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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 361 records · Page 20

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NASA NTRS1989

Total dose effect on soft error rate for dynamic metal-oxide-semiconductor memory cells

A simple model for the soft error rate for dynamic metal-oxide-semiconductor random access memories due to normal galactic radiation was devised and then used to calculate the rate of decrease of the single-event-upset rate with total radiation dose. The computation shows that the decrease in the soft error rate is less than 10 percent per day if the shielding is 0.5 g/sq cm and the spacecraft is in a geosynchronous orbit. The decrease is considerably less in a polar orbiting device.

Benumof, Reuben↗

NASA NTRS1990

Asymmetric Memory Circuit Would Resist Soft Errors

Some nonlinear error-correcting codes more efficient in presence of asymmetry. Combination of circuit-design and coding concepts expected to make integrated-circuit random-access memories more resistant to "soft" errors (temporary bit errors, also called "single-event upsets" due to ionizing radiation). Integrated circuit of new type made deliberately more susceptible to one kind of bit error than to other, and associated error-correcting code adapted to exploit this asymmetry in error probabilities.

Buehler, Martin G.↗

NASA NTRS1990

Upper-Bound Estimates Of SEU in CMOS

Theory of single-event upsets (SEU) (changes in logic state caused by energetic charged subatomic particles) in complementary metal oxide/semiconductor (CMOS) logic devices extended to provide upper-bound estimates of rates of SEU when limited experimental information available and configuration and dimensions of SEU-sensitive regions of devices unknown. Based partly on chord-length-distribution method.

Edmonds, Larry D.↗

NASA NTRS1990

Exact Chord-Length Distribution For SEU Calculations

Computed rates of SEU's more accurate. Exact integral chord-length distribution derived for use in calculations of rates of single-event upsets (SEU's) (changes in logic states) caused by impingement of cosmic rays or other ionizing radiation on electronic logic circuits.

Buehler, Martin G.↗

NASA NTRS1989

Product assurance technology for procuring reliable, radiation-hard, custom LSI/VLSI electronics

Advanced measurement methods using microelectronic test chips are described. These chips are intended to be used in acquiring the data needed to qualify Application Specific Integrated Circuits (ASIC's) for space use. Efforts were focused on developing the technology for obtaining custom IC's from CMOS/bulk silicon foundries. A series of test chips were developed: a parametric test strip, a fault chip, a set of reliability chips, and the CRRES (Combined Release and Radiation Effects Satellite) chip, a test circuit for monitoring space radiation effects. The technical accomplishments of the effort include: (1) development of a fault chip that contains a set of test structures used to evaluate the density of various process-induced defects; (2) development of new test structures and testing techniques for measuring gate-oxide capacitance, gate-overlap capacitance, and propagation delay; (3) development of a set of reliability chips that are used to evaluate failure mechanisms in CMOS/bulk: interconnect and contact electromigration and time-dependent dielectric breakdown; (4) development of MOSFET parameter extraction procedures for evaluating subthreshold characteristics; (5) evaluation of test chips and test strips on the second CRRES wafer run; (6) two dedicated fabrication runs for the CRRES chip flight parts; and (7) publication of two papers: one on the split-cross bridge resistor and another on asymmetrical SRAM (static random access memory) cells for single-event upset analysis.

Buehler, M. G.↗

NASA NTRS1990

Environment induced anomalies on the TDRS and the role of spacecraft charging

The NASA Tracking and Data Relay Satellites (TDRS) have experienced several classes of anomalies that appear to be related to the natural environment. The most serious of these have been anomalies in the Attitude Control System control processor electronics which resulted in check sum errors that were ultimately traced to high-energy, particle-induced single event upsets in the RAM memory. Three other types of anomalies on TDRS have also been correlated with environmental effects. This paper briefly documents the occurrences of these anomalies and describes the nature of each. These events are correlated with various environmental factors. For all cases, there appears to be a causal relationship between spacecraft charging events and the engineering anomalies.

