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DOE OSTI2025

Risk-informed Graded Approach for Reliability and Performance Assessment for Advanced Condition Monitoring Techniques

With the shift away from time-based maintenance and toward condition-based maintenance, and to reduce overall maintenance costs, there has been an upsurge in the usage and development of advanced condition monitoring (ACM) techniques for real-time monitoring of nuclear power plant (NPP) components. ACM is particularly useful in the development of digital twins, which are designed to predict the failure or degradation of plant components. Successful implementation of ACM requires an assessment to inform the development of a risk-informed approach to evaluate the use of ACM to meet Nuclear Regulatory Committee (NRC) regulations for in-service testing (IST) programs. This includes the monitoring and diagnostics of reactor components and systems in current, new, and advanced reactors. A key component in ACM is the usage of machine learning (ML) and artificial intelligence (AI) algorithms that can employ real-time data from instrumentation and sensors to detect and predict reactor component degradations. Such predictive capabilities enable early detection of component degradation so as to help plant personnel plan and execute necessary maintenance. For successful implementation of ML/AI in ACM such that regulatory requirements are met, a risk-informed graded approach is needed to assess the reliability and performance of ML/AI for ACM. The American Society for Mechanical Engineers (ASME) developed their Operations and Maintenance (O&M) Code to provide guidance on safe, reliable O&M of NPPs. The IST section of the O&M Code specifically establishes requirements for IST and examination to gauge operational readiness of components in water-cooled NPPs. This paper presents a state-of-the-art review of how reliability and risk assessment can be integrated with ACM to assess component performance by non-nuclear industries. This is followed by different methodologies and approaches for conducting performance and reliability assessments so as to meet IST requirements for NPP components.

99 - GENERAL AND MISCELLANEOUS↗

DOE OSTI2026

Portable and Cost-Effective Device for Reliable Detection of Counterfeit and Non-compliant Refrigerants in Diverse Applications

Counterfeit refrigerants pose significant challenges to safety, system reliability, and operational effectiveness due to their harmful contaminants or incompatible chemical compositions. Utilizing these noncompliant products can lead to reduced efficiency, equipment failures, and expensive repairs. Additionally, heightened demand for alternative refrigerants during the industry's transition has created supply gaps, enabling counterfeit products to proliferate. Accurate detection and analysis tools are therefore essential to verify refrigerant authenticity and ensure system integrity in diverse applications. This paper presents the development of a portable device designed for reliable identification and detailed analysis of refrigerant composition. By integrating precision gas sampling, controlled pressure regulation, and automated sensor technology, the device not only detects deviations from standard refrigerant properties but also provides a comprehensive composition breakdown. Pre-calibrated sensors measure the refrigerant gas to identify specific concentrations and contaminants, with an intuitive LED-based indicator system ensuring quick interpretation of results. The user-friendly interface enables operators to select refrigerant types for targeted testing, further enhancing accuracy and usability for field technicians. Comprehensive testing was conducted on mildly flammable A2L refrigerants, showcasing the device’s robustness and adaptability in analyzing composition and detecting discrepancies. The device demonstrated consistent accuracy across a range of refrigerant samples, affirming its reliability in diverse operational environments. Its design minimizes contamination risks during sampling and provides detailed composition results within 90 seconds, ensuring efficient and precise analysis. With a projected price point under $150, the proposed solution delivers affordability alongside its lightweight portability and straightforward operation. Unlike complex and costly alternatives, such as gas chromatography systems, this device provides an accessible option for technicians, customs personnel, and industry operators in need of quick and effective refrigerant verification. Compatible with both current formulations and emerging refrigerant technologies, the device addresses critical counterfeit detection needs across a range of applications. By delivering accurate composition analysis and counterfeit identification, this innovation enhances system performance, safety, and operational reliability in crucial industries.

