Vapor phase growth technique and system for several 3-5 compound semiconductors Quarterly technical report
Single vapor phase growth system for preparing semiconductor materials
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Single vapor phase growth system for preparing semiconductor materials
Bibliography, theory, and experiments on optical mixing in bulk semiconductors for millimeter wave generation
Growth and analysis of thin film piezoelectric transducers in study of electron phonon interactions in semiconductors
External visual inspection criteria for semiconductor devices
Radiation damage to silicon and germanium semiconductors by high energy electrons
Interrelation of process techniques and space radiation effects in metal oxide semiconductors
Preparation of vapor deposited cadmium sulfide thin films on indium antimonide semiconductors for acoustic propagation studies of electron- phonon interaction
Current-voltage characteristics of cathodic reduction of aqueous ferricyanide ion, using single crystal of n-type semiconductor zinc oxide
Junction depths measurement in semiconductor devices by drilling with rotating sphere
Bardeen-Cooper-Schrieffer energy gap equation /with constant kernel/ approximate solution derivation for superconducting semiconductors, discussing predicted very thin film transition temperatures
Book on radiation effects in semiconductor devices, discussing displacement, transient and surface damage
Flight specifications effects on failure rates of semiconductor parts in Apollo Guidance Computer, detailing procurement, screen, burn-in and field history
Total single particle energy of isotropic semiconductors, discussing energy spectra of bonded crystals for diamond and silicon
Technique using photodielectric effect of semiconductor in high-Q superconductive cavity gives initial improvement of 2-4 db in signal-to-noise enhancement of conventional RF communication systems. Wide band signal plus noise can be transmitted through a narrow-band cavity due to parametric perturbation of the cavity frequency or phase.
Electron irradiation effect on resolution of lithium-drifted silicon semiconductor detectors
Criteria applied to semiconductor materials and deposition processes for thick film, insulated gate field effect transistor fabrication
Electronic charge injection instability in silicon nitride metal-insulator-semiconductor devices
Measurement and interpretation of Hall coefficient and resistivity of semiconductors