Garrett, H. B.↗

NASA NTRS1988

Applicative architectures for fault-tolerant multiprocessors

This paper proposes functional programming frameworks for the design of highly reliable multiprocessor systems. In contrast to imperative programming environments, a functional environment offers elegant, relatively simple, and efficient solutions to concurrent error detection and recovery problems in multiprocessors. Specific fault tolerance mechanisms for upset exposure, fault containment, secure task assignment, and recovery are developed for a class of applicative multiprocessor architectures. Verification of abstract behavioral characteristics of applicative tasks is used for exposing faults during the execution of tasks. The fault containment mechanism is based on isolation of stack and heap segments of tasks. A protocol for secure task assignment is defined between system components. The architecture permits incremental, distributed, and asynchronous backups of system state. Finally, recovery is accomplished, even in the worst cases, by reexecution of a small number of tasks.

Sharma, Madhumitra↗

NASA NTRS1989

Read disturb errors in a CMOS static RAM chip

Results are reported from an extensive investigation into pattern-sensitive soft errors (read disturb errors) in the TCC244 CMOS static RAM chip. The TCC244, also known as the SA2838, is a radiation-hard single-event-upset-resistant 4 x 256 memory chip. This device is being used by the Jet Propulsion Laboratory in the Galileo and Magellan spacecraft, which will have encounters with Jupiter and Venus, respectively. Two aspects of the part's design are shown to result in the occurrence of read disturb errors: the transparence of the signal path from the address pins to the array of cells, and the large resistance in the Vdd and Vss lines of the cells in the center of the array. Probe measurements taken during a read disturb failure illustrate how address skews and the data pattern in the chip combine to produce a bit flip. A capacitive charge pump formed by the individual cell capacitances and the resistance in the supply lines pumps down both the internal cell voltage and the local supply voltage until a bit flip occurs.

Wood, Steven H.↗

NASA NTRS1991

Study Of Candidate Architectures For Data Processor

Report discusses candidate architectures for digital computer system, part of communication system in spacecraft. Primary issues in analysis; performance, rates of bit errors attributable to single-event upsets (caused by ionizing radiation), reliability, size, and dissipation of power.

Mcroberts, Lou↗

NASA NTRS1991

State estimation applications in aircraft flight-data analysis: A user's manual for SMACK

The evolution in the use of state estimation is traced for the analysis of aircraft flight data. A unifying mathematical framework for state estimation is reviewed, and several examples are presented that illustrate a general approach for checking instrument accuracy and data consistency, and for estimating variables that are difficult to measure. Recent applications associated with research aircraft flight tests and airline turbulence upsets are described. A computer program for aircraft state estimation is discussed in some detail. This document is intended to serve as a user's manual for the program called SMACK (SMoothing for AirCraft Kinematics). The diversity of the applications described emphasizes the potential advantages in using SMACK for flight-data analysis.

Bach, Ralph E., Jr.↗

NASA NTRS1991

A machine independent expert system for diagnosing environmentally induced spacecraft anomalies

A new rule-based, machine independent analytical tool for diagnosing spacecraft anomalies, the EnviroNET expert system, was developed. Expert systems provide an effective method for storing knowledge, allow computers to sift through large amounts of data pinpointing significant parts, and most importantly, use heuristics in addition to algorithms which allow approximate reasoning and inference, and the ability to attack problems not rigidly defines. The EviroNET expert system knowledge base currently contains over two hundred rules, and links to databases which include past environmental data, satellite data, and previous known anomalies. The environmental causes considered are bulk charging, single event upsets (SEU), surface charging, and total radiation dose.

Rolincik, Mark J.↗

NASA NTRS1990

Tethered gravity laboratories study

The scope of the study is to investigate ways of controlling the microgravity environment of the International Space Station by means of a tethered system. Four main study tasks were performed. First, researchers analyzed the utilization of the tether systems to improve the lowest possible steady gravity level on the Space Station and the tether capability to actively control the center of gravity position in order to compensate for activities that would upset the mass distribution of the Station. The purpose of the second task was to evaluate the whole of the experiments performable in a variable gravity environment and the related beneficial residual accelerations, both for pure and applied research in the fields of fluid, materials, and life science, so as to assess the relevance of a variable g-level laboratory. The third task involves the Tethered Variable Gravity Laboratory. The use of the facility that would crawl along a deployed tether and expose experiments to varying intensities of reduced gravity is discussed. Last, a study performed on the Attitude Tether Stabilizer concept is discussed. The stabilization effect of ballast masses tethered to the Space Station was investigated as a means of assisting the attitude control system of the Station.