Cheekatamarla, Praveen [ORNL] (ORCID:0000000248827↗

DOE OSTI2025

A note on the reliability of goal-oriented error estimates for Galerkin finite element methods with nonlinear functionals

Here, we consider estimating the discretization error in a nonlinear functional J (u) in the setting of an abstract variational problem: find u ϵ $\mathscr{V}$ such that B (u, φ) = L (φ) ∀φ ϵ $\mathscr{V}$, as approximated by a Galerkin finite element method. Here, $\mathscr{V}$ is a Hilbert space, B (. , .) is a bilinear form, and L (∙) is a linear functional. We consider well-known error estimates η of the form J (u) - J (u h ) ≈ η = L (z) - B (u h , z), where u h denotes a finite element approximation to u, and z denotes the solution to an auxiliary adjoint variational problem. We show that there exist nonlinear functionals for which error estimates of this form are not reliable, even in the presence of an exact adjoint solution z. An estimate η is said to be reliable if there exists a constant C ϵ $\mathbb{R}$ >0 independent of u h such that |J (u) - J (u h )| ≤ C|η|. We present several example pairs of bilinear forms and nonlinear functionals where reliability of η is not achieved.

A posteriori↗

DOE OSTI2025

A method for assessing economic, environmental, and reliability tradeoffs of interregional transmission connecting ERCOT (the Texas grid) to the eastern and western grids

Reliable development of the power grid is an evolving concern for humanity due to extreme weather that frequently threatens power sector infrastructure. The state of Texas is a uniquely structured testbed for grid planners to study when looking for solutions to development, innovation, and overcoming such challenges. Because of its size and islanded structure, Texas is small enough to model, but big enough to matter. Texas is a global leader in energy production, energy consumption, and maintains an unusually diverse fuel mix. In addition, the state has experienced winter freezes, heat waves, wind storms, droughts and floods that have threatened power sector infrastructure or caused recent blackouts and calls for demand side conservation. One of the most devastating of these events was the North American winter storm, dubbed “Winter Storm Uri” by the Weather Channel, that froze the region in February 2021 and led to an extended power outage event that put the majority of Texan residents in darkness for days. While preparing to avoid such outage events in the future, various tools have been proposed to improve grid reliability, including energy efficiency, demand response, and distributed energy resources. An additional option would be to develop interregional transmission that connects the Texas grid to other national grids. To assess the merits of this idea, we developed a novel, universally-applicable and internationally-relevant framework to study how the Texas grid would evolve alongside access to various interregional ties. This method allows us to stress the synthetic grid structure and analyze how it would respond to the shock of a simulated winter storm event. Our method leverages open-source modeling tools, such as PowerGenome, pyGRETA, and GenX to synthesize unique zonal grid data, construct a consolidated network of model regions, and simulate different developmental pathways of capacity expansion and operational dispatch. We demonstrate our method with an analysis connecting the Electric Reliability Council of Texas (ERCOT), the grid that serves most of Texas, the Western Electricity Coordinating Council (WECC), the grid that serves the western half of the contiguous U.S., and the Eastern Interconnect, the grid that serves the eastern half of the contiguous U.S. Our results indicate that the cost-optimal capacity of interregional transmission connecting the ERCOT grid to other grids lies between 9–13 GW assuming baseline conditions. Building this amount of connecting capacity in one or multiple directions lowers the costs and emissions of development and operation by up to $16 billion and 257 million metric tonnes (MMT) respectively. Additionally, our results show that the interregional connections between ERCOT and other national grids reduce the amount of total load shed required through mild winter storm events. However, our results also show that there is a threshold of very extreme winter storm conditions, spanning multiple service areas, above which the connections exacerbate resource adequacy problems. Therefore, the results indicate that the connections need to be carefully planned alongside the rest of the grid infrastructure to avoid over-reliance on specific resources or technology options.

24 POWER TRANSMISSION AND DISTRIBUTION↗

DOE OSTI2025

Model-driven prediction for accelerator magnet diagnostics to improve operation reliability

Reliability is one of the most critical metrics for accelerator operation, especially in user facilities. To reduce costly facility downtime and provide an operational environment where system performance can be reliably predicted in support of scientific studies, we are developing a model-driven approach for prediction and anomaly detection. Here, in this study, we present the application of a model-driven method that employs a linear regression model to predict the future temperature, in real time, of accelerator magnets at the NSLS-II light source. This approach enables proactive identification of magnet-heating issues, facilitating magnet flushing prior to the occurrence of permanent damage without interrupting machine operation. The implementation of this method in the NSLS-II control room is described and the analysis of the online results is presented. The results demonstrate the model’s effectiveness in providing early alerts to engineers and improving the reliability of accelerator operations.

