Search NASA⌕ Search

SEARCH · Search NASA

Results for “trapped”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 433 records · Page 24

Ground computer test trap

Test trap consists of logic nest of five printed circuit boards, plus power supply within the unit. Device monitors more than one logic area simultaneously, gives visual display of detected error, operates at computer speed, maintains readily available logic description of cards used, and is compatible with existing computer circuitry.

Fondrie, D. G.↗