Lucchetti, F.↗

NASA NTRS1991

Test chips and ASIC qualification

A test chip set being developed to aid in the qualification of spaceborne Application Specific Integrated Circuits (ASICs) is described. The chip set consists of a process monitor for process parameter verification, a fault chip for yield analysis, a reliability chip for ASIC failure rate analysis, and total ionizing dose and single event upset chips for radiation effect analysis. The test structures contained in these chips are discussed along with representative test results.

Buehler, M. G.↗

NASA NTRS1991

Further identification and treatment modalities in telephone mediated lightning strike

The results are presented of a prospective survey of people injured by lightning impulses transmitted by the public telephone system. The results are compared with those of a previous retrospective survey. Various deficiencies in the methodology of the latter survey are addressed. A division into a population with severe injury and a population with mild injury is made based on medical history and examination taken immediately after a strike. The best predictors of severe injury were found to be the presence of symptoms beyond one week after the strike, and also the initial presence of musculoskeletal injuries. Psychological upset is also seen to be a significant factor in severe injury. The only physical parameter of strike which could be used as a predictor of severe injury was the presence of concomitant power system damage. The importance of earth bonding between power and telephone system is thus supported in a protection strategy. One author draws on experience in treating patients with these injuries to propose a treatment regimen for those with ongoing symptoms. The importance of evaluating and treating psychological and physical aspects is stressed.

Andrews, Christopher J.↗

NASA NTRS1991

Influence of configuration effects on multiple burst simulation testing

During the initial phase of a lightning strike attachment on an aircraft, fast current pulses (rise time approximately 100 ns, I(sub max) approximately few kA) were measured, which can create equipment upsets or disturbances. This threat, made of repetitive pulses and usually called 'multiple bursts', can be reproduced at the equipment interfaces assuming that the transfer function of the structure was determined. The normalized waveform H (10 kA - 100 ns rise time) is the reference for one of these pulses. The importance of the coaxial return path termination for the injection of the wave H is emphasized. According to the constitutive materials of the test bed, and the adaptation of the line, the natural oscillations of the structure and the internal coupling mechanisms can be modified. As a conclusion, various test configurations in relation with the nature of the test bed and the characteristics of the generator are detailed, for a more accurate ground simulation of the attachment phase.

Emanuely, J. L.↗

NASA NTRS1991

Design of lightning protection for a full-authority digital engine control

The steps and procedures are described which are necessary to achieve a successful lightning-protection design for a state-of-the-art Full-Authority Digital Engine Control (FADEC) system. The engine and control systems used as examples are fictional, but the design and verification methods are real. Topics discussed include: applicable airworthiness regulation, selection of equipment transient design and control levels for the engine/airframe and intra-engine segments of the system, the use of cable shields, terminal-protection devices and filter circuits in hardware protection design, and software approaches to minimize upset potential. Shield terminations, grounding, and bonding are also discussed, as are the important elements of certification and test plans, and the role of tests and analyses. Also included are examples of multiple-stroke and multiple-burst testing. A review of design pitfalls and challenges, and status of applicable test standards such as RTCA DO-160, Section 22, are presented.

Dargi, M.↗

NASA NTRS1990

1990 IEEE Annual Conference on Nuclear and Space Radiation Effects, 27th, Reno, NV, July 16-20, 1990, Proceedings

Various papers on nuclear and space radiation effects are presented. The general topics addressed include: basic mechanisms of radiation effects, dosimetry and energy-dependent effects, hardness assurance and testing techniques, single-event upset and latchup, isolation technologies, device and integrated circuit effects and hardening, spacecraft charging and electromagnetic effects.

Fleetwood, Daniel M.↗

NASA NTRS1990

Environmental space hazards - An overview

An overview of space hazards that exist in the geo-lunar environment is given along with specific examples of deleterious effects that can be visited upon a long-term mission-oriented spacecraft system in LEO, GEO, the intervening space, LLO, and the lunar surface. Hazards discussed are categorized as pervasive (radiation), incident specific (meteoroids, monatomic oxygen, thermal gradient and shock, and low earth orbital debris), and chemically corrosive (monatomic oxygen). It is pointed out that, while some of the difficulties encountered are common to all types of propulsion systems, in the interplanetary domain the emphasis shifts from incident specific hazards to the pervasive upsets caused by ionizing and nonionizing radiation.

Bahr, G. K.↗