36 MATERIALS SCIENCE↗

DOE OSTI2024

Atomically Precise Graphene Nanoribbon Transistors with Long-Term Stability and Reliability

Atomically precise graphene nanoribbons (GNRs) synthesized from the bottom-up exhibit promising electronic properties for high-performance field-effect transistors (FETs). The feasibility of fabricating FETs with GNRs (GNRFETs) has been demonstrated, with ongoing efforts aimed at further improving their performance. However, their long-term stability and reliability remain unexplored, which is as important as their performance for practical applications. In this work, we fabricated short-channel FETs with nine-atom-wide armchair GNRs (9-AGNRFETs). We revealed that the on-state (/ ON ) current performance of the 9-AGNRFETs deteriorates significantly over consecutive full transistor on and off logic cycles, which has neither been demonstrated nor previously considered. To address this issue, we deposited a thin ~10 nm thick atomic layer deposition (ALD) layer of aluminum oxide (Al 2 O 3 ) directly on these devices. The integrity, compatibility, electrical performance, stability, and reliability, of the GNRFETs before and/or after Al 2 O 3 deposition were comprehensively studied. The results indicate that the observed decline in electrical device performance is most likely due to the degradation of contact resistance over multiple measurement cycles. We successfully demonstrated that the devices with the Al 2 O 3 layer operate well up to several thousand continuous full cycles without any degradation. Our study offers valuable insights into the stability and reliability of GNR transistors, which could facilitate their large-scale integration into practical applications.

36 MATERIALS SCIENCE↗

DOE OSTI2026

Reliability Assessment of Cooling Fans for PV Inverters: Testing, Modeling, and Case Studies

The reliability of photovoltaic (PV) inverters is critical for long-term solar system performance, with cooling fan failures frequently leading to costly downtime. While much research exists on general cooling fan reliability, little attention has been given to fans operating within PV inverters and their unique environmental challenges. Here, this article proposes a comprehensive methodology to address this gap. First, a failure mode and effects analysis is performed on fans to identify the key failure mechanisms in PV applications, their corresponding stressors, and the models necessary for lifetime prediction. Second, an accelerated life test is designed and conducted to collect valuable experimental data for PV inverter fans in a reasonable amount of time. Third, a mathematical conversion of dynamic mission profiles into effective constant stress levels is derived. Fourth, case studies are given, showcasing lifetime estimates that account for geographic variations in mission profile data. The results demonstrate that this integrated approach leads to an accurate reliability assessment for PV inverter cooling fans.

accelerated life testing (ALT)↗

DOE OSTI2026

A Faster-Than-Real-Time Framework for Reliability-Oriented Simulation of PV Inverters

Physics-of-Failure (PoF) based reliability assessment for photovoltaic (PV) inverters requires long-duration electrical and electrothermal stress histories, yet generating such stress histories with high-fidelity switching models over year long mission profiles is computationally prohibitive. Conventional methods either sacrifice modeling fidelity for speed or require runtimes that are impractical for design iteration and uncertainty studies. To address this bottleneck, this paper presents a High-Performance Computing (HPC) based simulation frame work for faster-than-real-time reliability-oriented simulation. The proposed framework integrates the Average-to-Switching (A2S) method with parallel computing techniques to accelerate switching-level waveform reconstruction. We further introduce optimization strategies, including cluster merging and sensitivity based mission profile screening, to reduce the computational burden. Evaluated using real-world mission profile inputs and a MATLAB/Simulink switching-model reference, the framework reduces the simulation time for a one-year mission from an intractable multi-year duration to approximately 7.3 minutes while maintaining low waveform error. This acceleration provides a practical reliability-oriented simulation engine that can be coupled with component-specific aging models for subsequent PV inverter PoF assessment.

