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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 451 records · Page 25

Micron MT29F128G08AJAAA 128GB Asynchronous Flash Memory Total Ionizing Dose Characterization Test Report

The purpose of this test was to characterize the Micron MT29F128G08AJAAAs parameter degradation for total dose response and to evaluate and compare lot date codes for sensitivity. In the test, the device was exposed to both low dose and high dose rate (HDR) irradiations using gamma radiation. Device parameters such as leakage currents, quantity of upset bits and overall chip and die health were investigated to determine which lot is more robust.

Flash Memory↗

Flash Optical Energy from the Geostationary Lightning Mapper

The Geostationary Operational Environmental Satellite - 16 (GOES-16) Geostationary Lightning Mapper (GLM) is evaluated for many months during the Post Launch Product Test (PLPT) phase in order to ensure that optimal products are available for both the operational forecasting and broader scientific research communities. An essential aspect of the PLPT phase is to obtain a benchmark of the GLM lightning optical amplitude, so that any long-term degradation in the nadir-staring GLM camera system can be realized and quantitatively assessed. This work provides a preliminary benchmark over a 60-day period using Provisionally Validated data.

Flash↗

Flash Communication: Flexibility of a Biologically Inspired Ligand Framework for Intramolecular C–H Activation

High-valent iron complexes play a crucial role in the oxidation of organic substrates, especially in C–H bond functionalization reactions in biology. This paper investigates the reactivity of nonporphyrin tripodal ligands featuring a secondary coordination sphere, focusing on their prospective ability to stabilize high-valent iron-oxo species. Using NMR spectroscopy and X-ray crystallography, we detail the formation of an Fe(III)-alkoxide complex through intramolecular C–H bond activation, providing insight into the potential transient formation of a high-valent iron-oxo intermediate. While attempts to observe an Fe(IV)-oxo complex were unsuccessful, our findings underscore the significance of the ligand electronic environment in stabilizing reactive iron species for C–H bond activation.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

Flash Communication: Boron K-edge XAS and TDDFT Studies of Covalent Metal–Ligand Bonding in Ni(C 2 B 9 H 11 ) 2

Ligand K-edge X-ray absorption spectroscopy (XAS), a technique that can measure variations in covalent metal–ligand bonding, has rarely been used to assess covalency in complexes containing metal–boron bonds. Here we describe ligand K-edge XAS and TDDFT studies of the Ni dicarbollide complex Ni(C 2 B 9 H 11 ) 2 (1) and the Ni-free salt (HNMe 3 )(C 2 B 9 H 12 ) (L1). The XAS spectrum for 1 reveals a pre-edge feature indicative of covalent Ni–B bonding, which is corroborated by time-dependent density functional theory (TDDFT) calculations and comparative analysis to L1 and inner-shell electron energy loss spectroscopy (ISEELS) collected on the same Ni complex.

Boron↗

Flash Communication: Properties and Applications of a Pentavalent Bromoantimony Lewis Acid

While normally reluctant toward oxidation, SbBr 3 can be oxidized with 3,4,5,6-tetrachloro-1,2-benzoquinone (o-chloranil) in the presence of a Lewis base like the bromide anion or triphenylphosphine oxide (PPh 3 O) to form the tetrachlorocatecholate (cat Cl ) derivatives [SbBr 4 (cat Cl )] − ([2-Br] − ) and SbBr 3 (cat Cl )•OPPh 3 (2•OPPh 3 ), respectively. Structural, spectroscopic, and computational data indicate that the SbBr 3 (cat Cl ) fragment is similarly, if slightly less, Lewis acidic than the previously reported SbCl 3 (cat Cl ) fragment. The SbBr 3 /o-chloranil system, as well as its previously reported counterpart SbCl 3 /o-chloranil, were tested as Lewis acid catalysts for C−O bond metathesis and polycarbonate depolymerization. These results identified SbX 3 /o-chloranil pairs (X = Cl, Br) as simple main-group platforms for C−O bond cleavage chemistry.

Anions↗

Charge Trap Layer Supercharging for Improved Bit Reliability in 3-D NAND Flash Under Proton Irradiation

Single-event upset (SEU) cross sections are reduced in 176-layer charge trap (CT) 3-D nand devices under proton irradiation when multiple write operations are applied sequentially without the typical erase-before-write. Here, this effect is observed for multiple data patterns and in both single-level cell (SLC) and triple-level cell (TLC) operating modes. SEU cross section calculation methodologies are discussed for highly scaled 3-D devices both with and without the application of rewrites, and potential implications for long-term endurance effects are proposed.

Breeding, Matthew Luel [Sandia National Laboratori↗

Physics Flash: Summer 2024

Each year, the Lab’s Partnerships and Pipeline Office's Postdoc Program honors outstanding efforts made by postdocs and mentors that have led to a positive impact on the Lab and its missions. For such contributions, Applied and Fundamental Physics (P-2) researchers David Rivera and Sowjanya Gollapinni have been recognized by the program.

99 GENERAL AND MISCELLANEOUS↗

Reference Materials for Laser and Xenon Flash Thermal Diffusivity Systems

This report presents the status of current standard reference materials for thermal diffusivity testing. In most thermal properties testing systems, it is common to use standard reference materials to show the reproducibility of the tests and certify the instrument is producing results within expected uncertainty range. The definition of reference materials or standards vary depending on the quality control protocols of the project. For thermal diffusivity, although there were standards available by the National Bureau of Standards (NBS) 40 years ago, there has been no recent NIST standard reference material (SRM). There are only a few sources that produce and provide traceable reference standards for thermal diffusivity. The certificate typically expires in 5 years and only applies to the specific lot of materials. Other reference materials are provided by the testing systems manufacturers. They are mostly well-known reference materials or materials used by the equipment manufacturers with historic data. However, most these reference materials no longer carry valid certificates. Various reference materials will be discussed along with the industry practice when only secondary standards are available.

36 MATERIALS SCIENCE↗