesis and CV Studies of Dithiol-terminated Metal Terpyridine Complexes
Transition metal coordination complexes possess unique electronic structures that should be a good model for studying electronic transport behavior at a molecular level. The discrete, multiple redox states, low redox potential and the superb ability to establish contact with other molecular and electronic components by coordination chemistry have made this a subject of investigation for their possible application as active electronic components in molecular devices. We present the synthesis and electrochemical characterization of 4'-thioacetylphenyl-2'2:6',2"-terpyridine iron(II) complex and compare it with a model bis-terpyridine iron(II) complex by cyclic voltammetry. With the use of different working electrodes, the behavior of these complexes show different electron transfer rates.
Asano, Sylvia↗
Electronics for Piezoelectric Smart Structures
This paper briefly presents work addressing some of the basic considerations for the electronic components used in smart structures incorporating piezoelectric elements. After general remarks on the application of piezoelectric elements to the problem of structural vibration control, three main topics are described. Work to date on the development of techniques for embedding electronic components within structural parts is presented, followed by a description of the power flow and dissipation requirements of those components. Finally current work on the development of electronic circuits for use in an 'active wall' for acoustic noise is introduced.
Warkentin, D. J.↗
Energy storage devices having coated passive particles
The present invention provides various passive electronic components comprising a layer of coated particles, and methods for producing and using the same. Some of the passive electronic components of the invention include, but are not limited to conductors, resistors, current collectors, capacitors, piezoelectronic devices, inductors and transformers. The present invention also provides energy storage devices and electrode layers for such energy storage devices having passive, electrically-conductive particles coated with one or more thin film materials.
King, David M.↗
Preventing Electrostatic-Discharge Damage to Electronics
Booklet discusses damage to electronic components caused by electrostatic discharges during assembly. Describes procedure for setting up static-free workplace for handling and assembling electronic components.
Read, W. S.↗
An emergency response mobile robot for operations in combustible atmospheres
A mobile, self-powered, self-contained, and remote-controlled robot is presented. The robot is capable of safely operating in a combustible atmosphere and providing information about the atmosphere to the operator. The robot includes non-sparking and non-arcing electro-mechanical and electronic components designed to prevent the robot from igniting the combustible atmosphere. The robot also includes positively pressurized enclosures that house the electromechanical and electronic components of the robot and prevent intrusion of the combustible atmosphere into the enclosures. The enclosures are interconnected such that a pressurized gas injected into any one of the enclosures is routed to all the other enclosures through the interconnections. It is preferred that one or more sealed internal channels through structures intervening between the enclosures be employed. Pressure transducers for detecting if the pressure within the enclosures falls below a predetermined level are included. The robot also has a sensing device for determining the types of combustible substances in the surrounding atmosphere, as well as the concentrations of each type of substance relative to a pre-determined lower explosive limit (LEL). In addition, the sensing device can determine the percent level of oxygen present in the surrounding atmosphere.
Stone, Henry W.↗
Emergency response mobile robot for operations in combustible atmospheres
A mobile, self-powered, self-contained, and remote-controlled robot is presented. The robot is capable of safely operating in a combustible atmosphere and providing information about the atmosphere to the operator. The robot includes non-sparking and non-arcing electro-mechanical and electronic components designed to prevent the robot from igniting the combustible atmosphere. The robot also includes positively pressurized enclosures that house the electromechanical and electronic components of the robot and prevent intrusion of the combustible atmosphere into the enclosures. The enclosures are interconnected such that a pressurized gas injected into any one of the enclosures is routed to all the other enclosures through the interconnections. It is preferred that one or more sealed internal channels through structures intervening between the enclosures be employed. Pressure transducers for detecting if the pressure within the enclosures falls below a predetermined level are included. The robot also has a sensing device for determining the types of combustible substances in the surrounding atmosphere, as well as the concentrations of each type of substance relative to a pre-determined lower explosive limit (LEL). In addition, the sensing device can determine the percent level of oxygen present in the surrounding atmosphere.
Stone, Henry W.↗
FIRM image analysis: A machine learning workflow for quantifying extracellular matrix components from electron microscopy images
The extracellular matrix (ECM) is a complex network of biomolecules that plays an integral role in the structure, processes, and signaling mechanisms of cells and tissues. Identifying and quantifying changes in these matrix components provides insight into the mechanisms behind specific tissue remodeling processes; however, quantifying these changes is challenging due to difficult imaging conditions, complexity of the ECM, and the subtlety of these changes. Current imaging techniques allow us to visualize these critical remodeling events and developments in image analysis have employed a combination of analysis software and machine learning techniques to improve the efficiency and accuracy with which features are measured. Although image analysis has seen much improvement in recent years, there has been no technique developed to address ambiguity in feature edges in electron microscopy images. Presented here is a new machine learning-based workflow for the analysis of microscopy images named FIRM (Feature Identification from Raw Microscopy) that uses a random forest classifier to identify ECM features of interest and generate binary segmentation masks for quantification with ImageJ-FIJI. FIRM performed with an F1 score of 0.794 and greater than 80% accuracy for number and size of features detected. FIRM had similar deviation from the ground truth in the number of identified fibrils, fibril size, and size distributions when compared to human analyses. The results suggest that FIRM performs as well as manual analysis and requires a fraction of the time. This analysis technique is more efficient, eliminates user bias, and can be easily optimized to identify a variety of features, making it useful for any discipline requiring image analysis.