High-performance Computing↗

DOE OSTI2026

Repowering: The Other Side of the Reliability Coin

Extreme weather, cracked backsheets, severe PID, poorly built modules, and installation flaws - all can compromise a solar plant's health and force repowering long before end of life. With more than 70% of U.S. PV capacity less than seven years old, the fleet is young, but its rapid expansion has introduced new materials and system designs that are still being tested under real-world conditions. As a result, reliability - not economics - is what most often drives repowering decisions. Repowering is frequently assumed to be an economically motivated choice, but our work shows that reliability concerns are the real trigger. Drawing from industry interviews, case studies, and modeling, we highlight the physical, electrical, and policy barriers owners face when deciding whether to repair, repower, or decommission. At the same time, repowering can create opportunities: renewed interconnection periods, improved energy yields, and strategic upgrades to extend system value. We present a quantitative framework using NLR's System Advisor Model (SAM) and PV in Circular Economy (PV ICE) tool to evaluate trade-offs across financial, material, and energy impacts. These findings provide practical guidance for navigating the realities of repowering today and underscore the critical role of reliability in shaping the future performance and sustainability of the PV fleet.

14 SOLAR ENERGY↗

NASA NTRS1962

Design Reliability Measurement and Evaluation

Reliability measurement by data collection and evaluation is considered. Parameters are defined and restrictions established. Reliability estimation of sub-systems and parts as a preliminary to system estimation is reviewed, and rules are established. Confidence levels of sub-systems and parts versus combined system are analyzed. Estimation planning is discussed. Tests planned for accept-reject reliability decision are very briefly considered.

RELIABILITY↗

NASA NTRS1994

Software analysis handbook: Software complexity analysis and software reliability estimation and prediction

This handbook documents the three software analysis processes the Space Station Software Analysis team uses to assess space station software, including their backgrounds, theories, tools, and analysis procedures. Potential applications of these analysis results are also presented. The first section describes how software complexity analysis provides quantitative information on code, such as code structure and risk areas, throughout the software life cycle. Software complexity analysis allows an analyst to understand the software structure, identify critical software components, assess risk areas within a software system, identify testing deficiencies, and recommend program improvements. Performing this type of analysis during the early design phases of software development can positively affect the process, and may prevent later, much larger, difficulties. The second section describes how software reliability estimation and prediction analysis, or software reliability, provides a quantitative means to measure the probability of failure-free operation of a computer program, and describes the two tools used by JSC to determine failure rates and design tradeoffs between reliability, costs, performance, and schedule.

Computer systems design↗

NASA NTRS2005

Design for ASIC reliability for low-temperature applications

In this paper, we present a methodology to design for reliability for low temperature applications without requiring process improvement. The developed hot carrier aging lifetime projection model takes into account both the transistor substrate current profile and temperature profile to determine the minimum transistor size needed in order to meet reliability requirements. The methodology is applicable for automotive, military, and space applications, where there can be varying temperature ranges. A case study utilizing this methodology is given to design for reliability into a custom application-specific integrated circuit (ASIC) for a Mars exploration mission.

reliability↗

NASA NTRS2006

Design Parameters Influencing Reliability of CCGA Assembly: A Sensitivity Analysis

Area Array microelectronic packages with small pitch and large I/O counts are now widely used in microelectronics packaging. The impact of various package design and materials/process parameters on reliability has been studied through extensive literature review. Reliability of Ceramic Column Grid Array (CCGA) package assemblies has been evaluated using JPL thermal cycle test results (-50(deg)/75(deg)C, -55(deg)/100(deg)C, and -55(deg)/125(deg)C), as well as those reported by other investigators. A sensitivity analysis has been performed using the literature da to study the impact of design parameters and global/local stress conditions on assembly reliability. The applicability of various life-prediction models for CCGA design has been investigated by comparing model's predictions with the experimental thermal cycling data. Finite Element Method (FEM) analysis has been conducted to assess the state of the stress/strain in CCGA assembly under different thermal cycling, and to explain the different failure modes and locations observed in JPL test assemblies.

