Modeling Spectralon's Bidirectional Reflectance for In-Flight Calibration of Earth-Orbiting Sensors
This paper describes the results of a model inversion which was conducted using measured Spectralon BRDF data at several illumination angles. We can describe the bidirectional reflectance of the Spectralon and in paticular its slight anisotrophy with a physically-based model. The root mean square difference between the model and the observations is currently of the order of the noise in the data (+/-1%). It is expected that meaningful corrections to account for the anisotrophy of the Spectralon panels will be achieved in the next few years and will improve the calibration of the MISR instrument.