Science & Technology - Other Topics↗
Estimating the Probability of Electrical Short Circuits from Tin Whiskers
To comply with lead-free legislation, many manufacturers have converted from tin-lead to pure tin finishes of electronic components. However, pure tin finishes have a greater propensity to grow tin whiskers than tin-lead finishes. Since tin whiskers present an electrical short circuit hazard in electronic components, simulations have been developed to quantify the risk of said short circuits occurring. Existing risk simulations make the assumption that when a free tin whisker has bridged two adjacent exposed electrical conductors, the result is an electrical short circuit. This conservative assumption is made because shorting is a random event that had an unknown probability associated with it. Note however that due to contact resistance electrical shorts may not occur at lower voltage levels. In our first article we developed an empirical probability model for tin whisker shorting. In this paper, we develop a more comprehensive empirical model using a refined experiment with a larger sample size, in which we studied the effect of varying voltage on the breakdown of the contact resistance which leads to a short circuit. From the resulting data we estimated the probability distribution of an electrical short, as a function of voltage. In addition, the unexpected polycrystalline structure seen in the focused ion beam (FIB) cross section in the first experiment was confirmed in this experiment using transmission electron microscopy (TEM). The FIB was also used to cross section two card guides to facilitate the measurement of the grain size of each card guide's tin plating to determine its finish .
Courey, Karim J.↗
Developing an Empirical Model for Estimating the Probability of Electrical Short Circuits from Tin Whiskers
To comply with lead-free legislation, many manufacturers have converted from tin-lead to pure tin finishes of electronic components. However, pure tin finishes have a greater propensity to grow tin whiskers than tin-lead finishes. Since tin whiskers present an electrical short circuit hazard in electronic components, simulations have been developed to quantify the risk of said short circuits occurring. Existing risk simulations make the assumption that when a free tin whisker has bridged two adjacent exposed electrical conductors, the result is an electrical short circuit. This conservative assumption is made because shorting is a random event that had an unknown probability associated with it. Note however that due to contact resistance electrical shorts may not occur at lower voltage levels. In our first article we developed an empirical probability model for tin whisker shorting. In this paper, we develop a more comprehensive empirical model using a refined experiment with a larger sample size, in which we studied the effect of varying voltage on the breakdown of the contact resistance which leads to a short circuit. From the resulting data we estimated the probability distribution of an electrical short, as a function of voltage. In addition, the unexpected polycrystalline structure seen in the focused ion beam (FIB) cross section in the first experiment was confirmed in this experiment using transmission electron microscopy (TEM). The FIB was also used to cross section two card guides to facilitate the measurement of the grain size of each card guide's tin plating to determine its finish.
Courey, Karim J.↗
Safe Handling Practices
In 1977 Compugraphic Corporation was experiencing an unacceptable failure rate on microelectronic chips. Company engineers suspected that static electricity was causing the trouble because some electronic components are highly susceptible to damage by electrostatic charge. From a NASA Tech Brief, they learned that Rockwell International had prepared a report on safe handling practices for electronic components. NASA provided a Technical Support Package detailing 50 safe handling procedures affecting workers, work areas, equipment and packaging materials. Where poor practices were discovered, re-education of employees and other corrective measures were undertaken.
Source record↗
Estimating the Probability of Electrical Short Circuits from Tin Whiskers
To comply with lead-free legislation, many manufacturers have converted from tin-lead to pure tin finishes of electronic components. However, pure tin finishes have a greater propensity to grow tin whiskers than tin-lead finishes. Since tin whiskers present an electrical short circuit hazard in electronic components, simulations have been developed to quantify the risk of said short circuits occurring. Existing risk simulations make the assumption that when a free tin whisker has bridged two adjacent exposed electrical conductors, the result is an electrical short circuit. This conservative assumption is made because shorting is a random event that had an unknown probability associated with it. Note however that due to contact resistance electrical shorts may not occur at lower voltage levels. In our first article we developed an empirical probability model for tin whisker shorting. In this paper, we develop a more comprehensive empirical model using a refined experiment with a larger sample size, in which we studied the effect of varying voltage on the breakdown of the contact resistance which leads to a short circuit. From the resulting data we estimated the probability distribution of an electrical short, as a function of voltage.
Courey, Karim J.↗