reliability↗

NASA NTRS2004

Qualification and Reliability for MEMS and IC Packages

Advanced IC electronic packages are moving toward miniaturization from two key different approaches, front and back-end processes, each with their own challenges. Successful use of more of the back-end process front-end, e.g. microelectromechanical systems (MEMS) Wafer Level Package (WLP), enable reducing size and cost. Use of direct flip chip die is the most efficient approach if and when the issues of know good die and board/assembly are resolved. Wafer level package solve the issue of known good die by enabling package test, but it has its own limitation, e.g., the I/O limitation, additional cost, and reliability. From the back-end approach, system-in-a-package (SIAP/SIP) development is a response to an increasing demand for package and die integration of different functions into one unit to reduce size and cost and improve functionality. MEMS add another challenging dimension to electronic packaging since they include moving mechanical elements. Conventional qualification and reliability need to be modified and expanded in most cases in order to detect new unknown failures. This paper will review four standards that already released or being developed that specifically address the issues on qualification and reliability of assembled packages. Exposures to thermal cycles, monotonic bend test, mechanical shock and drop are covered in these specifications. Finally, mechanical and thermal cycle qualification data generated for MEMS accelerometer will be presented. The MEMS was an element of an inertial measurement unit (IMU) qualified for NASA Mars Exploration Rovers (MERs), Spirit and Opportunity that successfully is currently roaring the Martian surface

inertial measurement unit↗

NASA NTRS2004

A Statistical Approach to Characterizing the Reliability of Systems Utilizing HBT Devices

This paper presents a statistical approach to characterizing the reliability of systems with HBT devices. The proposed approach utilizes the statistical reliability information of the HBT individual devices, along with the analysis on the critical paths of the system, to provide more accurate and more comprehensive reliability information about the HBT systems compared to the conventional worst-case method.

hetero bipolar transistors (HBTs)↗

NASA NTRS2011

Reliability of Sn/Pb and Lead-Free (SnAgCu) Solders of Surface Mounted Miniaturized Passive Components for Extreme Temperature (-185 C to +125 C) Space Missions

Surface mount electronic package test boards have been assembled using tin/lead (Sn/Pb) and lead-free (Pb-free or SnAgCu or SAC305) solders. The soldered surface mount packages include ball grid arrays (BGA), flat packs, various sizes of passive chip components, etc. They have been optically inspected after assembly and subsequently subjected to extreme temperature thermal cycling to assess their reliability or future deep space, long-term, extreme temperature environmental missions. In this study, the employed temperature range (-185oC to +125oC) covers military specifications (-55oC to +100oC), extreme old Martian (-120oC to +115oC), asteroid Nereus (-180oC to +25oC) and JUNO (-150oC to +120oC) environments. The boards were inspected at room temperature and at various intervals as a function of extreme temperature thermal cycling and bake duration. Electrical resistance measurements made at room temperature are reported and the tests to date have shown some change in resistance as a function of extreme temperature thermal cycling and some showed increase in resistance. However, the change in interconnect resistance becomes more noticeable with increasing number of thermal cycles. Further research work will be carried out to understand the reliability of packages under extreme temperature applications (-185oC to +125oC) via continuously monitoring the daisy chain resistance for BGA, Flat-packs, lead less chip packages, etc. This paper will describe the experimental reliability results of miniaturized passive components (01005, 0201, 0402, 0603, 0805, and 1206) assembled using surface mounting processes with tin-lead and lead-free solder alloys under extreme temperature environments.

extreme temperatures,↗

NASA NTRS2015

A Vision for Spaceflight Reliability: NASA's Objectives Based Strategy

In defining the direction for a new Reliability and Maintainability standard, OSMA has extracted the essential objectives that our programs need, to undertake a reliable mission. These objectives have been structured to lead mission planning through construction of an objective hierarchy, which defines the critical approaches for achieving high reliability and maintainability (R M). Creating a hierarchy, as a basis for assurance implementation, is a proven approach; yet, it holds the opportunity to enable new directions, as NASA moves forward in tackling the challenges of space exploration.

Strategy↗

NASA NTRS2015

Spaceflight Reliability: An Objectives-Based Strategy

Reliability and Maintainability↗